BRPI0708509B8 - gerador de raios-x múltiplos, e, aparelho de formação de imagem de raios-x múltiplos - Google Patents

gerador de raios-x múltiplos, e, aparelho de formação de imagem de raios-x múltiplos

Info

Publication number
BRPI0708509B8
BRPI0708509B8 BRPI0708509A BRPI0708509A BRPI0708509B8 BR PI0708509 B8 BRPI0708509 B8 BR PI0708509B8 BR PI0708509 A BRPI0708509 A BR PI0708509A BR PI0708509 A BRPI0708509 A BR PI0708509A BR PI0708509 B8 BRPI0708509 B8 BR PI0708509B8
Authority
BR
Brazil
Prior art keywords
ray
beams
imaging apparatus
electron
transmission
Prior art date
Application number
BRPI0708509A
Other languages
English (en)
Inventor
Okunuki Masahiko
Tsujii Osamu
Tsukamoto Takeo
Original Assignee
Canon Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Kk filed Critical Canon Kk
Publication of BRPI0708509A2 publication Critical patent/BRPI0708509A2/pt
Publication of BRPI0708509B1 publication Critical patent/BRPI0708509B1/pt
Publication of BRPI0708509B8 publication Critical patent/BRPI0708509B8/pt

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/16—Vessels; Containers; Shields associated therewith
    • H01J35/18—Windows
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • H01J35/06—Cathodes
    • H01J35/065—Field emission, photo emission or secondary emission cathodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • H01J35/08—Anodes; Anti cathodes
    • H01J35/12—Cooling non-rotary anodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/16—Vessels; Containers; Shields associated therewith
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2235/00—X-ray tubes
    • H01J2235/06—Cathode assembly
    • H01J2235/062—Cold cathodes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2235/00—X-ray tubes
    • H01J2235/06—Cathode assembly
    • H01J2235/068—Multi-cathode assembly
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2235/00—X-ray tubes
    • H01J2235/16—Vessels
    • H01J2235/165—Shielding arrangements
    • H01J2235/166—Shielding arrangements against electromagnetic radiation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2235/00—X-ray tubes
    • H01J2235/16—Vessels
    • H01J2235/165—Shielding arrangements
    • H01J2235/168—Shielding arrangements against charged particles
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • H01J35/08—Anodes; Anti cathodes
    • H01J35/112—Non-rotating anodes
    • H01J35/116—Transmissive anodes

Landscapes

  • X-Ray Techniques (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

gerador de raios-x múltiplos, e, aparelho de formação de imagem de raios-x múltiplos um aparelho compacto pode formar feixes de raios-x múltiplos com boa controlabilidade. feixes de elétrons (e) emitidos pelos elementos de emissão de elétrons (15) de uma unidade geradora de feixe de elétrons múltiplos (12) recebem o efeito de lente de um eletrodo de lente (19). os feixes de elétrons resultantes são acelerados até o nível de potencial final por porções de uma porção alvo do tipo transmissão (13) de um eletrodo anodo (20). os feixes de raios-x múltiplos (x) gerados pela porção alvo do tipo transmissão (13) passam através de uma placa de blindagem de raios-x (23) e porções de extração de raios-x (24) em uma câmara de vácuo e são extraídos das janelas de extração de raios-x (27) de uma porção de parede (25) para a atmosfera.
BRPI0708509A 2006-03-03 2007-03-02 gerador de raios-x múltiplos, e, aparelho de formação de imagem de raios-x múltiplos BRPI0708509B8 (pt)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
JP2006-057846 2006-03-03
JP2006057846 2006-03-03
JP2007050942A JP4878311B2 (ja) 2006-03-03 2007-03-01 マルチｘ線発生装置
JP2007-050942 2007-03-01
PCT/JP2007/054090 WO2007100105A1 (ja) 2006-03-03 2007-03-02 マルチｘ線発生装置およびマルチｘ線撮影装置

Publications (3)

Publication Number Publication Date
BRPI0708509A2 BRPI0708509A2 (pt) 2011-05-31
BRPI0708509B1 BRPI0708509B1 (pt) 2019-04-02
BRPI0708509B8 true BRPI0708509B8 (pt) 2021-07-27

Family

ID=38459200

Family Applications (1)

Application Number Title Priority Date Filing Date
BRPI0708509A BRPI0708509B8 (pt) 2006-03-03 2007-03-02 gerador de raios-x múltiplos, e, aparelho de formação de imagem de raios-x múltiplos

