BRPI0818025A2 - Método para o tratamento de plasma de metal ou substratos de isolamento, dispositivo para o tratamento de metal ou substratos de isolamento por plasma - Google Patents
Método para o tratamento de plasma de metal ou substratos de isolamento, dispositivo para o tratamento de metal ou substratos de isolamento por plasmaInfo
- Publication number
- BRPI0818025A2 BRPI0818025A2 BRPI0818025A BRPI0818025A2 BR PI0818025 A2 BRPI0818025 A2 BR PI0818025A2 BR PI0818025 A BRPI0818025 A BR PI0818025A BR PI0818025 A2 BRPI0818025 A2 BR PI0818025A2
- Authority
- BR
- Brazil
- Prior art keywords
- plasma
- insulating substrates
- treating metal
- treating
- metal
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/321—Radio frequency generated discharge the radio frequency energy being inductively coupled to the plasma
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
- H05H1/00—Generating plasma; Handling plasma
- H05H1/24—Generating plasma
- H05H1/46—Generating plasma using applied electromagnetic fields, e.g. high frequency or microwave energy
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23F—NON-MECHANICAL REMOVAL OF METALLIC MATERIAL FROM SURFACE; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL; MULTI-STEP PROCESSES FOR SURFACE TREATMENT OF METALLIC MATERIAL INVOLVING AT LEAST ONE PROCESS PROVIDED FOR IN CLASS C23 AND AT LEAST ONE PROCESS COVERED BY SUBCLASS C21D OR C22F OR CLASS C25
- C23F1/00—Etching metallic material by chemical means
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32623—Mechanical discharge control means
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32697—Electrostatic control
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32733—Means for moving the material to be treated
- H01J37/32752—Means for moving the material to be treated for moving the material across the discharge
- H01J37/32761—Continuous moving
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
Landscapes
- Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Analytical Chemistry (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Materials Engineering (AREA)
- Electromagnetism (AREA)
- General Chemical & Material Sciences (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Plasma Technology (AREA)
- Cleaning In General (AREA)
- Electron Sources, Ion Sources (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP07119011.0 | 2007-10-22 | ||
| EP07119011A EP2053631A1 (fr) | 2007-10-22 | 2007-10-22 | Procédé et dispositif pour le traitement par plasma de substrats au défilé |
| PCT/EP2008/063354 WO2009053235A1 (fr) | 2007-10-22 | 2008-10-06 | Procede et dispositif pour le traitement par plasma de substrats au defile |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| BRPI0818025A2 true BRPI0818025A2 (pt) | 2015-03-24 |
| BRPI0818025B1 BRPI0818025B1 (pt) | 2019-12-03 |
Family
ID=39233067
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| BRPI0818025-3A BRPI0818025B1 (pt) | 2007-10-22 | 2008-10-06 | método para o tratamento de plasma de substratos metálicos ou isolantes, e dispositivo para o tratamento de substratos metálicos ou isolantes por plasma |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US8835797B2 (pt) |
| EP (2) | EP2053631A1 (pt) |
| JP (1) | JP5462796B2 (pt) |
| KR (1) | KR101550472B1 (pt) |
| CN (1) | CN101884086B (pt) |
| AU (1) | AU2008315375A1 (pt) |
| BR (1) | BRPI0818025B1 (pt) |
| WO (1) | WO2009053235A1 (pt) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102625559B (zh) * | 2012-03-30 | 2014-06-04 | 安徽航天环境工程有限公司 | 长寿命双重点火的等离子体点火枪 |
| JP5861045B2 (ja) * | 2013-03-28 | 2016-02-16 | パナソニックIpマネジメント株式会社 | プラズマ処理装置及び方法 |
| CN106880401B (zh) * | 2017-03-28 | 2023-05-26 | 成都美创医疗科技股份有限公司 | 一种等离子清创手术刀 |
| CN110536530A (zh) * | 2018-09-20 | 2019-12-03 | 北京北方华创微电子装备有限公司 | 磁增强法拉第屏蔽结构及感应耦合等离子体源 |
| CN110560346B (zh) * | 2019-09-12 | 2022-05-13 | 广东小天才科技有限公司 | 一种电子产品外壳的制作方法、电子产品外壳及电子产品 |
| EP4084040A1 (en) | 2021-04-29 | 2022-11-02 | voestalpine Stahl GmbH | Method and devices for plasma treatment |
Family Cites Families (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3381916B2 (ja) * | 1990-01-04 | 2003-03-04 | マトソン テクノロジー,インコーポレイテッド | 低周波誘導型高周波プラズマ反応装置 |
| US5811022A (en) * | 1994-11-15 | 1998-09-22 | Mattson Technology, Inc. | Inductive plasma reactor |
| JP2001358131A (ja) * | 1995-05-19 | 2001-12-26 | Hitachi Ltd | プラズマ処理方法及びプラズマ処理装置 |
| TW279240B (en) * | 1995-08-30 | 1996-06-21 | Applied Materials Inc | Parallel-plate icp source/rf bias electrode head |
| KR100428428B1 (ko) * | 1996-04-12 | 2004-04-28 | 가부시끼가이샤 히다치 세이사꾸쇼 | 플라즈마 처리장치 |
| US6097157A (en) * | 1998-04-09 | 2000-08-01 | Board Of Regents, The University Of Texas System | System for ion energy control during plasma processing |
