CA2682092C - Cellule de memoire non reprogrammable du type et - Google Patents
Cellule de memoire non reprogrammable du type et Download PDFInfo
- Publication number
- CA2682092C CA2682092C CA2682092A CA2682092A CA2682092C CA 2682092 C CA2682092 C CA 2682092C CA 2682092 A CA2682092 A CA 2682092A CA 2682092 A CA2682092 A CA 2682092A CA 2682092 C CA2682092 C CA 2682092C
- Authority
- CA
- Canada
- Prior art keywords
- fuse
- memory cell
- memory
- voltage level
- cell
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C17/00—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
- G11C17/14—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards in which contents are determined by selectively establishing, breaking or modifying connecting links by permanently altering the state of coupling elements, e.g. PROM
- G11C17/16—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards in which contents are determined by selectively establishing, breaking or modifying connecting links by permanently altering the state of coupling elements, e.g. PROM using electrically-fusible links
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C17/00—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards
- G11C17/14—Read-only memories programmable only once; Semi-permanent stores, e.g. manually-replaceable information cards in which contents are determined by selectively establishing, breaking or modifying connecting links by permanently altering the state of coupling elements, e.g. PROM
- G11C17/18—Auxiliary circuits, e.g. for writing into memory
Landscapes
- Read Only Memory (AREA)
- Semiconductor Memories (AREA)
Abstract
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CA2682092A CA2682092C (fr) | 2009-10-30 | 2009-10-30 | Cellule de memoire non reprogrammable du type et |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CA2682092A CA2682092C (fr) | 2009-10-30 | 2009-10-30 | Cellule de memoire non reprogrammable du type et |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CA2682092A1 CA2682092A1 (fr) | 2010-01-05 |
| CA2682092C true CA2682092C (fr) | 2010-11-02 |
Family
ID=41508489
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CA2682092A Active CA2682092C (fr) | 2009-10-30 | 2009-10-30 | Cellule de memoire non reprogrammable du type et |
Country Status (1)
| Country | Link |
|---|---|
| CA (1) | CA2682092C (fr) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9123572B2 (en) | 2004-05-06 | 2015-09-01 | Sidense Corporation | Anti-fuse memory cell |
| WO2017117663A1 (fr) * | 2016-01-08 | 2017-07-13 | Sidense Corp. | Génération de valeur de fonction physique non clonable (puf) au moyen d'un réseau de mémoires anti-fusible |
| US20240312543A1 (en) * | 2020-02-27 | 2024-09-19 | Taiwan Semiconductor Manufacturing Company, Ltd. | One-time-programmable memory |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI511144B (zh) * | 2014-04-03 | 2015-12-01 | 席登斯公司 | 抗熔絲記憶單元 |
| CN115910990B (zh) * | 2023-02-23 | 2023-05-23 | 长鑫存储技术有限公司 | 反熔丝结构及反熔丝结构的制备方法 |
-
2009
- 2009-10-30 CA CA2682092A patent/CA2682092C/fr active Active
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9123572B2 (en) | 2004-05-06 | 2015-09-01 | Sidense Corporation | Anti-fuse memory cell |
| WO2017117663A1 (fr) * | 2016-01-08 | 2017-07-13 | Sidense Corp. | Génération de valeur de fonction physique non clonable (puf) au moyen d'un réseau de mémoires anti-fusible |
| US10032521B2 (en) | 2016-01-08 | 2018-07-24 | Synopsys, Inc. | PUF value generation using an anti-fuse memory array |
| US20240312543A1 (en) * | 2020-02-27 | 2024-09-19 | Taiwan Semiconductor Manufacturing Company, Ltd. | One-time-programmable memory |
| US12518841B2 (en) * | 2020-02-27 | 2026-01-06 | Taiwan Semiconductor Manufacturing Company, Ltd. | One-time-programmable memory |
Also Published As
| Publication number | Publication date |
|---|---|
| CA2682092A1 (fr) | 2010-01-05 |
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Legal Events
| Date | Code | Title | Description |
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| EEER | Examination request | ||
| MPN | Maintenance fee for patent paid |
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| U00 | Fee paid |
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| U11 | Full renewal or maintenance fee paid |
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| MPN | Maintenance fee for patent paid |
Free format text: FEE DESCRIPTION TEXT: MF (PATENT, 16TH ANNIV.) - STANDARD Year of fee payment: 16 |
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| U00 | Fee paid |
Free format text: ST27 STATUS EVENT CODE: A-4-4-U10-U00-U101 (AS PROVIDED BY THE NATIONAL OFFICE); EVENT TEXT: MAINTENANCE REQUEST RECEIVED Effective date: 20250925 |
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| U11 | Full renewal or maintenance fee paid |
Free format text: ST27 STATUS EVENT CODE: A-4-4-U10-U11-U102 (AS PROVIDED BY THE NATIONAL OFFICE); EVENT TEXT: MAINTENANCE FEE PAYMENT PAID IN FULL Effective date: 20250925 |