BE1015745A3 - Procede de detection de couches minces tres faiblement visibles. - Google Patents

Procede de detection de couches minces tres faiblement visibles. Download PDF

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Publication number
BE1015745A3
BE1015745A3 BE2003/0567A BE200300567A BE1015745A3 BE 1015745 A3 BE1015745 A3 BE 1015745A3 BE 2003/0567 A BE2003/0567 A BE 2003/0567A BE 200300567 A BE200300567 A BE 200300567A BE 1015745 A3 BE1015745 A3 BE 1015745A3
Authority
BE
Belgium
Prior art keywords
glazing
layer
face
glass substrate
measurement
Prior art date
Application number
BE2003/0567A
Other languages
English (en)
French (fr)
Inventor
Pichon Michel
Original Assignee
Saint Gobain
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Saint Gobain filed Critical Saint Gobain
Application granted granted Critical
Publication of BE1015745A3 publication Critical patent/BE1015745A3/fr

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens

Landscapes

  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Mathematical Physics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Surface Treatment Of Glass (AREA)
BE2003/0567A 2002-10-23 2003-10-23 Procede de detection de couches minces tres faiblement visibles. BE1015745A3 (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR0213200A FR2846421B1 (fr) 2002-10-23 2002-10-23 Procede de detection de couches minces tres faiblement visibles

Publications (1)

Publication Number Publication Date
BE1015745A3 true BE1015745A3 (fr) 2005-08-02

Family

ID=29559190

Family Applications (1)

Application Number Title Priority Date Filing Date
BE2003/0567A BE1015745A3 (fr) 2002-10-23 2003-10-23 Procede de detection de couches minces tres faiblement visibles.

Country Status (7)

Country Link
AT (1) AT413154B (de)
BE (1) BE1015745A3 (de)
DE (2) DE20316224U1 (de)
ES (1) ES2219190B2 (de)
FR (1) FR2846421B1 (de)
GB (1) GB2398119B (de)
IT (1) ITMI20032056A1 (de)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102004037555B4 (de) * 2004-08-03 2012-09-06 Erlus Aktiengesellschaft Verfahren zur berührungslosen und/oder zerstörungsfreien Prüfung einer photokatalytischen Oberflächenbeschichtung

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4284356A (en) * 1979-09-26 1981-08-18 Ppg Industries, Inc. Method of and apparatus for comparing surface reflectivity
US4591271A (en) * 1983-03-21 1986-05-27 Byers Donald W Method and apparatus for coating detection and surface evaluation
US5391891A (en) * 1990-02-28 1995-02-21 Leopold Kostal Gmbh & Co. Kg Moisture sensing device
US5196906A (en) * 1990-06-29 1993-03-23 Tma Technologies, Inc. Modular scatterometer with interchangeable scanning heads
JPH08233532A (ja) * 1995-02-27 1996-09-13 Suinku:Kk 透明電極の検査方法
US5966214A (en) * 1998-05-12 1999-10-12 Electronic Design To Market, Inc. Gauge for measuring glass thickness and glass pane spacing
WO2000071971A1 (en) * 1999-05-24 2000-11-30 Luxtron Corporation Optical techniques for measuring layer thicknesses
US6683695B1 (en) * 1999-07-21 2004-01-27 Electronic Design To Market, Inc. Method and apparatus for detecting properties of reflective transparent surface coatings on a sheet of transparent material
JP3852557B2 (ja) * 2000-09-08 2006-11-29 オムロン株式会社 膜厚測定方法およびその方法を用いた膜厚センサ
AT410257B (de) * 2000-10-23 2003-03-25 Mte Innovative Measurement Sol Vorrichtung zur überprüfung und kontrolle einer einzel-glasscheibe oder eines isolierglas-elements

Also Published As

Publication number Publication date
FR2846421A1 (fr) 2004-04-30
GB2398119A (en) 2004-08-11
FR2846421B1 (fr) 2004-12-17
DE10349169B4 (de) 2008-05-21
ATA16902003A (de) 2005-04-15
IE20030776A1 (en) 2004-05-05
ITMI20032056A1 (it) 2004-04-24
ES2219190B2 (es) 2005-12-16
DE20316224U1 (de) 2004-03-04
GB2398119B (en) 2006-04-19
AT413154B (de) 2005-11-15
ES2219190A1 (es) 2004-11-16
GB0324462D0 (en) 2003-11-19
DE10349169A1 (de) 2004-05-06

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Legal Events

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RE Patent lapsed

Effective date: 20081031