ATE549617T1 - Gerät und verfahren zur laser-ultraschall frequenzkontrolle unter verwendung optimaler wellenlängenabstimmung - Google Patents
Gerät und verfahren zur laser-ultraschall frequenzkontrolle unter verwendung optimaler wellenlängenabstimmungInfo
- Publication number
- ATE549617T1 ATE549617T1 AT00953691T AT00953691T ATE549617T1 AT E549617 T1 ATE549617 T1 AT E549617T1 AT 00953691 T AT00953691 T AT 00953691T AT 00953691 T AT00953691 T AT 00953691T AT E549617 T1 ATE549617 T1 AT E549617T1
- Authority
- AT
- Austria
- Prior art keywords
- laser pulse
- optimal wavelength
- optimal
- laser
- frequency control
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/34—Generating the ultrasonic, sonic or infrasonic waves, e.g. electronic circuits specially adapted therefor
- G01N29/348—Generating the ultrasonic, sonic or infrasonic waves, e.g. electronic circuits specially adapted therefor with frequency characteristics, e.g. single frequency signals, chirp signals
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/22—Details, e.g. general constructional or apparatus details
- G01N29/24—Probes
- G01N29/2418—Probes using optoacoustic interaction with the material, e.g. laser radiation, photoacoustics
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
- G01N29/34—Generating the ultrasonic, sonic or infrasonic waves, e.g. electronic circuits specially adapted therefor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/01—Indexing codes associated with the measuring variable
- G01N2291/015—Attenuation, scattering
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/02—Indexing codes associated with the analysed material
- G01N2291/023—Solids
- G01N2291/0231—Composite or layered materials
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2291/00—Indexing codes associated with group G01N29/00
- G01N2291/26—Scanned objects
- G01N2291/269—Various geometry objects
- G01N2291/2694—Wings or other aircraft parts
Landscapes
- Physics & Mathematics (AREA)
- General Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Optics & Photonics (AREA)
- Lasers (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
- Semiconductor Lasers (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US09/361,768 US6176135B1 (en) | 1999-07-27 | 1999-07-27 | System and method for laser-ultrasonic frequency control using optimal wavelength tuning |
| PCT/US2000/020404 WO2001007906A1 (en) | 1999-07-27 | 2000-07-27 | Device and method for laser-ultrasonic frequency control using optimal wavelength tuning |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE549617T1 true ATE549617T1 (de) | 2012-03-15 |
Family
ID=23423376
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT00953691T ATE549617T1 (de) | 1999-07-27 | 2000-07-27 | Gerät und verfahren zur laser-ultraschall frequenzkontrolle unter verwendung optimaler wellenlängenabstimmung |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US6176135B1 (de) |
| EP (1) | EP1203230B1 (de) |
| AT (1) | ATE549617T1 (de) |
| AU (1) | AU6609500A (de) |
| CA (1) | CA2379279C (de) |
| TW (1) | TW455686B (de) |
| WO (1) | WO2001007906A1 (de) |
Families Citing this family (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6668654B2 (en) * | 2001-08-15 | 2003-12-30 | Lockheed Martin Corporation | Method and apparatus for generating specific frequency response for ultrasound testing |
| US7117134B2 (en) * | 2001-10-18 | 2006-10-03 | Lockheed Martin Corporation | Method to optimize generation of ultrasound using mathematical modeling for laser ultrasound inspection |
| KR100624081B1 (ko) * | 2002-01-31 | 2006-09-19 | 캐논 가부시끼가이샤 | 레이저장치, 노광장치 및 노광방법 |
| US7474411B2 (en) * | 2003-11-07 | 2009-01-06 | Lockheed Martin Corporation | System and method to reduce laser noise for improved interferometric laser ultrasound detection |
