ATE550454T1 - Plasmaquelle mit segmentierter magnetron-kathode - Google Patents
Plasmaquelle mit segmentierter magnetron-kathodeInfo
- Publication number
- ATE550454T1 ATE550454T1 AT04810268T AT04810268T ATE550454T1 AT E550454 T1 ATE550454 T1 AT E550454T1 AT 04810268 T AT04810268 T AT 04810268T AT 04810268 T AT04810268 T AT 04810268T AT E550454 T1 ATE550454 T1 AT E550454T1
- Authority
- AT
- Austria
- Prior art keywords
- magnetron cathode
- plasma source
- switch
- voltage pulses
- chamber
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3402—Gas-filled discharge tubes operating with cathodic sputtering using supplementary magnetic fields
- H01J37/3405—Magnetron sputtering
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/0021—Reactive sputtering or evaporation
- C23C14/0036—Reactive sputtering
- C23C14/0063—Reactive sputtering characterised by means for introducing or removing gases
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3435—Applying energy to the substrate during sputtering
- C23C14/345—Applying energy to the substrate during sputtering using substrate bias
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/35—Sputtering by application of a magnetic field, e.g. magnetron sputtering
- C23C14/352—Sputtering by application of a magnetic field, e.g. magnetron sputtering using more than one target
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/54—Controlling or regulating the coating process
- C23C14/542—Controlling the film thickness or evaporation rate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3402—Gas-filled discharge tubes operating with cathodic sputtering using supplementary magnetic fields
- H01J37/3405—Magnetron sputtering
- H01J37/3408—Planar magnetron sputtering
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3411—Constructional aspects of the reactor
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3411—Constructional aspects of the reactor
- H01J37/3414—Targets
- H01J37/342—Hollow targets
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3411—Constructional aspects of the reactor
- H01J37/3414—Targets
- H01J37/3426—Material
- H01J37/3429—Plural materials
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3411—Constructional aspects of the reactor
- H01J37/3438—Electrodes other than cathode
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3411—Constructional aspects of the reactor
- H01J37/3444—Associated circuits
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3411—Constructional aspects of the reactor
- H01J37/345—Magnet arrangements in particular for cathodic sputtering apparatus
- H01J37/3455—Movable magnets
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3411—Constructional aspects of the reactor
- H01J37/345—Magnet arrangements in particular for cathodic sputtering apparatus
- H01J37/3458—Electromagnets in particular for cathodic sputtering apparatus
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3464—Operating strategies
- H01J37/347—Thickness uniformity of coated layers or desired profile of target erosion
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Analytical Chemistry (AREA)
- Materials Engineering (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Electromagnetism (AREA)
- Physical Vapour Deposition (AREA)
- Plasma Technology (AREA)
- Electron Sources, Ion Sources (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US48167103P | 2003-11-19 | 2003-11-19 | |
| US10/710,946 US20050103620A1 (en) | 2003-11-19 | 2004-08-13 | Plasma source with segmented magnetron cathode |
| PCT/US2004/036636 WO2005052979A2 (en) | 2003-11-19 | 2004-11-04 | Plasma source with segmented magnetron cathode |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| ATE550454T1 true ATE550454T1 (de) | 2012-04-15 |
Family
