CA2682092C - Cellule de memoire non reprogrammable du type et - Google Patents

Cellule de memoire non reprogrammable du type et Download PDF

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Publication number
CA2682092C
CA2682092C CA2682092A CA2682092A CA2682092C CA 2682092 C CA2682092 C CA 2682092C CA 2682092 A CA2682092 A CA 2682092A CA 2682092 A CA2682092 A CA 2682092A CA 2682092 C CA2682092 C CA 2682092C
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Canada
Prior art keywords
fuse
memory cell
memory
voltage level
cell
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CA2682092A
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English (en)
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CA2682092A1 (fr
Inventor
Wlodek Kurjanowicz
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Synopsys Inc
Original Assignee
Sidense Corp
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Filing date
Publication date
Application filed by Sidense Corp filed Critical Sidense Corp
Priority to CA2682092A priority Critical patent/CA2682092C/fr
Publication of CA2682092A1 publication Critical patent/CA2682092A1/fr
Application granted granted Critical
Publication of CA2682092C publication Critical patent/CA2682092C/fr
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C17/00Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
    • G11C17/14Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards in which contents are determined by selectively establishing, breaking or modifying connecting links by permanently altering the state of coupling elements, e.g. PROM
    • G11C17/16Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards in which contents are determined by selectively establishing, breaking or modifying connecting links by permanently altering the state of coupling elements, e.g. PROM using electrically-fusible links
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C17/00Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
    • G11C17/14Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards in which contents are determined by selectively establishing, breaking or modifying connecting links by permanently altering the state of coupling elements, e.g. PROM
    • G11C17/18Auxiliary circuits, e.g. for writing into memory

Landscapes

  • Read Only Memory (AREA)
  • Semiconductor Memories (AREA)

Abstract

L'invention concerne une cellule de mémoire anti-fusible de type ET, ainsi qu'une mémoire se composant de cellules de mémoire anti-fusibles de type ET. Des chaînes de cellules anti-fusibles de type et sont reliées en séries les unes avec les autres. Chaque cellule anti-fusible de type ET comprend un transistor d'accès branchable en série à la ligne de bits ou aux transistors d'accès d'autres cellules anti-fusibles de type et, ainsi qu'un dispositif anti-fusible. La région de canal du transistor d'accès est reliée à la région de canal du dispositif anti-fusible. Les deux régions de canal sont couvertes par la même ligne de mot. La ligne de mot est poussée au niveau de tension de programmation pour programmer le dispositif anti-fusible, ou à un niveau de tension de lecture pour lire le dispositif anti-fusible.
CA2682092A 2009-10-30 2009-10-30 Cellule de memoire non reprogrammable du type et Active CA2682092C (fr)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CA2682092A CA2682092C (fr) 2009-10-30 2009-10-30 Cellule de memoire non reprogrammable du type et

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CA2682092A CA2682092C (fr) 2009-10-30 2009-10-30 Cellule de memoire non reprogrammable du type et

Publications (2)

Publication Number Publication Date
CA2682092A1 CA2682092A1 (fr) 2010-01-05
CA2682092C true CA2682092C (fr) 2010-11-02

Family

ID=41508489

Family Applications (1)

Application Number Title Priority Date Filing Date
CA2682092A Active CA2682092C (fr) 2009-10-30 2009-10-30 Cellule de memoire non reprogrammable du type et

Country Status (1)

Country Link
CA (1) CA2682092C (fr)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9123572B2 (en) 2004-05-06 2015-09-01 Sidense Corporation Anti-fuse memory cell
WO2017117663A1 (fr) * 2016-01-08 2017-07-13 Sidense Corp. Génération de valeur de fonction physique non clonable (puf) au moyen d'un réseau de mémoires anti-fusible
US20240312543A1 (en) * 2020-02-27 2024-09-19 Taiwan Semiconductor Manufacturing Company, Ltd. One-time-programmable memory

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI511144B (zh) * 2014-04-03 2015-12-01 席登斯公司 抗熔絲記憶單元
CN115910990B (zh) * 2023-02-23 2023-05-23 长鑫存储技术有限公司 反熔丝结构及反熔丝结构的制备方法

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9123572B2 (en) 2004-05-06 2015-09-01 Sidense Corporation Anti-fuse memory cell
WO2017117663A1 (fr) * 2016-01-08 2017-07-13 Sidense Corp. Génération de valeur de fonction physique non clonable (puf) au moyen d'un réseau de mémoires anti-fusible
US10032521B2 (en) 2016-01-08 2018-07-24 Synopsys, Inc. PUF value generation using an anti-fuse memory array
US20240312543A1 (en) * 2020-02-27 2024-09-19 Taiwan Semiconductor Manufacturing Company, Ltd. One-time-programmable memory
US12518841B2 (en) * 2020-02-27 2026-01-06 Taiwan Semiconductor Manufacturing Company, Ltd. One-time-programmable memory

Also Published As

Publication number Publication date
CA2682092A1 (fr) 2010-01-05

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