|
FR2163861A5
(fr)
*
|
1971-12-03 |
1973-07-27 |
Anvar |
|
|
US3782826A
(en)
*
|
1972-08-21 |
1974-01-01 |
Cutler Hammer Inc |
Method and apparatus for measuring rotational angles by measuring changes in optical beam path length
|
|
DE2306091C3
(de)
*
|
1973-02-08 |
1975-10-30 |
Hewlett-Packard Gmbh, 7030 Boeblingen |
Interferenz-Refraktometer
|
|
US3899253A
(en)
*
|
1973-09-10 |
1975-08-12 |
Mario W Overhoff |
Apparatus and method for automatic cross correlation interferometry
|
|
US4190366A
(en)
*
|
1977-04-25 |
1980-02-26 |
Laser Precision Corporation |
Refractively scanned interferometer
|
|
US4165938A
(en)
*
|
1977-06-22 |
1979-08-28 |
Laser Precision Corporation |
Refractively scanned interferometer
|
|
DE2904836A1
(de)
*
|
1979-02-08 |
1980-08-14 |
Max Planck Gesellschaft |
Interferometrische einrichtung zur messung der wellenlaenge optischer strahlung
|
|
US4735505A
(en)
*
|
1983-08-30 |
1988-04-05 |
The Perkin-Elmer Corporation |
Assembly for adjusting an optical element
|
|
GB8525650D0
(en)
|
1985-10-17 |
1985-11-20 |
Pilkington Brothers Plc |
Interferometer
|
|
JPH0719965A
(ja)
*
|
1993-06-30 |
1995-01-20 |
Ando Electric Co Ltd |
光波長計
|
|
GB9403206D0
(en)
*
|
1994-02-19 |
1994-04-13 |
Renishaw Plc |
Laser interferometer
|
|
EP0877913B1
(fr)
*
|
1995-05-04 |
2002-10-09 |
Haag-Streit AG |
Dispositif pour la mesure d'epaisseur d'objets transparents
|
|
US5883713A
(en)
*
|
1997-09-16 |
1999-03-16 |
Boeing North American, Inc. |
Ultra fast fourier transform spectrometer with rotating scanning cube
|
|
DE19801469C2
(de)
|
1998-01-16 |
2001-05-17 |
Campus Technologies Ag Zug |
Vorrichtung zur Erfassung oder Erzeugung optischer Signale
|
|
US20080068612A1
(en)
*
|
2000-08-02 |
2008-03-20 |
Manning Christopher J |
Fourier-transform spectrometers
|
|
FR2817039B1
(fr)
*
|
2000-11-22 |
2003-06-20 |
Nanotec Solution |
Dispositif de mesure optique utilisant un interferometre a division d'amplitude, et procede mettant en oeuvre ce dispositif
|
|
WO2004027491A1
(fr)
*
|
2002-09-18 |
2004-04-01 |
Teraview Limited |
Appareil destine a faire varier la longueur du trajet d'un faisceau de rayonnement
|
|
US6989901B2
(en)
*
|
2003-07-02 |
2006-01-24 |
Inlight Solutions, Inc. |
Interferometer
|
|
US6952266B2
(en)
|
2003-01-15 |
2005-10-04 |
Inlight Solutions, Inc. |
Interferometer alignment
|
|
WO2004065894A2
(fr)
*
|
2003-01-15 |
2004-08-05 |
Inlight Solutions, Inc. |
Interferometre
|
|
FR2947049B1
(fr)
*
|
2009-06-19 |
2019-07-12 |
Thales |
Systeme et procede d'interferometrie statique
|
|
US20150292859A1
(en)
*
|
2014-04-14 |
2015-10-15 |
Finite Element Analyst, Inc. |
Rotary fourier transform interferometer spectrometer including a multi-faceted optical element
|
|
US9597839B2
(en)
|
2015-06-16 |
2017-03-21 |
Xerox Corporation |
System for adjusting operation of a printer during three-dimensional object printing to compensate for errors in object formation
|
|
US9557221B1
(en)
|
2016-06-24 |
2017-01-31 |
Mettler-Toledo Autochem, Inc. |
Interferometer for Fourier transform infrared spectrometry
|
|
EP3339822A1
(fr)
*
|
2016-12-22 |
2018-06-27 |
Nederlandse Organisatie voor toegepast- natuurwetenschappelijk onderzoek TNO |
Système interféromètre et son utilisation
|
|
AU2019393832B2
(en)
*
|
2018-12-04 |
2025-05-22 |
Rapid Phenotyping Pty Limited |
Refractive scanning interferometer
|
|
US11463088B2
(en)
*
|
2019-09-18 |
2022-10-04 |
Semtech Corporation |
Proximity sensor with nonlinear filter and method
|
|
CN115342737B
(zh)
*
|
2022-09-06 |
2024-04-16 |
中国科学院长春光学精密机械与物理研究所 |
星间激光外差干涉信号多频率信息捕获系统及其捕获方法
|