ID=34576510
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| AT04810268T ATE550454T1 (de) | 2003-11-19 | 2004-11-04 | Plasmaquelle mit segmentierter magnetron-kathode |
Country Status (4)
| Country | Link |
|---|---|
| US (2) | US20050103620A1 (de) |
| EP (1) | EP1690279B1 (de) |
| AT (1) | ATE550454T1 (de) |
| WO (1) | WO2005052979A2 (de) |
Families Citing this family (76)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6764940B1 (en) | 2001-03-13 | 2004-07-20 | Novellus Systems, Inc. | Method for depositing a diffusion barrier for copper interconnect applications |
| US7186648B1 (en) | 2001-03-13 | 2007-03-06 | Novellus Systems, Inc. | Barrier first method for single damascene trench applications |
| US8043484B1 (en) | 2001-03-13 | 2011-10-25 | Novellus Systems, Inc. | Methods and apparatus for resputtering process that improves barrier coverage |
| US7781327B1 (en) | 2001-03-13 | 2010-08-24 | Novellus Systems, Inc. | Resputtering process for eliminating dielectric damage |
| US6896773B2 (en) * | 2002-11-14 | 2005-05-24 | Zond, Inc. | High deposition rate sputtering |
| US8298933B2 (en) | 2003-04-11 | 2012-10-30 | Novellus Systems, Inc. | Conformal films on semiconductor substrates |
| US7842605B1 (en) | 2003-04-11 | 2010-11-30 | Novellus Systems, Inc. | Atomic layer profiling of diffusion barrier and metal seed layers |
| US9771648B2 (en) | 2004-08-13 | 2017-09-26 | Zond, Inc. | Method of ionized physical vapor deposition sputter coating high aspect-ratio structures |
| CN100419117C (zh) * | 2004-02-02 | 2008-09-17 | 株式会社神户制钢所 | 硬质叠层被膜、其制造方法及成膜装置 |
| US7663319B2 (en) * | 2004-02-22 | 2010-02-16 | Zond, Inc. | Methods and apparatus for generating strongly-ionized plasmas with ionizational instabilities |
| US7095179B2 (en) * | 2004-02-22 | 2006-08-22 | Zond, Inc. | Methods and apparatus for generating strongly-ionized plasmas with ionizational instabilities |
| US9123508B2 (en) * | 2004-02-22 | 2015-09-01 | Zond, Llc | Apparatus and method for sputtering hard coatings |
| US7750575B2 (en) * | 2004-04-07 | 2010-07-06 | Zond, Inc. | High density plasma source |
| WO2006036846A1 (en) * | 2004-09-24 | 2006-04-06 | Zond, Inc. | Apparatus for generating high-current electrical discharges |
| US20070056845A1 (en) * | 2005-09-13 | 2007-03-15 | Applied Materials, Inc. | Multiple zone sputtering target created through conductive and insulation bonding |
| US20070056843A1 (en) * | 2005-09-13 | 2007-03-15 | Applied Materials, Inc. | Method of processing a substrate using a large-area magnetron sputtering chamber with individually controlled sputtering zones |
| WO2007032858A1 (en) * | 2005-09-13 | 2007-03-22 | Applied Materials, Inc. | Large-area magnetron sputtering chamber with individually controlled sputtering zones |
| US7588668B2 (en) | 2005-09-13 | 2009-09-15 | Applied Materials, Inc. | Thermally conductive dielectric bonding of sputtering targets using diamond powder filler or thermally conductive ceramic fillers |
| US20070056850A1 (en) * | 2005-09-13 | 2007-03-15 | Applied Materials, Inc. | Large-area magnetron sputtering chamber with individually controlled sputtering zones |
| US7855147B1 (en) | 2006-06-22 | 2010-12-21 | Novellus Systems, Inc. | Methods and apparatus for engineering an interface between a diffusion barrier layer and a seed layer |
| US20080023319A1 (en) * | 2006-07-28 | 2008-01-31 | Hien Minh Huu Le | Magnetron assembly |
| KR100910673B1 (ko) * | 2006-08-04 | 2009-08-04 | 어플라이드 머티어리얼스, 인코포레이티드 | 다중 마그네트론들, 특히 2 레벨 접지형 마그네트론들의집단 스캐닝 |
| US8961756B2 (en) * | 2006-08-04 | 2015-02-24 | Applied Materials, Inc. | Ganged scanning of multiple magnetrons, especially two level folded magnetrons |
| US7850828B2 (en) * | 2006-09-15 | 2010-12-14 | Cardinal Cg Company | Enhanced virtual anode |