Country Status (8)

Country Link
US (4) US7873146B2 (pt)
EP (2) EP2573791B1 (pt)
JP (1) JP4878311B2 (pt)
KR (2) KR101113093B1 (pt)
CN (2) CN101395691B (pt)
BR (1) BRPI0708509B8 (pt)
RU (1) RU2388103C1 (pt)
WO (1) WO2007100105A1 (pt)

Families Citing this family (135)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB0812864D0 (en) 2008-07-15 2008-08-20 Cxr Ltd Coolign anode
GB0525593D0 (en) 2005-12-16 2006-01-25 Cxr Ltd X-ray tomography inspection systems
US8243876B2 (en) 2003-04-25 2012-08-14 Rapiscan Systems, Inc. X-ray scanners
US9208988B2 (en) 2005-10-25 2015-12-08 Rapiscan Systems, Inc. Graphite backscattered electron shield for use in an X-ray tube
US10483077B2 (en) 2003-04-25 2019-11-19 Rapiscan Systems, Inc. X-ray sources having reduced electron scattering
US8094784B2 (en) 2003-04-25 2012-01-10 Rapiscan Systems, Inc. X-ray sources
US9046465B2 (en) 2011-02-24 2015-06-02 Rapiscan Systems, Inc. Optimization of the source firing pattern for X-ray scanning systems
JP5268340B2 (ja) * 2007-12-07 2013-08-21 キヤノン株式会社 Ｘ線撮影装置及びｘ線撮影方法
KR100895067B1 (ko) * 2007-12-17 2009-05-04 한국전자통신연구원 개별 어드레싱이 가능한 대면적 ｘ 선 시스템
JP5550209B2 (ja) * 2007-12-25 2014-07-16 キヤノン株式会社 Ｘ線撮影装置
JP4886713B2 (ja) * 2008-02-13 2012-02-29 キヤノン株式会社 Ｘ線撮影装置及びその制御方法
JP5367275B2 (ja) * 2008-02-18 2013-12-11 株式会社アールエフ 放射線撮像システム
JP5294653B2 (ja) 2008-02-28 2013-09-18 キヤノン株式会社 マルチｘ線発生装置及びｘ線撮影装置
JP5398157B2 (ja) * 2008-03-17 2014-01-29 キヤノン株式会社 Ｘ線撮影装置及びその制御方法
RU2366990C1 (ru) * 2008-04-02 2009-09-10 Государственное образовательное учреждение высшего профессионального образования "Оренбургский государственный университет" Способ мультиэнергетической рентгенографии
JP2010015711A (ja) * 2008-07-01 2010-01-21 Kyoto Univ 異極像結晶を用いたｘ線発生装置
JP4693884B2 (ja) * 2008-09-18 2011-06-01 キヤノン株式会社 マルチｘ線撮影装置及びその制御方法
JP5247363B2 (ja) 2008-11-11 2013-07-24 キヤノン株式会社 Ｘ線撮影装置
GB0901338D0 (en) 2009-01-28 2009-03-11 Cxr Ltd X-Ray tube electron sources
JP5416426B2 (ja) * 2009-02-03 2014-02-12 富士フイルム株式会社 放射線画像撮影装置
US8724872B1 (en) * 2009-02-25 2014-05-13 L-3 Communications Security And Detection Systems, Inc. Single radiation data from multiple radiation sources
CN102365703A (zh) * 2009-03-27 2012-02-29 皇家飞利浦电子股份有限公司 用于利用x射线管进行编码源成像的结构化的电子发射器
JP5346654B2 (ja) 2009-03-31 2013-11-20 キヤノン株式会社 放射線撮影装置及びその制御方法
JP5460106B2 (ja) 2009-04-03 2014-04-02 キヤノン株式会社 Ｘ線撮影装置及びその制御方法、コンピュータプログラム
JP5766184B2 (ja) * 2009-06-03 2015-08-19 ラピスカン システムズ、インコーポレイテッド Ｘ線管の中で使用されるグラファイト後方散乱電子シールド
KR101023713B1 (ko) 2009-06-16 2011-03-25 한국전기연구원 투과형 또는 반사형 모드의 선택이 가능한 듀얼 ｘ-선 발생장치
