BRPI0918099A2 - dispositivo para a medição tridimensional de um objeto e método de medição tridimensional de um objeto - Google Patents

dispositivo para a medição tridimensional de um objeto e método de medição tridimensional de um objeto

Info

Publication number
BRPI0918099A2
BRPI0918099A2 BRPI0918099A BRPI0918099A BRPI0918099A2 BR PI0918099 A2 BRPI0918099 A2 BR PI0918099A2 BR PI0918099 A BRPI0918099 A BR PI0918099A BR PI0918099 A BRPI0918099 A BR PI0918099A BR PI0918099 A2 BRPI0918099 A2 BR PI0918099A2
Authority
BR
Brazil
Prior art keywords
dimensional measurement
dimensional
measurement
Prior art date
Application number
BRPI0918099A
Other languages
English (en)
Inventor
David Nabs
Kai Gensecke
Original Assignee
Aimess Services Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Aimess Services Gmbh filed Critical Aimess Services Gmbh
Publication of BRPI0918099A2 publication Critical patent/BRPI0918099A2/pt
Publication of BRPI0918099B1 publication Critical patent/BRPI0918099B1/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
    • G01B11/25—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object
    • G01B11/2513—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures by projecting a pattern, e.g. one or more lines, moiré fringes on the object with several lines being projected in more than one direction, e.g. grids, patterns
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Length Measuring Devices By Optical Means (AREA)
BRPI0918099-0A 2008-12-19 2009-05-07 Dispositivo para a medição tridimensional de um objeto e método de medição tridimensional de um objeto BRPI0918099B1 (pt)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102008064104.9 2008-12-19
DE102008064104.9A DE102008064104B4 (de) 2008-12-19 2008-12-19 Vorrichtung und Verfahren zum dreidimensionalen optischen Vermessen von stark reflektierenden oder durchsichtigen Objekten
PCT/EP2009/003275 WO2010069409A1 (de) 2008-12-19 2009-05-07 Vorrichtung und verfahren zum dreidimensionalen optischen vermessen von stark reflektierenden oder durchsichtigen objekten

Publications (2)

Publication Number Publication Date
BRPI0918099A2 true BRPI0918099A2 (pt) 2016-07-26
BRPI0918099B1 BRPI0918099B1 (pt) 2019-07-02

Family

ID=40910787

Family Applications (1)

Application Number Title Priority Date Filing Date
BRPI0918099-0A BRPI0918099B1 (pt) 2008-12-19 2009-05-07 Dispositivo para a medição tridimensional de um objeto e método de medição tridimensional de um objeto

Country Status (16)

Country Link
US (1) US20110285823A1 (pt)
EP (1) EP2370781B1 (pt)
JP (1) JP5777524B2 (pt)
KR (1) KR20110110159A (pt)
CN (1) CN102257353B (pt)
BR (1) BRPI0918099B1 (pt)
CA (1) CA2746191C (pt)
DE (1) DE102008064104B4 (pt)
ES (1) ES2781351T3 (pt)
HU (1) HUE049026T2 (pt)
MX (1) MX2011006556A (pt)
PL (1) PL2370781T3 (pt)
PT (1) PT2370781T (pt)
RU (1) RU2495371C2 (pt)
SI (1) SI2370781T1 (pt)
WO (1) WO2010069409A1 (pt)

