CN102768972A - Wafer drying device - Google Patents
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- CN102768972A CN102768972A CN2012102408092A CN201210240809A CN102768972A CN 102768972 A CN102768972 A CN 102768972A CN 2012102408092 A CN2012102408092 A CN 2012102408092A CN 201210240809 A CN201210240809 A CN 201210240809A CN 102768972 A CN102768972 A CN 102768972A
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Abstract
本发明公开了一种晶圆干燥装置。所述晶圆干燥装置包括:本体;晶圆夹持机构,所述晶圆夹持机构设在所述本体上用于支撑沿竖直方向定向的晶圆;水箱,所述水箱可上下移动地设在所述本体上,所述水箱的顶壁上设有沿上下方向贯通所述顶壁的槽口用于通过晶圆;水箱驱动件,所述水箱驱动件设在所述本体上且与所述水箱相连以便驱动所述水箱上下移动;和IPA干燥系统,所述IPA干燥系统设在所述水箱上用于干燥所述晶圆。根据本发明实施例的晶圆干燥装置具有制造难度小、制造成本低、可靠性高等优点,而且大大地降低了对用于搬运晶圆的机械手的重复定位精度的要求。
The invention discloses a wafer drying device. The wafer drying device includes: a body; a wafer clamping mechanism, which is arranged on the body to support a vertically oriented wafer; a water tank, which can move up and down Provided on the body, the top wall of the water tank is provided with a notch penetrating the top wall in the up and down direction for passing the wafer; the water tank driver, the water tank driver is arranged on the body and is connected with The water tank is connected so as to drive the water tank to move up and down; and an IPA drying system, the IPA drying system is arranged on the water tank for drying the wafer. The wafer drying device according to the embodiment of the present invention has the advantages of low manufacturing difficulty, low manufacturing cost, high reliability, etc., and greatly reduces the requirement on repeat positioning accuracy of the manipulator used to transport the wafer.
Description
技术领域 technical field
本发明涉及半导体制造领域,具体而言,涉及一种晶圆干燥装置。The invention relates to the field of semiconductor manufacturing, in particular to a wafer drying device.
背景技术 Background technique
现有的晶圆干燥装置采用甩干加烘干的技术。但是晶圆要做高速旋转运动,同时会加烘干工艺,这样会对晶圆的整体稳定性有影响,严重的甚至会损坏晶圆。同时旋转台高速旋转也会加快机械设备的损耗。The existing wafer drying device adopts the technology of spinning and drying. However, the wafer needs to be rotated at a high speed, and a drying process will be added at the same time, which will affect the overall stability of the wafer, and even damage the wafer in severe cases. At the same time, the high-speed rotation of the turntable will also accelerate the loss of mechanical equipment.
发明内容 Contents of the invention
本发明旨在至少在一定程度上解决上述技术问题之一或至少提供一种有用的商业选择。为此,本发明的一个目的在于提出一种可以大大地降低对用于搬运晶圆的机械手的重复定位精度的要求的晶圆干燥装置。The present invention aims at solving one of the above technical problems at least to a certain extent or at least providing a useful commercial choice. Therefore, an object of the present invention is to provide a wafer drying device that can greatly reduce the requirement on repeat positioning accuracy of a manipulator used to transfer wafers.
为实现上述目的,根据本发明的实施例提出一种晶圆干燥装置,所述晶圆干燥装置包括:本体;晶圆夹持机构,所述晶圆夹持机构设在所述本体上用于支撑沿竖直方向定向的晶圆;水箱,所述水箱可上下移动地设在所述本体上,所述水箱的顶壁上设有沿上下方向贯通所述顶壁的槽口用于通过晶圆;水箱驱动件,所述水箱驱动件设在所述本体上且与所述水箱相连以便驱动所述水箱上下移动;和IPA干燥系统,所述IPA干燥系统设在所述水箱上用于干燥所述晶圆。In order to achieve the above object, a wafer drying device is proposed according to an embodiment of the present invention, the wafer drying device includes: a body; a wafer clamping mechanism, the wafer clamping mechanism is arranged on the body for Supporting the wafer oriented in the vertical direction; the water tank, the water tank is arranged on the body so that it can move up and down, and the top wall of the water tank is provided with a notch penetrating the top wall in the up and down direction for passing the wafer circle; the water tank driver, the water tank driver is located on the body and is connected with the water tank so as to drive the water tank to move up and down; and the IPA drying system, the IPA drying system is located on the water tank for drying the wafer.
