BRPI0719944A2 - Inspeção não destrutiva usando termografia a laser - ultrassom e infravermelho - Google Patents

Inspeção não destrutiva usando termografia a laser - ultrassom e infravermelho

Info

Publication number
BRPI0719944A2
BRPI0719944A2 BRPI0719944-9A2A BRPI0719944A BRPI0719944A2 BR PI0719944 A2 BRPI0719944 A2 BR PI0719944A2 BR PI0719944 A BRPI0719944 A BR PI0719944A BR PI0719944 A2 BRPI0719944 A2 BR PI0719944A2
Authority
BR
Brazil
Prior art keywords
ultrasound
infrared
destructive inspection
thermography
laser
Prior art date
Application number
BRPI0719944-9A2A
Other languages
English (en)
Inventor
Peter William Lorraine
Donald Robert Howard
Henry Israel Ringermacher
Marc Dubois
William Peter Drake
Original Assignee
Lockheed Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Lockheed Corp filed Critical Lockheed Corp
Publication of BRPI0719944A2 publication Critical patent/BRPI0719944A2/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/1717—Systems in which incident light is modified in accordance with the properties of the material investigated with a modulation of one or more physical properties of the sample during the optical investigation, e.g. electro-reflectance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/1702—Systems in which incident light is modified in accordance with the properties of the material investigated with opto-acoustic detection, e.g. for gases or analysing solids
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G01N25/72—Investigating presence of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/04—Analysing solids
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • G01N29/228—Details, e.g. general constructional or apparatus details related to high temperature conditions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N29/00—Investigating or analysing materials by the use of ultrasonic, sonic or infrasonic waves; Visualisation of the interior of objects by transmitting ultrasonic or sonic waves through the object
    • G01N29/22—Details, e.g. general constructional or apparatus details
    • G01N29/24—Probes
    • G01N29/2418—Probes using optoacoustic interaction with the material, e.g. laser radiation, photoacoustics
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/1702—Systems in which incident light is modified in accordance with the properties of the material investigated with opto-acoustic detection, e.g. for gases or analysing solids
    • G01N2021/1706—Systems in which incident light is modified in accordance with the properties of the material investigated with opto-acoustic detection, e.g. for gases or analysing solids in solids
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N2021/8472—Investigation of composite materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/71—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light thermally excited
    • G01N21/718—Laser microanalysis, i.e. with formation of sample plasma
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/069—Supply of sources
    • G01N2201/0696—Pulsed
    • G01N2201/0697—Pulsed lasers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/023—Solids
    • G01N2291/0231—Composite or layered materials

Landscapes

  • Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Optics & Photonics (AREA)
  • Acoustics & Sound (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Radiation Pyrometers (AREA)
BRPI0719944-9A2A 2007-12-06 2007-12-06 Inspeção não destrutiva usando termografia a laser - ultrassom e infravermelho BRPI0719944A2 (pt)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/US2007/025228 WO2009073014A1 (en) 2007-12-06 2007-12-06 Non-destructive inspection using laser- ultrasound and infrared thermography

Publications (1)

Publication Number Publication Date
BRPI0719944A2 true BRPI0719944A2 (pt) 2014-06-10

Family

ID=39327481

Family Applications (1)

Application Number Title Priority Date Filing Date
BRPI0719944-9A2A BRPI0719944A2 (pt) 2007-12-06 2007-12-06 Inspeção não destrutiva usando termografia a laser - ultrassom e infravermelho

Country Status (9)

Country Link
EP (1) EP2217908A1 (pt)
JP (1) JP5307155B2 (pt)
KR (1) KR101380491B1 (pt)
CN (1) CN101889194B (pt)
AU (1) AU2007361989B2 (pt)
BR (1) BRPI0719944A2 (pt)
CA (1) CA2672378A1 (pt)
IL (1) IL199202A (pt)
WO (1) WO2009073014A1 (pt)

