CA2173932A1 - Procede de fabrication de matrices de microelectrodes - Google Patents
Procede de fabrication de matrices de microelectrodesInfo
- Publication number
- CA2173932A1 CA2173932A1 CA 2173932 CA2173932A CA2173932A1 CA 2173932 A1 CA2173932 A1 CA 2173932A1 CA 2173932 CA2173932 CA 2173932 CA 2173932 A CA2173932 A CA 2173932A CA 2173932 A1 CA2173932 A1 CA 2173932A1
- Authority
- CA
- Canada
- Prior art keywords
- top surface
- microelectrodes
- array
- substrate
- metal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
- 238000000034 method Methods 0.000 title claims abstract description 68
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 21
- 239000000758 substrate Substances 0.000 claims abstract description 59
- 229910052751 metal Inorganic materials 0.000 claims abstract description 38
- 239000002184 metal Substances 0.000 claims abstract description 38
- 238000000608 laser ablation Methods 0.000 claims abstract description 17
- 229910001092 metal group alloy Inorganic materials 0.000 claims abstract description 13
- 150000002739 metals Chemical class 0.000 claims abstract description 5
- 238000000151 deposition Methods 0.000 claims description 31
- 229910052741 iridium Inorganic materials 0.000 claims description 25
- GKOZUEZYRPOHIO-UHFFFAOYSA-N iridium atom Chemical compound [Ir] GKOZUEZYRPOHIO-UHFFFAOYSA-N 0.000 claims description 25
- 230000008021 deposition Effects 0.000 claims description 23
- 239000010948 rhodium Substances 0.000 claims description 21
- 229910052703 rhodium Inorganic materials 0.000 claims description 17
- MHOVAHRLVXNVSD-UHFFFAOYSA-N rhodium atom Chemical compound [Rh] MHOVAHRLVXNVSD-UHFFFAOYSA-N 0.000 claims description 17
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 claims description 16
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 claims description 15
- KJTLSVCANCCWHF-UHFFFAOYSA-N Ruthenium Chemical compound [Ru] KJTLSVCANCCWHF-UHFFFAOYSA-N 0.000 claims description 9
- 229910052707 ruthenium Inorganic materials 0.000 claims description 9
- 239000004020 conductor Substances 0.000 claims description 8
- 230000005670 electromagnetic radiation Effects 0.000 claims description 8
- 229910052763 palladium Inorganic materials 0.000 claims description 8
- 239000010409 thin film Substances 0.000 claims description 8
- 229910052697 platinum Inorganic materials 0.000 claims description 7
- 229910045601 alloy Inorganic materials 0.000 claims description 6
- 239000000956 alloy Substances 0.000 claims description 6
- 230000005855 radiation Effects 0.000 claims description 6
- WUAPFZMCVAUBPE-UHFFFAOYSA-N rhenium atom Chemical compound [Re] WUAPFZMCVAUBPE-UHFFFAOYSA-N 0.000 claims description 4
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 claims description 3
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 3
- 229910052737 gold Inorganic materials 0.000 claims description 3
- 239000010931 gold Substances 0.000 claims description 3
- 239000002923 metal particle Substances 0.000 claims description 3
- 229910052702 rhenium Inorganic materials 0.000 claims description 3
- 229910052709 silver Inorganic materials 0.000 claims description 3
- 239000004332 silver Substances 0.000 claims description 3
- 239000000470 constituent Substances 0.000 claims description 2
- HBMJWWWQQXIZIP-UHFFFAOYSA-N silicon carbide Chemical compound [Si+]#[C-] HBMJWWWQQXIZIP-UHFFFAOYSA-N 0.000 description 14
- 239000000463 material Substances 0.000 description 13
- 229910010271 silicon carbide Inorganic materials 0.000 description 13
- 239000010408 film Substances 0.000 description 7
- 238000000137 annealing Methods 0.000 description 6
- 239000000126 substance Substances 0.000 description 6
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 5
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 4
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 4
- 239000008367 deionised water Substances 0.000 description 4
- 229910021641 deionized water Inorganic materials 0.000 description 4
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 description 4
- 238000004377 microelectronic Methods 0.000 description 4
- 238000000623 plasma-assisted chemical vapour deposition Methods 0.000 description 4
- KRHYYFGTRYWZRS-UHFFFAOYSA-N Fluorane Chemical compound F KRHYYFGTRYWZRS-UHFFFAOYSA-N 0.000 description 3
- 238000002679 ablation Methods 0.000 description 3
- 239000007789 gas Substances 0.000 description 3
- 238000007654 immersion Methods 0.000 description 3
- 239000000203 mixture Substances 0.000 description 3
- 238000012858 packaging process Methods 0.000 description 3
- 238000004151 rapid thermal annealing Methods 0.000 description 3
- 238000002791 soaking Methods 0.000 description 3