根据本发明实施例的晶圆干燥装置通过在所述本体上设置驱动所述水箱上下移动的所述水箱驱动件,从而在对所述晶圆进行干燥时可以保持所述晶圆不动而使所述水箱上下移动,这样可以大大地降低对升降运动(即上下运动)的精度要求,从而不仅可以大大地降低所述晶圆干燥装置的加工精度以及安装和调试所述晶圆干燥装置的难度,而且可以使所述晶圆干燥装置在运行过程中动作平稳。因此,根据本发明实施例的所述晶圆干燥装置具有制造难度小、制造成本低、可靠性高等优点。According to the wafer drying device according to the embodiment of the present invention, the water tank driver is provided on the body to drive the water tank to move up and down, so that the wafer can be kept still when the wafer is dried. The water tank moves up and down, which can greatly reduce the accuracy requirements of the lifting movement (ie, up and down movement), thereby not only greatly reducing the processing accuracy of the wafer drying device and the difficulty of installing and debugging the wafer drying device , and can make the wafer drying device operate smoothly during operation. Therefore, the wafer drying device according to the embodiment of the present invention has the advantages of low manufacturing difficulty, low manufacturing cost, and high reliability.
而且,由于在对所述晶圆进行干燥时所述晶圆保持不动而所述水箱30上下移动,因此可以大大地降低对用于搬运所述晶圆的机械手的重复定位精度的要求,从而可以使所述机械手更好地、更精确地抓取所述晶圆,保证了所述晶圆的整体稳定性。Moreover, since the wafer remains stationary while the
另外,根据本发明上述实施例的晶圆干燥装置还可以具有如下附加的技术特征:In addition, the wafer drying device according to the above-mentioned embodiments of the present invention may also have the following additional technical features:
根据本发明的一个实施例,所述晶圆夹持机构包括:支架,所述支架设在所述本体上;下夹持爪支架,所述下夹持爪支架为L形,所述下夹持爪支架的竖直肢与所述支架相连且所述竖直肢的下端伸入所述水箱内;第一和第二上夹持爪;上夹持爪驱动件,所述上夹持爪驱动件设在所述支架和所述下夹持爪支架中的一个上且与所述第一和第二上夹持爪相连以便驱动所述第一和第二上夹持爪上下移动;和下夹持爪,所述下夹持爪设在所述下夹持爪支架的水平肢上,其中所述下夹持爪与所述第一和第二上夹持爪协作支撑所述晶圆且将所述晶圆沿竖直方向定向。所述晶圆夹持机构具有结构简单的优点。而且,所述晶圆夹持机构通过设置所述下夹持爪、所述第一上夹持爪和所述第二上夹持爪,从而不仅可以更加稳定地夹持所述晶圆,而且可以更加精确地将所述晶圆定位在竖直方向上,从而可以更好地对所述晶圆进行干燥。According to an embodiment of the present invention, the wafer clamping mechanism includes: a bracket, the bracket is arranged on the body; a lower clamping claw bracket, the lower clamping claw bracket is L-shaped, and the lower clamping The vertical leg of the claw-holding bracket is connected with the support and the lower end of the vertical leg stretches into the water tank; the first and second upper clamping claws; the upper clamping claw driver, the upper clamping claw a driving member is provided on one of the bracket and the lower clamping jaw bracket and is connected with the first and second upper clamping jaws so as to drive the first and second upper clamping jaws to move up and down; and a lower clamping jaw provided on a horizontal leg of the lower clamping jaw bracket, wherein the lower clamping jaw cooperates with the first and second upper clamping jaws to support the wafer and orienting the wafer in a vertical direction. The wafer clamping mechanism has the advantage of simple structure. Moreover, by setting the lower clamping claw, the first upper clamping claw and the second upper clamping claw, the wafer clamping mechanism can not only clamp the wafer more stably, but also The wafer can be positioned more precisely in the vertical direction so that the wafer can be dried better.
根据本发明的一个实施例,所述槽口的宽度与所述晶圆的厚度适配。这样在所述水箱对所述晶圆进行浸没时可以利用所述槽口对所述晶圆进行夹持。According to an embodiment of the present invention, the width of the slot is adapted to the thickness of the wafer. In this way, the notch can be used to clamp the wafer when the water tank immerses the wafer.
