BE750961A - Procede pour determiner la duree de vie des porteurs de charge excedentaires dans les dispositifs semiconducteurs - Google Patents

Procede pour determiner la duree de vie des porteurs de charge excedentaires dans les dispositifs semiconducteurs

Info

Publication number
BE750961A
BE750961A BE750961DA BE750961A BE 750961 A BE750961 A BE 750961A BE 750961D A BE750961D A BE 750961DA BE 750961 A BE750961 A BE 750961A
Authority
BE
Belgium
Prior art keywords
lifetime
procedure
determining
semiconductor devices
excessive load
Prior art date
Application number
Other languages
English (en)
Inventor
R G Mazur
Original Assignee
Westinghouse Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Westinghouse Electric Corp filed Critical Westinghouse Electric Corp
Publication of BE750961A publication Critical patent/BE750961A/fr

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26Testing of individual semiconductor devices
    • G01R31/2607Circuits therefor
    • G01R31/2637Circuits therefor for testing other individual devices

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
BE750961D 1969-05-28 1970-05-26 Procede pour determiner la duree de vie des porteurs de charge excedentaires dans les dispositifs semiconducteurs BE750961A (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US82862169A 1969-05-28 1969-05-28

Publications (1)

Publication Number Publication Date
BE750961A true BE750961A (fr) 1970-11-03

Family

ID=25252291

Family Applications (1)

Application Number Title Priority Date Filing Date
BE750961D BE750961A (fr) 1969-05-28 1970-05-26 Procede pour determiner la duree de vie des porteurs de charge excedentaires dans les dispositifs semiconducteurs

Country Status (4)

Country Link
US (1) US3697873A (fr)
BE (1) BE750961A (fr)
FR (1) FR2048965A5 (fr)
GB (1) GB1247466A (fr)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4444351A (en) * 1981-11-16 1984-04-24 Electric Power Research Institute, Inc. Method of soldering metal oxide varistors
US4646009A (en) * 1982-05-18 1987-02-24 Ade Corporation Contacts for conductivity-type sensors
US4564807A (en) * 1984-03-27 1986-01-14 Ga Technologies Inc. Method of judging carrier lifetime in semiconductor devices
JP3696352B2 (ja) * 1996-12-17 2005-09-14 三菱電機株式会社 ライフタイム評価用teg
US6045026A (en) 1998-02-23 2000-04-04 Micron Technology, Inc. Utilize ultrasonic energy to reduce the initial contact forces in known-good-die or permanent contact systems
CN1388937A (zh) * 2000-06-29 2003-01-01 松下电器产业株式会社 物品的重复利用方法
US8912799B2 (en) * 2011-11-10 2014-12-16 Semiconductor Physics Laboratory Co., Ltd. Accurate measurement of excess carrier lifetime using carrier decay method
US20200065449A1 (en) * 2018-08-21 2020-02-27 Ge Aviation Systems Llc Method and system for predicting semiconductor fatigue
CN110702790B (zh) * 2019-11-11 2022-08-19 成都主导科技有限责任公司 一种用于远声程检测的超声波探头
US20220219254A1 (en) * 2021-01-13 2022-07-14 Carlex Glass America, Llc Method of connection to a conductive material

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL133499C (fr) * 1960-05-18
US3366879A (en) * 1963-10-17 1968-01-30 Fujitsu Ltd Method for measuring the specific resistance of a silicon crystal by measuring the breakdown voltage
US3384283A (en) * 1964-10-16 1968-05-21 Axion Corp Vibratory wire bonding method and apparatus
US3459355A (en) * 1967-10-11 1969-08-05 Gen Motors Corp Ultrasonic welder for thin wires

Also Published As

Publication number Publication date
GB1247466A (en) 1971-09-22
US3697873A (en) 1972-10-10
FR2048965A5 (fr) 1971-03-19

Similar Documents

Publication Publication Date Title
BE761668A (fr) Structure de contact perfectionnee pour semi-conducteurs
FR2320636A1 (fr) Procede pour reduire la duree de vie des porteurs minoritaires dans les semi-conducteurs et dispositifs en resultant
BR6915742D0 (pt) Dispositivo semicondutor
CH521154A (de) Sedimentationsvorrichtung
BR6915753D0 (pt) Estrutura de semicondutor
BE764282R (fr) Pare-brise pour
BR7404876D0 (pt) Dispositivo semicondutor
CH507826A (fr) Double ancrage pour ceintures de sécurité
CH512914A (fr) Tétine pour biberon
CH528426A (fr) Installation pour la manutention de marchandises
BE762107A (fr) Etui pour lentille de contact
CH502056A (fr) Réceptacle pour plaquette insecticide
BE750961A (fr) Procede pour determiner la duree de vie des porteurs de charge excedentaires dans les dispositifs semiconducteurs
BE766750A (fr) Procedes de tirage de cristaux pour semiconducteurs
BE781382A (fr) Appareil pour le reglage de la distance separant les centres depaliers
BE751343A (fr) Installation pour la projection de matieres
BR6915308D0 (pt) Dispositivo de retificadores semicondutores
BE774653R (fr) Pare-brise pour
BE749221A (fr) Systeme pour le traitement continu de dispositifs semiconducteurs
BE744737A (fr) Plaques pour planographie
BE757182A (fr) Procede pour la reduction de minerais
BE744684A (fr) Dispositif pour la fabrication de lingots
BE754617A (fr) Dipositif pour la coulee continue de
BE752548A (fr) Support pour cristal semiconducteur
BR7017682D0 (pt) Dispositivo semicondutor