US8229074B2 (en) * 2009-08-17 2012-07-24 Indian Institute Of Science Carbon nanotube array for focused field emission
JP5641916B2 (ja) * 2010-02-23 2014-12-17 キヤノン株式会社 放射線発生装置および放射線撮像システム
JP5416006B2 (ja) 2010-03-23 2014-02-12 キヤノン株式会社 Ｘ線発生装置及びその制御方法
JP5661368B2 (ja) * 2010-08-04 2015-01-28 キヤノン株式会社 Ｘ線発生装置
JP2012066062A (ja) * 2010-08-24 2012-04-05 Fujifilm Corp 放射線撮影システム及び放射線撮影方法
US8320521B2 (en) * 2010-09-30 2012-11-27 General Electric Company Method and system for operating an electron beam system
CN103250225B (zh) 2010-12-10 2016-05-25 佳能株式会社 放射线产生装置和放射线成像装置
JP5455880B2 (ja) 2010-12-10 2014-03-26 キヤノン株式会社 放射線発生管、放射線発生装置ならびに放射線撮影装置
JP2012138203A (ja) * 2010-12-24 2012-07-19 Aet Inc Ｘ線発生装置とｘ線発生装置群を用いたｘ線照射装置
RS53452B (sr) * 2011-06-10 2014-12-31 Outotec Oyj Rendgenska cev i uređaj za analiziranje fluorescencije rendgenskih zraka koji koristi selektivnu ekscitaciju radijacije
CN103430630B (zh) * 2011-06-28 2016-01-20 株式会社东芝 X射线管球以及x射线ct装置
KR101773960B1 (ko) * 2011-06-30 2017-09-12 한국전자통신연구원 단층합성영상 시스템
JP5791401B2 (ja) 2011-07-11 2015-10-07 キヤノン株式会社 放射線発生装置及びそれを用いた放射線撮影装置
JP2013020792A (ja) 2011-07-11 2013-01-31 Canon Inc 放射線発生装置及びそれを用いた放射線撮影装置
JP6039282B2 (ja) 2011-08-05 2016-12-07 キヤノン株式会社 放射線発生装置及び放射線撮影装置
EP2740331B1 (en) 2011-08-05 2018-05-30 Canon Kabushiki Kaisha Radiation generating apparatus and radiation imaging apparatus
JP2013051165A (ja) * 2011-08-31 2013-03-14 Canon Inc 透過型ｘ線発生装置
JP5871529B2 (ja) * 2011-08-31 2016-03-01 キヤノン株式会社 透過型ｘ線発生装置及びそれを用いたｘ線撮影装置
JP5875297B2 (ja) 2011-08-31 2016-03-02 キヤノン株式会社 放射線発生管及びそれを用いた放射線発生装置、放射線撮影システム
JP5901180B2 (ja) 2011-08-31 2016-04-06 キヤノン株式会社 透過型ｘ線発生装置及びそれを用いたｘ線撮影装置
JP5871528B2 (ja) 2011-08-31 2016-03-01 キヤノン株式会社 透過型ｘ線発生装置及びそれを用いたｘ線撮影装置
JP5854707B2 (ja) * 2011-08-31 2016-02-09 キヤノン株式会社 透過型ｘ線発生管及び透過型ｘ線発生装置
WO2013046875A1 (ja) * 2011-09-29 2013-04-04 富士フイルム株式会社 放射線撮影システム及び放射線撮影方法
WO2013065762A1 (ja) * 2011-11-02 2013-05-10 富士フイルム株式会社 放射線照射装置、放射線照射方法、及びプログラム記憶媒体
US20150117599A1 (en) 2013-10-31 2015-04-30 Sigray, Inc. X-ray interferometric imaging system
JP2013128661A (ja) 2011-12-21 2013-07-04 Canon Inc ステレオｘ線撮影装置、ステレオｘ線撮影方法
US9058954B2 (en) 2012-02-20 2015-06-16 Georgia Tech Research Corporation Carbon nanotube field emission devices and methods of making same
JP5580843B2 (ja) * 2012-03-05 2014-08-27 双葉電子工業株式会社 Ｘ線管
JP6108671B2 (ja) 2012-03-13 2017-04-05 キヤノン株式会社 放射線撮影装置
JP2015515091A (ja) * 2012-03-16 2015-05-21 ナノックス イメージング ピーエルシー 電子放出構造を有する装置
JP2013218933A (ja) * 2012-04-10 2013-10-24 Canon Inc 微小焦点ｘ線発生装置及びｘ線撮影装置