根据本发明的一个实施例,所述水箱上设有进水口和出水口,所述进水口适于与水源相连。通过在所述水箱上设置所述出水口和与水源相连的所述进水口,从而可以使水从所述进水口注入所述水箱且从所述出水口排出所述水箱。换言之,所述水箱内的水可以始终处于循环状态,这样可以使所述水箱内的水保持清洁,进而可以大大地提高所述晶圆的洁净度。According to an embodiment of the present invention, the water tank is provided with a water inlet and a water outlet, and the water inlet is suitable for being connected with a water source. By setting the water outlet and the water inlet connected to the water source on the water tank, water can be injected into the water tank from the water inlet and discharged from the water tank through the water outlet. In other words, the water in the water tank can always be in a circulating state, so that the water in the water tank can be kept clean, and the cleanliness of the wafer can be greatly improved.
根据本发明的一个实施例,所述IPA干燥系统包括第一和第二管道,所述第一和第二管道在所述晶圆的轴向上间隔开地设置,所述第一和第二管道中的每一个的一部分位于所述水箱内且另一部分伸出所述水箱,其中所述第一管道的所述一部分上设有第一喷嘴且所述第二管道的所述一部分上设有第二喷嘴以便向所述晶圆的两个表面喷射IPA蒸汽。所述IPA干燥系统具有结构简单的优点。According to an embodiment of the present invention, the IPA drying system includes first and second pipelines, the first and second pipelines are spaced apart in the axial direction of the wafer, and the first and second A portion of each of the pipes is located within the tank and another portion protrudes from the tank, wherein the portion of the first pipe is provided with a first nozzle and the portion of the second pipe is provided with a A second nozzle to spray IPA vapor to both surfaces of the wafer. The IPA drying system has the advantage of simple structure.
根据本发明的一个实施例,所述第一管道平行于所述第二管道,所述第一喷嘴等间距地设在所述第一管道上且所述第二喷嘴等间距地设在所述第二管道上。这样所述IPA干燥系统可以将IPA蒸汽更加均匀地喷射到所述晶圆的两个表面上,从而可以更加均匀地对所述晶圆的两个表面进行干燥以便避免所述晶圆的表面上留有水痕。According to an embodiment of the present invention, the first pipeline is parallel to the second pipeline, the first nozzles are equidistantly arranged on the first pipeline and the second nozzles are equidistantly arranged on the on the second pipe. In this way, the IPA drying system can spray IPA steam onto the two surfaces of the wafer more evenly, so that the two surfaces of the wafer can be dried more evenly so as to avoid the surface of the wafer There are water marks.
根据本发明的一个实施例,所述水箱驱动件包括:驱动电机,所述驱动电机设在所述本体上;和滚珠丝杠,所述滚珠丝杠的螺杆与所述驱动电机相连,所述滚珠丝杠的螺母与所述水箱相连。通过利用所述滚珠丝杠驱动所述水箱上下移动,从而可以使所述水箱匀速地上下移动,这样不仅可以大大地提高所述晶圆干燥装置在运行时的稳定性,而且可以更加均匀地对所述晶圆的两个表面进行干燥以便避免所述晶圆的表面上留有水痕。According to an embodiment of the present invention, the water tank driving part includes: a driving motor, the driving motor is arranged on the body; and a ball screw, the screw of the ball screw is connected with the driving motor, the The nut of the ball screw is connected with the water tank. By using the ball screw to drive the water tank to move up and down, the water tank can be moved up and down at a uniform speed, which can not only greatly improve the stability of the wafer drying device during operation, but also more evenly Both surfaces of the wafer are dried in order to avoid water marks on the surface of the wafer.
根据本发明的一个实施例,所述晶圆干燥装置还包括水箱支架,所述水箱设在所述水箱支架上,其中所述水箱驱动件与所述水箱支架相连以便驱动所述水箱支架和所述水箱上下移动。通过设置所述水箱支架,可以将所述水箱驱动件直接与所述水箱支架相连并通过所述水箱支架来带动所述水箱上下移动,这样可以避免损坏所述水箱,提高所述水箱的使用寿命。According to an embodiment of the present invention, the wafer drying device further includes a water tank support, the water tank is arranged on the water tank support, wherein the water tank driving member is connected with the water tank support so as to drive the water tank support and the water tank support. The water tank moves up and down. By setting the water tank bracket, the water tank driving part can be directly connected with the water tank bracket and drive the water tank to move up and down through the water tank bracket, so as to avoid damage to the water tank and improve the service life of the water tank .
