CA2860733A1 - Largeur d'impulsion de test commandee et position pour disjoncteur de fuite a la terre a autocontrole - Google Patents

Largeur d'impulsion de test commandee et position pour disjoncteur de fuite a la terre a autocontrole Download PDF

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Publication number
CA2860733A1
CA2860733A1 CA2860733A CA2860733A CA2860733A1 CA 2860733 A1 CA2860733 A1 CA 2860733A1 CA 2860733 A CA2860733 A CA 2860733A CA 2860733 A CA2860733 A CA 2860733A CA 2860733 A1 CA2860733 A1 CA 2860733A1
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CA
Canada
Prior art keywords
test
fault
circuit
self
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CA2860733A
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English (en)
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CA2860733C (fr
Inventor
Stephen Paul Simonin
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hubbell Inc
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Hubbell Inc
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Publication date
Priority claimed from US14/468,224 external-priority patent/US9640975B2/en
Application filed by Hubbell Inc filed Critical Hubbell Inc
Publication of CA2860733A1 publication Critical patent/CA2860733A1/fr
Application granted granted Critical
Publication of CA2860733C publication Critical patent/CA2860733C/fr
Active legal-status Critical Current
Anticipated expiration legal-status Critical

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  • Emergency Protection Circuit Devices (AREA)

Abstract

Il est décrit un dispositif dinterruption de circuit comportant un circuit dauto-surveillance destiné à tester périodiquement diverses fonctions et structures du dispositif. Le circuit dauto-surveillance déclenche un sous-programme dauto-surveillance qui génère, entre autres fonctions, une condition de défaut dautotest et détermine si les mécanismes de détection que comporte le dispositif détectent correctement le défaut dautotest. Un circuit de défaut de test est configuré pour générer au moins une impulsion qui provoque la condition de défaut dauto-test et les impulsions sont générées pour se produire à lextérieur dune région active du circuit de détection de défaut.
CA2860733A 2013-08-27 2014-08-27 Largeur d'impulsion de test commandee et position pour disjoncteur de fuite a la terre a autocontrole Active CA2860733C (fr)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US201361870452P 2013-08-27 2013-08-27
US61/870,452 2013-08-27
US14/468,224 2014-08-25
US14/468,224 US9640975B2 (en) 2013-08-27 2014-08-25 Controllable test-pulse width and position for self-test ground fault circuit interrupter

Publications (2)

Publication Number Publication Date
CA2860733A1 true CA2860733A1 (fr) 2015-02-27
CA2860733C CA2860733C (fr) 2022-08-16

Family

ID=52580605

Family Applications (1)

Application Number Title Priority Date Filing Date
CA2860733A Active CA2860733C (fr) 2013-08-27 2014-08-27 Largeur d'impulsion de test commandee et position pour disjoncteur de fuite a la terre a autocontrole

Country Status (1)

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CA (1) CA2860733C (fr)

Also Published As

Publication number Publication date
CA2860733C (fr) 2022-08-16

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