BRPI0412515A - partìculas abrasivas para polimento quìmico mecánico - Google Patents
partìculas abrasivas para polimento quìmico mecánicoInfo
- Publication number
- BRPI0412515A BRPI0412515A BRPI0412515-0A BRPI0412515A BRPI0412515A BR PI0412515 A BRPI0412515 A BR PI0412515A BR PI0412515 A BRPI0412515 A BR PI0412515A BR PI0412515 A BRPI0412515 A BR PI0412515A
- Authority
- BR
- Brazil
- Prior art keywords
- abrasive particles
- nanometers
- chemical polishing
- mechanical chemical
- volume
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K3/00—Materials not provided for elsewhere
- C09K3/14—Anti-slip materials; Abrasives
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
- B24B37/042—Lapping machines or devices; Accessories designed for working plane surfaces operating processes therefor
- B24B37/044—Lapping machines or devices; Accessories designed for working plane surfaces operating processes therefor characterised by the composition of the lapping agent
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09G—POLISHING COMPOSITIONS; SKI WAXES
- C09G1/00—Polishing compositions
- C09G1/02—Polishing compositions containing abrasives or grinding agents
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K3/00—Materials not provided for elsewhere
- C09K3/14—Anti-slip materials; Abrasives
- C09K3/1409—Abrasive particles per se
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K3/00—Materials not provided for elsewhere
- C09K3/14—Anti-slip materials; Abrasives
- C09K3/1454—Abrasive powders, suspensions and pastes for polishing
- C09K3/1463—Aqueous liquid suspensions
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P52/00—Grinding, lapping or polishing of wafers, substrates or parts of devices
- H10P52/40—Chemomechanical polishing [CMP]
- H10P52/403—Chemomechanical polishing [CMP] of conductive or resistive materials
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Manufacturing Of Magnetic Record Carriers (AREA)
Abstract
"PARTìCULAS ABRASIVAS PARA POLIMENTO QUìMICO MECáNICO". A presente invenção se refere a uma composição abrasiva para o polimento de substratos que incluem uma pluralidade de partículas abrasivas dotadas de uma distribuição de tamanho de partícula polidispersa com um tamanho médio, por volume, estando em cerca de 20 nanómetros a cerca de 100 nanómetros, o valor de amplitude, por volume, sendo superior ou igual a cerca de 20 nanómetros, onde a fração de partículas superior ou igual a cerca de 100 nanómetros é menor ou igual a 20% em volume das partículas abrasivas.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US48668603P | 2003-07-11 | 2003-07-11 | |
| PCT/US2004/021998 WO2005007770A1 (en) | 2003-07-11 | 2004-07-09 | Abrasive particles for chemical mechanical polishing |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| BRPI0412515A true BRPI0412515A (pt) | 2006-09-19 |
Family
ID=34079279