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TWI482484B (zh) * 2011-06-17 2015-04-21 Wistron Corp 立體顯示系統及其方法
CN103376071B (zh) * 2012-04-20 2017-06-30 德律科技股份有限公司 三维测量系统与三维测量方法
TWI546518B (zh) * 2012-04-20 2016-08-21 德律科技股份有限公司 三維量測系統與三維量測方法
JP2014163690A (ja) * 2013-02-21 2014-09-08 Mitsutoyo Corp 形状測定装置
DE202015102791U1 (de) * 2015-05-29 2015-07-01 Nikolaus Kreuzhermes System zur Erfassung von Bilddaten einer Oberfläche eines Objekts und Kamerasystem zur Verwendung in einem solchen System
DE102015211954B4 (de) * 2015-06-26 2017-12-28 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Verfahren und Vorrichtung zum berührungslosen Vermessen einer Objektoberfläche
US9958259B2 (en) 2016-01-12 2018-05-01 Canon Kabushiki Kaisha Depth value measurement
KR102015384B1 (ko) * 2017-11-15 2019-08-28 주식회사 마인즈아이 투명면 및 반사면 검사 방법 및 장치
CN109059806B (zh) * 2018-07-26 2019-09-06 河北工业大学 一种基于红外条纹的镜面物体三维面形测量装置及方法
DE102020201536A1 (de) 2020-02-07 2021-08-12 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung eingetragener Verein Verfahren und Vorrichtung zum berührungslosen Vermessen einer Objektoberfläche
WO2021257734A1 (en) 2020-06-18 2021-12-23 Arizona Board Of Regents On Behalf Of The University Of Arizona Freeform surface metrology and deflectometry
CN113188474B (zh) * 2021-05-06 2022-09-23 山西大学 一种用于高反光材质复杂物体成像的图像序列采集系统及其三维形貌重建方法
EP4231001A1 (en) * 2022-02-16 2023-08-23 Carl Zeiss Vision International GmbH Testing device and testing method
DE102022128499B3 (de) * 2022-10-27 2023-11-16 Thyssenkrupp Steel Europe Ag Verfahren und Vorrichtung zur Bestimmung der Planheit eines Metallbandes

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US4171917A (en) * 1974-07-02 1979-10-23 Centre De Recherches Metallurgiques-Centrum Voor Research In De Metallurgie Determining the profile of a surface of an object
US4511252A (en) * 1975-08-27 1985-04-16 Robotic Vision Systems, Inc. Arrangement for sensing the geometric characteristics of an object
US4920385A (en) * 1984-02-14 1990-04-24 Diffracto Ltd. Panel surface flaw inspection
JP3166185B2 (ja) * 1990-05-15 2001-05-14 横河電機株式会社 赤外線厚さ計
JPH05180632A (ja) * 1991-12-26 1993-07-23 I N R Kenkyusho:Kk 三次元形状測定方法及びその装置
JPH05231832A (ja) * 1992-02-24 1993-09-07 I N R Kenkyusho:Kk 三次元形状測定方法及び装置
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JP3414624B2 (ja) * 1997-09-16 2003-06-09 松下電器産業株式会社 実時間レンジファインダ
JPH11257930A (ja) * 1998-03-13 1999-09-24 Nidek Co Ltd 三次元形状測定装置
RU2128892C1 (ru) * 1998-05-27 1999-04-10 Лейпи Эмиль Густавович Электрический инфракрасный нагреватель
DE10006663B4 (de) * 2000-02-15 2006-10-05 Metronom Ag Verfahren zur Vermessung von langwelligen Oberflächenstrukturen
US6754370B1 (en) * 2000-08-14 2004-06-22 The Board Of Trustees Of The Leland Stanford Junior University Real-time structured light range scanning of moving scenes
JP2003232620A (ja) * 2002-02-08 2003-08-22 Canon Inc 透明膜の形状計測方法及び装置
JP3700778B2 (ja) * 2002-03-14 2005-09-28 三菱電機株式会社 赤外線撮像装置
DE10217068B4 (de) * 2002-04-17 2005-09-15 Michael Dr.-Ing. Gandyra Verfahren zum optischen Messen der Form reflektierender und streuender Freiformflächen
US7440590B1 (en) * 2002-05-21 2008-10-21 University Of Kentucky Research Foundation System and technique for retrieving depth information about a surface by projecting a composite image of modulated light patterns
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DE20216852U1 (de) 2002-10-28 2003-03-27 ViALUX Messtechnik + Bildverarbeitung GmbH, 09126 Chemnitz Vorrichtung zur Oberflächenprüfung
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FR2870935A1 (fr) * 2004-05-25 2005-12-02 Insidix Sarl Dispositif de mesure de deformations de surface
DE102004033526A1 (de) * 2004-07-08 2006-02-02 Universität Karlsruhe (TH) Institut für Mess- und Regelungstechnik Verfahren und Vorrichtung zur Analyse zumindest partiell reflektierender Oberflächen
JP2006170744A (ja) * 2004-12-15 2006-06-29 Tohoku Techno Arch Co Ltd ３次元距離計測装置
DE102005018656B4 (de) * 2005-04-21 2007-04-12 GOM - Gesellschaft für Optische Meßtechnik mbH Projektor für eine Anordnung zum dreidimensionalen optischen Vermessen von Objekten
WO2008008774A2 (en) * 2006-07-10 2008-01-17 The Board Of Trustees Of The University Of Illinois Interferometric synthetic aperture microscopy
US8284392B2 (en) * 2007-03-13 2012-10-09 3D-Shape Gmbh Method and apparatus for the three-dimensional measurement of the shape and the local surface normal of preferably specular objects
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WO2010070383A1 (en) * 2008-12-16 2010-06-24 Sabanci Universitesi A 3d scanner

