CA955652A - Testing of non-linear circuits by accumulated result comparison - Google Patents

Testing of non-linear circuits by accumulated result comparison

Info

Publication number
CA955652A
CA955652A CA148,260A CA148260A CA955652A CA 955652 A CA955652 A CA 955652A CA 148260 A CA148260 A CA 148260A CA 955652 A CA955652 A CA 955652A
Authority
CA
Canada
Prior art keywords
testing
result comparison
accumulated result
linear circuits
circuits
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
CA148,260A
Other languages
English (en)
Other versions
CA148260S (en
Inventor
Maurcie T. Mcmahon (Jr.)
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Application granted granted Critical
Publication of CA955652A publication Critical patent/CA955652A/en
Expired legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318385—Random or pseudo-random test pattern
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/273—Tester hardware, i.e. output processing circuits
    • G06F11/277—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault-free response

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • For Increasing The Reliability Of Semiconductor Memories (AREA)
  • Measurement Of Current Or Voltage (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
CA148,260A 1971-08-02 1972-07-31 Testing of non-linear circuits by accumulated result comparison Expired CA955652A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US16825971A 1971-08-02 1971-08-02

Publications (1)

Publication Number Publication Date
CA955652A true CA955652A (en) 1974-10-01

Family

ID=22610764

Family Applications (1)

Application Number Title Priority Date Filing Date
CA148,260A Expired CA955652A (en) 1971-08-02 1972-07-31 Testing of non-linear circuits by accumulated result comparison

Country Status (7)

Country Link
US (1) US3740646A (it)
JP (1) JPS5138220B2 (it)
CA (1) CA955652A (it)
DE (1) DE2235802C2 (it)
FR (1) FR2148311B1 (it)
GB (1) GB1340157A (it)
IT (1) IT956842B (it)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3826909A (en) * 1973-03-29 1974-07-30 Ncr Dynamic comparison tester for go-no-go testing of digital circuit packages in normal environment
DE2323358C2 (de) * 1973-05-09 1984-12-20 Robert Bosch Gmbh, 7000 Stuttgart Prüfeinrichtung für ein Antiblockierregelsystem
US3883801A (en) * 1973-11-07 1975-05-13 Bell Telephone Labor Inc Fault testing of logic circuits
US3927310A (en) * 1974-01-25 1975-12-16 Us Air Force Digital test apparatus
FR2289960A1 (fr) * 1974-10-28 1976-05-28 Honeywell Bull Soc Ind Dispositif de cumul et de compression de donnees
US4058767A (en) * 1975-04-29 1977-11-15 International Business Machines Corporation Apparatus and process for testing AC performance of LSI components
MX4130E (es) * 1977-05-20 1982-01-04 Amdahl Corp Mejoras en sistema de procesamiento de datos y escrutinio de informacion utilizando sumas de comprobacion
US4236246A (en) * 1978-11-03 1980-11-25 Genrad, Inc. Method of and apparatus for testing electronic circuit assemblies and the like
US4864570A (en) * 1987-06-29 1989-09-05 International Business Machines Corporation Processing pulse control circuit for use in device performing signature analysis of digital circuits
GB0413146D0 (en) * 2004-06-12 2004-07-14 Texas Instruments Ltd Comparator for circuit testing

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3265973A (en) * 1962-05-16 1966-08-09 Bell Telephone Labor Inc Synthesis of two-port networks having periodically time-varying elements
BE642111A (it) * 1963-02-05
DE1957638A1 (de) * 1968-11-17 1970-11-19 Nippon Electric Co Vorrichtung zur automatischen Wellenformanalyse
US3614608A (en) * 1969-05-19 1971-10-19 Ibm Random number statistical logic test system
US3633100A (en) * 1970-05-12 1972-01-04 Ibm Testing of nonlinear circuits by comparison with a reference simulation with means to eliminate errors caused by critical race conditions
US3636443A (en) * 1970-10-29 1972-01-18 Ibm Method of testing devices using untested devices as a reference standard

Also Published As

Publication number Publication date
DE2235802C2 (de) 1982-04-15
FR2148311A1 (it) 1973-03-16
GB1340157A (en) 1973-12-12
IT956842B (it) 1973-10-10
JPS5138220B2 (it) 1976-10-20
JPS4825481A (it) 1973-04-03
DE2235802A1 (de) 1973-02-15
FR2148311B1 (it) 1975-03-07
US3740646A (en) 1973-06-19

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