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| BRPI0412515-0A BRPI0412515A (pt) | 2003-07-11 | 2004-07-09 | partìculas abrasivas para polimento quìmico mecánico |
Country Status (17)
| Country | Link |
|---|---|
| US (1) | US20060175295A1 (pt) |
| EP (1) | EP1660606B1 (pt) |
| JP (1) | JP2007531631A (pt) |
| KR (1) | KR101134827B1 (pt) |
| CN (1) | CN1849379B (pt) |
| AU (1) | AU2004257233A1 (pt) |
| BR (1) | BRPI0412515A (pt) |
| CA (1) | CA2532114A1 (pt) |
| DK (1) | DK1660606T3 (pt) |
| ES (1) | ES2436215T3 (pt) |
| MX (1) | MXPA06000251A (pt) |
| NO (1) | NO20060576L (pt) |
| PL (1) | PL1660606T3 (pt) |
| PT (1) | PT1660606E (pt) |
| RU (1) | RU2356926C2 (pt) |
| TW (1) | TWI415926B (pt) |
| WO (1) | WO2005007770A1 (pt) |
Families Citing this family (60)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100662546B1 (ko) * | 2005-03-07 | 2006-12-28 | 제일모직주식회사 | 실리콘 웨이퍼의 표면 품질을 개선하는 연마용 슬러리 조성물 및 이를 이용한 연마방법 |
| DE102005017372A1 (de) * | 2005-04-14 | 2006-10-19 | Degussa Ag | Wässrige Ceroxiddispersion |
| TWI506621B (zh) * | 2005-12-22 | 2015-11-01 | Kao Corp | 硬碟基板用研磨液組合物 |
| US20130000214A1 (en) * | 2006-01-11 | 2013-01-03 | Jia-Ni Chu | Abrasive Particles for Chemical Mechanical Polishing |
| JP2007220995A (ja) * | 2006-02-17 | 2007-08-30 | Fujifilm Corp | 金属用研磨液 |
| US7897061B2 (en) * | 2006-02-01 | 2011-03-01 | Cabot Microelectronics Corporation | Compositions and methods for CMP of phase change alloys |
| EP2052048B1 (en) * | 2006-07-12 | 2018-01-24 | Cabot Microelectronics Corporation | Cmp method for metal-containing substrates |
| JP5007384B2 (ja) * | 2006-10-18 | 2012-08-22 | 株式会社荏原製作所 | 触媒支援型化学加工方法及び装置 |
| US20080085412A1 (en) * | 2006-10-04 | 2008-04-10 | Ortiz C Yolanda | Silica-coated metal oxide sols having variable metal oxide to silica ratio |
| JP4665886B2 (ja) * | 2006-10-27 | 2011-04-06 | 富士電機デバイステクノロジー株式会社 | 垂直磁気記録媒体、垂直磁気記録媒体用基板、および、それらの製造方法 |
| US7837888B2 (en) * | 2006-11-13 | 2010-11-23 | Cabot Microelectronics Corporation | Composition and method for damascene CMP |
| US7976723B2 (en) * | 2007-05-17 | 2011-07-12 | International Business Machines Corporation | Method for kinetically controlled etching of copper |
| US20090001373A1 (en) * | 2007-06-26 | 2009-01-01 | Kabushiki Kaisha Kobe Seiko Sho (Kobe Steel Ltd.) | Electrode of aluminum-alloy film with low contact resistance, method for production thereof, and display unit |
| EP2048207A1 (en) * | 2007-10-11 | 2009-04-15 | STMicroelectronics S.r.l. | Method of planarizing chalcogenide alloys, in particular for use in phase change memory devices |
| JP5270303B2 (ja) * | 2008-10-31 | 2013-08-21 | 日揮触媒化成株式会社 | 研磨用シリカゾルおよびその製造方法 |
| JP5326638B2 (ja) * | 2009-02-18 | 2013-10-30 | 富士電機株式会社 | 磁気記録媒体用ガラス基板の製造方法、それが使用される磁気記録媒体用ガラス基板、および、垂直磁気記録媒体 |
| US8382016B2 (en) * | 2009-02-25 | 2013-02-26 | Thiele Kaolin Company | Nano particle mineral pigment |
| US20140234639A1 (en) * | 2013-02-21 | 2014-08-21 | Prakash B Malla | Self binding nano particle mineral pigment |
| CN101928521B (zh) * | 2009-06-26 | 2014-09-03 | 盟智科技股份有限公司 | 研浆组成物及使用该研浆组成物的金属镶嵌结构制造方法 |