| US6101971A (en) * | 1998-05-13 | 2000-08-15 | Axcelis Technologies, Inc. | Ion implantation control using charge collection, optical emission spectroscopy and mass analysis |
| US6300643B1 (en) * | 1998-08-03 | 2001-10-09 | Varian Semiconductor Equipment Associates, Inc. | Dose monitor for plasma doping system |
| DE69919499T2 (de) * | 1999-01-14 | 2005-09-08 | Vlaamse Instelling Voor Technologisch Onderzoek, Afgekort V.I.T.O. | Vorrichtung zum Aufbringen von Beschichtungen auf ein Substrat durch eine induktiv-angekoppelte magnetisch-begrenzte Plasmaquelle |
| US6287643B1 (en) * | 1999-09-30 | 2001-09-11 | Novellus Systems, Inc. | Apparatus and method for injecting and modifying gas concentration of a meta-stable or atomic species in a downstream plasma reactor |
| TW534928B (en) * | 2000-03-31 | 2003-06-01 | Lam Res Corp | Apparatus and methods for actively controlling RF peak-to-peak voltage in an inductively coupled plasma etching system |
| US6592710B1 (en) * | 2001-04-12 | 2003-07-15 | Lam Research Corporation | Apparatus for controlling the voltage applied to an electrostatic shield used in a plasma generator |
| EP1178134A1 (fr) * | 2000-08-04 | 2002-02-06 | Cold Plasma Applications C.P.A. | Procédé et dispositif pour traiter des substrats métalliques au défilé par plasma |
| US6459066B1 (en) * | 2000-08-25 | 2002-10-01 | Board Of Regents, The University Of Texas System | Transmission line based inductively coupled plasma source with stable impedance |
| US20020170678A1 (en) * | 2001-05-18 | 2002-11-21 | Toshio Hayashi | Plasma processing apparatus |
| US20040194890A1 (en) * | 2001-09-28 | 2004-10-07 | Tokyo Electron Limited | Hybrid plasma processing apparatus |
| JP3889280B2 (ja) * | 2002-01-07 | 2007-03-07 | 忠弘 大見 | プラズマ処理装置 |
| US6946054B2 (en) * | 2002-02-22 | 2005-09-20 | Tokyo Electron Limited | Modified transfer function deposition baffles and high density plasma ignition therewith in semiconductor processing |
| US7223321B1 (en) * | 2002-08-30 | 2007-05-29 | Lam Research Corporation | Faraday shield disposed within an inductively coupled plasma etching apparatus |
| US8012306B2 (en) * | 2006-02-15 | 2011-09-06 | Lam Research Corporation | Plasma processing reactor with multiple capacitive and inductive power sources |
-
2007
- 2007-10-22 EP EP07119011A patent/EP2053631A1/fr not_active Withdrawn
-
2008
- 2008-10-06 KR KR1020107010470A patent/KR101550472B1/ko active Active
- 2008-10-06 WO PCT/EP2008/063354 patent/WO2009053235A1/fr not_active Ceased
- 2008-10-06 BR BRPI0818025-3A patent/BRPI0818025B1/pt active IP Right Grant
- 2008-10-06 EP EP08843182.0A patent/EP2208218B1/fr active Active
- 2008-10-06 AU AU2008315375A patent/AU2008315375A1/en not_active Abandoned
- 2008-10-06 CN CN200880118815.2A patent/CN101884086B/zh active Active
- 2008-10-06 US US12/739,305 patent/US8835797B2/en active Active
- 2008-10-06 JP JP2010530391A patent/JP5462796B2/ja active Active
Also Published As
| Publication number | Publication date |
|---|---|
| KR20100102095A (ko) | 2010-09-20 |
| BRPI0818025B1 (pt) | 2019-12-03 |
| EP2208218B1 (fr) | 2016-03-16 |
| WO2009053235A1 (fr) | 2009-04-30 |
| JP5462796B2 (ja) | 2014-04-02 |
| EP2053631A1 (fr) | 2009-04-29 |
| EP2208218A1 (fr) | 2010-07-21 |
| JP2011501869A (ja) | 2011-01-13 |
| KR101550472B1 (ko) | 2015-09-04 |
| CN101884086A (zh) | 2010-11-10 |
| CN101884086B (zh) | 2012-11-21 |
| AU2008315375A1 (en) | 2009-04-30 |
| US20100308022A1 (en) | 2010-12-09 |
| US8835797B2 (en) | 2014-09-16 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| B25C | Requirement related to requested transfer of rights |
Owner name: INDUSTRIAL PLASMA SERVICES AND TECHNOLOGIES - IPST |
|
| B25A | Requested transfer of rights approved |
Owner name: ADVANCED GALVANISATION AG (CH) |
|
| B06T | Formal requirements before examination [chapter 6.20 patent gazette] | ||
| B06F | Objections, documents and/or translations needed after an examination request according [chapter 6.6 patent gazette] | ||
| B06A | Patent application procedure suspended [chapter 6.1 patent gazette] | ||
| B09A | Decision: intention to grant [chapter 9.1 patent gazette] | ||
| B16A | Patent or certificate of addition of invention granted [chapter 16.1 patent gazette] |
Free format text: PRAZO DE VALIDADE: 10 (DEZ) ANOS CONTADOS A PARTIR DE 03/12/2019, OBSERVADAS AS CONDICOES LEGAIS. (CO) 10 (DEZ) ANOS CONTADOS A PARTIR DE 03/12/2019, OBSERVADAS AS CONDICOES LEGAIS |
|
| B25G | Requested change of headquarter approved |
Owner name: ADVANCED GALVANISATION AG (CH) |
|
| B25A | Requested transfer of rights approved |
Owner name: NEOVAC GMBH (DE) |