| US7510634B1 (en) | 2006-11-10 | 2009-03-31 | Novellus Systems, Inc. | Apparatus and methods for deposition and/or etch selectivity |
| DE502006008952D1 (de) * | 2006-11-14 | 2011-04-07 | Applied Materials Inc | Magnetron-Sputterquelle, Sputter-Beschichtungsanlage und Verfahren zur Beschichtung eines Substrats |
| US7682966B1 (en) | 2007-02-01 | 2010-03-23 | Novellus Systems, Inc. | Multistep method of depositing metal seed layers |
| US20080197015A1 (en) * | 2007-02-16 | 2008-08-21 | Terry Bluck | Multiple-magnetron sputtering source with plasma confinement |
| US7737042B2 (en) * | 2007-02-22 | 2010-06-15 | Applied Materials, Inc. | Pulsed-plasma system for etching semiconductor structures |
| US7771606B2 (en) * | 2007-02-22 | 2010-08-10 | Applied Materials, Inc. | Pulsed-plasma system with pulsed reaction gas replenish for etching semiconductors structures |
| US7718538B2 (en) * | 2007-02-21 | 2010-05-18 | Applied Materials, Inc. | Pulsed-plasma system with pulsed sample bias for etching semiconductor substrates |
| US7897516B1 (en) | 2007-05-24 | 2011-03-01 | Novellus Systems, Inc. | Use of ultra-high magnetic fields in resputter and plasma etching |
| US7922880B1 (en) | 2007-05-24 | 2011-04-12 | Novellus Systems, Inc. | Method and apparatus for increasing local plasma density in magnetically confined plasma |
| US7966909B2 (en) * | 2007-07-25 | 2011-06-28 | The Gillette Company | Process of forming a razor blade |
| US9039871B2 (en) | 2007-11-16 | 2015-05-26 | Advanced Energy Industries, Inc. | Methods and apparatus for applying periodic voltage using direct current |
| US8133359B2 (en) * | 2007-11-16 | 2012-03-13 | Advanced Energy Industries, Inc. | Methods and apparatus for sputtering deposition using direct current |
| JP4568321B2 (ja) * | 2007-11-27 | 2010-10-27 | 有限会社真空実験室 | 冷陰極電離真空計 |
| EP2091067A1 (de) | 2008-02-14 | 2009-08-19 | Applied Materials, Inc. | Vorrichtung zur Verarbeitung eines Substrats |
| US8083911B2 (en) | 2008-02-14 | 2011-12-27 | Applied Materials, Inc. | Apparatus for treating a substrate |
| US8017523B1 (en) | 2008-05-16 | 2011-09-13 | Novellus Systems, Inc. | Deposition of doped copper seed layers having improved reliability |
| KR101272009B1 (ko) * | 2008-12-26 | 2013-06-05 | 캐논 아네르바 가부시키가이샤 | 스퍼터링 장치, 스퍼터링 방법 및 전자 디바이스의 제조 방법 |
| US8137517B1 (en) | 2009-02-10 | 2012-03-20 | Wd Media, Inc. | Dual position DC magnetron assembly |
| US20110011737A1 (en) * | 2009-07-17 | 2011-01-20 | Institute Of Nuclear Energy Research Atomic Energy Council, Executive Yuan | High-power pulse magnetron sputtering apparatus and surface treatment apparatus using the same |
| US8956516B2 (en) * | 2009-08-31 | 2015-02-17 | Semicat, Inc. | System and apparatus to facilitate physical vapor deposition to modify non-metal films on semiconductor substrates |
| US8936703B2 (en) * | 2009-08-31 | 2015-01-20 | Semicat, Inc. | Methods to fabricate non-metal films on semiconductor substrates using physical vapor deposition |
| US9111729B2 (en) * | 2009-12-03 | 2015-08-18 | Lam Research Corporation | Small plasma chamber systems and methods |
| ES2364773B1 (es) * | 2010-01-19 | 2012-08-08 | Consejo Superior De Investigaciones Científicas (Csic) | Dispositivo y procedimiento de fabricación de nanopartículas. |
| DE202010001497U1 (de) * | 2010-01-29 | 2010-04-22 | Hauzer Techno-Coating B.V. | Beschichtungsvorrichtung mit einer HIPIMS-Leistungsquelle |
| US9190289B2 (en) * | 2010-02-26 | 2015-11-17 | Lam Research Corporation | System, method and apparatus for plasma etch having independent control of ion generation and dissociation of process gas |
| JPWO2011152182A1 (ja) * | 2010-05-31 | 2013-07-25 | 株式会社ジェイテクト | 被覆部材の製造方法 |