根据本发明的一个实施例,所述水箱支架包括:水平板,所述水箱设在所述水平板上;和竖直板,所述竖直板设在所述水平板上且从所述水平板向上延伸,所述竖直板与所述水箱驱动件相连。所述水箱支架具有结构简单的优点。According to an embodiment of the present invention, the water tank support includes: a horizontal plate on which the water tank is set; and a vertical plate A plate extends upwardly, and the vertical plate is connected to the tank drive. The water tank bracket has the advantage of simple structure.
根据本发明的一个实施例,所述晶圆干燥装置还包括滚珠导轨,所述滚珠导轨的导轨设在所述本体上且沿上下方向延伸,所述滚珠导轨的滑块设在所述竖直板上。通过设置具有沿上下方向延伸的导轨的所述滚珠导轨,从而可以使所述水箱支架和所述水箱更加精确地沿上下方向移动。According to an embodiment of the present invention, the wafer drying device further includes a ball guide rail, the guide rail of the ball guide rail is arranged on the body and extends in the vertical direction, and the slider of the ball guide rail is arranged on the vertical board. By providing the ball guide rail having a guide rail extending in the vertical direction, the water tank bracket and the water tank can be moved in the vertical direction more precisely.
本发明的附加方面和优点将在下面的描述中部分给出,部分将从下面的描述中变得明显,或通过本发明的实践了解到。Additional aspects and advantages of the invention will be set forth in the description which follows, and in part will be obvious from the description, or may be learned by practice of the invention.
附图说明 Description of drawings
本发明的上述和/或附加的方面和优点从结合下面附图对实施例的描述中将变得明显和容易理解,其中:The above and/or additional aspects and advantages of the present invention will become apparent and comprehensible from the description of the embodiments in conjunction with the following drawings, wherein:
图1是根据本发明实施例的晶圆干燥装置的结构示意图;1 is a schematic structural view of a wafer drying device according to an embodiment of the present invention;
图2是根据本发明实施例的晶圆干燥装置的结构示意图;和2 is a schematic structural view of a wafer drying device according to an embodiment of the present invention; and
图3是根据本发明实施例的晶圆干燥装置的剖视图。FIG. 3 is a cross-sectional view of a wafer drying apparatus according to an embodiment of the present invention.
具体实施方式 Detailed ways
下面详细描述本发明的实施例,所述实施例的示例在附图中示出,其中自始至终相同或类似的标号表示相同或类似的元件或具有相同或类似功能的元件。下面通过参考附图描述的实施例是示例性的,旨在用于解释本发明,而不能理解为对本发明的限制。Embodiments of the present invention are described in detail below, examples of which are shown in the drawings, wherein the same or similar reference numerals designate the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the figures are exemplary and are intended to explain the present invention and should not be construed as limiting the present invention.
在本发明的描述中,需要理解的是,术语“中心”、“纵向”、“横向”、“长度”、“宽度”、“厚度”、“上”、“下”、“前”、“后”、“左”、“右”、“竖直”、“水平”、“顶”、“底”“内”、“外”、“顺时针”、“逆时针”等指示的方位或位置关系为基于附图所示的方位或位置关系,仅是为了便于描述本发明和简化描述,而不是指示或暗示所指的装置或元件必须具有特定的方位、以特定的方位构造和操作,因此不能理解为对本发明的限制。In describing the present invention, it should be understood that the terms "center", "longitudinal", "transverse", "length", "width", "thickness", "upper", "lower", "front", " Orientation or position indicated by "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", etc. The relationship is based on the orientation or positional relationship shown in the drawings, and is only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the referred device or element must have a specific orientation, be constructed and operated in a specific orientation, therefore It should not be construed as a limitation of the present invention.
