CA2158146A1 - Radiometre actif servant a effectuer des mesures a etalonnage automatique de la temperature d'un fourneau - Google Patents
Radiometre actif servant a effectuer des mesures a etalonnage automatique de la temperature d'un fourneauInfo
- Publication number
- CA2158146A1 CA2158146A1 CA002158146A CA2158146A CA2158146A1 CA 2158146 A1 CA2158146 A1 CA 2158146A1 CA 002158146 A CA002158146 A CA 002158146A CA 2158146 A CA2158146 A CA 2158146A CA 2158146 A1 CA2158146 A1 CA 2158146A1
- Authority
- CA
- Canada
- Prior art keywords
- radiometer
- receiver
- millimeter
- temperature
- probe beam
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
- 238000009529 body temperature measurement Methods 0.000 title claims abstract description 10
- 239000000523 sample Substances 0.000 claims abstract description 22
- 230000005855 radiation Effects 0.000 claims abstract description 13
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical group [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 claims description 14
- 229910002804 graphite Inorganic materials 0.000 claims description 14
- 239000010439 graphite Substances 0.000 claims description 14
- 238000006243 chemical reaction Methods 0.000 claims description 2
- 230000000903 blocking effect Effects 0.000 claims 1
- 238000005259 measurement Methods 0.000 abstract description 2
- 239000000463 material Substances 0.000 description 6
- 238000002310 reflectometry Methods 0.000 description 6
- 230000001427 coherent effect Effects 0.000 description 4
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 3
- 239000004809 Teflon Substances 0.000 description 3
- 229920006362 Teflon® Polymers 0.000 description 3
- 229910052802 copper Inorganic materials 0.000 description 3
- 239000010949 copper Substances 0.000 description 3
- 238000012544 monitoring process Methods 0.000 description 3
- 230000003287 optical effect Effects 0.000 description 3
- 238000012935 Averaging Methods 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 2
- 239000011449 brick Substances 0.000 description 2
- 239000004020 conductor Substances 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 231100001261 hazardous Toxicity 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 229910052751 metal Inorganic materials 0.000 description 2
- 239000011819 refractory material Substances 0.000 description 2
- 239000004698 Polyethylene Substances 0.000 description 1
- 239000011358 absorbing material Substances 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000005670 electromagnetic radiation Effects 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 230000010354 integration Effects 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- GWUSZQUVEVMBPI-UHFFFAOYSA-N nimetazepam Chemical compound N=1CC(=O)N(C)C2=CC=C([N+]([O-])=O)C=C2C=1C1=CC=CC=C1 GWUSZQUVEVMBPI-UHFFFAOYSA-N 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- -1 polyethylene Polymers 0.000 description 1
- 229920000573 polyethylene Polymers 0.000 description 1
- 230000000644 propagated effect Effects 0.000 description 1
- 238000005067 remediation Methods 0.000 description 1
- 239000000779 smoke Substances 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- 230000007704 transition Effects 0.000 description 1
- 239000002699 waste material Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K17/00—Measuring quantity of heat
- G01K17/003—Measuring quantity of heat for measuring the power of light beams, e.g. laser beams
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/52—Radiation pyrometry, e.g. infrared or optical thermometry using comparison with reference sources, e.g. disappearing-filament pyrometer
- G01J5/53—Reference sources, e.g. standard lamps; Black bodies
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K11/00—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00
- G01K11/006—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00 using measurement of the effect of a material on microwaves or longer electromagnetic waves, e.g. measuring temperature via microwaves emitted by the object
