CA2235093C - Methode et appareil pour une meilleure determination des defauts probables d'une piece a travailler - Google Patents

Methode et appareil pour une meilleure determination des defauts probables d'une piece a travailler Download PDF

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Publication number
CA2235093C
CA2235093C CA002235093A CA2235093A CA2235093C CA 2235093 C CA2235093 C CA 2235093C CA 002235093 A CA002235093 A CA 002235093A CA 2235093 A CA2235093 A CA 2235093A CA 2235093 C CA2235093 C CA 2235093C
Authority
CA
Canada
Prior art keywords
workpiece
signals
average
zone
energy
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
CA002235093A
Other languages
English (en)
Other versions
CA2235093A1 (fr
Inventor
Michael Mcguire
Steve C. Woods
Carl Flatman
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
USNR Kockums Cancar Co
Original Assignee
USNR Kockums Cancar Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by USNR Kockums Cancar Co filed Critical USNR Kockums Cancar Co
Priority to CA002235093A priority Critical patent/CA2235093C/fr
Publication of CA2235093A1 publication Critical patent/CA2235093A1/fr
Application granted granted Critical
Publication of CA2235093C publication Critical patent/CA2235093C/fr
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/18—Investigating the presence of flaws defects or foreign matter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/16—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being a moving sheet or film
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/46—Wood
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/02—Indexing codes associated with the analysed material
    • G01N2291/023—Solids
    • G01N2291/0238—Wood
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2291/00—Indexing codes associated with group G01N29/00
    • G01N2291/04—Wave modes and trajectories
    • G01N2291/048—Transmission, i.e. analysed material between transmitter and receiver

Landscapes

  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Toxicology (AREA)
  • Wood Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Food Science & Technology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Length-Measuring Devices Using Wave Or Particle Radiation (AREA)
CA002235093A 1998-04-17 1998-04-17 Methode et appareil pour une meilleure determination des defauts probables d'une piece a travailler Expired - Lifetime CA2235093C (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CA002235093A CA2235093C (fr) 1998-04-17 1998-04-17 Methode et appareil pour une meilleure determination des defauts probables d'une piece a travailler

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CA002235093A CA2235093C (fr) 1998-04-17 1998-04-17 Methode et appareil pour une meilleure determination des defauts probables d'une piece a travailler

Publications (2)

Publication Number Publication Date
CA2235093A1 CA2235093A1 (fr) 1999-10-17
CA2235093C true CA2235093C (fr) 2009-02-03

Family

ID=29275565

Family Applications (1)

Application Number Title Priority Date Filing Date
CA002235093A Expired - Lifetime CA2235093C (fr) 1998-04-17 1998-04-17 Methode et appareil pour une meilleure determination des defauts probables d'une piece a travailler

Country Status (1)

Country Link
CA (1) CA2235093C (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20230314346A1 (en) * 2020-09-02 2023-10-05 Force Technology A device for testing a flat plate-shaped material

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7066007B2 (en) * 2003-10-17 2006-06-27 Eyerhaeuser Company Systems and methods for predicting the bending stiffness of wood products
JP5156546B2 (ja) * 2008-08-28 2013-03-06 株式会社イシダ Ｘ線検査装置
CN112819745B (zh) * 2019-10-31 2023-02-28 合肥美亚光电技术股份有限公司 坚果籽仁中心虫蚀缺陷检测方法及装置
CN116930446B (zh) * 2022-03-29 2026-02-06 核工业理化工程研究院 一种用于薄壁盘类锻件无损检测缺陷的尺寸规则化方法及其应用

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20230314346A1 (en) * 2020-09-02 2023-10-05 Force Technology A device for testing a flat plate-shaped material

Also Published As

Publication number Publication date
CA2235093A1 (fr) 1999-10-17

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Legal Events

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EEER Examination request
MKEX Expiry

Effective date: 20180417