CN101213687A - 用于减少在有机功能设备中出现短路故障的方法 - Google Patents

用于减少在有机功能设备中出现短路故障的方法 Download PDF

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Publication number
CN101213687A
CN101213687A CNA2006800240437A CN200680024043A CN101213687A CN 101213687 A CN101213687 A CN 101213687A CN A2006800240437 A CNA2006800240437 A CN A2006800240437A CN 200680024043 A CN200680024043 A CN 200680024043A CN 101213687 A CN101213687 A CN 101213687A
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CN
China
Prior art keywords
electrode layer
organic functional
layer
organic
voltage
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Pending
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CNA2006800240437A
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English (en)
Chinese (zh)
Inventor
M·巴切尔
E·W·A·扬
A·塞姆佩尔
I·J·博雷菲恩
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Koninklijke Philips NV
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Koninklijke Philips Electronics NV
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Application filed by Koninklijke Philips Electronics NV filed Critical Koninklijke Philips Electronics NV
Publication of CN101213687A publication Critical patent/CN101213687A/zh
Pending legal-status Critical Current

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    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B33/00—Electroluminescent light sources
    • H05B33/10—Apparatus or processes specially adapted to the manufacture of electroluminescent light sources
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G01N25/72—Investigating presence of flaws
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K30/00—Organic devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation
    • H10K30/80—Constructional details
    • H10K30/81—Electrodes
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K50/00—Organic light-emitting devices
    • H10K50/80—Constructional details
    • H10K50/805—Electrodes
    • H10K50/81—Anodes
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
    • H10K59/80—Constructional details
    • H10K59/805—Electrodes
    • H10K59/8051—Anodes
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K2102/00—Constructional details relating to the organic devices covered by this subclass
    • H10K2102/301—Details of OLEDs
    • H10K2102/341—Short-circuit prevention
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
    • H10K71/861—Repairing
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00—Energy generation through renewable energy sources
    • Y02E10/50—Photovoltaic [PV] energy
    • Y02E10/549—Organic PV cells

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  • Physics & Mathematics (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Pathology (AREA)
  • General Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Optics & Photonics (AREA)
  • Electroluminescent Light Sources (AREA)
  • Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
  • Photovoltaic Devices (AREA)
  • Led Devices (AREA)
CNA2006800240437A 2005-06-30 2006-06-27 用于减少在有机功能设备中出现短路故障的方法 Pending CN101213687A (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
EP05105864.2 2005-06-30
EP05105864 2005-06-30

Publications (1)

Publication Number Publication Date
CN101213687A true CN101213687A (zh) 2008-07-02

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ID=37604854

Family Applications (1)

Application Number Title Priority Date Filing Date
CNA2006800240437A Pending CN101213687A (zh) 2005-06-30 2006-06-27 用于减少在有机功能设备中出现短路故障的方法

Country Status (7)

Country Link
US (1) US20100062550A1 (fr)
EP (1) EP1905108A2 (fr)
JP (1) JP2008545232A (fr)
KR (1) KR20080027900A (fr)
CN (1) CN101213687A (fr)
TW (1) TW200707719A (fr)
WO (1) WO2007004118A2 (fr)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103392381A (zh) * 2011-06-16 2013-11-13 松下电器产业株式会社 有机电致发光元件的制造方法以及有机电致发光元件
CN107925005A (zh) * 2015-06-16 2018-04-17 原子能和能源替代品委员会 用于制造第一电极/有源层/第二电极的叠层的方法
CN108054278A (zh) * 2017-11-23 2018-05-18 华中科技大学 一种高良率有机太阳能电池及其制备方法