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K11/00—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00
- G01K11/12—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00 using changes in colour, translucency or reflectance
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Optics & Photonics (AREA)
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Combustion & Propulsion (AREA)
- Electromagnetism (AREA)
- Radiation Pyrometers (AREA)
Abstract
Radiomètre à faisceau de sondage superposé à son champ de perception et permettant d'effectuer des mesures de température. Ce radiomètre comprend un récepteur hétérodyne d'ondes millimétriques/sous-millimétriques, doté d'une source d'ondes millimétriques/sous-millimétriques en vue d'effectuer le sondage. Le récepteur est conçu pour recevoir un rayonnement émis par une surface dont la température doit être mesurée. Ce rayonnement comprend une partie constituée de l'énergie émise de la surface et une partie constituée de l'énergie réfléchie par la surface, qui elle-même contient l'énergie du faisceau de sondage réfléchie par la surface. La partie d'énergie émise de la surface est associée à la température de surface, et la partie d'énergie réfléchie par la surface est associée au pouvoir émissif de ladite surface. La mesure simultanée du pouvoir émissif de la surface permet l'étalonnage en temps réel de la mesure de température.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US08/181,706 US5573339A (en) | 1994-01-14 | 1994-01-14 | Active radiometer for self-calibrated furnace temperature measurements |
| US08/181,706 | 1994-01-14 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CA2158146A1 true CA2158146A1 (fr) | 1995-07-20 |
Family
ID=22665439
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CA002158146A Abandoned CA2158146A1 (fr) | 1994-01-14 | 1995-01-12 | Radiometre actif servant a effectuer des mesures a etalonnage automatique de la temperature d'un fourneau |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US5573339A (fr) |
| EP (1) | EP0689678A1 (fr) |
| JP (1) | JPH08511107A (fr) |
| CA (1) | CA2158146A1 (fr) |
| WO (1) | WO1995019575A1 (fr) |
Families Citing this family (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5785426A (en) * | 1994-01-14 | 1998-07-28 | Massachusetts Institute Of Technology | Self-calibrated active pyrometer for furnace temperature measurements |
| US6012840A (en) * | 1997-01-27 | 2000-01-11 | The Regents Of The University Of California | Single-fiber multi-color pyrometry |
| US6682216B1 (en) * | 1999-12-16 | 2004-01-27 | The Regents Of The University Of California | Single-fiber multi-color pyrometry |
| JP3819298B2 (ja) | 2000-01-21 | 2006-09-06 | インテグレイテッド エンバイロンメンタル テクノロジーズ, エルエルシー. | 廃棄物を処理する方法および装置 |
| US6352192B1 (en) * | 2000-02-29 | 2002-03-05 | Motorola, Inc. | System and method to control solder reflow furnace with wafer surface characterization |
| GB0005925D0 (en) * | 2000-03-10 | 2000-05-03 | Univ Glasgow | Radiometer antenna cavities |
| CA2520776C (fr) * | 2003-04-01 | 2012-05-08 | Shell Internationale Research Maatschappij B.V. | Procede d'epoxydation olefinique et catalyseur a utiliser dans ce procede |
| US20080290265A1 (en) * | 2007-05-21 | 2008-11-27 | Robert Patrick Daly | System and method of calibrating a millimeter wave radiometer using an optical chopper |
| US8003425B2 (en) * | 2008-05-14 | 2011-08-23 | International Business Machines Corporation | Methods for forming anti-reflection structures for CMOS image sensors |
| US7759755B2 (en) * | 2008-05-14 | 2010-07-20 | International Business Machines Corporation | Anti-reflection structures for CMOS image sensors |
| US7997121B2 (en) * | 2008-07-11 | 2011-08-16 | Savannah River Nuclear Solutions, Llc | Milliwave melter monitoring system |
| US20140035779A1 (en) * | 2012-07-31 | 2014-02-06 | Radiometrics Corporation | Highly accurate calibration of microwave radiometry devices |