- UOCLXMDMGBRAIB-UHFFFAOYSA-N 1,1,1-trichloroethane Chemical compound CC(Cl)(Cl)Cl UOCLXMDMGBRAIB-UHFFFAOYSA-N 0.000 description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- BLRPTPMANUNPDV-UHFFFAOYSA-N Silane Chemical compound [SiH4] BLRPTPMANUNPDV-UHFFFAOYSA-N 0.000 description 2
- 229910052786 argon Inorganic materials 0.000 description 2
- 238000004140 cleaning Methods 0.000 description 2
- 239000011248 coating agent Substances 0.000 description 2
- 238000000576 coating method Methods 0.000 description 2
- 150000002500 ions Chemical class 0.000 description 2
- 230000000873 masking effect Effects 0.000 description 2
- BDERNNFJNOPAEC-UHFFFAOYSA-N propan-1-ol Chemical compound CCCO BDERNNFJNOPAEC-UHFFFAOYSA-N 0.000 description 2
- 229910000077 silane Inorganic materials 0.000 description 2
- 239000004593 Epoxy Substances 0.000 description 1
- 229910001252 Pd alloy Inorganic materials 0.000 description 1
- 229910000691 Re alloy Inorganic materials 0.000 description 1
- 229910000929 Ru alloy Inorganic materials 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
- 238000013019 agitation Methods 0.000 description 1
- 238000003491 array Methods 0.000 description 1
- 238000001311 chemical methods and process Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000004090 dissolution Methods 0.000 description 1
- 238000005538 encapsulation Methods 0.000 description 1
- 230000004927 fusion Effects 0.000 description 1
- 229910001385 heavy metal Inorganic materials 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- QPJSUIGXIBEQAC-UHFFFAOYSA-N n-(2,4-dichloro-5-propan-2-yloxyphenyl)acetamide Chemical compound CC(C)OC1=CC(NC(C)=O)=C(Cl)C=C1Cl QPJSUIGXIBEQAC-UHFFFAOYSA-N 0.000 description 1
- 230000007935 neutral effect Effects 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 239000012299 nitrogen atmosphere Substances 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 238000005334 plasma enhanced chemical vapour deposition Methods 0.000 description 1
- 238000004321 preservation Methods 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/26—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
- G01N27/403—Cells and electrode assemblies
Landscapes
- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Electrochemistry (AREA)
- Molecular Biology (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Physical Vapour Deposition (AREA)
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CA 2173932 CA2173932A1 (fr) | 1996-04-11 | 1996-04-11 | Procede de fabrication de matrices de microelectrodes |
| JP09535704A JP2000517413A (ja) | 1996-04-11 | 1997-04-08 | マイクロ電極アレイの製造方法 |
| AU22837/97A AU2283797A (en) | 1996-04-11 | 1997-04-08 | Method for manufacturing an array of microelectrodes |
| PCT/CA1997/000236 WO1997038301A1 (fr) | 1996-04-11 | 1997-04-08 | Procede de formation d'un reseau de microelectrodes |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CA 2173932 CA2173932A1 (fr) | 1996-04-11 | 1996-04-11 | Procede de fabrication de matrices de microelectrodes |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CA2173932A1 true CA2173932A1 (fr) | 1997-10-12 |
Family
ID=4157961
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CA 2173932 Abandoned CA2173932A1 (fr) | 1996-04-11 | 1996-04-11 | Procede de fabrication de matrices de microelectrodes |
Country Status (4)
| Country | Link |
|---|---|
| JP (1) | JP2000517413A (fr) |
| AU (1) | AU2283797A (fr) |
| CA (1) | CA2173932A1 (fr) |
| WO (1) | WO1997038301A1 (fr) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE19831529C2 (de) * | 1998-07-14 | 2002-04-11 | Micronas Gmbh | Verfahren zum Herstellen einer Elektrode |
| CH697478B1 (fr) * | 2001-05-22 | 2008-11-14 | Adamant Technologies Sa | Système d'électrodes pour capteur électrochimique et procédé de détermination du PH d'une eau chlorée. |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB2190399A (en) * | 1986-05-02 | 1987-11-18 | Nat Res Dev | Multi-metal electrode |
| GB8927377D0 (en) * | 1989-12-04 | 1990-01-31 | Univ Edinburgh | Improvements in and relating to amperometric assays |
| EP0690467B1 (fr) * | 1994-07-01 | 1999-11-10 | Sony Corporation | Structure d'écran fluorescente et dispositif de visualisation à effet de champ et méthodes pour leur fabrication |
-
1996
- 1996-04-11 CA CA 2173932 patent/CA2173932A1/fr not_active Abandoned
-
1997
- 1997-04-08 WO PCT/CA1997/000236 patent/WO1997038301A1/fr not_active Ceased
- 1997-04-08 AU AU22837/97A patent/AU2283797A/en not_active Abandoned
- 1997-04-08 JP JP09535704A patent/JP2000517413A/ja active Pending
Also Published As
| Publication number | Publication date |
|---|---|
| AU2283797A (en) | 1997-10-29 |
| JP2000517413A (ja) | 2000-12-26 |
| WO1997038301A1 (fr) | 1997-10-16 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| FZDE | Dead |