ATE555439T1 - Systeme, verfahren und vorrichtungen zur übertragung von daten und datenmaskenbits in einem herkömmlichen frame mit gemeinsamen fehlerbitcode - Google Patents

Systeme, verfahren und vorrichtungen zur übertragung von daten und datenmaskenbits in einem herkömmlichen frame mit gemeinsamen fehlerbitcode

Info

Publication number
ATE555439T1
ATE555439T1 AT09251583T AT09251583T ATE555439T1 AT E555439 T1 ATE555439 T1 AT E555439T1 AT 09251583 T AT09251583 T AT 09251583T AT 09251583 T AT09251583 T AT 09251583T AT E555439 T1 ATE555439 T1 AT E555439T1
Authority
AT
Austria
Prior art keywords
data
mask bits
bits
error bit
systems
Prior art date
Application number
AT09251583T
Other languages
English (en)
Inventor
Kuljit S Bains
Dennis W Brzezinski
Original Assignee
Intel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Intel Corp filed Critical Intel Corp
Application granted granted Critical
Publication of ATE555439T1 publication Critical patent/ATE555439T1/de

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
    • G11C7/1006—Data managing, e.g. manipulating data before writing or reading out, data bus switches or control circuits therefor
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1004—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's to protect a block of data words, e.g. CRC or checksum
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
    • G11C7/1015—Read-write modes for single port memories, i.e. having either a random port or a serial port
    • G11C7/1045—Read-write mode select circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
    • G11C7/1051—Data output circuits, e.g. read-out amplifiers, data output buffers, data output registers, data output level conversion circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
    • G11C7/1051—Data output circuits, e.g. read-out amplifiers, data output buffers, data output registers, data output level conversion circuits
    • G11C7/1069—I/O lines read out arrangements

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Security & Cryptography (AREA)
  • Detection And Correction Of Errors (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Memory System (AREA)
  • Detection And Prevention Of Errors In Transmission (AREA)
AT09251583T 2008-06-18 2009-06-17 Systeme, verfahren und vorrichtungen zur übertragung von daten und datenmaskenbits in einem herkömmlichen frame mit gemeinsamen fehlerbitcode ATE555439T1 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US12/141,339 US8196009B2 (en) 2008-06-18 2008-06-18 Systems, methods, and apparatuses to transfer data and data mask bits in a common frame with a shared error bit code

Publications (1)

Publication Number Publication Date
ATE555439T1 true ATE555439T1 (de) 2012-05-15

Family

ID=40957974

Family Applications (1)

Application Number Title Priority Date Filing Date
AT09251583T ATE555439T1 (de) 2008-06-18 2009-06-17 Systeme, verfahren und vorrichtungen zur übertragung von daten und datenmaskenbits in einem herkömmlichen frame mit gemeinsamen fehlerbitcode

Country Status (6)

Country Link
US (1) US8196009B2 (de)
EP (1) EP2136295B1 (de)
JP (2) JP2010003299A (de)
KR (1) KR101093857B1 (de)
CN (1) CN101609418B (de)
AT (1) ATE555439T1 (de)

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US8612828B2 (en) * 2009-12-22 2013-12-17 Intel Corporation Error correction mechanisms for 8-bit memory devices
KR101688051B1 (ko) 2010-11-08 2016-12-20 삼성전자 주식회사 에러 검출 코드를 이용한 데이터 처리 장치, 데이터 처리 방법, 데이터 스큐 보상 방법 및 데이터 처리 장치를 포함하는 반도체 장치
US8738993B2 (en) * 2010-12-06 2014-05-27 Intel Corporation Memory device on the fly CRC mode
US8527836B2 (en) * 2011-07-01 2013-09-03 Intel Corporation Rank-specific cyclic redundancy check
KR101700492B1 (ko) * 2012-03-26 2017-01-26 인텔 코포레이션 에러 검출 코딩된 트랜잭션들을 이용한 메모리 디바이스들에 대한 타이밍 최적화
US9299400B2 (en) 2012-09-28 2016-03-29 Intel Corporation Distributed row hammer tracking
CN103187104B (zh) * 2013-03-19 2016-11-23 西安紫光国芯半导体有限公司 Dram存储器的纠错方法
US9081700B2 (en) 2013-05-16 2015-07-14 Western Digital Technologies, Inc. High performance read-modify-write system providing line-rate merging of dataframe segments in hardware
JP2014225309A (ja) * 2013-05-16 2014-12-04 ピーエスフォー ルクスコ エスエイアールエルＰＳ４ Ｌｕｘｃｏ Ｓ．ａ．ｒ．ｌ． 半導体装置
US9135984B2 (en) * 2013-12-18 2015-09-15 Micron Technology, Inc. Apparatuses and methods for writing masked data to a buffer
US9354818B2 (en) 2014-02-25 2016-05-31 Kabushiki Kaisha Toshiba Memory device and data storing method
US9983925B2 (en) 2014-04-11 2018-05-29 Micron Technology, Inc. Apparatuses and methods for fixing a logic level of an internal signal line
DE102015209196A1 (de) * 2014-09-08 2016-03-10 Robert Bosch Gmbh Verfahren zur seriellen Übertragung eines Rahmens über ein Bussystem von einem Sender zu mindestens einem Empfänger und Teilnehmern eines Bussystems
CN107924369B (zh) * 2015-09-11 2021-08-31 东芝存储器株式会社 存储器装置
WO2017072475A1 (en) * 2015-10-27 2017-05-04 Cirus Logic International Semiconductor Limited Transfer of data with check bits
CN108369568A (zh) * 2015-12-16 2018-08-03 索尼公司 通信设备、通信方法、程序以及通信系统
US9996414B2 (en) * 2016-07-12 2018-06-12 International Business Machines Corporation Auto-disabling DRAM error checking on threshold
KR102810613B1 (ko) * 2016-12-02 2025-05-21 삼성전자주식회사 반도체 장치의 오류 검출 코드 생성 회로, 이를 포함하는 메모리 컨트롤러 및 반도체 메모리 장치
CN109474378B (zh) * 2017-09-08 2022-07-29 华为技术有限公司 编码方法及装置
WO2019047788A1 (zh) 2017-09-08 2019-03-14 华为技术有限公司 编码方法及装置
US11994943B2 (en) * 2018-12-31 2024-05-28 Lodestar Licensing Group Llc Configurable data path for memory modules
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US7734985B2 (en) * 2006-02-27 2010-06-08 Intel Corporation Systems, methods, and apparatuses for using the same memory type to support an error check mode and a non-error check mode
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KR101308047B1 (ko) * 2007-02-08 2013-09-12 삼성전자주식회사 메모리 시스템, 이 시스템을 위한 메모리, 및 이 메모리를위한 명령 디코딩 방법

Also Published As

Publication number Publication date
US8196009B2 (en) 2012-06-05
CN101609418B (zh) 2016-01-20
JP5437470B2 (ja) 2014-03-12
EP2136295A1 (de) 2009-12-23
JP2013065347A (ja) 2013-04-11
KR20090131667A (ko) 2009-12-29
CN101609418A (zh) 2009-12-23
US20090319877A1 (en) 2009-12-24
EP2136295B1 (de) 2012-04-25
KR101093857B1 (ko) 2011-12-13
JP2010003299A (ja) 2010-01-07

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