| US10876898B2 (en) | 2018-08-08 | 2020-12-29 | National Technology & Engineering Solutions Of Sandia, Llc | Passive millimeter wave radiometer system for calibration of infrared cameras |
| US11187587B1 (en) * | 2020-08-12 | 2021-11-30 | Rohde & Schwarz Gmbh & Co. Kg | Calibration device and method of calibrating a microwave radiometer |
| JP7693315B2 (ja) * | 2020-12-25 | 2025-06-17 | イビデン株式会社 | 黒鉛材の製造方法 |
| CN112729605B (zh) * | 2021-02-26 | 2022-08-02 | 王世有 | 一种基于光谱吸收原理的光纤测温系统 |
Family Cites Families (20)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4292638A (en) * | 1971-06-17 | 1981-09-29 | Sperry Corporation | Augmented radiometric system |
| CH547487A (de) * | 1972-07-27 | 1974-03-29 | Bbc Brown Boveri & Cie | Verfahren zur beruehrungslosen und materialunabhaengigen temperaturmessung an oberflaechen mittels infrarot-pyrometer. |
| DE2803480C2 (de) * | 1978-01-27 | 1984-11-22 | Philips Patentverwaltung Gmbh, 2000 Hamburg | Verfahren und Anordnung zur Messung der physikalischen Objekttemperatur mittels Mikrowellen |
| JPS5939385B2 (ja) * | 1980-01-31 | 1984-09-22 | 第一化成株式会社 | ガラス繊維の表面処理法 |
| JPS56108944A (en) * | 1980-02-01 | 1981-08-28 | Mitsubishi Electric Corp | Microwave radiometer |
| JPS57161521A (en) * | 1981-03-31 | 1982-10-05 | Chino Works Ltd | Radiation thermometer |
| JPS58171643A (ja) * | 1982-04-01 | 1983-10-08 | Nippon Steel Corp | 管状物体の温度測定方法及び装置 |
| US4568199A (en) * | 1983-04-06 | 1986-02-04 | Shell Oil Company | Microwave pyrometer |
| US4708493A (en) * | 1986-05-19 | 1987-11-24 | Quantum Logic Corporation | Apparatus for remote measurement of temperatures |
| JPH01202633A (ja) * | 1988-02-08 | 1989-08-15 | Minolta Camera Co Ltd | 放射温度計 |
| US4919542A (en) * | 1988-04-27 | 1990-04-24 | Ag Processing Technologies, Inc. | Emissivity correction apparatus and method |
| KR960013995B1 (ko) * | 1988-07-15 | 1996-10-11 | 도오교오 에레구토론 가부시끼가이샤 | 반도체 웨이퍼 기판의 표면온도 측정 방법 및 열처리 장치 |
| US4956538A (en) * | 1988-09-09 | 1990-09-11 | Texas Instruments, Incorporated | Method and apparatus for real-time wafer temperature measurement using infrared pyrometry in advanced lamp-heated rapid thermal processors |
| US5036289A (en) * | 1989-03-17 | 1991-07-30 | Infrared Systems, Inc. | Method and apparatus for synchronously demodulating detector output of a radiometer |
| US4984902A (en) * | 1989-04-13 | 1991-01-15 | Peak Systems, Inc. | Apparatus and method for compensating for errors in temperature measurement of semiconductor wafers during rapid thermal processing |
| US5029117A (en) * | 1989-04-24 | 1991-07-02 | Tektronix, Inc. | Method and apparatus for active pyrometry |
| US5255286A (en) * | 1991-05-17 | 1993-10-19 | Texas Instruments Incorporated | Multi-point pyrometry with real-time surface emissivity compensation |
| US5326173A (en) * | 1993-01-11 | 1994-07-05 | Alcan International Limited | Apparatus and method for remote temperature measurement |
| US5308161A (en) * | 1993-02-11 | 1994-05-03 | Quantum Logic Corporation | Pyrometer apparatus for use in rapid thermal processing of semiconductor wafers |
| US5305416A (en) * | 1993-04-02 | 1994-04-19 | At&T Bell Laboratories | Semiconductor processing technique, including pyrometric measurement of radiantly heated bodies |
-
1994
- 1994-01-14 US US08/181,706 patent/US5573339A/en not_active Expired - Fee Related
-
1995
- 1995-01-12 JP JP7519104A patent/JPH08511107A/ja active Pending
- 1995-01-12 CA CA002158146A patent/CA2158146A1/fr not_active Abandoned
- 1995-01-12 WO PCT/US1995/000404 patent/WO1995019575A1/fr not_active Ceased
- 1995-01-12 EP EP95907398A patent/EP0689678A1/fr not_active Withdrawn
Also Published As
| Publication number | Publication date |
|---|---|
| WO1995019575A1 (fr) | 1995-07-20 |
| JPH08511107A (ja) | 1996-11-19 |
| US5573339A (en) | 1996-11-12 |
| EP0689678A1 (fr) | 1996-01-03 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| EEER | Examination request | ||
| FZDE | Discontinued |