CH519171A - X-ray diffractometer - Google Patents

X-ray diffractometer

Info

Publication number
CH519171A
CH519171A CH740170A CH740170A CH519171A CH 519171 A CH519171 A CH 519171A CH 740170 A CH740170 A CH 740170A CH 740170 A CH740170 A CH 740170A CH 519171 A CH519171 A CH 519171A
Authority
CH
Switzerland
Prior art keywords
ray diffractometer
diffractometer
ray
Prior art date
Application number
CH740170A
Other languages
German (de)
Inventor
Julius Schmidt Gerhard Martin
Rabinovich Dov
Original Assignee
Yeda Res & Dev
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yeda Res & Dev filed Critical Yeda Res & Dev
Publication of CH519171A publication Critical patent/CH519171A/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20025—Sample holders or supports therefor

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
CH740170A 1969-05-20 1970-05-19 X-ray diffractometer CH519171A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
IL32247A IL32247A (en) 1969-05-20 1969-05-20 X-ray diffractometer

Publications (1)

Publication Number Publication Date
CH519171A true CH519171A (en) 1972-02-15

Family

ID=11044944

Family Applications (1)

Application Number Title Priority Date Filing Date
CH740170A CH519171A (en) 1969-05-20 1970-05-19 X-ray diffractometer

Country Status (7)

Country Link
US (1) US3728541A (en)
CH (1) CH519171A (en)
DE (1) DE2023646A1 (en)
FR (1) FR2048551A5 (en)
GB (1) GB1307570A (en)
IL (1) IL32247A (en)
NL (1) NL7007274A (en)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5222553B2 (en) * 1973-02-20 1977-06-17
US4016420A (en) * 1975-05-30 1977-04-05 Dekanat Prirodovedecke Fakulty University Karlovy Precession-type x-ray diffraction camera
DE2534790C2 (en) * 1975-08-04 1986-08-21 Max-Planck-Gesellschaft zur Förderung der Wissenschaften e.V., 3400 Göttingen X-ray goniometer for optionally performing Buerger precession recordings and rotary crystal recordings
DE8423909U1 (en) * 1984-08-11 1985-01-03 Kernforschungsanlage Jülich GmbH, 5170 Jülich EULERWIEGE FOR DEEP TEMPERATURE DIFFRAKTOMETRY
US4723075A (en) * 1985-06-12 1988-02-02 The United States Of America As Represented By The Secretary Of The Air Force Translational mount for large optical elements
GB9919396D0 (en) * 1999-08-18 1999-10-20 Knight Richard A moving yoke
GB0415053D0 (en) * 2004-07-05 2004-08-04 Dage Prec Ind Ltd X-ray manipulator
FI20041538L (en) * 2004-11-29 2006-05-30 Stresstech Oy Goniometer
IT1403478B1 (en) * 2010-12-28 2013-10-17 Fond Bruno Kessler X-RAY DIFFRATTOMETER OF THE PERFECT PORTABLE TYPE
US9613728B2 (en) * 2013-03-15 2017-04-04 Proto Manufacturing Ltd. X-ray diffraction apparatus and method
EP3112815B1 (en) * 2015-07-01 2021-01-27 Microtecnica S.r.l. Sensor mount
CN107101712B (en) * 2017-04-06 2019-04-05 东北大学 Auxiliary instrument for multi-direction and large-angle continuous scanning vibrometer based on single-point laser vibrometer

Also Published As

Publication number Publication date
IL32247A (en) 1972-08-30
FR2048551A5 (en) 1971-03-19
IL32247A0 (en) 1969-07-30
GB1307570A (en) 1973-02-21
NL7007274A (en) 1970-11-24
US3728541A (en) 1973-04-17
DE2023646A1 (en) 1970-11-26

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Legal Events

Date Code Title Description
PL Patent ceased