BRPI0718200A2 - aparelho para observar a aparência da superfície de uma amostra, e, método para observar a aparência da superfície de uma amostra - Google Patents

aparelho para observar a aparência da superfície de uma amostra, e, método para observar a aparência da superfície de uma amostra

Info

Publication number
BRPI0718200A2
BRPI0718200A2 BRPI0718200A BRPI0718200A BRPI0718200A2 BR PI0718200 A2 BRPI0718200 A2 BR PI0718200A2 BR PI0718200 A BRPI0718200 A BR PI0718200A BR PI0718200 A BRPI0718200 A BR PI0718200A BR PI0718200 A2 BRPI0718200 A2 BR PI0718200A2
Authority
BR
Brazil
Prior art keywords
observing
appearance
sample surface
sample
Prior art date
Application number
BRPI0718200A
Other languages
English (en)
Inventor
Wadman Sipke
Original Assignee
Koninl Philips Electronics Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninl Philips Electronics Nv filed Critical Koninl Philips Electronics Nv
Publication of BRPI0718200A2 publication Critical patent/BRPI0718200A2/pt
Publication of BRPI0718200A8 publication Critical patent/BRPI0718200A8/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G01N21/474—Details of optical heads therefor, e.g. using optical fibres
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B5/00—Measuring for diagnostic purposes; Identification of persons
    • A61B5/103—Measuring devices for testing the shape, pattern, colour, size or movement of the body or parts thereof, for diagnostic purposes
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B5/00—Measuring for diagnostic purposes; Identification of persons
    • A61B5/0059—Measuring for diagnostic purposes; Identification of persons using light, e.g. diagnosis by transillumination, diascopy, fluorescence
    • A—HUMAN NECESSITIES
    • A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B5/00—Measuring for diagnostic purposes; Identification of persons
    • A61B5/44—Detecting, measuring or recording for evaluating the integumentary system, e.g. skin, hair or nails
    • A61B5/441—Skin evaluation, e.g. for skin disorder diagnosis
    • A61B5/442—Evaluating skin mechanical properties, e.g. elasticity, hardness, texture, wrinkle assessment
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N2021/4704—Angular selective
    • G01N2021/4711—Multiangle measurement

Landscapes

  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • General Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Surgery (AREA)
  • Veterinary Medicine (AREA)
  • Engineering & Computer Science (AREA)
  • Biomedical Technology (AREA)
  • Heart & Thoracic Surgery (AREA)
  • Medical Informatics (AREA)
  • Molecular Biology (AREA)
  • Biophysics (AREA)
  • Animal Behavior & Ethology (AREA)
  • Public Health (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Dermatology (AREA)
  • Dentistry (AREA)
  • Oral & Maxillofacial Surgery (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Microscoopes, Condenser (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
BRPI0718200A 2006-10-05 2007-09-28 Aparelho para observar a aparência da superfície de uma amostra, e, método para observar a aparência da superfície de uma amostra BRPI0718200A8 (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP06121782 2006-10-05
PCT/IB2007/053943 WO2008041162A1 (en) 2006-10-05 2007-09-28 An apparatus and a method for observing the surface of a sample

Publications (2)

Publication Number Publication Date
BRPI0718200A2 true BRPI0718200A2 (pt) 2017-10-24
BRPI0718200A8 BRPI0718200A8 (pt) 2017-12-05

Family

ID=39027495

Family Applications (1)

Application Number Title Priority Date Filing Date
BRPI0718200A BRPI0718200A8 (pt) 2006-10-05 2007-09-28 Aparelho para observar a aparência da superfície de uma amostra, e, método para observar a aparência da superfície de uma amostra

Country Status (8)

Country Link
US (1) US8077319B2 (pt)
EP (1) EP2074408A1 (pt)
JP (1) JP5411698B2 (pt)
KR (1) KR101396146B1 (pt)
CN (1) CN101523195B (pt)
BR (1) BRPI0718200A8 (pt)
RU (1) RU2473887C2 (pt)
WO (1) WO2008041162A1 (pt)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2009115947A1 (en) * 2008-03-18 2009-09-24 Koninklijke Philips Electronics N.V. Apparatus for skin imaging, system for skin analysis
US9901746B2 (en) 2009-07-09 2018-02-27 Koninklijke Philips N.V. Skin radiation apparatus and method
US9816683B2 (en) * 2011-10-20 2017-11-14 Appotronics Corporation Limited Light sources system and projection device using the same
KR102475651B1 (ko) * 2015-12-30 2022-12-09 엘지이노텍 주식회사 인체 착용장치 및 이의 동작 방법
DE102016108079A1 (de) * 2016-05-02 2017-11-02 Carl Zeiss Microscopy Gmbh Artefaktreduktion bei der winkelselektiven beleuchtung
KR102310449B1 (ko) * 2019-11-14 2021-10-12 아나나스엘엘씨 유한책임회사 개선된 구조의 다면 비전 검사 시스템 및 검사 방법
KR102303073B1 (ko) * 2019-11-14 2021-09-17 아나나스엘엘씨 유한책임회사 다면 비전 검사 알고리즘 및 이를 이용한 시스템
KR102547544B1 (ko) * 2021-05-25 2023-06-27 한국기계연구원 3차원 조리개 모듈 및 이의 제조방법
CN115979171B (zh) * 2023-01-13 2025-09-23 中国科学院长春光学精密机械与物理研究所 凸面镜面形检测装置及方法

