BRPI0612383A2 - método e sistema para medir a curvatura de uma superfície de um objeto - Google Patents

método e sistema para medir a curvatura de uma superfície de um objeto

Info

Publication number
BRPI0612383A2
BRPI0612383A2 BRPI0612383A BRPI0612383A BRPI0612383A2 BR PI0612383 A2 BRPI0612383 A2 BR PI0612383A2 BR PI0612383 A BRPI0612383 A BR PI0612383A BR PI0612383 A BRPI0612383 A BR PI0612383A BR PI0612383 A2 BRPI0612383 A2 BR PI0612383A2
Authority
BR
Brazil
Prior art keywords
curvature
measuring
Prior art date
Application number
BRPI0612383A
Other languages
English (en)
Inventor
Daniel R Neal
Richard J Copland
Zino Altman
Original Assignee
Wavefront Sciences Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Wavefront Sciences Inc filed Critical Wavefront Sciences Inc
Publication of BRPI0612383A2 publication Critical patent/BRPI0612383A2/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/025—Testing optical properties by measuring geometrical properties or aberrations by determining the shape of the object to be tested
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/255—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures for measuring radius of curvature
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02—Testing optical properties
    • G01M11/0242—Testing optical properties by measuring geometrical properties or aberrations
    • G01M11/0257—Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested
    • G01M11/0264—Testing optical properties by measuring geometrical properties or aberrations by analyzing the image formed by the object to be tested by using targets or reference patterns

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Geometry (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
BRPI0612383A 2005-06-30 2006-06-29 método e sistema para medir a curvatura de uma superfície de um objeto BRPI0612383A2 (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US69498905P 2005-06-30 2005-06-30
PCT/US2006/025383 WO2007005527A2 (en) 2005-06-30 2006-06-29 Method and system for measuring the curvature of an optical surface

Publications (1)

Publication Number Publication Date
BRPI0612383A2 true BRPI0612383A2 (pt) 2016-09-06

Family

ID=37605005

Family Applications (1)

Application Number Title Priority Date Filing Date
BRPI0612383A BRPI0612383A2 (pt) 2005-06-30 2006-06-29 método e sistema para medir a curvatura de uma superfície de um objeto

Country Status (7)

Country Link
US (1) US7570351B2 (pt)
EP (1) EP1896792B1 (pt)
JP (1) JP5226510B2 (pt)
AU (1) AU2006266021B2 (pt)
BR (1) BRPI0612383A2 (pt)
CA (1) CA2612237C (pt)
WO (1) WO2007005527A2 (pt)

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7315359B2 (en) * 2004-12-31 2008-01-01 Dongbu Electronics Co., Ltd. Method for monitoring micro-lens curvature in-line
CA2648305C (en) 2006-04-07 2012-10-16 Amo Wavefront Sciences, Llc Geometric measurement system and method of measuring a geometric characteristic of an object
TW201022653A (en) * 2008-12-10 2010-06-16 Ind Tech Res Inst Inspection method and system for display
CN102735188B (zh) * 2012-06-21 2014-09-10 南京邮电大学 一种测量球面曲率半径的方法
US10603610B2 (en) * 2016-08-17 2020-03-31 Ingersoll-Rand Industrial U.S., Inc. Oil water separator diffuser cap extension to filter cartridge
JP7524119B2 (ja) * 2021-03-22 2024-07-29 株式会社東芝 光学装置、光学検査方法及び光学検査プログラム
FR3128018B1 (fr) * 2021-10-11 2023-10-27 Riber Instrument et procédé de mesure de courbure d’une surface d’un échantillon

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0624511B2 (ja) * 1986-03-25 1994-04-06 株式会社トプコン 眼科装置
US4993826A (en) * 1987-11-25 1991-02-19 Taunton Technologies, Inc. Topography measuring apparatus
US4902123A (en) * 1987-11-25 1990-02-20 Taunton Technologies, Inc. Topography measuring apparatus
JPH0265833A (ja) * 1988-08-31 1990-03-06 Topcon Corp オートケラトメータ
JPH06188173A (ja) * 1992-12-16 1994-07-08 Nikon Corp 表面位置検出装置
JPH09138181A (ja) * 1995-11-15 1997-05-27 Nikon Corp 光学系の屈折力および曲率半径の測定装置
US5873832A (en) * 1996-08-12 1999-02-23 Xeyex Corporation Method and apparatus for measuring properties of the eye using a virtual image
DE19911419A1 (de) * 1998-03-16 1999-10-14 Cyberoptics Corp Digitales Bereichssensorsystem
JP2003202216A (ja) * 2002-01-08 2003-07-18 Canon Inc 三次元画像処理方法、三次元画像処理装置、三次元画像処理システムおよび三次元画像処理プログラム
JP2004077270A (ja) * 2002-08-19 2004-03-11 Toppan Forms Co Ltd 膜厚測定装置および方法

Also Published As

Publication number Publication date
AU2006266021B2 (en) 2011-07-07
US7570351B2 (en) 2009-08-04
CA2612237A1 (en) 2007-01-11
AU2006266021A1 (en) 2007-01-11
US20070002334A1 (en) 2007-01-04
WO2007005527A2 (en) 2007-01-11
EP1896792A4 (en) 2012-07-25
JP2008545140A (ja) 2008-12-11
JP5226510B2 (ja) 2013-07-03
EP1896792A2 (en) 2008-03-12
CA2612237C (en) 2013-05-21
EP1896792B1 (en) 2013-07-10
WO2007005527A3 (en) 2007-05-24

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Legal Events

Date Code Title Description
B06G Technical and formal requirements: other requirements [chapter 6.7 patent gazette]

Free format text: SOLICITA-SE A REGULARIZACAO DA PROCURACAO, UMA VEZ QUE BASEADO NO ARTIGO 216 PAR 1O DA LPI, O DOCUMENTO DE PROCURACAO DEVE SER APRESENTADO NO ORIGINAL, TRASLADO OU FOTOCOPIA AUTENTICADA.

B11Z Dismissal: petition dismissal - article 216, par 2 of industrial property law

Free format text: REFERENTE A PETICAO 020070185066/RJ DE 28/12/2007.

B15G Petition not considered as such [chapter 15.7 patent gazette]

Free format text: A PETICAO DE NO 20080044103, APRESENTADA EM 25/03/2008, EM VIRTUDE DO DISPOSTO NOS ARTS. 219, II, DA LPI (LEI 9279 / 96) DE 14/05/1996, E CONSIDERADA COMO PETICAO NAO CONHECIDA, UMA VEZ QUE A PETICAO DE DEPOSITO FOI ARQUIVADA NA RPI NO 2135, DE 06/12/2011.

B06H Technical and formal requirements: requirement cancelled [chapter 6.8 patent gazette]
B11M Dismissal: decision cancelled
B08F Application fees: application dismissed [chapter 8.6 patent gazette]
B151 Others concerning applications: resolution cancelled

Free format text: ANULADA A PUBLICACAO DO DESPACHO 15.7, PUBLICADO NA RPI 2374 DE 05/07/2016 POR TER SIDO INDEVIDO.

B25F Entry of change of name and/or headquarter and transfer of application, patent and certif. of addition of invention: change of name on requirement

Owner name: WAVEFRONT SCIENCES, INC. (US)

B08K Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette]
B25E Requested change of name of applicant rejected

Owner name: WAVEFRONT SCIENCES, INC. (US)