此外,术语“第一”、“第二”仅用于描述目的,而不能理解为指示或暗示相对重要性或者隐含指明所指示的技术特征的数量。由此,限定有“第一”、“第二”的特征可以明示或者隐含地包括一个或者更多个该特征。在本发明的描述中,“多个”的含义是两个或两个以上,除非另有明确具体的限定。In addition, the terms "first" and "second" are used for descriptive purposes only, and cannot be interpreted as indicating or implying relative importance or implicitly specifying the quantity of indicated technical features. Thus, a feature defined as "first" and "second" may explicitly or implicitly include one or more of these features. In the description of the present invention, "plurality" means two or more, unless otherwise specifically defined.
在本发明中,除非另有明确的规定和限定,术语“安装”、“相连”、“连接”、“固定”等术语应做广义理解,例如,可以是固定连接,也可以是可拆卸连接,或一体地连接;可以是机械连接,也可以是电连接;可以是直接相连,也可以通过中间媒介间接相连,可以是两个元件内部的连通。对于本领域的普通技术人员而言,可以根据具体情况理解上述术语在本发明中的具体含义。In the present invention, unless otherwise clearly specified and limited, terms such as "installation", "connection", "connection" and "fixation" should be understood in a broad sense, for example, it can be a fixed connection or a detachable connection , or integrally connected; it may be mechanically connected or electrically connected; it may be directly connected or indirectly connected through an intermediary, and it may be the internal communication of two components. Those of ordinary skill in the art can understand the specific meanings of the above terms in the present invention according to specific situations.
在本发明中,除非另有明确的规定和限定,第一特征在第二特征之“上”或之“下”可以包括第一和第二特征直接接触,也可以包括第一和第二特征不是直接接触而是通过它们之间的另外的特征接触。而且,第一特征在第二特征“之上”、“上方”和“上面”包括第一特征在第二特征正上方和斜上方,或仅仅表示第一特征水平高度高于第二特征。第一特征在第二特征“之下”、“下方”和“下面”包括第一特征在第二特征正下方和斜下方,或仅仅表示第一特征水平高度小于第二特征。In the present invention, unless otherwise clearly specified and limited, a first feature being "on" or "under" a second feature may include direct contact between the first and second features, and may also include the first and second features Not in direct contact but through another characteristic contact between them. Moreover, "above", "above" and "above" the first feature on the second feature include that the first feature is directly above and obliquely above the second feature, or simply means that the first feature is horizontally higher than the second feature. "Below", "beneath" and "under" the first feature to the second feature include that the first feature is directly below and obliquely below the second feature, or simply means that the first feature has a lower level than the second feature.