Family Cites Families (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4360275A (en) 1980-08-11 1982-11-23 Litton Systems Inc. Device for measurement of optical scattering
HU188795B (en) 1982-05-28 1986-05-28 Koezponti Elelmiszeripari Kutato Intezet,Hu Detecting arrangement for meassuring the intensity of radiation scattering at a given angle from a sample exposed to radiation of given angle of incidence
SU1326004A1 (ru) * 1985-07-30 1990-07-23 Институт Полупроводников Ан Усср Устройство дл контрол дефектов оптических поверхностей
US4815858A (en) * 1987-10-09 1989-03-28 The United States Of America As Represented By The Secretary Of The Navy Reflectometers
US5309339A (en) * 1992-06-24 1994-05-03 The Schepens Eye Research Institute, Inc. Concentrator for laser light
US5256871A (en) * 1992-12-22 1993-10-26 Emhart Glass Machinery Investments Inc. Machine for video inspection of glass containers with intersecting light beams
US5485263A (en) * 1994-08-18 1996-01-16 United Parcel Service Of America, Inc. Optical path equalizer
US5845002A (en) * 1994-11-03 1998-12-01 Sunkist Growers, Inc. Method and apparatus for detecting surface features of translucent objects
IL113428A0 (en) 1995-04-20 1995-07-31 Yissum Res Dev Co Glossmeter
DE19706973A1 (de) 1997-02-21 1998-08-27 Wacker Siltronic Halbleitermat Vorrichtung und Verfahren zur Untersuchung einer glatten Oberfläche einer Probe
US5912741A (en) * 1997-10-10 1999-06-15 Northrop Grumman Corporation Imaging scatterometer
JP3631365B2 (ja) 1998-02-10 2005-03-23 日本ペイント株式会社 変角分光反射率の測定方法
US6424413B1 (en) 1998-06-12 2002-07-23 Gretagmacbeth Llc Multi-channel integrating sphere
WO2000037923A1 (en) 1998-12-21 2000-06-29 Koninklijke Philips Electronics N.V. Scatterometer
DE19950588B4 (de) 1999-10-20 2013-07-18 Byk Gardner Gmbh Vorrichtung und Verfahren zur Qualitätskontrolle von insbesondere lackierten Oberflächen
DE1207386T1 (de) 2000-11-20 2003-05-28 Dow Global Technologies, Inc. Verfahren zum Charakterisieren des Aussehens eines Gegenstandes, zum Vorhersagen des Aussehens eines Gegenstandes und zum Herstellen eines Gegenstandes mit vorbestimmtem Aussehen, das optional auf Grundlage eines Referenzobjektes bestimmt wurde
US6538730B2 (en) 2001-04-06 2003-03-25 Kla-Tencor Technologies Corporation Defect detection system
US7190461B2 (en) 2002-07-17 2007-03-13 New York University Method and apparatus for determining a bidirectional reflectance distribution function, subsurface scattering or a bidirectional texture function of a subject
JP4824541B2 (ja) * 2003-02-28 2011-11-30 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 面を検査するスキャタロメータ及び方法
EP1611430B1 (en) 2003-02-28 2010-04-21 Koninklijke Philips Electronics N.V. A scatterometer and a method for observing a surface
US7145663B2 (en) 2004-09-20 2006-12-05 Zetetic Institute Catoptric imaging systems comprising pellicle and/or aperture-array beam-splitters and non-adaptive and/or adaptive catoptric surfaces
KR20070072514A (ko) 2004-10-08 2007-07-04 코닌클리케 필립스 일렉트로닉스 엔.브이. 테스트 표면의 광학 검사
US8018396B2 (en) * 2008-08-18 2011-09-13 Auden Techno Corp. Dual-resonance retractable antenna

Also Published As

Publication number Publication date
BRPI0718200A8 (pt) 2017-12-05
EP2074408A1 (en) 2009-07-01
JP2010506163A (ja) 2010-02-25
RU2009116927A (ru) 2010-11-10
JP5411698B2 (ja) 2014-02-12
CN101523195A (zh) 2009-09-02
US8077319B2 (en) 2011-12-13
RU2473887C2 (ru) 2013-01-27
WO2008041162A1 (en) 2008-04-10
KR20090064557A (ko) 2009-06-19
US20100091291A1 (en) 2010-04-15
KR101396146B1 (ko) 2014-05-19
CN101523195B (zh) 2012-04-25

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Legal Events

Date Code Title Description
B25D Requested change of name of applicant approved

Owner name: KONINKLIJKE PHILIPS N.V. (NL)

B25G Requested change of headquarter approved

Owner name: KONINKLIJKE PHILIPS N.V. (NL)

B07A Application suspended after technical examination (opinion) [chapter 7.1 patent gazette]
B08F Application dismissed because of non-payment of annual fees [chapter 8.6 patent gazette]

Free format text: REFERENTE A 11A ANUIDADE.

B08K Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette]

Free format text: EM VIRTUDE DO ARQUIVAMENTO PUBLICADO NA RPI 2481 DE 24-07-2018 E CONSIDERANDO AUSENCIA DE MANIFESTACAO DENTRO DOS PRAZOS LEGAIS, INFORMO QUE CABE SER MANTIDO O ARQUIVAMENTO DO PEDIDO DE PATENTE, CONFORME O DISPOSTO NO ARTIGO 12, DA RESOLUCAO 113/2013.