BE817811A - Dispositif pour l'absorption des rayons x - Google Patents

Dispositif pour l'absorption des rayons x

Info

Publication number
BE817811A
BE817811A BE146694A BE146694A BE817811A BE 817811 A BE817811 A BE 817811A BE 146694 A BE146694 A BE 146694A BE 146694 A BE146694 A BE 146694A BE 817811 A BE817811 A BE 817811A
Authority
BE
Belgium
Prior art keywords
absorption device
ray absorption
ray
absorption
Prior art date
Application number
BE146694A
Other languages
English (en)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Publication of BE817811A publication Critical patent/BE817811A/fr

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G21—NUCLEAR PHYSICS; NUCLEAR ENGINEERING
    • G21F—PROTECTION AGAINST X-RADIATION, GAMMA RADIATION, CORPUSCULAR RADIATION OR PARTICLE BOMBARDMENT; TREATING RADIOACTIVELY CONTAMINATED MATERIAL; DECONTAMINATION ARRANGEMENTS THEREFOR
    • G21F1/00—Shielding characterised by the composition of the materials
    • G21F1/02—Selection of uniform shielding materials
    • G21F1/08—Metals; Alloys; Cermets, i.e. sintered mixtures of ceramics and metals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Ceramic Engineering (AREA)
  • Metallurgy (AREA)
  • General Engineering & Computer Science (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
BE146694A 1973-07-18 1974-07-18 Dispositif pour l'absorption des rayons x BE817811A (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE19732336652 DE2336652A1 (de) 1973-07-18 1973-07-18 Schichtsystem zur absorption von roentgenstrahlen

Publications (1)

Publication Number Publication Date
BE817811A true BE817811A (fr) 1974-11-18

Family

ID=5887354

Family Applications (1)

Application Number Title Priority Date Filing Date
BE146694A BE817811A (fr) 1973-07-18 1974-07-18 Dispositif pour l'absorption des rayons x

Country Status (9)

Country Link
US (1) US3925678A (fr)
JP (1) JPS5044882A (fr)
BE (1) BE817811A (fr)
DE (1) DE2336652A1 (fr)
DK (1) DK385174A (fr)
FR (1) FR2238218B3 (fr)
IT (1) IT1017127B (fr)
LU (1) LU70538A1 (fr)
NL (1) NL7409479A (fr)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4626688A (en) 1982-11-26 1986-12-02 Barnes Gary T Split energy level radiation detection
WO1986002164A1 (fr) * 1984-10-05 1986-04-10 Kawasaki Steel Corporation Procede permettant de determiner l'epaisseur et la composition d'un film en alliage
US4821301A (en) * 1986-02-28 1989-04-11 Duke University X-ray reflection method and apparatus for chemical analysis of thin surface layers
EP1319175A2 (fr) * 2000-07-18 2003-06-18 Uop Llc Procede de preparation d'echantillons en parallele
US6806093B2 (en) * 2000-07-18 2004-10-19 Uop Llc Process of parallel sample preparation
US6677162B1 (en) 2000-07-18 2004-01-13 Uop Llc Process of parallel sample preparation
US7341414B2 (en) * 2005-05-02 2008-03-11 Cummins Inc. Fastener and method for reducing stress failure in an engine component
DE102011109822B4 (de) * 2011-08-09 2019-10-10 Ketek Gmbh Vorrichtung für einen Strahlungsdetektor sowie Strahlungsdetektor mit der Vorrichtung
JP7416254B2 (ja) 2020-07-14 2024-01-17 株式会社島津製作所 蛍光ｘ線分析装置

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3644736A (en) * 1968-11-05 1972-02-22 Giken Kogyo Kk Back-scattering absorber materials for gamma-rays

Also Published As

Publication number Publication date
JPS5044882A (fr) 1975-04-22
US3925678A (en) 1975-12-09
NL7409479A (nl) 1975-01-21
IT1017127B (it) 1977-07-20
LU70538A1 (fr) 1974-11-28
DK385174A (fr) 1975-03-10
DE2336652A1 (de) 1975-01-30
FR2238218A1 (fr) 1975-02-14
FR2238218B3 (fr) 1977-05-06

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