Also Published As

Publication number Publication date
CA2746191A1 (en) 2010-06-24
CN102257353A (zh) 2011-11-23
BRPI0918099B1 (pt) 2019-07-02
WO2010069409A8 (de) 2010-08-05
WO2010069409A1 (de) 2010-06-24
HUE049026T2 (hu) 2020-08-28
PL2370781T3 (pl) 2020-10-19
DE102008064104B4 (de) 2014-06-18
CN102257353B (zh) 2013-10-23
KR20110110159A (ko) 2011-10-06
EP2370781A1 (de) 2011-10-05
PT2370781T (pt) 2020-04-23
ES2781351T3 (es) 2020-09-01
RU2011123399A (ru) 2013-01-27
DE102008064104A1 (de) 2010-07-01
EP2370781B1 (de) 2020-01-22
JP5777524B2 (ja) 2015-09-09
JP2012512400A (ja) 2012-05-31
MX2011006556A (es) 2011-10-21
SI2370781T1 (sl) 2020-06-30
CA2746191C (en) 2016-10-25
RU2495371C2 (ru) 2013-10-10
US20110285823A1 (en) 2011-11-24

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Legal Events

Date Code Title Description
B06F Objections, documents and/or translations needed after an examination request according [chapter 6.6 patent gazette]
B06T Formal requirements before examination [chapter 6.20 patent gazette]
B09A Decision: intention to grant [chapter 9.1 patent gazette]
B16A Patent or certificate of addition of invention granted [chapter 16.1 patent gazette]

Free format text: PRAZO DE VALIDADE: 10 (DEZ) ANOS CONTADOS A PARTIR DE 02/07/2019, OBSERVADAS AS CONDICOES LEGAIS. (CO) 10 (DEZ) ANOS CONTADOS A PARTIR DE 02/07/2019, OBSERVADAS AS CONDICOES LEGAIS

B25A Requested transfer of rights approved

Owner name: AIMESS GMBH (DE)

B25G Requested change of headquarter approved

Owner name: AIMESS GMBH (DE)

B21F Lapse acc. art. 78, item iv - on non-payment of the annual fees in time

Free format text: REFERENTE A 15A ANUIDADE.

B24J Lapse because of non-payment of annual fees (definitively: art 78 iv lpi, resolution 113/2013 art. 12)

Free format text: EM VIRTUDE DA EXTINCAO PUBLICADA NA RPI 2774 DE 05-03-2024 E CONSIDERANDO AUSENCIA DE MANIFESTACAO DENTRO DOS PRAZOS LEGAIS, INFORMO QUE CABE SER MANTIDA A EXTINCAO DA PATENTE E SEUS CERTIFICADOS, CONFORME O DISPOSTO NO ARTIGO 12, DA RESOLUCAO 113/2013.