CA547871A - Systeme de mesurage de semiconducteur - Google Patents

Systeme de mesurage de semiconducteur

Info

Publication number
CA547871A
CA547871A CA547871A CA547871DA CA547871A CA 547871 A CA547871 A CA 547871A CA 547871 A CA547871 A CA 547871A CA 547871D A CA547871D A CA 547871DA CA 547871 A CA547871 A CA 547871A
Authority
CA
Canada
Prior art keywords
measuring system
semiconductor measuring
semiconductor
measuring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
CA547871A
Other languages
English (en)
Inventor
V. Geppert Donovan
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Motorola Solutions Inc
Original Assignee
Motorola Inc
Publication date
Application granted granted Critical
Publication of CA547871A publication Critical patent/CA547871A/fr
Expired legal-status Critical Current

Links

CA547871A Systeme de mesurage de semiconducteur Expired CA547871A (fr)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CA547871T

Publications (1)

Publication Number Publication Date
CA547871A true CA547871A (fr) 1957-10-22

Family

ID=35705079

Family Applications (1)

Application Number Title Priority Date Filing Date
CA547871A Expired CA547871A (fr) Systeme de mesurage de semiconducteur

Country Status (1)

Country Link
CA (1) CA547871A (fr)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4551674A (en) * 1982-11-12 1985-11-05 At&T Bell Laboratories Noncontacting conductivity type determination and surface state spectroscopy of semiconductor materials
US4891582A (en) * 1986-09-24 1990-01-02 Technion Research & Development Foundation Optical apparatus and method for photocarrier diffusion length measurement

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4551674A (en) * 1982-11-12 1985-11-05 At&T Bell Laboratories Noncontacting conductivity type determination and surface state spectroscopy of semiconductor materials
US4891582A (en) * 1986-09-24 1990-01-02 Technion Research & Development Foundation Optical apparatus and method for photocarrier diffusion length measurement

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