| US9155181B2 (en) | 2010-08-06 | 2015-10-06 | Lam Research Corporation | Distributed multi-zone plasma source systems, methods and apparatus |
| US9967965B2 (en) | 2010-08-06 | 2018-05-08 | Lam Research Corporation | Distributed, concentric multi-zone plasma source systems, methods and apparatus |
| US9449793B2 (en) | 2010-08-06 | 2016-09-20 | Lam Research Corporation | Systems, methods and apparatus for choked flow element extraction |
| US8999104B2 (en) | 2010-08-06 | 2015-04-07 | Lam Research Corporation | Systems, methods and apparatus for separate plasma source control |
| DE102011117177A1 (de) * | 2011-10-28 | 2013-05-02 | Oerlikon Trading Ag, Trübbach | Verfahren zur Bereitstellung sequenzieller Leistungspulse |
| PT2700083E (pt) * | 2011-04-20 | 2015-08-24 | Oerlikon Surface Solutions Ag Trubbach | Método para fornecimento de impulsos de potência sequenciais |
| US9153422B2 (en) * | 2011-08-02 | 2015-10-06 | Envaerospace, Inc. | Arc PVD plasma source and method of deposition of nanoimplanted coatings |
| US9177762B2 (en) | 2011-11-16 | 2015-11-03 | Lam Research Corporation | System, method and apparatus of a wedge-shaped parallel plate plasma reactor for substrate processing |
| US10283325B2 (en) | 2012-10-10 | 2019-05-07 | Lam Research Corporation | Distributed multi-zone plasma source systems, methods and apparatus |
| PL2789006T3 (pl) * | 2011-12-05 | 2019-04-30 | Oerlikon Surface Solutions Ag Pfaeffikon | Reaktywny sposób napylania |
| DE102011121770A1 (de) * | 2011-12-21 | 2013-06-27 | Oerlikon Trading Ag, Trübbach | Homogenes HIPIMS-Beschichtungsverfahren |
| US8674327B1 (en) | 2012-05-10 | 2014-03-18 | WD Media, LLC | Systems and methods for uniformly implanting materials on substrates using directed magnetic fields |
| RU2518047C1 (ru) * | 2012-11-26 | 2014-06-10 | Федеральное государственное бюджетное образовательное учреждение высшего профессионального образования "Кубанский государственный технологический университет" (ФГБОУ ВПО "КубГТУ") | Устройство для химико-термической обработки деталей в несамостоятельном тлеющем разряде |
| US20140174921A1 (en) * | 2012-12-21 | 2014-06-26 | Intermolecular, Inc. | Multi-Piece Target and Magnetron to Prevent Sputtering of Target Backing Materials |
| US9406487B2 (en) * | 2012-12-28 | 2016-08-02 | Sputtering Components, Inc. | Plasma enhanced chemical vapor deposition (PECVD) source |
| EP2811508B1 (de) | 2013-06-07 | 2019-04-24 | Soleras Advanced Coatings bvba | Gaskonfiguration für Magnetron-Abscheidungssysteme |
| ES2636867T3 (es) * | 2013-06-26 | 2017-10-09 | Oerlikon Surface Solutions Ag, Pfäffikon | Procedimiento para la fabricación de capas decorativas de material duro por HIPIMS |
| KR20150078153A (ko) * | 2013-12-30 | 2015-07-08 | 삼성디스플레이 주식회사 | 스퍼터링 장치 및 그 방법 |
| JP5704772B1 (ja) * | 2014-02-04 | 2015-04-22 | 株式会社京三製作所 | 高周波電源装置およびプラズマ着火方法 |
| KR102195789B1 (ko) * | 2014-03-18 | 2020-12-28 | 어플라이드 머티어리얼스, 인코포레이티드 | 정적 반응성 스퍼터 프로세스들을 위한 프로세스 가스 세그먼트화 |
| WO2016126650A1 (en) | 2015-02-03 | 2016-08-11 | Cardinal Cg Company | Sputtering apparatus including gas distribution system |
| JP6310601B1 (ja) * | 2017-06-07 | 2018-04-11 | 日新電機株式会社 | スパッタリング装置 |
| US20200090914A1 (en) * | 2018-09-14 | 2020-03-19 | Applied Materials, Inc. | Methods and apparatus for uniformity control in selective plasma vapor deposition |
| US12525458B2 (en) | 2020-11-20 | 2026-01-13 | Lam Research Corporation | Plasma uniformity control using a pulsed magnetic field |
| CN112795891B (zh) * | 2020-12-22 | 2022-10-21 | 北京北方华创微电子装备有限公司 | 半导体工艺设备 |
| DE102024000625A1 (de) * | 2024-02-27 | 2025-08-28 | Hermann Schlemm | Anordnung zum Zerstäuben von Targetmaterial in einem magnetfeldgestützten Plasma mit definierter Primärionenenergie |
Family Cites Families (109)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR1488482A (de) * | 1965-07-16 | 1967-11-02 | ||