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FR2981450B1 (fr) * 2011-10-17 2014-06-06 Eads Europ Aeronautic Defence Systeme et procede de controle de la qualite d'un objet
CN102621185B (zh) * 2012-03-29 2014-04-30 冯辅周 一种参数可控的超声脉冲激励装置
JP2015132475A (ja) * 2014-01-09 2015-07-23 学校法人東北学院 電子走査式光源走査装置及び方法
KR102399493B1 (ko) 2014-01-23 2022-05-19 삼성전자주식회사 반도체 칩 표면검사 장치 및 이를 이용한 반도체 칩의 표면검사 방법
FR3020678B1 (fr) * 2014-04-30 2021-06-25 Areva Np Procede d'examen photothermique et ensemble d'examen correspondant
JP6304880B2 (ja) * 2014-06-17 2018-04-04 株式会社Ihi 非破壊検査装置
JP2016007256A (ja) * 2014-06-23 2016-01-18 株式会社東芝 光音響計測装置及び光音響計測方法
KR101611726B1 (ko) 2014-09-11 2016-04-14 한국표준과학연구원 열팽창을 이용한 적외선 열화상 비파괴 검사 시스템 및 검사방법
CN104237381A (zh) * 2014-10-15 2014-12-24 北京新联铁科技股份有限公司 一种激光超声和高速摄像的图像融合的钢轨探伤方法
US9995670B2 (en) * 2015-12-09 2018-06-12 The Boeing Company Method of controlling a laser bond inspection system
CN105628739A (zh) * 2015-12-25 2016-06-01 黑龙江科技大学 面向大型工件的机器人激光红外无损检测装置及探损方法
FR3053469B1 (fr) * 2016-06-30 2018-08-17 Areva Np Procede d'inspection d'une surface metallique et dispositif associe
CN106768466B (zh) * 2016-11-16 2019-03-29 石友安 一种基于超声波的瞬态转捩热流的无损探测方法
US10241036B2 (en) * 2017-05-08 2019-03-26 Siemens Energy, Inc. Laser thermography
CN107356674A (zh) * 2017-08-17 2017-11-17 福建省永正工程质量检测有限公司 一种建筑钢结构超声检测装置
CN108333219A (zh) * 2018-03-19 2018-07-27 长沙理工大学 一种用于大型金属构件激光增材制造过程的在线无损检测方法
CN108444936B (zh) * 2018-03-27 2020-05-22 重庆交通大学 一种钢管混凝土脱空的无损检测系统及方法
KR102110399B1 (ko) * 2018-06-19 2020-05-13 전주대학교 산학협력단 검사 대상체의 내부 또는 표면 결함을 측정하기 위한 적외선 열화상 보정 방법
KR102283337B1 (ko) * 2019-05-13 2021-07-29 단국대학교 산학협력단 플라즈몬 효과를 이용한 결함 검출 방법
US11402356B2 (en) * 2019-12-12 2022-08-02 Provenance Laboratories LLC Object identification system and method
FR3106662B1 (fr) 2020-01-24 2022-04-15 Centre Nat Rech Scient Procede et systeme selectif de controle non destructif d’une piece mecanique
CN111426919A (zh) * 2020-04-08 2020-07-17 国网山西省电力公司电力科学研究院 基于激光诱导超声的盆式绝缘子检测装置
CN111982966B (zh) * 2020-08-11 2023-10-31 深圳大学 轨道结构无损及温度检测装置
CN112881427B (zh) * 2021-01-13 2023-06-13 四川宇然智荟科技有限公司 可见光和红外热成像的电子元器件缺陷检测装置及方法
CN113325027B (zh) * 2021-08-02 2021-09-28 西南交通大学 一种压电陶瓷测量冻土未冻水含量的方法
CN113866219A (zh) * 2021-08-30 2021-12-31 东南大学 气瓶内胆微裂纹的超声红外热成像检测方法及系统
CN114414658B (zh) * 2022-01-11 2024-04-09 南京大学 一种金属表面微裂纹深度的激光超声探测方法
CN117571712B (zh) * 2023-08-17 2024-07-16 哈尔滨工业大学 一种重用航天器多类型跨尺度损伤的混频激光诱导超声红外多场成像检测装置与方法
CN118518686B (zh) * 2024-05-27 2025-01-03 湖南科技学院 基于不可移动文物的木质文物含水率检测系统及方法
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Also Published As

Publication number Publication date
IL199202A (en) 2013-04-30
CA2672378A1 (en) 2009-06-11
AU2007361989A1 (en) 2009-06-11
JP2011506927A (ja) 2011-03-03
KR20100099040A (ko) 2010-09-10
CN101889194B (zh) 2014-06-18
CN101889194A (zh) 2010-11-17
AU2007361989B2 (en) 2013-10-03
EP2217908A1 (en) 2010-08-18
KR101380491B1 (ko) 2014-04-01
JP5307155B2 (ja) 2013-10-02
WO2009073014A1 (en) 2009-06-11

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Legal Events

Date Code Title Description
B07A Application suspended after technical examination (opinion) [chapter 7.1 patent gazette]
B09B Patent application refused [chapter 9.2 patent gazette]
B09B Patent application refused [chapter 9.2 patent gazette]

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