| WO2011031666A1 (en) | 2009-09-11 | 2011-03-17 | First Solar, Inc. | Photovoltaic back contact |
| US20110117696A1 (en) * | 2009-11-19 | 2011-05-19 | Air Liquide Electronics U.S. Lp | CdTe SURFACE TREATMENT FOR STABLE BACK CONTACTS |
| KR101271414B1 (ko) * | 2010-02-15 | 2013-06-05 | 미쯔비시 가스 케미칼 컴파니, 인코포레이티드 | 구리층 및 몰리브덴층을 포함하는 다층 박막용 에칭액 |
| JP5617387B2 (ja) * | 2010-07-06 | 2014-11-05 | 富士電機株式会社 | 垂直磁気記録媒体用基板の製造方法、および、該製造方法により製造される垂直磁気記録媒体用基板 |
| SG11201606187RA (en) * | 2010-09-08 | 2016-09-29 | Basf Se | Aqueous polishing composition and process for chemically mechanically polishing substrates containing silicon oxide dielectric and polysilicon films |
| WO2012032466A1 (en) * | 2010-09-08 | 2012-03-15 | Basf Se | Aqueous polishing compositions containing n-substituted diazenium dioxides and/or n'-hydroxy-diazenium oxide salts |
| JP5965907B2 (ja) * | 2010-09-08 | 2016-08-10 | ビーエーエスエフ ソシエタス・ヨーロピアBasf Se | 電気機器や機械機器・光学機器用の基板の化学機械研磨用の水性研磨組成物と方法 |
| WO2012036087A1 (ja) * | 2010-09-15 | 2012-03-22 | 旭硝子株式会社 | 研磨剤および研磨方法 |
| JP5979872B2 (ja) * | 2011-01-31 | 2016-08-31 | 花王株式会社 | 磁気ディスク基板の製造方法 |
| TWI605112B (zh) * | 2011-02-21 | 2017-11-11 | 福吉米股份有限公司 | 研磨用組成物 |
| JP5979871B2 (ja) * | 2011-03-09 | 2016-08-31 | 花王株式会社 | 磁気ディスク基板の製造方法 |
| US20120264303A1 (en) * | 2011-04-15 | 2012-10-18 | Taiwan Semiconductor Manufacturing Co., Ltd. | Chemical mechanical polishing slurry, system and method |
| US9443739B2 (en) | 2011-08-01 | 2016-09-13 | Basf Se | Process for the manufacture of semiconductor devices comprising the chemical mechanical polishing of elemental germanium and/or Si1-xGex material in the presence of a CMP composition comprising a specific organic compound |
| CN102344761A (zh) * | 2011-08-03 | 2012-02-08 | 南通海迅天恒纳米科技有限公司 | 一种铈掺杂二氧化硅溶胶的制备方法 |
| WO2013077368A1 (ja) * | 2011-11-25 | 2013-05-30 | 株式会社 フジミインコーポレーテッド | 研磨用組成物 |
| JP6077208B2 (ja) * | 2011-11-25 | 2017-02-08 | 株式会社フジミインコーポレーテッド | 研磨用組成物 |
| EP2794733B1 (en) * | 2011-12-21 | 2019-05-15 | Basf Se | Method for manufacturing cmp composition and application thereof |
| EP2802436B1 (en) * | 2012-01-10 | 2019-09-25 | Saint-Gobain Ceramics & Plastics, Inc. | Abrasive particles having complex shapes |
| JP6291026B2 (ja) * | 2013-03-15 | 2018-03-14 | エコラボ ユーエスエー インコーポレイティド | サファイアの表面を研磨する方法 |
| JP2013177617A (ja) * | 2013-05-09 | 2013-09-09 | Jgc Catalysts & Chemicals Ltd | 研磨用シリカゾルおよび研磨用組成物 |
| EP2810997A1 (en) * | 2013-06-05 | 2014-12-10 | Basf Se | A chemical mechanical polishing (cmp) composition |
| JP6407582B2 (ja) * | 2013-07-03 | 2018-10-17 | Hoya株式会社 | 基板の製造方法、多層反射膜付き基板の製造方法、マスクブランクの製造方法、転写用マスクの製造方法、及び基板加工装置 |
| US9190091B2 (en) * | 2013-08-02 | 2015-11-17 | HGST Netherlands, B.V. | Composition and method for planarized bit-patterned magnetic media |
| US9340706B2 (en) * | 2013-10-10 | 2016-05-17 | Cabot Microelectronics Corporation | Mixed abrasive polishing compositions |