| US3461054A (en) * | 1966-03-24 | 1969-08-12 | Bell Telephone Labor Inc | Cathodic sputtering from a cathodically biased target electrode having an rf potential superimposed on the cathodic bias |
| US3609658A (en) * | 1969-06-02 | 1971-09-28 | Ibm | Pilot light gas cells for gas panels |
| US3666982A (en) * | 1970-03-20 | 1972-05-30 | United Aircraft Corp | Distributive cathode for flowing gas electric discharge plasma |
| US3761836A (en) * | 1972-01-07 | 1973-09-25 | United Aircraft Corp | Magnetically compensated cross field flowing gas laser |
| US4046659A (en) * | 1974-05-10 | 1977-09-06 | Airco, Inc. | Method for coating a substrate |
| US4132961A (en) * | 1977-03-31 | 1979-01-02 | Calspan Corporation | Gaseous discharge stabilization apparatus and method |
| US4453069A (en) * | 1981-05-02 | 1984-06-05 | Inoue-Japax Research Incorporated | EDM Pulse forming circuit arrangement and method |
| US4761218A (en) * | 1984-05-17 | 1988-08-02 | Varian Associates, Inc. | Sputter coating source having plural target rings |
| US4731172A (en) * | 1985-04-18 | 1988-03-15 | Matsushita Electric Industrial Co., Ltd. | Method for sputtering multi-component thin-film |
| US4588490A (en) * | 1985-05-22 | 1986-05-13 | International Business Machines Corporation | Hollow cathode enhanced magnetron sputter device |
| DE3700633C2 (de) * | 1987-01-12 | 1997-02-20 | Reinar Dr Gruen | Verfahren und Vorrichtung zum schonenden Beschichten elektrisch leitender Gegenstände mittels Plasma |
| DE3805010A1 (de) * | 1988-02-18 | 1989-08-24 | Kernforschungsanlage Juelich | Verfahren zur herstellung duenner schichten aus oxydischem hochtemperatur-supraleiter |
| US5429070A (en) * | 1989-06-13 | 1995-07-04 | Plasma & Materials Technologies, Inc. | High density plasma deposition and etching apparatus |
| US5306407A (en) * | 1989-06-27 | 1994-04-26 | Hauzer Holding Bv | Method and apparatus for coating substrates |
| US4953174A (en) * | 1989-10-23 | 1990-08-28 | Hughes Aircraft Company | Preionization electrode for pulsed gas laser |
| EP0428161B1 (de) * | 1989-11-15 | 1999-02-17 | Kokusai Electric Co., Ltd. | Trocken-Behandlungsvorrichtung |
| JP2819420B2 (ja) * | 1989-11-20 | 1998-10-30 | 東京エレクトロン株式会社 | イオン源 |
| US5241152A (en) * | 1990-03-23 | 1993-08-31 | Anderson Glen L | Circuit for detecting and diverting an electrical arc in a glow discharge apparatus |
| US5045166A (en) * | 1990-05-21 | 1991-09-03 | Mcnc | Magnetron method and apparatus for producing high density ionic gas discharge |
| JP3076367B2 (ja) * | 1990-11-29 | 2000-08-14 | キヤノン株式会社 | プラズマ処理装置 |
| DE4108474A1 (de) * | 1991-03-15 | 1992-09-17 | Lambda Physik Forschung | Vorrichtung zur vorionisierung eines gepulsten gaslasers |
| DE59207306D1 (de) * | 1991-04-12 | 1996-11-14 | Balzers Hochvakuum | Verfahren und Anlage zur Beschichtung mindestens eines Gegenstandes |
| US5310607A (en) * | 1991-05-16 | 1994-05-10 | Balzers Aktiengesellschaft | Hard coating; a workpiece coated by such hard coating and a method of coating such workpiece by such hard coating |
| US5135554A (en) * | 1991-05-20 | 1992-08-04 | Hughes Aircraft Company | Method and apparatus for continuous sputter coating of fibers |
| DE4202425C2 (de) * | 1992-01-29 | 1997-07-17 | Leybold Ag | Verfahren und Vorrichtung zum Beschichten eines Substrats, insbesondere mit elektrisch nichtleitenden Schichten |
| DE69322404T2 (de) * | 1992-09-30 | 1999-04-29 | Advanced Energy Industries, Inc., Fort Collins, Col. 80525 | Topographisch genaues duennfilm-beschichtungssystem |
| US5330800A (en) * | 1992-11-04 | 1994-07-19 | Hughes Aircraft Company | High impedance plasma ion implantation method and apparatus |
| US6217717B1 (en) * | 1992-12-30 | 2001-04-17 | Advanced Energy Industries, Inc. | Periodically clearing thin film plasma processing system |
