CH476994A - Anordnung zur automatischen Röntgenfluoreszenzanalyse - Google Patents

Anordnung zur automatischen Röntgenfluoreszenzanalyse

Info

Publication number
CH476994A
CH476994A CH205167A CH205167A CH476994A CH 476994 A CH476994 A CH 476994A CH 205167 A CH205167 A CH 205167A CH 205167 A CH205167 A CH 205167A CH 476994 A CH476994 A CH 476994A
Authority
CH
Switzerland
Prior art keywords
automatic
arrangement
ray fluorescence
fluorescence analysis
analysis
Prior art date
Application number
CH205167A
Other languages
English (en)
Inventor
Gerd Dipl Phys Foersterling
Nat Kleinstueck Karl-Heinz Rer
Nat Gnauck Rudolf Dr Rer
Simon Gerhard
Original Assignee
Mansfeld Kombinat W Pieck Veb
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mansfeld Kombinat W Pieck Veb filed Critical Mansfeld Kombinat W Pieck Veb
Publication of CH476994A publication Critical patent/CH476994A/de

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/07Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
CH205167A 1966-07-05 1967-02-13 Anordnung zur automatischen Röntgenfluoreszenzanalyse CH476994A (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DD11855666 1966-07-05
GB740467A GB1179894A (en) 1966-07-05 1967-02-16 Apparatus for the Automatic Analysis of X-Ray Fluorescence
NL6703385A NL6703385A (de) 1966-07-05 1967-02-28

Publications (1)

Publication Number Publication Date
CH476994A true CH476994A (de) 1969-08-15

Family

ID=27179688

Family Applications (1)

Application Number Title Priority Date Filing Date
CH205167A CH476994A (de) 1966-07-05 1967-02-13 Anordnung zur automatischen Röntgenfluoreszenzanalyse

Country Status (3)

Country Link
CH (1) CH476994A (de)
GB (1) GB1179894A (de)
NL (1) NL6703385A (de)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112313503A (zh) * 2018-04-20 2021-02-02 奥图泰(芬兰)公司 X射线荧光分析仪系统和用于对浆料中的感兴趣元素执行x射线荧光分析的方法

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FI80524C (fi) * 1986-06-02 1990-06-11 Outokumpu Oy Foerfarande och anordning foer analysering av slamartade material.

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN112313503A (zh) * 2018-04-20 2021-02-02 奥图泰(芬兰)公司 X射线荧光分析仪系统和用于对浆料中的感兴趣元素执行x射线荧光分析的方法

Also Published As

Publication number Publication date
GB1179894A (en) 1970-02-04
NL6703385A (de) 1968-08-29

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Legal Events

Date Code Title Description
PL Patent ceased