下面参考图1至图3描述根据本发明实施例的晶圆干燥装置1。如图1至图3所示,根据本发明实施例的晶圆干燥装置1包括本体10、晶圆夹持机构、水箱30、水箱驱动件40和IPA干燥系统50。A wafer drying apparatus 1 according to an embodiment of the present invention will be described below with reference to FIGS. 1 to 3 . As shown in FIGS. 1 to 3 , a wafer drying device 1 according to an embodiment of the present invention includes a
所述晶圆夹持机构设在本体10上用于支撑沿竖直方向(竖直方向A如图1至图3中的箭头方向所示,其中竖直方向与上下方向相同)定向的晶圆2。水箱30可上下移动地设在本体10上,水箱30的顶壁32上设有沿上下方向贯通顶壁32的槽口31用于通过晶圆2。水箱驱动件40设在本体10上,且水箱驱动件40与水箱30相连以便驱动水箱30上下移动。IPA干燥系统50设在水箱30上用于干燥晶圆2。The wafer clamping mechanism is provided on the
下面参照图1至图3描述利用根据本发明实施例的晶圆干燥装置1对晶圆2进行干燥的过程。首先,机械手(图中未示出)将未进行干燥的晶圆2搬运到所述晶圆夹持机构上,然后水箱驱动件40驱动水箱30向上移动直至水箱30内的水将晶圆2完全浸没(晶圆2从槽口31进入到水箱30内)。然后水箱驱动件40驱动水箱30向下移动,当晶圆2的上端露出水面时开始利用IPA干燥系统50对晶圆2进行干燥直至晶圆2全部露出水面,此时完成了对整个晶圆2的干燥。利用所述机械手将干燥后的晶圆2从所述晶圆夹持机构上搬运走。The process of drying a
根据本发明实施例的晶圆干燥装置1通过在本体10上设置驱动水箱30上下移动的水箱驱动件40,从而在对晶圆2进行干燥时可以保持晶圆2不动而使水箱30上下移动,这样可以大大地降低对升降运动(即上下运动)的精度要求,从而不仅可以大大地降低晶圆干燥装置1的加工精度以及安装和调试晶圆干燥装置1的难度,而且可以使晶圆干燥装置1在运行过程中动作平稳。因此,根据本发明实施例的晶圆干燥装置1具有制造难度小、制造成本低、可靠性高等优点。According to the wafer drying device 1 of the embodiment of the present invention, the
而且,由于在对晶圆2进行干燥时晶圆2保持不动而水箱30上下移动,因此可以大大地降低对用于搬运晶圆2的机械手的重复定位精度的要求,从而可以使所述机械手更好地、更精确地抓取晶圆2,保证了晶圆2的整体稳定性。Moreover, since the
如图1至图3所示,在本发明的一些实施例中,所述晶圆夹持机构可以包括支架21、下夹持爪支架22、第一上夹持爪23、第二上夹持爪24、上夹持爪驱动件25和下夹持爪26。As shown in Figures 1 to 3, in some embodiments of the present invention, the wafer clamping mechanism may include a
支架21可以设在本体10上。下夹持爪支架22可以是L形,下夹持爪支架22的竖直肢221可以与支架21相连,且竖直肢221的下端可以伸入水箱30内(水箱30的顶壁32上可以设有沿上下方向贯通顶壁32的通孔用于通过竖直肢221的下端)。上夹持爪驱动件25可以设在支架21和下夹持爪支架22中的一个上,且上夹持爪驱动件25可以与第一上夹持爪23和第二上夹持爪24相连以便驱动第一上夹持爪23和第二上夹持爪24上下移动。下夹持爪26可以设在下夹持爪支架22的水平肢222上,其中下夹持爪26可以与第一上夹持爪23和第二上夹持爪24协作支撑晶圆2且可以将晶圆2沿竖直方向定向。The
有利地,竖直肢221的下端可以伸入水箱30内,这样,水平肢222可以全部设置在水箱30的容纳腔内,从而水箱30的所述顶壁上可以设有沿上下方向贯通所述顶壁的通孔用于通过竖直肢221,且所述通孔可以与竖直肢221的下端相适配Advantageously, the lower ends of the
所述晶圆夹持机构具有结构简单的优点。而且,所述晶圆夹持机构通过设置下夹持爪26、第一上夹持爪23和第二上夹持爪24,从而不仅可以更加稳定地夹持晶圆2,而且可以更加精确地将晶圆2定位在竖直方向上,从而可以更好地对晶圆2进行干燥。具体地,上夹持爪驱动件25可以是气缸,上夹持爪驱动件25也可以是电缸。The wafer clamping mechanism has the advantage of simple structure. Moreover, the wafer clamping mechanism can not only clamp the
在本发明的一个实施例中,槽口31的宽度可以与晶圆2的厚度适配,这样在水箱30对晶圆2进行浸没时可以利用槽口31对晶圆2进行夹持。有利地,槽口31可以是矩形槽口,且槽口31的长度可以远远大于槽口31的宽度。In one embodiment of the present invention, the width of the
具体地,当水箱驱动件40驱动水箱30向上移动且晶圆2的下端进入水箱30后,上夹持爪驱动件25可以驱动第一上夹持爪23和第二上夹持爪24脱离晶圆2向上移动以便晶圆2可以完全浸没在水箱30内的水中,此时槽口31和下夹持爪26可以协作支撑晶圆2且可以将晶圆2沿竖直方向定向。当水箱驱动件40驱动水箱30向下移动且晶圆2的上部伸出水箱30后,上夹持爪驱动件25可以驱动第一上夹持爪23和第二上夹持爪24向下移动以便使第一上夹持爪23和第二上夹持爪24与下夹持爪26协作支撑晶圆2且将晶圆2沿竖直方向定向。Specifically, when the