| US5718813A (en) * | 1992-12-30 | 1998-02-17 | Advanced Energy Industries, Inc. | Enhanced reactive DC sputtering system |
| US5427669A (en) * | 1992-12-30 | 1995-06-27 | Advanced Energy Industries, Inc. | Thin film DC plasma processing system |
| US5410425A (en) * | 1993-05-10 | 1995-04-25 | The United States Of America As Represented By The United States Department Of Energy | Magnetron cathodes in plasma electrode pockels cells |
| EP0639655B1 (de) * | 1993-07-28 | 2000-09-27 | Asahi Glass Company Ltd. | Verfahren und Vorrichtung zur Kathodenzerstäubung |
| US6190512B1 (en) * | 1993-09-07 | 2001-02-20 | Tokyo Electron Arizona Inc. | Soft plasma ignition in plasma processing chambers |
| US5473344A (en) * | 1994-01-06 | 1995-12-05 | Microsoft Corporation | 3-D cursor positioning device |
| US5616225A (en) * | 1994-03-23 | 1997-04-01 | The Boc Group, Inc. | Use of multiple anodes in a magnetron for improving the uniformity of its plasma |
| DE4412906C1 (de) * | 1994-04-14 | 1995-07-13 | Fraunhofer Ges Forschung | Verfahren und Einrichtung für die ionengestützte Vakuumbeschichtung |
| US5651865A (en) * | 1994-06-17 | 1997-07-29 | Eni | Preferential sputtering of insulators from conductive targets |
| DE4426723A1 (de) * | 1994-07-22 | 1996-01-25 | Atl Lasertechnik & Accessoires | Gleitentladungsvorionisation für Gaslaser |
| US6346176B1 (en) * | 1995-01-27 | 2002-02-12 | Gentex Optics, Inc. | Method of depositing thin films |
| JPH08279495A (ja) * | 1995-02-07 | 1996-10-22 | Seiko Epson Corp | プラズマ処理装置及びその方法 |
| JP3060876B2 (ja) * | 1995-02-15 | 2000-07-10 | 日新電機株式会社 | 金属イオン注入装置 |
| WO1996031899A1 (en) * | 1995-04-07 | 1996-10-10 | Advanced Energy Industries, Inc. | Adjustable energy quantum thin film plasma processing system |
| US5576939A (en) * | 1995-05-05 | 1996-11-19 | Drummond; Geoffrey N. | Enhanced thin film DC plasma power supply |
| EP0831679B1 (de) * | 1995-06-05 | 2008-10-01 | Musashino Kikai Co., Ltd. | Leistungsversorgung für multielektroden-entladung |
| JP3808917B2 (ja) * | 1995-07-20 | 2006-08-16 | オリンパス株式会社 | 薄膜の製造方法及び薄膜 |
| DE19610012B4 (de) * | 1996-03-14 | 2005-02-10 | Unaxis Deutschland Holding Gmbh | Verfahren zur Stabilisierung eines Arbeitspunkts beim reaktiven Zerstäuben in einer Sauerstoff enthaltenden Atmosphäre |
| US5733418A (en) * | 1996-05-07 | 1998-03-31 | Pld Advanced Automation Systems, Inc. | Sputtering method and apparatus |
| US5917286A (en) * | 1996-05-08 | 1999-06-29 | Advanced Energy Industries, Inc. | Pulsed direct current power supply configurations for generating plasmas |
| US5777863A (en) * | 1996-06-14 | 1998-07-07 | Photran Corporation | Low-frequency modulated current mode power supply for magnetron sputtering cathodes |
| US5846883A (en) * | 1996-07-10 | 1998-12-08 | Cvc, Inc. | Method for multi-zone high-density inductively-coupled plasma generation |
| DE19651615C1 (de) * | 1996-12-12 | 1997-07-10 | Fraunhofer Ges Forschung | Verfahren zum Aufbringen von Kohlenstoffschichten durch reaktives Magnetron-Sputtern |
| DE19702187C2 (de) * | 1997-01-23 | 2002-06-27 | Fraunhofer Ges Forschung | Verfahren und Einrichtung zum Betreiben von Magnetronentladungen |
| SE9704607D0 (sv) * | 1997-12-09 | 1997-12-09 | Chemfilt R & D Ab | A method and apparatus for magnetically enhanced sputtering |
| JP4355036B2 (ja) * | 1997-03-18 | 2009-10-28 | キヤノンアネルバ株式会社 | イオン化スパッタリング装置 |
| JP3846970B2 (ja) * | 1997-04-14 | 2006-11-15 | キヤノンアネルバ株式会社 | イオン化スパッタリング装置 |
| DE19720251A1 (de) * | 1997-05-15 | 1998-11-19 | Fraunhofer Ges Forschung | Verfahren zum Beschichten von Dünnfilmmagnetplatten |
| JPH10330932A (ja) * | 1997-05-28 | 1998-12-15 | Anelva Corp | スパッタリング装置 |
