BE845628A - Detecteur pyro-electrique a effet de champ pour rayonnement electromagnetique - Google Patents
Detecteur pyro-electrique a effet de champ pour rayonnement electromagnetiqueInfo
- Publication number
- BE845628A BE845628A BE170171A BE170171A BE845628A BE 845628 A BE845628 A BE 845628A BE 170171 A BE170171 A BE 170171A BE 170171 A BE170171 A BE 170171A BE 845628 A BE845628 A BE 845628A
- Authority
- BE
- Belgium
- Prior art keywords
- pyro
- effect
- field
- electromagnetic radiation
- electric detector
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/10—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors
- G01J5/34—Radiation pyrometry, e.g. infrared or optical thermometry using electric radiation detectors using capacitors, e.g. pyroelectric capacitors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
- H10F30/20—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors
- H10F30/21—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation
- H10F30/28—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation the devices being characterised by field-effect operation, e.g. junction field-effect phototransistors
- H10F30/282—Insulated-gate field-effect transistors [IGFET], e.g. MISFET [metal-insulator-semiconductor field-effect transistor] phototransistors
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N15/00—Thermoelectric devices without a junction of dissimilar materials; Thermomagnetic devices, e.g. using the Nernst-Ettingshausen effect
- H10N15/10—Thermoelectric devices using thermal change of the dielectric constant, e.g. working above and below the Curie point
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Photometry And Measurement Of Optical Pulse Characteristics (AREA)
- Radiation Pyrometers (AREA)
- Light Receiving Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US05/610,365 US4024560A (en) | 1975-09-04 | 1975-09-04 | Pyroelectric-field effect electromagnetic radiation detector |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| BE845628A true BE845628A (fr) | 1977-02-28 |
Family
ID=24444727
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| BE170171A BE845628A (fr) | 1975-09-04 | 1976-08-27 | Detecteur pyro-electrique a effet de champ pour rayonnement electromagnetique |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US4024560A (fr) |
| JP (1) | JPS5232288A (fr) |
| BE (1) | BE845628A (fr) |
| CA (1) | CA1071743A (fr) |
| DE (1) | DE2637623A1 (fr) |
| FR (1) | FR2323133A1 (fr) |
| GB (1) | GB1561904A (fr) |
Families Citing this family (32)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB1562287A (en) * | 1976-03-27 | 1980-03-12 | Marconi Co Ltd | Imaging device |
| GB1580403A (en) * | 1977-04-19 | 1980-12-03 | Philips Electronic Associated | Pyroelectric detector circuits and devices |
| JPS57104828A (en) * | 1980-12-20 | 1982-06-30 | Horiba Ltd | Composing infrared detector |
| US4473836A (en) * | 1982-05-03 | 1984-09-25 | Dalsa Inc. | Integrable large dynamic range photodetector element for linear and area integrated circuit imaging arrays |
| US4464572A (en) * | 1982-05-06 | 1984-08-07 | The United States Of America As Represented By The United States Department Of Energy | Infrared photoemitting diode having reduced work function |
| US4501967A (en) * | 1982-11-18 | 1985-02-26 | North American Philips Corporation | Broad band pyroelectric infrared detector |
| US4698657A (en) * | 1984-02-10 | 1987-10-06 | Sharp Kabushiki Kaisha | FET type sensor and a method for driving the same |
| JPH0752124B2 (ja) * | 1985-06-26 | 1995-06-05 | 松下電器産業株式会社 | 赤外線検出素子 |
| JP2599354B2 (ja) * | 1985-06-27 | 1997-04-09 | 松下電器産業株式会社 | 赤外線検出素子 |
| DE3617910A1 (de) * | 1986-05-28 | 1987-12-03 | Siemens Ag | Matrixsensor |
| KR910001878B1 (ko) * | 1986-12-16 | 1991-03-28 | 가부시기가이샤 시마즈세이사구쇼 | 열센서 및 그 제조방법 |
| US4804844A (en) * | 1987-09-03 | 1989-02-14 | The United States Of America As Represented By The Secretary Of The Army | Method and apparatus for enhancement of primary pyroelectric response |