WO2013184213A2 (en) * 2012-05-14 2013-12-12 The General Hospital Corporation A distributed, field emission-based x-ray source for phase contrast imaging
KR101917742B1 (ko) * 2012-07-06 2018-11-12 삼성전자주식회사 메쉬 전극 접합 구조체, 전자 방출 소자, 및 전자 방출 소자를 포함하는 전자 장치
CN104584179B (zh) 2012-08-16 2017-10-13 纳欧克斯影像有限公司 图像捕捉装置
JP5662393B2 (ja) * 2012-08-30 2015-01-28 株式会社アドバンテスト 電子ビーム検出器、電子ビーム処理装置及び電子ビーム検出器の製造方法
JP6099938B2 (ja) * 2012-11-13 2017-03-22 キヤノン株式会社 マルチｘ線発生管及びそれを用いたｘ線撮影システム
US9008278B2 (en) * 2012-12-28 2015-04-14 General Electric Company Multilayer X-ray source target with high thermal conductivity
CN203165848U (zh) * 2012-12-29 2013-08-28 清华大学 X光管
JP6116274B2 (ja) 2013-02-13 2017-04-19 キヤノン株式会社 放射線発生装置および該放射線発生装置を備える放射線撮影装置
JP6080610B2 (ja) * 2013-02-26 2017-02-15 キヤノン株式会社 マルチ放射線発生装置および放射線撮影システム
JP5693650B2 (ja) * 2013-05-09 2015-04-01 キヤノン株式会社 Ｘ線撮影装置及びｘ線撮影方法
JP2013154254A (ja) * 2013-05-24 2013-08-15 Canon Inc Ｘ線断層撮影装置
RU2578675C1 (ru) * 2013-06-28 2016-03-27 Демидова Елена Викторовна Многолучевая рентгеновская трубка
JP2015019987A (ja) * 2013-07-23 2015-02-02 キヤノン株式会社 マルチ放射線発生装置及び放射線撮影システム
JP6188470B2 (ja) * 2013-07-24 2017-08-30 キヤノン株式会社 放射線発生装置及びそれを用いた放射線撮影システム
KR20150024720A (ko) 2013-08-27 2015-03-09 삼성전자주식회사 평판형 엑스선 발생기 및 이를 구비하는 엑스선 영상 시스템
US9368316B2 (en) * 2013-09-03 2016-06-14 Electronics And Telecommunications Research Institute X-ray tube having anode electrode
US10295485B2 (en) 2013-12-05 2019-05-21 Sigray, Inc. X-ray transmission spectrometer system
US10269528B2 (en) 2013-09-19 2019-04-23 Sigray, Inc. Diverging X-ray sources using linear accumulation
US9448190B2 (en) 2014-06-06 2016-09-20 Sigray, Inc. High brightness X-ray absorption spectroscopy system
US10297359B2 (en) 2013-09-19 2019-05-21 Sigray, Inc. X-ray illumination system with multiple target microstructures
US9570265B1 (en) 2013-12-05 2017-02-14 Sigray, Inc. X-ray fluorescence system with high flux and high flux density
US9449781B2 (en) 2013-12-05 2016-09-20 Sigray, Inc. X-ray illuminators with high flux and high flux density
JP2016537797A (ja) * 2013-09-19 2016-12-01 シグレイ、インコーポレイテッド 直線累積を用いたｘ線ソース
US9390881B2 (en) 2013-09-19 2016-07-12 Sigray, Inc. X-ray sources using linear accumulation
CN104470179B (zh) * 2013-09-23 2017-10-24 清华大学 一种产生均整x射线辐射场的装置以及方法
JP5723432B2 (ja) * 2013-10-24 2015-05-27 キヤノン株式会社 Ｘ線撮影装置及びその制御方法
USRE48612E1 (en) 2013-10-31 2021-06-29 Sigray, Inc. X-ray interferometric imaging system
US10304580B2 (en) 2013-10-31 2019-05-28 Sigray, Inc. Talbot X-ray microscope
KR20150051820A (ko) * 2013-11-05 2015-05-13 삼성전자주식회사 투과형 평판 엑스레이 발생 장치 및 엑스레이 영상 시스템