| US6051114A (en) * | 1997-06-23 | 2000-04-18 | Applied Materials, Inc. | Use of pulsed-DC wafer bias for filling vias/trenches with metal in HDP physical vapor deposition |
| US5973447A (en) * | 1997-07-25 | 1999-10-26 | Monsanto Company | Gridless ion source for the vacuum processing of materials |
| US5993613A (en) * | 1997-11-07 | 1999-11-30 | Sierra Applied Sciences, Inc. | Method and apparatus for periodic polarity reversal during an active state |
| US5990668A (en) * | 1997-11-07 | 1999-11-23 | Sierra Applied Sciences, Inc. | A.C. power supply having combined regulator and pulsing circuits |
| US5976327A (en) * | 1997-12-12 | 1999-11-02 | Applied Materials, Inc. | Step coverage and overhang improvement by pedestal bias voltage modulation |
| US6093293A (en) * | 1997-12-17 | 2000-07-25 | Balzers Hochvakuum Ag | Magnetron sputtering source |
| US6197165B1 (en) * | 1998-05-06 | 2001-03-06 | Tokyo Electron Limited | Method and apparatus for ionized physical vapor deposition |
| US6124675A (en) * | 1998-06-01 | 2000-09-26 | University Of Montreal | Metastable atom bombardment source |
| US6057244A (en) * | 1998-07-31 | 2000-05-02 | Applied Materials, Inc. | Method for improved sputter etch processing |
| US6238537B1 (en) * | 1998-08-06 | 2001-05-29 | Kaufman & Robinson, Inc. | Ion assisted deposition source |
| JP2000144399A (ja) * | 1998-10-30 | 2000-05-26 | Applied Materials Inc | スパッタリング装置 |
| DE19851062C1 (de) * | 1998-11-05 | 2000-06-15 | Ibm | Verfahren zum Beschichten von Magnetspeicherplatten und danach hergestellte Magnetspeicherplatte |
| US6497802B2 (en) * | 1999-02-12 | 2002-12-24 | Applied Materials, Inc. | Self ionized plasma sputtering |
| US6183614B1 (en) * | 1999-02-12 | 2001-02-06 | Applied Materials, Inc. | Rotating sputter magnetron assembly |
| US6306265B1 (en) * | 1999-02-12 | 2001-10-23 | Applied Materials, Inc. | High-density plasma for ionized metal deposition capable of exciting a plasma wave |
| JP4351755B2 (ja) * | 1999-03-12 | 2009-10-28 | キヤノンアネルバ株式会社 | 薄膜作成方法および薄膜作成装置 |
| US6086730A (en) * | 1999-04-22 | 2000-07-11 | Komag, Incorporated | Method of sputtering a carbon protective film on a magnetic disk with high sp3 content |
| JP2001003166A (ja) * | 1999-04-23 | 2001-01-09 | Nippon Sheet Glass Co Ltd | 基体表面に被膜を被覆する方法およびその方法による基体 |
| US6327163B1 (en) * | 1999-04-27 | 2001-12-04 | Science Research Laboratory, Inc. | Solid state pulsed power supply |
| US6319355B1 (en) * | 1999-06-30 | 2001-11-20 | Lam Research Corporation | Plasma processor with coil responsive to variable amplitude rf envelope |
| US6440282B1 (en) * | 1999-07-06 | 2002-08-27 | Applied Materials, Inc. | Sputtering reactor and method of using an unbalanced magnetron |
| US6290821B1 (en) * | 1999-07-15 | 2001-09-18 | Seagate Technology Llc | Sputter deposition utilizing pulsed cathode and substrate bias power |
| US6398929B1 (en) * | 1999-10-08 | 2002-06-04 | Applied Materials, Inc. | Plasma reactor and shields generating self-ionized plasma for sputtering |
| US6610184B2 (en) * | 2001-11-14 | 2003-08-26 | Applied Materials, Inc. | Magnet array in conjunction with rotating magnetron for plasma sputtering |
| US20010050220A1 (en) * | 1999-11-16 | 2001-12-13 | Applied Materials, Inc. | Method and apparatus for physical vapor deposition using modulated power |
| US6350353B2 (en) * | 1999-11-24 | 2002-02-26 | Applied Materials, Inc. | Alternate steps of IMP and sputtering process to improve sidewall coverage |
| US6344419B1 (en) * | 1999-12-03 | 2002-02-05 | Applied Materials, Inc. | Pulsed-mode RF bias for sidewall coverage improvement |
| US6451177B1 (en) * | 2000-01-21 | 2002-09-17 | Applied Materials, Inc. | Vault shaped target and magnetron operable in two sputtering modes |