| CH676523A5 (fr) * | 1988-06-01 | 1991-01-31 | Cerberus Ag | |
| DE3823901A1 (de) * | 1988-07-14 | 1990-02-01 | Bernd Dr Rer Nat Ploss | Verfahren zur herstellung ferroelektrischer festkoerperbauelemente |
| US5273910A (en) * | 1990-08-08 | 1993-12-28 | Minnesota Mining And Manufacturing Company | Method of making a solid state electromagnetic radiation detector |
| US5182624A (en) * | 1990-08-08 | 1993-01-26 | Minnesota Mining And Manufacturing Company | Solid state electromagnetic radiation detector fet array |
| GB2250751B (en) * | 1990-08-24 | 1995-04-12 | Kawasaki Heavy Ind Ltd | Process for the production of dielectric thin films |
| FR2670325B1 (fr) * | 1990-12-11 | 1993-01-22 | Thomson Composants Militaires | Detecteur infrarouge monolithique a materiau pyroelectrique. |
| JP3831524B2 (ja) * | 1998-06-26 | 2006-10-11 | 株式会社堀場製作所 | 赤外線ガス分析計用流量検出素子とその製造方法 |
| EP1098362B1 (fr) * | 1998-06-19 | 2007-05-09 | Matsushita Electric Industrial Co., Ltd. | Procede et dispositif servant a creer des protuberances |
| US6821787B2 (en) * | 2000-11-17 | 2004-11-23 | Thermogenic Imaging, Inc. | Apparatus and methods for infrared calorimetric measurements |
| US20020132360A1 (en) * | 2000-11-17 | 2002-09-19 | Flir Systems Boston, Inc. | Apparatus and methods for infrared calorimetric measurements |
| US20040110301A1 (en) * | 2000-11-17 | 2004-06-10 | Neilson Andy C | Apparatus and methods for measuring reaction byproducts |
| US6657358B2 (en) * | 2001-06-26 | 2003-12-02 | Hewlett-Packard Development Company, L.P. | Power supply including pyroelectric capacitor |
| JP2003031579A (ja) * | 2001-07-18 | 2003-01-31 | Denso Corp | センサ及びその製造方法 |
| US7439555B2 (en) * | 2003-12-05 | 2008-10-21 | International Rectifier Corporation | III-nitride semiconductor device with trench structure |
| US9223186B2 (en) * | 2009-02-26 | 2015-12-29 | Corning Incorporated | Frequency converted laser sources and methods for operating frequency converted laser sources |
| FR2959657B1 (fr) * | 2010-05-06 | 2012-06-22 | Commissariat Energie Atomique | Transducteur de variation temporelle de température, puce électronique incorporant ce transducteur et procédé de fabrication de cette puce |
| TW201216363A (en) * | 2010-10-01 | 2012-04-16 | Univ Nat Chiao Tung | Dielectric structure, transistor and manufacturing method thereof with praseodymium oxide |
| JP5533638B2 (ja) * | 2010-12-24 | 2014-06-25 | セイコーエプソン株式会社 | 検出装置、センサーデバイス及び電子機器 |
| JP2012134415A (ja) * | 2010-12-24 | 2012-07-12 | Seiko Epson Corp | 検出装置、センサーデバイス及び電子機器 |
| CN109786498B (zh) * | 2018-12-10 | 2021-04-06 | 华南理工大学 | 一种基于二维半导体材料的红外探测元件及其制备方法 |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3400383A (en) * | 1964-08-05 | 1968-09-03 | Texas Instruments Inc | Trainable decision system and adaptive memory element |
| DE1514495C3 (de) * | 1965-07-01 | 1974-10-17 | Siemens Ag, 1000 Berlin Und 8000 Muenchen | Halbleiteranordnung |
| US3453887A (en) * | 1967-02-08 | 1969-07-08 | Corning Glass Works | Temperature change measuring device |
| US3450966A (en) * | 1967-09-12 | 1969-06-17 | Rca Corp | Ferroelectric insulated gate field effect device |
-
1975
- 1975-09-04 US US05/610,365 patent/US4024560A/en not_active Expired - Lifetime
-
1976
- 1976-08-13 CA CA259,094A patent/CA1071743A/fr not_active Expired
- 1976-08-20 DE DE19762637623 patent/DE2637623A1/de not_active Withdrawn
- 1976-08-27 BE BE170171A patent/BE845628A/fr unknown
- 1976-08-31 FR FR7626261A patent/FR2323133A1/fr not_active Withdrawn
- 1976-09-02 GB GB36386/76A patent/GB1561904A/en not_active Expired
- 1976-09-03 JP JP51105090A patent/JPS5232288A/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| DE2637623A1 (de) | 1977-03-17 |
| CA1071743A (fr) | 1980-02-12 |
| GB1561904A (en) | 1980-03-05 |
| FR2323133A1 (fr) | 1977-04-01 |
| JPS5232288A (en) | 1977-03-11 |
| US4024560A (en) | 1977-05-17 |
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