| US20150114928A1 (en) * | 2013-10-30 | 2015-04-30 | Jia-Ni Chu | Abrasive Particles for Chemical Mechanical Polishing |
| CN104650739A (zh) * | 2013-11-22 | 2015-05-27 | 安集微电子(上海)有限公司 | 一种用于抛光二氧化硅基材的化学机械抛光液 |
| WO2016136447A1 (ja) * | 2015-02-26 | 2016-09-01 | 堺化学工業株式会社 | 負帯電性基板の研磨方法、及び、高表面平滑性の負帯電性基板の製造方法 |
| US10414947B2 (en) * | 2015-03-05 | 2019-09-17 | Cabot Microelectronics Corporation | Polishing composition containing ceria particles and method of use |
| US9505952B2 (en) * | 2015-03-05 | 2016-11-29 | Cabot Microelectronics Corporation | Polishing composition containing ceria abrasive |
| CN105463467A (zh) * | 2015-11-30 | 2016-04-06 | 江苏中晶科技有限公司 | 高精密弱碱性不锈钢抛光液及其制备方法 |
| US10066126B2 (en) * | 2016-01-06 | 2018-09-04 | Cabot Microelectronics Corporation | Tungsten processing slurry with catalyst |
| US10253216B2 (en) * | 2016-07-01 | 2019-04-09 | Versum Materials Us, Llc | Additives for barrier chemical mechanical planarization |
| US10752785B2 (en) * | 2016-09-09 | 2020-08-25 | IndusCo, Ltd. | Anti-slip botanical antimicrobial microemulsions |
| CN108728849A (zh) * | 2018-05-17 | 2018-11-02 | 合肥协耀玻璃制品有限公司 | 一种不锈钢材料用抛光剂及其制备方法 |
| CN108587478B (zh) * | 2018-07-03 | 2020-09-25 | 中国人民解放军国防科技大学 | 一种改性纳米二氧化硅复合抛光液及其应用 |
| US10907074B2 (en) * | 2019-07-03 | 2021-02-02 | Fujifilm Electronic Materials U.S.A., Inc. | Polishing compositions for reduced defectivity and methods of using the same |
| US20220411686A1 (en) * | 2019-12-04 | 2022-12-29 | 3M Innovative Properties Company | Particulate slurries and methods of making the same |
| ES2756948B2 (es) * | 2020-02-04 | 2022-12-19 | Drylyte Sl | Electrolito solido para el electropulido en seco de metales con moderador de actividad |
| US20210269674A1 (en) * | 2020-02-28 | 2021-09-02 | Fujimi Corporation | Polishing composition containing zirconia particles and an oxidizer |
| KR102526666B1 (ko) | 2021-06-17 | 2023-04-26 | 배진범 | 정전기 방지용 연마체 |
| CN115109520B (zh) * | 2022-06-01 | 2024-10-15 | 大连理工大学 | 用于单晶金刚石化学机械抛光加工的抛光液及其制备方法 |
Family Cites Families (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| SU817038A1 (ru) * | 1979-06-28 | 1981-03-30 | Всесоюзный Научно-Исследовательскийинститут Синтетических Смол | Полимерна абразивна композици |
| RU2064943C1 (ru) * | 1994-09-29 | 1996-08-10 | Институт неметаллических материалов СО РАН | Композиционный полимерный материал для абразивного инструмента |
| KR100313573B1 (ko) * | 1999-02-19 | 2001-11-07 | 안복현 | 연마용 조성물 |
| JP3099002B1 (ja) * | 1999-06-25 | 2000-10-16 | 茂徳科技股▲ふん▼有限公司 | 2段階化学機械研磨方法 |
| US6527817B1 (en) * | 1999-11-15 | 2003-03-04 | Cabot Microelectronics Corporation | Composition and method for planarizing surfaces |
| US6454820B2 (en) * | 2000-02-03 | 2002-09-24 | Kao Corporation | Polishing composition |
| US6471884B1 (en) * | 2000-04-04 | 2002-10-29 | Cabot Microelectronics Corporation | Method for polishing a memory or rigid disk with an amino acid-containing composition |
| EP2045307A1 (en) * | 2000-05-12 | 2009-04-08 | Nissan Chemical Industries, Ltd. | Polishing composition |