EP3075000B1 (en) 2013-11-27 2024-08-21 Nano-X Imaging Ltd Electron emitting construct configured with ion bombardment resistant
JP6395373B2 (ja) 2013-11-29 2018-09-26 キヤノン株式会社 放射線発生ユニットおよび放射線撮影装置
JP6272043B2 (ja) * 2014-01-16 2018-01-31 キヤノン株式会社 Ｘ線発生管及びこれを用いたｘ線発生装置、ｘ線撮影システム
US9823203B2 (en) 2014-02-28 2017-11-21 Sigray, Inc. X-ray surface analysis and measurement apparatus
US9594036B2 (en) 2014-02-28 2017-03-14 Sigray, Inc. X-ray surface analysis and measurement apparatus
JP2015170424A (ja) * 2014-03-05 2015-09-28 株式会社日立メディコ Ｘ線発生装置
US9976971B2 (en) * 2014-03-06 2018-05-22 United Technologies Corporation Systems and methods for X-ray diffraction
US10401309B2 (en) 2014-05-15 2019-09-03 Sigray, Inc. X-ray techniques using structured illumination
CN105374654B (zh) 2014-08-25 2018-11-06 同方威视技术股份有限公司 电子源、x射线源、使用了该x射线源的设备
GB2531326B (en) * 2014-10-16 2020-08-05 Adaptix Ltd An X-Ray emitter panel and a method of designing such an X-Ray emitter panel
TWI552187B (zh) * 2014-11-20 2016-10-01 能資國際股份有限公司 冷陰極ｘ射線產生器的封裝結構及其抽真空的方法
US10352880B2 (en) 2015-04-29 2019-07-16 Sigray, Inc. Method and apparatus for x-ray microscopy
US10295486B2 (en) 2015-08-18 2019-05-21 Sigray, Inc. Detector for X-rays with high spatial and high spectral resolution
EP3171163B1 (en) * 2015-11-18 2022-05-04 FEI Company X-ray imaging technique
US10991539B2 (en) * 2016-03-31 2021-04-27 Nano-X Imaging Ltd. X-ray tube and a conditioning method thereof
US11282668B2 (en) * 2016-03-31 2022-03-22 Nano-X Imaging Ltd. X-ray tube and a controller thereof
WO2018035171A1 (en) * 2016-08-16 2018-02-22 Massachusetts Institute Of Technology Nanoscale x-ray tomosynthesis for rapid analysis of integrated circuit (ic) dies
US11145431B2 (en) * 2016-08-16 2021-10-12 Massachusetts Institute Of Technology System and method for nanoscale X-ray imaging of biological specimen
KR102830495B1 (ko) * 2016-10-19 2025-07-04 어답틱스 리미티드 Ｘ선 소스
US10247683B2 (en) 2016-12-03 2019-04-02 Sigray, Inc. Material measurement techniques using multiple X-ray micro-beams
WO2018175570A1 (en) 2017-03-22 2018-09-27 Sigray, Inc. Method of performing x-ray spectroscopy and x-ray absorption spectrometer system
CN109216139B (zh) * 2017-06-30 2024-06-21 同方威视技术股份有限公司 用于多焦点x射线管的壳体和多焦点x射线管
CN109216140B (zh) * 2017-06-30 2024-09-10 同方威视技术股份有限公司 多焦点x射线管和壳体
KR101966794B1 (ko) * 2017-07-12 2019-08-27 (주)선재하이테크 전자 집속 개선용 엑스선관
US10578566B2 (en) 2018-04-03 2020-03-03 Sigray, Inc. X-ray emission spectrometer system