Families Citing this family (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102007007853B4 (de) * 2007-02-16 2022-03-31 Pictiva Displays International Limited Elektrolumineszentes organisches Halbleiterelement
JP2008306129A (ja) * 2007-06-11 2008-12-18 Clean Venture 21 Corp 光電変換装置の製造方法
CN101971040B (zh) * 2008-02-22 2014-11-26 弗朗霍夫应用科学研究促进协会 用于表征半导体构件的测量方法和装置
AU2010260159B2 (en) * 2009-06-15 2015-07-09 University Of Houston Wrapped optoelectronic devices and methods for making same
US8212581B2 (en) * 2009-09-30 2012-07-03 Global Oled Technology Llc Defective emitter detection for electroluminescent display
SG10201601903YA (en) * 2010-06-08 2016-04-28 Dcg Systems Inc Three-dimensional hot spot localization
TWI460422B (zh) * 2010-10-22 2014-11-11 Dcg Systems Inc 從裝置一側作鎖相熱雷射激發並從另一側取得鎖相熱發散影像
JP2014510956A (ja) * 2011-03-31 2014-05-01 セイジ・エレクトロクロミクス，インコーポレイテッド 熱撮像を用いてエレクトロクロミックデバイス内の欠陥を検出及び修復するためのシステム及び方法
JP5310773B2 (ja) 2011-04-15 2013-10-09 パナソニック株式会社 有機ｅｌディスプレイの製造方法
JP5687339B2 (ja) * 2011-06-08 2015-03-18 パナソニック株式会社 有機ｅｌ素子及び有機ｅｌ素子の製造方法
CN103620681B (zh) * 2011-06-27 2016-11-02 薄膜电子有限公司 具有横向尺寸改变吸收缓冲层的电子部件及其生产方法
KR101911979B1 (ko) * 2011-07-13 2018-10-25 하마마츠 포토닉스 가부시키가이샤 발열점 검출 방법 및 발열점 검출 장치
FR2991505B1 (fr) * 2012-06-05 2016-12-16 Commissariat Energie Atomique Procede de realisation d'un empilement du type premiere electrode/couche active/deuxieme electrode.
DE102012017216B4 (de) * 2012-08-31 2016-06-16 Laser Zentrum Hannover E.V. Verfahren und Vorrichtung zum Herstellen einer elektrischen Schichtstruktur
US10179952B2 (en) * 2013-03-08 2019-01-15 Rutgers, The State University Of New Jersey Patterned thin films by thermally induced mass displacement
JP2014232689A (ja) * 2013-05-30 2014-12-11 東京エレクトロン株式会社 欠陥検査装置及び欠陥検査方法
EP2840408B1 (fr) * 2013-08-23 2016-02-10 DCG Systems, Inc. Procédé LIT permettant d'identifier les points surchauffés à différentes localisations de profondeur
KR102231509B1 (ko) * 2014-10-09 2021-03-23 하마마츠 포토닉스 가부시키가이샤 해석 장치 및 해석 방법
WO2016103007A1 (fr) * 2014-12-24 2016-06-30 Arcelormittal Procédé de contrôle d'un support comprenant un substrat métallique, un revêtement diélectrique, et une couche conductrice
US10569894B2 (en) * 2017-10-16 2020-02-25 Rohr, Inc. Locating an aperture based on a signature of an embedded conductive element
DE102018214496A1 (de) 2018-08-28 2020-03-05 Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. Kurzschlussfestes Elektrodensystem für elektronische Bauelemente
KR102835199B1 (ko) 2019-11-07 2025-07-17 삼성전자주식회사 반도체 패키지 검사장치 및 이를 구비하는 반도체 패키지 제조 시스템

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002260857A (ja) * 2000-12-28 2002-09-13 Semiconductor Energy Lab Co Ltd 発光装置の作製方法および薄膜形成装置
US6909111B2 (en) * 2000-12-28 2005-06-21 Semiconductor Energy Laboratory Co., Ltd. Method of manufacturing a light emitting device and thin film forming apparatus
JP4270891B2 (ja) * 2003-01-21 2009-06-03 三洋電機株式会社 Ｅｌ表示装置のレーザーリペア方法
TW575967B (en) * 2002-06-03 2004-02-11 Ritdisplay Corp Method of repairing organic light emitting element pixels
TW577136B (en) * 2002-10-25 2004-02-21 Ritdisplay Corp Detecting repairing system and method
JP2004199970A (ja) * 2002-12-18 2004-07-15 Sony Corp Ｅｌ表示装置の補修方法及びｅｌ表示装置の補修装置
JP2004342457A (ja) * 2003-05-15 2004-12-02 Sanyo Electric Co Ltd 表示パネルの製造方法および表示パネル
JP2005032576A (ja) * 2003-07-04 2005-02-03 Fuji Electric Holdings Co Ltd 多色有機発光表示素子の修復方法および修復装置
US7602958B1 (en) * 2004-10-18 2009-10-13 Kla-Tencor Corporation Mirror node process verification

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103392381A (zh) * 2011-06-16 2013-11-13 松下电器产业株式会社 有机电致发光元件的制造方法以及有机电致发光元件
US9276231B2 (en) 2011-06-16 2016-03-01 Joled Inc. Method for fabricating organic electroluminescence device and organic electroluminescence device
CN103392381B (zh) * 2011-06-16 2016-05-25 株式会社日本有机雷特显示器 有机电致发光元件的制造方法以及有机电致发光元件
CN107925005A (zh) * 2015-06-16 2018-04-17 原子能和能源替代品委员会 用于制造第一电极/有源层/第二电极的叠层的方法
CN108054278A (zh) * 2017-11-23 2018-05-18 华中科技大学 一种高良率有机太阳能电池及其制备方法

Also Published As

Publication number Publication date
TW200707719A (en) 2007-02-16
JP2008545232A (ja) 2008-12-11
KR20080027900A (ko) 2008-03-28
EP1905108A2 (fr) 2008-04-02
WO2007004118A3 (fr) 2007-07-26
US20100062550A1 (en) 2010-03-11
WO2007004118A2 (fr) 2007-01-11

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