BRPI0407762A - processo para a medição sem contato de um objeto - Google Patents

processo para a medição sem contato de um objeto

Info

Publication number
BRPI0407762A
BRPI0407762A BRPI0407762-8A BRPI0407762A BRPI0407762A BR PI0407762 A BRPI0407762 A BR PI0407762A BR PI0407762 A BRPI0407762 A BR PI0407762A BR PI0407762 A BRPI0407762 A BR PI0407762A
Authority
BR
Brazil
Prior art keywords
scanning
contact measurement
dimension
field
radius
Prior art date
Application number
BRPI0407762-8A
Other languages
English (en)
Inventor
Beat De Coi
Original Assignee
Cedes Ag
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Cedes Ag filed Critical Cedes Ag
Publication of BRPI0407762A publication Critical patent/BRPI0407762A/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/04—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness specially adapted for measuring length or width of objects while moving
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/245—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/024—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of diode-array scanning
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
    • G01B11/10—Measuring arrangements characterised by the use of optical techniques for measuring diameters of objects while moving
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
    • G01B11/10—Measuring arrangements characterised by the use of optical techniques for measuring diameters of objects while moving
    • G01B11/105—Measuring arrangements characterised by the use of optical techniques for measuring diameters of objects while moving using photoelectric detection means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/2433—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures for measuring outlines by shadow casting

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Length Measuring Devices Characterised By Use Of Acoustic Means (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)

Abstract

"PROCESSO PARA A MEDIçãO SEM CONTATO DE UM OBJETO". A invenção refere-se a um processo para a medição sem contato de um objeto (6) em pelo menos uma dimensão, em que o objeto (6) é explorado em uma região efetiva espacialmente limitada de um campo de raios de exploração (1) e o tamanho do objeto (6) em termos da dimensão medida é deduzido a partir da detecção de uma ou mais interrupções dos raios de exploração (L). O campo de raios de exploração (1) é construido a partir de um número de raios individuais (L) diretamente endereçáveis, a exploração é efetuada de acordo com um padrão de etapas que pode ser previamente definido e um processo de classificação não linear é usado para a exploração. Um processo preferido usa locação binária.
BRPI0407762-8A 2003-02-24 2004-01-07 processo para a medição sem contato de um objeto BRPI0407762A (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CH2842003 2003-02-24
PCT/CH2004/000003 WO2004074769A2 (de) 2003-02-24 2004-01-07 Verfahren zur berührungslosen vermessung eines objekts

Publications (1)

Publication Number Publication Date
BRPI0407762A true BRPI0407762A (pt) 2006-02-14

Family

ID=32873425

Family Applications (1)

Application Number Title Priority Date Filing Date
BRPI0407762-8A BRPI0407762A (pt) 2003-02-24 2004-01-07 processo para a medição sem contato de um objeto

Country Status (7)

Country Link
US (1) US7126144B2 (pt)
EP (1) EP1597538B1 (pt)
JP (1) JP2006518840A (pt)
KR (1) KR20050104385A (pt)
CN (1) CN1754081A (pt)
BR (1) BRPI0407762A (pt)
WO (1) WO2004074769A2 (pt)

