BRPI0917090A2 - dispositivo para a detecção sem contato do grau de secura de uma camada de verniz e um método para a mesma - Google Patents

dispositivo para a detecção sem contato do grau de secura de uma camada de verniz e um método para a mesma

Info

Publication number
BRPI0917090A2
BRPI0917090A2 BRPI0917090A BRPI0917090A BRPI0917090A2 BR PI0917090 A2 BRPI0917090 A2 BR PI0917090A2 BR PI0917090 A BRPI0917090 A BR PI0917090A BR PI0917090 A BRPI0917090 A BR PI0917090A BR PI0917090 A2 BRPI0917090 A2 BR PI0917090A2
Authority
BR
Brazil
Prior art keywords
dryness
degree
varnish layer
contact detecting
detecting
Prior art date
Application number
BRPI0917090A
Other languages
English (en)
Inventor
Rebecca Siewert
Rolf Bense
Original Assignee
Airbus Operations Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Airbus Operations Gmbh filed Critical Airbus Operations Gmbh
Publication of BRPI0917090A2 publication Critical patent/BRPI0917090A2/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/359—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using near infrared light
    • F—MECHANICAL ENGINEERING; LIGHTING; HEATING; WEAPONS; BLASTING
    • F26—DRYING
    • F26B—DRYING SOLID MATERIALS OR OBJECTS BY REMOVING LIQUID THEREFROM
    • F26B25/00—Details of general application not covered by group F26B21/00 or F26B23/00
    • F26B25/22—Controlling the drying process in dependence on liquid content of solid materials or objects
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3563—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing solids; Preparation of samples therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3581—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared light; using Terahertz radiation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47—Scattering, i.e. diffuse reflection
    • G01N21/4738—Diffuse reflection, e.g. also for testing fluids, fibrous materials
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/26—Oils; Viscous liquids; Paints; Inks
    • G01N33/32—Paints; Inks
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/27—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration
    • G01N21/272—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands using photo-electric detection ; circuits for computing concentration for following a reaction, e.g. for determining photometrically a reaction rate (photometric cinetic analysis)
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3554—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for determining moisture content

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Pathology (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Analytical Chemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Food Science & Technology (AREA)
  • Mathematical Physics (AREA)
  • Medicinal Chemistry (AREA)
  • Toxicology (AREA)
  • Mechanical Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Drying Of Solid Materials (AREA)
  • Application Of Or Painting With Fluid Materials (AREA)
  • Coating Apparatus (AREA)
BRPI0917090A 2008-08-06 2009-07-07 dispositivo para a detecção sem contato do grau de secura de uma camada de verniz e um método para a mesma BRPI0917090A2 (pt)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US18809908P 2008-08-06 2008-08-06
DE102008041052A DE102008041052B4 (de) 2008-08-06 2008-08-06 Vorrichtung zur berührungslosen Ermittlung des Trocknungsgrades einer Lackschicht sowie Verfahren
PCT/EP2009/058627 WO2010015475A1 (de) 2008-08-06 2009-07-07 Vorrichtung zur berührungslosen ermittlung des trocknungsgrades einer lackschicht sowie verfahren

Publications (1)

Publication Number Publication Date
BRPI0917090A2 true BRPI0917090A2 (pt) 2016-02-16

Family

ID=41501378

Family Applications (1)

Application Number Title Priority Date Filing Date
BRPI0917090A BRPI0917090A2 (pt) 2008-08-06 2009-07-07 dispositivo para a detecção sem contato do grau de secura de uma camada de verniz e um método para a mesma

Country Status (9)

Country Link
US (1) US8674705B2 (pt)
EP (1) EP2310783B1 (pt)
JP (1) JP2011529785A (pt)
CN (1) CN102112831B (pt)
BR (1) BRPI0917090A2 (pt)
CA (1) CA2731033A1 (pt)
DE (1) DE102008041052B4 (pt)
RU (1) RU2011100724A (pt)
WO (1) WO2010015475A1 (pt)