AU2018425050B2 (en) * 2018-05-25 2024-01-11 Micro-X Limited A device for applying beamforming signal processing to RF modulated X-rays
US10845491B2 (en) 2018-06-04 2020-11-24 Sigray, Inc. Energy-resolving x-ray detection system
GB2591630B (en) 2018-07-26 2023-05-24 Sigray Inc High brightness x-ray reflection source
US10656105B2 (en) 2018-08-06 2020-05-19 Sigray, Inc. Talbot-lau x-ray source and interferometric system
US10962491B2 (en) 2018-09-04 2021-03-30 Sigray, Inc. System and method for x-ray fluorescence with filtering
DE112019004478T5 (de) 2018-09-07 2021-07-08 Sigray, Inc. System und verfahren zur röntgenanalyse mit wählbarer tiefe
JP7043381B2 (ja) * 2018-09-27 2022-03-29 富士フイルム株式会社 トモシンセシス撮影装置及びその作動方法
US11152183B2 (en) 2019-07-15 2021-10-19 Sigray, Inc. X-ray source with rotating anode at atmospheric pressure
JP7705852B2 (ja) * 2019-10-24 2025-07-10 ノヴァ メジャリング インスツルメンツ インコーポレイテッド パターン化ｘ線放出ターゲット
GB2589086B (en) * 2019-11-12 2023-09-13 Adaptix Ltd A method of obtaining x-ray images
US11437218B2 (en) 2019-11-14 2022-09-06 Massachusetts Institute Of Technology Apparatus and method for nanoscale X-ray imaging
US11404235B2 (en) 2020-02-05 2022-08-02 John Thomas Canazon X-ray tube with distributed filaments
EP3933881A1 (en) 2020-06-30 2022-01-05 VEC Imaging GmbH & Co. KG X-ray source with multiple grids
KR102902018B1 (ko) * 2020-09-24 2025-12-18 엘지전자 주식회사 엑스선 튜브 및 엑스선 촬영장치
CN114415225A (zh) * 2021-12-20 2022-04-29 核工业西南物理研究院 一种核聚变α粒子损失探测器
CN118541772A (zh) 2022-01-13 2024-08-23 斯格瑞公司 用于生成高通量低能量x射线的微焦x射线源
US12360067B2 (en) 2022-03-02 2025-07-15 Sigray, Inc. X-ray fluorescence system and x-ray source with electrically insulative target material
DE112023001408T5 (de) 2022-03-15 2025-02-13 Sigray, Inc. System und verfahren für die kompakte laminographie unter verwendung einer mikrofokus-transmissionsröntgenquelle und eines röntgendetektors mit variabler vergrösserung
DE112023002079T5 (de) 2022-05-02 2025-02-27 Sigray, Inc. Sequenzielles wellenlängendispersives röntgenspektrometer
US12230468B2 (en) 2022-06-30 2025-02-18 Varex Imaging Corporation X-ray system with field emitters and arc protection
JP2024012973A (ja) * 2022-07-19 2024-01-31 株式会社ニューフレアテクノロジー ブランキングアパーチャアレイシステム及びマルチ荷電粒子ビーム描画装置
US12181423B1 (en) 2023-09-07 2024-12-31 Sigray, Inc. Secondary image removal using high resolution x-ray transmission sources
CN117255468A (zh) * 2023-09-12 2023-12-19 清华大学 分布式x射线源以及具有该射线源的ct设备
WO2025181643A1 (en) * 2024-02-27 2025-09-04 Nano-X Imaging Ltd System and method for generating x-rays at multiple energy levels by a single device