| JP4251516B2 (ja) * | 2000-05-12 | 2009-04-08 | 花王株式会社 | 研磨液組成物 |
| MY118582A (en) * | 2000-05-12 | 2004-12-31 | Kao Corp | Polishing composition |
| US6976905B1 (en) * | 2000-06-16 | 2005-12-20 | Cabot Microelectronics Corporation | Method for polishing a memory or rigid disk with a phosphate ion-containing polishing system |
| JP3945745B2 (ja) * | 2001-03-09 | 2007-07-18 | 三井金属鉱業株式会社 | セリウム系研摩材及び研摩材スラリー並びにセリウム系研摩材の製造方法 |
| JP2003197573A (ja) * | 2001-12-26 | 2003-07-11 | Ekc Technology Kk | メタル膜絶縁膜共存表面研磨用コロイダルシリカ |
| JP3748410B2 (ja) * | 2001-12-27 | 2006-02-22 | 株式会社東芝 | 研磨方法及び半導体装置の製造方法 |
| US6896942B2 (en) * | 2002-04-17 | 2005-05-24 | W. R. Grace & Co. -Conn. | Coating composition comprising colloidal silica and glossy ink jet recording sheets prepared therefrom |
-
2004
- 2004-07-09 US US10/564,842 patent/US20060175295A1/en not_active Abandoned
- 2004-07-09 JP JP2006520233A patent/JP2007531631A/ja active Pending
- 2004-07-09 BR BRPI0412515-0A patent/BRPI0412515A/pt not_active IP Right Cessation
- 2004-07-09 WO PCT/US2004/021998 patent/WO2005007770A1/en not_active Ceased
- 2004-07-09 PT PT47778345T patent/PT1660606E/pt unknown
- 2004-07-09 DK DK04777834.5T patent/DK1660606T3/da active
- 2004-07-09 KR KR1020067000642A patent/KR101134827B1/ko not_active Expired - Fee Related
- 2004-07-09 TW TW093120616A patent/TWI415926B/zh not_active IP Right Cessation
- 2004-07-09 CN CN2004800260037A patent/CN1849379B/zh not_active Expired - Fee Related
- 2004-07-09 RU RU2006104117/04A patent/RU2356926C2/ru not_active IP Right Cessation
- 2004-07-09 PL PL04777834T patent/PL1660606T3/pl unknown
- 2004-07-09 EP EP04777834.5A patent/EP1660606B1/en not_active Revoked
- 2004-07-09 CA CA002532114A patent/CA2532114A1/en not_active Abandoned
- 2004-07-09 AU AU2004257233A patent/AU2004257233A1/en not_active Abandoned
- 2004-07-09 MX MXPA06000251A patent/MXPA06000251A/es unknown
- 2004-07-09 ES ES04777834T patent/ES2436215T3/es not_active Expired - Lifetime
-
2006
- 2006-02-03 NO NO20060576A patent/NO20060576L/no not_active Application Discontinuation
Also Published As
| Publication number | Publication date |
|---|---|
| RU2006104117A (ru) | 2006-07-27 |
| KR20060041220A (ko) | 2006-05-11 |
| EP1660606A1 (en) | 2006-05-31 |
| MXPA06000251A (es) | 2006-03-30 |
| DK1660606T3 (da) | 2013-12-02 |
| NO20060576L (no) | 2006-02-03 |
| KR101134827B1 (ko) | 2012-04-13 |
| AU2004257233A1 (en) | 2005-01-27 |
| CN1849379B (zh) | 2011-12-14 |
| US20060175295A1 (en) | 2006-08-10 |
| PL1660606T3 (pl) | 2014-02-28 |
| WO2005007770A1 (en) | 2005-01-27 |
| CN1849379A (zh) | 2006-10-18 |
| EP1660606B1 (en) | 2013-09-04 |
| CA2532114A1 (en) | 2005-01-27 |
| RU2356926C2 (ru) | 2009-05-27 |
| TWI415926B (zh) | 2013-11-21 |
| ES2436215T3 (es) | 2013-12-27 |
| TW200516132A (en) | 2005-05-16 |
| JP2007531631A (ja) | 2007-11-08 |
| PT1660606E (pt) | 2013-12-09 |
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