| US20070015992A1 (en) * | 2005-06-30 | 2007-01-18 | General Electric Company | System and method for optoacoustic imaging |
| US7747833B2 (en) * | 2005-09-30 | 2010-06-29 | Mosaid Technologies Incorporated | Independent link and bank selection |
| US8113056B2 (en) * | 2008-05-15 | 2012-02-14 | Lockheed Martin Corporation | Mid-IR laser for generation of ultrasound using a CO2 laser and harmonic generation |
| US7821646B2 (en) * | 2008-05-15 | 2010-10-26 | Lockheed Martin Corporation | Method and apparatus for generating mid-IR laser beam for ultrasound inspection |
| US7734133B2 (en) * | 2008-05-15 | 2010-06-08 | Lockheed Martin Corporation | Hollow core waveguide for laser generation of ultrasonic waves |
| US8054470B2 (en) * | 2008-05-15 | 2011-11-08 | Lockheed Martin Corporation | Method and apparatus for spectroscopic characterization of samples using a laser-ultrasound system |
| US8243280B2 (en) * | 2008-05-20 | 2012-08-14 | Iphoton Solutions, Llc | Laser ultrasonic measurement system with movable beam delivery |
| WO2012019189A2 (en) | 2010-08-06 | 2012-02-09 | Par Systems, Inc. | Containerized systems |
| CN106338423B (zh) | 2015-07-10 | 2020-07-14 | 三斯坎公司 | 组织学染色的空间复用 |
| US10018113B2 (en) * | 2015-11-11 | 2018-07-10 | General Electric Company | Ultrasonic cleaning system and method |
| EP4312060A1 (de) * | 2022-07-26 | 2024-01-31 | Nokia Technologies Oy | Materialempfindliches lidar |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4683750A (en) * | 1984-11-07 | 1987-08-04 | The Board Of Trustees Of The Leland Stanford Junior University | Thermal acoustic probe |
| US4633715A (en) * | 1985-05-08 | 1987-01-06 | Canadian Patents And Development Limited - Societe Canadienne Des Brevets Et D'exploitation Limitee | Laser heterodyne interferometric method and system for measuring ultrasonic displacements |
| US5287291A (en) * | 1991-09-03 | 1994-02-15 | Krautkramer-Branson, Incorporated | Quiet bus for the busing of analog and digital data |
| US5583877A (en) * | 1995-05-09 | 1996-12-10 | Ophir Corporation | Method and apparatus for generating high power laser pulses in the two to six micron wavelength range |
| US5608166A (en) * | 1995-10-12 | 1997-03-04 | National Research Council Of Canada | Generation and detection of ultrasound with long pulse lasers |
| US5814730A (en) * | 1996-06-10 | 1998-09-29 | Institute Of Paper Science And Technology And Georgia Institute Of Technology | Material characteristic testing method and apparatus using interferometry to detect ultrasonic signals in a web |
| US5982482A (en) * | 1997-07-31 | 1999-11-09 | Massachusetts Institute Of Technology | Determining the presence of defects in thin film structures |
-
1999
- 1999-07-27 US US09/361,768 patent/US6176135B1/en not_active Expired - Lifetime
-
2000
- 2000-07-25 TW TW089114841A patent/TW455686B/zh not_active IP Right Cessation
- 2000-07-27 EP EP00953691A patent/EP1203230B1/de not_active Expired - Lifetime
- 2000-07-27 CA CA002379279A patent/CA2379279C/en not_active Expired - Fee Related
- 2000-07-27 AT AT00953691T patent/ATE549617T1/de active
- 2000-07-27 WO PCT/US2000/020404 patent/WO2001007906A1/en not_active Ceased
- 2000-07-27 AU AU66095/00A patent/AU6609500A/en not_active Abandoned
Also Published As
| Publication number | Publication date |
|---|---|
| AU6609500A (en) | 2001-02-13 |
| WO2001007906A1 (en) | 2001-02-01 |
| US6176135B1 (en) | 2001-01-23 |
| CA2379279C (en) | 2008-07-15 |
| TW455686B (en) | 2001-09-21 |
| EP1203230B1 (de) | 2012-03-14 |
| CA2379279A1 (en) | 2001-02-01 |
| EP1203230A1 (de) | 2002-05-08 |
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