BRPI0912816A2 - sistema de inspeção de raios-x de energia elevada utilizando um feixe no formato de leque e detectores de retrodispersão colimada - Google Patents

sistema de inspeção de raios-x de energia elevada utilizando um feixe no formato de leque e detectores de retrodispersão colimada

Info

Publication number
BRPI0912816A2
BRPI0912816A2 BRPI0912816A BRPI0912816A BRPI0912816A2 BR PI0912816 A2 BRPI0912816 A2 BR PI0912816A2 BR PI0912816 A BRPI0912816 A BR PI0912816A BR PI0912816 A BRPI0912816 A BR PI0912816A BR PI0912816 A2 BRPI0912816 A2 BR PI0912816A2
Authority
BR
Brazil
Prior art keywords
fan
high energy
inspection system
shaped beam
ray inspection
Prior art date
Application number
BRPI0912816A
Other languages
English (en)
Inventor
Edward James Morton
Original Assignee
Rapiscan Systems Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rapiscan Systems Inc filed Critical Rapiscan Systems Inc
Publication of BRPI0912816A2 publication Critical patent/BRPI0912816A2/pt
Publication of BRPI0912816B1 publication Critical patent/BRPI0912816B1/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G01V5/222—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays measuring scattered radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials by using a combination of at least two measurements at least one being a transmission measurement and one a scatter measurement
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203—Measuring back scattering
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01V—GEOPHYSICS; GRAVITATIONAL MEASUREMENTS; DETECTING MASSES OR OBJECTS; TAGS
    • G01V5/00—Prospecting or detecting by the use of ionising radiation, e.g. of natural or induced radioactivity
    • G01V5/20—Detecting prohibited goods, e.g. weapons, explosives, hazardous substances, contraband or smuggled objects
    • G01V5/22—Active interrogation, i.e. by irradiating objects or goods using external radiation sources, e.g. using gamma rays or cosmic rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/05—Investigating materials by wave or particle radiation by diffraction, scatter or reflection
    • G01N2223/053—Investigating materials by wave or particle radiation by diffraction, scatter or reflection back scatter

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • High Energy & Nuclear Physics (AREA)
  • General Life Sciences & Earth Sciences (AREA)
  • Geophysics (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Immunology (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Health & Medical Sciences (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • X-Ray Techniques (AREA)
BRPI0912816A 2008-05-20 2009-05-20 sistema e método de escaneamento para escanear um objeto BRPI0912816B1 (pt)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GBGB0809107.6A GB0809107D0 (en) 2008-05-20 2008-05-20 Scannign systems
PCT/GB2009/001275 WO2009141613A1 (en) 2008-05-20 2009-05-20 High energy x-ray inspection.system using a fan-shaped beam and collimated backscatter detectors

Publications (2)

Publication Number Publication Date
BRPI0912816A2 true BRPI0912816A2 (pt) 2015-10-13
BRPI0912816B1 BRPI0912816B1 (pt) 2020-04-28

Family

ID=39596162

Family Applications (1)

Application Number Title Priority Date Filing Date
BRPI0912816A BRPI0912816B1 (pt) 2008-05-20 2009-05-20 sistema e método de escaneamento para escanear um objeto

Country Status (5)

Country Link
US (2) US8831176B2 (pt)
BR (1) BRPI0912816B1 (pt)
GB (2) GB0809107D0 (pt)
MX (1) MX2010012667A (pt)
WO (1) WO2009141613A1 (pt)

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BRPI0912816B1 (pt) 2020-04-28
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US20110135060A1 (en) 2011-06-09
GB2472356A (en) 2011-02-02
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US8831176B2 (en) 2014-09-09
US20150078519A1 (en) 2015-03-19
US9465135B2 (en) 2016-10-11

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