Family Cites Families (40)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE407436C (de) * 1921-02-19 1924-12-23 Julius Edgar Lilienfeld Dr Roentgenroehre
GB268012A (en) * 1925-12-18 1927-03-18 Warnford Moppett Improvements in x-ray apparatus
FR984432A (fr) * 1943-09-23 1951-07-05 Tubix Sa Tube pour rayons x de grande longueur d'onde
US2919362A (en) * 1958-04-21 1959-12-29 Dunlee Corp Stabilized x-ray generator
DE2203403A1 (de) * 1972-01-25 1973-08-09 Siemens Ag Roentgen-strahlenquelle
SU746771A1 (ru) * 1977-07-05 1980-07-07 Предприятие П/Я Р-6495 Источник рентгеновского излучени
JPS59144129A (ja) * 1983-02-08 1984-08-18 Seiko Epson Corp Ｘ線源装置
US4870671A (en) * 1988-10-25 1989-09-26 X-Ray Technologies, Inc. Multitarget x-ray tube
JPH06196114A (ja) * 1992-12-25 1994-07-15 Toshiba Corp ベリリウム箔を用いた真空容器
JPH08264139A (ja) * 1995-03-22 1996-10-11 Hamamatsu Photonics Kk Ｘ線発生装置
JP3439590B2 (ja) 1995-12-22 2003-08-25 株式会社荏原製作所 Ｘ線源
FR2764731A1 (fr) * 1997-06-13 1998-12-18 Commissariat Energie Atomique Tube a rayons x comportant une source d'electrons a micropointes et des moyens de focalisations magnetique
DE19802668B4 (de) * 1998-01-24 2013-10-17 Smiths Heimann Gmbh Röntgenstrahlungserzeuger
FR2778757B1 (fr) * 1998-05-12 2001-10-05 Commissariat Energie Atomique Systeme d'inscription d'informations sur un support sensible aux rayons x
US6333968B1 (en) * 2000-05-05 2001-12-25 The United States Of America As Represented By The Secretary Of The Navy Transmission cathode for X-ray production
US20040213378A1 (en) * 2003-04-24 2004-10-28 The University Of North Carolina At Chapel Hill Computed tomography system for imaging of human and small animal
US7082182B2 (en) * 2000-10-06 2006-07-25 The University Of North Carolina At Chapel Hill Computed tomography system for imaging of human and small animal
US6876724B2 (en) * 2000-10-06 2005-04-05 The University Of North Carolina - Chapel Hill Large-area individually addressable multi-beam x-ray system and method of forming same
JP3848087B2 (ja) * 2001-01-18 2006-11-22 アロカ株式会社 放射線検出器
JP2002298772A (ja) * 2001-03-30 2002-10-11 Toshiba Corp 透過放射型ｘ線管およびその製造方法
JP2002352754A (ja) * 2001-05-29 2002-12-06 Shimadzu Corp 透過型ｘ線ターゲット
US7104686B2 (en) * 2001-05-30 2006-09-12 Canon Kabushiki Kaisha Radiographic apparatus
US6760403B2 (en) * 2001-10-25 2004-07-06 Seh America, Inc. Method and apparatus for orienting a crystalline body during radiation diffractometry
JP3639826B2 (ja) * 2002-04-03 2005-04-20 キヤノン株式会社 放射線撮影装置、プログラム、コンピュータ可読記憶媒体、及び放射線撮影システム
JP4150237B2 (ja) * 2002-09-20 2008-09-17 浜松ホトニクス株式会社 Ｘ線管
US6947522B2 (en) * 2002-12-20 2005-09-20 General Electric Company Rotating notched transmission x-ray for multiple focal spots
US7466799B2 (en) * 2003-04-09 2008-12-16 Varian Medical Systems, Inc. X-ray tube having an internal radiation shield
GB0309374D0 (en) * 2003-04-25 2003-06-04 Cxr Ltd X-ray sources
JP2004333131A (ja) * 2003-04-30 2004-11-25 Rigaku Corp 全反射蛍光ｘａｆｓ測定装置
JP4002984B2 (ja) 2003-05-12 2007-11-07 株式会社エーイーティー Ｘ線ｃｔ装置
JP2004357724A (ja) * 2003-05-30 2004-12-24 Toshiba Corp Ｘ線ｃｔ装置、ｘ線発生装置及びｘ線ｃｔ装置のデータ収集方法
JP4439882B2 (ja) * 2003-11-14 2010-03-24 キヤノン株式会社 放射線画像処理装置及び処理方法
US7042982B2 (en) * 2003-11-19 2006-05-09 Lucent Technologies Inc. Focusable and steerable micro-miniature x-ray apparatus
CN1674204B (zh) * 2004-03-24 2010-10-13 徐文廷 一种x射线管
JP4549093B2 (ja) * 2004-04-12 2010-09-22 キヤノン株式会社 画像処理装置及びその方法、プログラム
JP4497997B2 (ja) * 2004-04-21 2010-07-07 キヤノン株式会社 放射線画像撮影装置及びその制御方法
WO2006009053A1 (ja) 2004-07-15 2006-01-26 Hitachi Medical Corporation 固定陽極x線管とそれを用いたx線検査装置及びx線照射装置
US7240777B2 (en) 2004-08-16 2007-07-10 Guzik Technical Enterprises Constrained layer damping assembly
JP4088642B2 (ja) 2005-08-15 2008-05-21 株式会社エヌ・ティ・ティ・ドコモ 輸送管理方法、輸送管理サーバ、格納箱、輸送車両、及び、輸送管理システム
US7809114B2 (en) * 2008-01-21 2010-10-05 General Electric Company Field emitter based electron source for multiple spot X-ray

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US8861682B2 (en) 2014-10-14
CN102129948A (zh) 2011-07-20
WO2007100105A1 (ja) 2007-09-07
JP4878311B2 (ja) 2012-02-15
KR101113093B1 (ko) 2012-03-13
KR20080095295A (ko) 2008-10-28
EP1995757A1 (en) 2008-11-26
US7889844B2 (en) 2011-02-15
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EP2573791A2 (en) 2013-03-27
BRPI0708509B1 (pt) 2019-04-02
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EP2573791A3 (en) 2013-07-31
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