下面参照图1至图3描述晶圆2的取放过程。在放置晶圆2时,首先可以利用上夹持爪驱动件25驱动第一上夹持爪23和第二上夹持爪24向上移动以便避开晶圆2,随后可以利用所述机械手将晶圆2搬运到下夹持爪26上(下夹持爪26夹持晶圆2),然后可以利用上夹持爪驱动件25驱动第一上夹持爪23和第二上夹持爪24向下移动以便使第一上夹持爪23和第二上夹持爪24与下夹持爪26协作支撑晶圆2且将晶圆2沿竖直方向定向,最后所述机械手脱离晶圆2并复位。取出晶圆2的过程与放置晶圆2的过程相反,在此不再详细地描述。The pick-and-place process of the
有利地,水箱30上可以设有进水口和出水口,所述进水口可以适于与水源相连。通过在水箱30上设置所述出水口和与水源相连的所述进水口,从而可以使水从所述进水口注入水箱30且从所述出水口排出水箱30。换言之,水箱30内的水可以始终处于循环状态,这样可以使水箱30内的水保持清洁,进而可以大大地提高晶圆2的洁净度。具体地,水箱30内的水可以是去离子水。Advantageously, the
如图1至图3所示,在本发明的一些示例中,IPA干燥系统50可以包括第一管道51和第二管道52,第一管道51和第二管道52可以在晶圆2的轴向上间隔开地设置,第一管道51和第二管道52中的每一个的一部分可以位于水箱30内,且第一管道51和第二管道52中的每一个的另一部分可以伸出水箱30(第一管道51和第二管道52中的每一个的另一部分可以与IPA蒸汽发生器相连),其中第一管道51的所述一部分(即第一管道51的位于水箱30内的部分)上可以设有第一喷嘴且第二管道52的所述一部分(即第二管道52的位于水箱30内的部分)上可以设有第二喷嘴以便向晶圆2的两个表面喷射IPA(异丙醇)蒸汽。IPA干燥系统50具有结构简单的优点。As shown in Figures 1 to 3, in some examples of the present invention, the
在本发明的一个具体示例中,第一管道51可以平行于第二管道52,所述第一喷嘴可以等间距地设在第一管道51上且所述第二喷嘴可以等间距地设在第二管道52上。换言之,所述第一喷嘴可以是多个且多个所述第一喷嘴可以等间距地设在第一管道51上,所述第二喷嘴可以是多个且多个所述第二喷嘴可以等间距地设在第二管道52上。这样IPA干燥系统50可以将IPA蒸汽更加均匀地喷射到晶圆2的两个表面上,从而可以更加均匀地对晶圆2的两个表面进行干燥以便避免晶圆2的表面上留有水痕。In a specific example of the present invention, the
有利地,第一管道51的两端可以伸出水箱30(即第一管道51的中部可以位于水箱30内)且第一管道51的两端都可以与IPA蒸汽发生器相连,第二管道52的两端可以伸出水箱30(即第二管道52的中部可以位于水箱30内)且第二管道52的两端都可以与IPA蒸汽发生器相连。也就是说,IPA蒸汽可以从第一管道51的两端同时进入第一管道51内且IPA蒸汽可以从第二管道52的两端同时进入第二管道52内。这样IPA干燥系统50可以将IPA蒸汽更加均匀地喷射到晶圆2的两个表面上,从而可以更加均匀地对晶圆2的两个表面进行干燥以便避免晶圆2的表面上留有水痕。Advantageously, both ends of the
如图1至图3所示,在本发明的一些实施例中,水箱驱动件40可以包括驱动电机41和滚珠丝杠42。驱动电机41可以设在本体10上,滚珠丝杠42的螺杆421可以与驱动电机41相连,滚珠丝杠42的螺母422可以与水箱30相连。驱动电机41可以驱动滚珠丝杠42的螺杆421旋转,进而可以通过滚珠丝杠42的螺母422带动水箱30上下移动。通过利用滚珠丝杠42驱动水箱30上下移动,从而可以使水箱30匀速地上下移动,这样不仅可以大大地提高晶圆干燥装置1在运行时的稳定性,而且可以更加均匀地对晶圆2的两个表面进行干燥以便避免晶圆2的表面上留有水痕(晶圆2可以匀速地露出水面)。水箱驱动件40还可以是电缸。As shown in FIGS. 1 to 3 , in some embodiments of the present invention, the water
在本发明的一个示例中,如图1至图3所示,晶圆干燥装置1还可以包括水箱支架60,水箱30可以设在水箱支架60上,其中水箱驱动件40可以与水箱支架60相连以便驱动水箱支架60和水箱30上下移动。通过设置水箱支架60,可以将水箱驱动件40直接与水箱支架60相连并通过水箱支架60来带动水箱30上下移动,这样可以避免损坏水箱30,提高水箱30的使用寿命。具体地,滚珠丝杠42的螺母422可以与水箱支架60相连。水箱支架60可以由金属材料制成,水箱30可以由非金属材料(例如塑料)制成。In an example of the present invention, as shown in FIG. 1 to FIG. 3 , the wafer drying device 1 may further include a
可选地,水箱支架60可以包括水平板61和竖直板62,水箱30可以设在水平板61上(例如,水箱30可以通过紧固件(例如螺钉)可拆卸地固定在水平板61上),竖直板62可以设在水平板61上,且竖直板62可以从水平板61向上延伸,竖直板62可以与水箱驱动件40相连。水箱支架60具有结构简单的优点。具体地,滚珠丝杠42的螺母422可以与竖直板62的后表面相连,其中竖直板62的后表面是指竖直板62的远离水箱30的表面。Optionally, the