| US6277249B1 (en) * | 2000-01-21 | 2001-08-21 | Applied Materials Inc. | Integrated process for copper via filling using a magnetron and target producing highly energetic ions |
| DE10015244C2 (de) * | 2000-03-28 | 2002-09-19 | Fraunhofer Ges Forschung | Verfahren und Schaltungsanordnung zur pulsförmigen Energieeinspeisung in Magnetronentladungen |
| US6455326B1 (en) * | 2000-05-15 | 2002-09-24 | Ramtron International Corporation | Enhanced process capability for sputtered ferroelectric films using low frequency pulsed DC and RF power supplies |
| US6447655B2 (en) * | 2000-05-30 | 2002-09-10 | Alexander D. Lantsman | DC plasma power supply for a sputter deposition |
| US6497803B2 (en) * | 2000-05-31 | 2002-12-24 | Isoflux, Inc. | Unbalanced plasma generating apparatus having cylindrical symmetry |
| US6554979B2 (en) * | 2000-06-05 | 2003-04-29 | Applied Materials, Inc. | Method and apparatus for bias deposition in a modulating electric field |
| US6296747B1 (en) * | 2000-06-22 | 2001-10-02 | Applied Materials, Inc. | Baffled perforated shield in a plasma sputtering reactor |
| KR100365643B1 (ko) * | 2000-10-09 | 2002-12-26 | 삼성전자 주식회사 | 반도체 장치의 다마신 배선 형성 방법 및 그에 의해형성된 다마신 배선 구조체 |
| DE10051509B4 (de) * | 2000-10-18 | 2007-08-30 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Verfahren zur Herstellung eines Dünnschichtsystems und Anwendung des Verfahrens |
| US6488822B1 (en) * | 2000-10-20 | 2002-12-03 | Veecoleve, Inc. | Segmented-target ionized physical-vapor deposition apparatus and method of operation |
| US6413382B1 (en) * | 2000-11-03 | 2002-07-02 | Applied Materials, Inc. | Pulsed sputtering with a small rotating magnetron |
| US6777037B2 (en) * | 2001-02-21 | 2004-08-17 | Hitachi, Ltd. | Plasma processing method and apparatus |
| US6642146B1 (en) * | 2001-03-13 | 2003-11-04 | Novellus Systems, Inc. | Method of depositing copper seed on semiconductor substrates |
| US20030209423A1 (en) * | 2001-03-27 | 2003-11-13 | Christie David J. | System for driving multiple magnetrons with multiple phase ac |
| US20020153103A1 (en) * | 2001-04-20 | 2002-10-24 | Applied Process Technologies, Inc. | Plasma treatment apparatus |
| US20020157964A1 (en) * | 2001-04-25 | 2002-10-31 | Hoffman Industries International, Ltd. | System and method for electrolytic cleaning |
| CN100355058C (zh) * | 2001-05-04 | 2007-12-12 | 东京毅力科创株式会社 | 具有连续沉积和蚀刻的电离pvd |
| SE525231C2 (sv) * | 2001-06-14 | 2005-01-11 | Chemfilt R & D Ab | Förfarande och anordning för att alstra plasma |
| KR100439474B1 (ko) * | 2001-09-12 | 2004-07-09 | 삼성전자주식회사 | 스퍼터링 장치 |
| US6709553B2 (en) * | 2002-05-09 | 2004-03-23 | Applied Materials, Inc. | Multiple-step sputter deposition |
| US6852202B2 (en) * | 2002-05-21 | 2005-02-08 | Applied Materials, Inc. | Small epicyclic magnetron with controlled radial sputtering profile |
| US7095179B2 (en) * | 2004-02-22 | 2006-08-22 | Zond, Inc. | Methods and apparatus for generating strongly-ionized plasmas with ionizational instabilities |
| WO2006036846A1 (en) * | 2004-09-24 | 2006-04-06 | Zond, Inc. | Apparatus for generating high-current electrical discharges |
-
2004
- 2004-08-13 US US10/710,946 patent/US20050103620A1/en not_active Abandoned
- 2004-11-04 WO PCT/US2004/036636 patent/WO2005052979A2/en not_active Ceased
- 2004-11-04 EP EP04810268A patent/EP1690279B1/de not_active Expired - Lifetime
- 2004-11-04 AT AT04810268T patent/ATE550454T1/de active
-
2010
- 2010-06-21 US US12/819,914 patent/US20100270144A1/en not_active Abandoned
Also Published As
| Publication number | Publication date |
|---|---|
| US20100270144A1 (en) | 2010-10-28 |
| US20050103620A1 (en) | 2005-05-19 |
| WO2005052979A2 (en) | 2005-06-09 |
| EP1690279B1 (de) | 2012-03-21 |
| WO2005052979A3 (en) | 2006-01-12 |
| EP1690279A2 (de) | 2006-08-16 |
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