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DE102010030159A1 (de) * 2010-06-16 2011-12-22 Robert Bosch Gmbh Prüfvorrichtung zur Überprüfung der Qualität einer Farb- oder Lackschicht
DE102011121689B4 (de) 2011-01-13 2025-05-22 Heidelberger Druckmaschinen Ag Verfahren und Vorrichtung zur Ermittlung des Härtungsgrades von Druckfarben
CN103837491B (zh) * 2012-11-21 2018-11-23 上海宝钢工业技术服务有限公司 带钢表面涂层含水率红外光谱测量模型的建立方法
PL2808636T3 (pl) * 2013-05-30 2016-07-29 Flooring Technologies Ltd Sposób określania wilgotności w warstwie żywicy na płycie podłożowej
JP6454955B2 (ja) * 2013-09-11 2019-01-23 株式会社リコー 乾燥装置、画像形成装置及び制御装置
FR3012218B1 (fr) 2013-10-17 2015-12-04 Aircelle Sa Procede d’evaluation de l’endommagement d’un materiau composite recouvert d’une peinture, mesurant sur le spectrogramme deux criteres distincts
CN104677852A (zh) * 2013-11-27 2015-06-03 上海宝钢工业技术服务有限公司 带钢氧化镁涂层质量在线检测系统
CN105092537B (zh) * 2014-04-28 2021-07-13 深圳迈瑞生物医疗电子股份有限公司 样本涂片涂层干燥度检测方法、装置、样本涂片干燥装置
US9997079B2 (en) 2014-12-12 2018-06-12 Amazon Technologies, Inc. Commercial and general aircraft avoidance using multi-spectral wave detection
US9761147B2 (en) 2014-12-12 2017-09-12 Amazon Technologies, Inc. Commercial and general aircraft avoidance using light pattern detection
US9685089B2 (en) * 2014-12-12 2017-06-20 Amazon Technologies, Inc. Commercial and general aircraft avoidance using acoustic pattern recognition
CN104503809A (zh) * 2015-01-08 2015-04-08 大唐微电子技术有限公司 一种实现应用下载更新的方法及装置
US10247814B2 (en) 2015-01-20 2019-04-02 National Institute Of Standards And Technology Phase shift detector process for making and use of same
JP6750826B2 (ja) * 2016-01-18 2020-09-02 株式会社クボタ 乾燥機
WO2018024339A1 (en) 2016-08-04 2018-02-08 Hp Indigo B.V. Online surface resistance measuring of primed substrates to evaluate drying state
RU2697427C2 (ru) * 2017-01-11 2019-08-14 Федеральное государственное казенное военное образовательное учреждение высшего образования "Военная академия материально-технического обеспечения имени генерала армии А.В. Хрулёва" Диагностический комплекс для контроля состояния защитного лакокрасочного покрытия артиллерийских боеприпасов
US20180229437A1 (en) * 2017-02-16 2018-08-16 Ford Global Technologies, Llc Windshield bond strength assessment by terahertz spectroscopy
JP2021120198A (ja) * 2020-01-30 2021-08-19 株式会社リコー 分析方法、分析装置、印刷装置、および、印刷システム
JP2021120199A (ja) * 2020-01-30 2021-08-19 株式会社リコー 分析方法、分析装置、印刷装置、および、印刷システム
KR102230894B1 (ko) * 2020-06-19 2021-03-23 (주)씨엘팜 건조도(lod) 측정기를 이용하여 제조 정밀도를 높인 odf 제조 시스템 및 방법
US12437132B2 (en) 2020-11-18 2025-10-07 Axalta Coating Systems Ip Co., Llc Methods and devices for estimating a component transmission loss of radar signal
US11592544B2 (en) * 2020-11-18 2023-02-28 Axalta Coating Systems Ip Co., Llc Methods and devices for estimating a component transmission loss of radar signal
CN113137853B (zh) * 2021-04-26 2022-10-21 四川蜀冷冷暖设备有限公司 一种适用于烘干机的智能控制方法
CN117761048B (zh) * 2023-02-02 2024-06-11 嘉兴市叁壹工程检测有限公司 一种防水涂料的干燥阶段检测识别方法及系统
JP2025103577A (ja) * 2023-12-27 2025-07-09 ａｒｔｉｅｎｃｅ株式会社 印刷装置及び印刷物の製造方法
CN119713822B (zh) * 2025-03-03 2025-11-25 杭州元创新型材料科技有限公司 一种喷涂生产线在线干燥度干燥阶段检测识别方法及系统

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Also Published As

Publication number Publication date
US8674705B2 (en) 2014-03-18
EP2310783A1 (de) 2011-04-20
CN102112831A (zh) 2011-06-29
US20110199098A1 (en) 2011-08-18
RU2011100724A (ru) 2012-09-20
JP2011529785A (ja) 2011-12-15
EP2310783B1 (de) 2016-03-30
CN102112831B (zh) 2014-08-06
WO2010015475A9 (de) 2010-04-08
DE102008041052B4 (de) 2010-04-15
WO2010015475A4 (de) 2010-06-03
CA2731033A1 (en) 2010-02-11
DE102008041052A1 (de) 2010-02-11
WO2010015475A1 (de) 2010-02-11

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B11A Dismissal acc. art.33 of ipl - examination not requested within 36 months of filing
B11Y Definitive dismissal - extension of time limit for request of examination expired [chapter 11.1.1 patent gazette]