有利地,水箱支架60还可以包括左侧板和右侧板,所述左侧板和所述右侧板中的每一个都可以是大体直角三角形。其中,所述左侧板的一个直角边可以与水平板61的左侧相连且所述左侧板的另一个直角边可以与竖直板62的左侧相连,所述右侧板的一个直角边可以与水平板61的右侧相连且所述右侧板的另一个直角边可以与竖直板62的右侧相连。Advantageously, the
在本发明的一个示例中,如图1和图2所示,晶圆干燥装置1还可以包括滚珠导轨70,滚珠导轨70的导轨可以设在本体10上,且滚珠导轨70的导轨可以沿上下方向延伸,滚珠导轨70的滑块可以设在竖直板62上。通过设置具有沿上下方向延伸的导轨的滚珠导轨70,从而可以使水箱支架60和水箱30更加精确地沿上下方向移动。具体地,滚珠导轨70的滑块可以与竖直板62的后表面相连。In an example of the present invention, as shown in FIG. 1 and FIG. 2 , the wafer drying device 1 may further include a
根据本发明实施例的晶圆干燥装置1具有制造难度小、制造成本低、可靠性高等优点,而且大大地降低了对用于搬运晶圆2的机械手的重复定位精度的要求。The wafer drying device 1 according to the embodiment of the present invention has the advantages of low manufacturing difficulty, low manufacturing cost, high reliability, etc., and greatly reduces the requirement for repeat positioning accuracy of the manipulator used to transport the
在本说明书的描述中,参考术语“一个实施例”、“一些实施例”、“示例”、“具体示例”、或“一些示例”等的描述意指结合该实施例或示例描述的具体特征、结构、材料或者特点包含于本发明的至少一个实施例或示例中。在本说明书中,对上述术语的示意性表述不一定指的是相同的实施例或示例。而且,描述的具体特征、结构、材料或者特点可以在任何的一个或多个实施例或示例中以合适的方式结合。In the description of this specification, descriptions referring to the terms "one embodiment", "some embodiments", "example", "specific examples", or "some examples" mean that specific features described in connection with the embodiment or example , structure, material or characteristic is included in at least one embodiment or example of the present invention. In this specification, schematic representations of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.
尽管上面已经示出和描述了本发明的实施例,可以理解的是,上述实施例是示例性的,不能理解为对本发明的限制,本领域的普通技术人员在不脱离本发明的原理和宗旨的情况下在本发明的范围内可以对上述实施例进行变化、修改、替换和变型。Although the embodiments of the present invention have been shown and described above, it can be understood that the above embodiments are exemplary and cannot be construed as limitations to the present invention. Variations, modifications, substitutions, and modifications to the above-described embodiments are possible within the scope of the present invention.
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| CN114562874A (en) * | 2022-03-02 | 2022-05-31 | 浙江光特科技有限公司 | Drying treatment device used after wafer cleaning |
| CN114562874B (en) * | 2022-03-02 | 2023-07-04 | 浙江光特科技有限公司 | Be used for wafer to wash back drying device |
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| CN115031509B (en) * | 2022-05-18 | 2023-06-30 | 扬州思普尔科技有限公司 | Lifting type semiconductor wafer drying device |
| WO2025242162A1 (en) * | 2024-05-24 | 2025-11-27 | 北京北方华创微电子装备有限公司 | Steam generating device and semiconductor process apparatus |
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