CH374494A - Struktur-Röntgen-Goniometer zur direkten Messung von um einen ganzzahligen Faktor vergrösserten Gitterebenenabständen - Google Patents
Struktur-Röntgen-Goniometer zur direkten Messung von um einen ganzzahligen Faktor vergrösserten GitterebenenabständenInfo
- Publication number
- CH374494A CH374494A CH7907459A CH7907459A CH374494A CH 374494 A CH374494 A CH 374494A CH 7907459 A CH7907459 A CH 7907459A CH 7907459 A CH7907459 A CH 7907459A CH 374494 A CH374494 A CH 374494A
- Authority
- CH
- Switzerland
- Prior art keywords
- enlarged
- structural
- direct measurement
- lattice plane
- integral factor
- Prior art date
Links
- 238000005259 measurement Methods 0.000 title 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
- G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CS503158 | 1958-10-07 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CH374494A true CH374494A (de) | 1964-01-15 |
Family
ID=5394374
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CH7907459A CH374494A (de) | 1958-10-07 | 1959-10-06 | Struktur-Röntgen-Goniometer zur direkten Messung von um einen ganzzahligen Faktor vergrösserten Gitterebenenabständen |
Country Status (6)
| Country | Link |
|---|---|
| BE (1) | BE583396A (de) |
| CH (1) | CH374494A (de) |
| DE (1) | DE1105194B (de) |
| FR (1) | FR1239513A (de) |
| GB (1) | GB894796A (de) |
| NL (1) | NL244115A (de) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE1245164B (de) * | 1964-05-23 | 1967-07-20 | Chirana Praha Np | Diffraktionsgoniometer, insbesondere Roentgengoniometer |
-
0
- NL NL244115D patent/NL244115A/xx unknown
-
1959
- 1959-10-06 GB GB3380759A patent/GB894796A/en not_active Expired
- 1959-10-06 CH CH7907459A patent/CH374494A/de unknown
- 1959-10-06 DE DEK38840A patent/DE1105194B/de active Pending
- 1959-10-07 FR FR807085A patent/FR1239513A/fr not_active Expired
- 1959-10-07 BE BE583396A patent/BE583396A/fr unknown
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE1245164B (de) * | 1964-05-23 | 1967-07-20 | Chirana Praha Np | Diffraktionsgoniometer, insbesondere Roentgengoniometer |
Also Published As
| Publication number | Publication date |
|---|---|
| DE1105194B (de) | 1961-04-20 |
| GB894796A (en) | 1962-04-26 |
| FR1239513A (fr) | 1960-08-26 |
| BE583396A (fr) | 1960-02-01 |
| NL244115A (de) |
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