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SE0401408D0 (sv) * 2004-06-02 2004-06-02 Astrazeneca Ab Diameter measuring device
DK1896872T3 (en) * 2005-06-08 2017-01-09 C-Dax Ltd IMPROVEMENTS IN OR RELATING pasture management
DE102005038019A1 (de) * 2005-08-09 2007-02-15 Cedes Ag Sensorvorrichtung zur Detektion eines Überhangs an der Beladung einer Trägereinrichtung
DE102006052921A1 (de) * 2006-11-08 2008-05-21 Gerd Laschinski Verfahren und Vorrichtung zum Vermessen eines Körpers
DE102007006306A1 (de) * 2007-01-30 2008-07-31 Pilz Gmbh & Co. Kg Sicherheitseinrichtung für eine Maschine
CN101281028A (zh) * 2007-04-02 2008-10-08 鸿富锦精密工业（深圳）有限公司 检测仪
DE202007007160U1 (de) * 2007-05-19 2007-08-02 Leica Microsystems Nussloch Gmbh Vorrichtung zur Erzeugung von Dünnschnitten
DE102007023457B4 (de) * 2007-05-19 2009-05-20 Leica Biosystems Nussloch Gmbh Verfahren zur automatischen Annäherung eines dünn zu schneidenden Präparates an das Messer eines Mikrotoms
US7960681B2 (en) * 2007-11-16 2011-06-14 Honeywell International Inc. Scanning method and system for a multiple light beam system
US20090188435A1 (en) * 2008-01-25 2009-07-30 Hale Jr Seymour B Apparatus and methods for securing pet doors
JP5507879B2 (ja) * 2009-04-24 2014-05-28 株式会社キーエンス 透過型寸法測定装置
US8416428B2 (en) * 2009-11-05 2013-04-09 Toyota Motor Engineering & Manufacturing North America, Inc. Detection Methods and Systems
CN102753934A (zh) * 2010-05-31 2012-10-24 天际停车公司 用于测量物体的空间范围的方法及装置
DE102011083757A1 (de) * 2011-09-29 2013-04-04 Krones Aktiengesellschaft Triggerlichtgitter und Verfahren zur Positionsbestimmung von Behältern
ES2545626T3 (es) * 2012-01-27 2015-09-14 Glp Systems Gmbh Cartucho de almacenamiento
DE102012005966B4 (de) * 2012-03-23 2022-06-09 S.E.A. - Science & Engineering Applications Datentechnik GmbH Vorrichtung und Verfahren zur Erzeugung einer flächenhaften Darstellung eines dreidimensionalen Körpers sowie Beleuchtungseinrichtung dazu
CN104359405B (zh) * 2014-11-27 2017-11-07 上海集成电路研发中心有限公司 三维扫描装置
DE102015220289A1 (de) * 2015-10-19 2017-04-20 Sms Group Gmbh Verfahren und Vermessungssystem zum Vermessen eines bewegbaren Objektes
US10647454B2 (en) * 2016-07-22 2020-05-12 Packsize Llc Smart packaging wall
CN106370110A (zh) * 2016-08-30 2017-02-01 深圳前海弘稼科技有限公司 一种种植箱内植物的高度确定方法及系统
CN106644704B (zh) * 2017-03-09 2019-02-22 中国工程物理研究院核物理与化学研究所 一种材料微观变形的测试方法
CN107792150A (zh) * 2017-09-27 2018-03-13 西安科技大学 一种建筑施工用智能运料车
CN108344382B (zh) * 2018-01-22 2019-07-16 上海交通大学 具有定位补偿功能的数字化卡板及其测量方法
CN111256613B (zh) * 2020-02-25 2021-10-08 厦门市省力机械有限公司 一种圆度测试仪和圆度测试方法
CN112432598A (zh) * 2020-05-08 2021-03-02 浙江嘉福玻璃有限公司 一种玻璃尺寸在线光栅检测方法
DE102021113754A1 (de) * 2021-05-27 2022-12-01 mb bergmann GmbH Dichtheitsprüfung von Vakuumverpackungen
CN114993207B (zh) * 2022-08-03 2022-10-25 广东省智能机器人研究院 基于双目测量系统的三维重建方法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SE8105051L (sv) * 1981-08-26 1982-08-30 Kockumation Ab Forfarande for indikering av ett foremals nervaro i en metzon och anordning for genomforande av forfarandet
AT396036B (de) * 1981-12-31 1993-05-25 Keba Gmbh & Co Messeinrichtung zum feststellen bzw. ueberwachen einer abmessung
DE3942304A1 (de) * 1989-12-21 1991-06-27 Schlafhorst & Co W Verfahren und vorrichtung zur qualitativen und quantitativen erfassung eines garnwickels und zum ableiten definierter steuervorgaenge daraus
US5266810A (en) * 1992-04-14 1993-11-30 Imtec, Inc. Package height detector having a first group of light sensors selectively enabled by the detector outputs of a second group of light sensors
US5389789A (en) * 1992-05-20 1995-02-14 Union Camp Corporation Portable edge crack detector for detecting size and shape of a crack and a portable edge detector
JPH06208637A (ja) * 1993-01-11 1994-07-26 Sumitomo Electric Ind Ltd 光学式走査装置
JP4052608B2 (ja) * 1998-06-02 2008-02-27 株式会社キーエンス 多光軸光電スイッチ
JP2003074790A (ja) * 2001-09-03 2003-03-12 Keyence Corp 多光軸光電式安全装置の設置方法
KR100459478B1 (ko) * 2002-07-09 2004-12-03 엘지산전 주식회사 레이저 센서를 이용한 차량 검지 장치 및 방법

Also Published As

Publication number Publication date
US7126144B2 (en) 2006-10-24
WO2004074769A3 (de) 2004-11-04
KR20050104385A (ko) 2005-11-02
EP1597538B1 (de) 2012-10-17
EP1597538A2 (de) 2005-11-23
CN1754081A (zh) 2006-03-29
WO2004074769A2 (de) 2004-09-02
JP2006518840A (ja) 2006-08-17
US20060145101A1 (en) 2006-07-06

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Legal Events

Date Code Title Description
B08F Application dismissed because of non-payment of annual fees [chapter 8.6 patent gazette]

Free format text: REFERENTE AS 5A E 6A ANUIDADES.

B08K Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette]

Free format text: REFERENTE AO DESPACHO 8.6 PUBLICADO NA RPI 2159 DE 22/05/2012.