CN107782995A

CN107782995A - A kind of electronic product combined stress is known the real situation test method

Info

Publication number: CN107782995A
Application number: CN201710993342.1A
Authority: CN
Inventors: 倪永亮; 郑洁; 孙文欣; 党寻诣; 王道灿
Original assignee: China North Vehicle Research Institute
Current assignee: China North Vehicle Research Institute
Priority date: 2017-10-23
Filing date: 2017-10-23
Publication date: 2018-03-09

Abstract

The invention relates to a comprehensive stress test method for electronic products, and relates to the technical field of comprehensive stress tests for electronic products. The present invention is based on the use environment and electrical characteristics of armored vehicle electronic products, and fully considers the harsh temperature, vibration, electrical stress and other characteristics of armored vehicle electronic products. The comprehensive stress investigation test plan and test method for cyclic, random vibration and electrical stress, and each test step and key parameter values are clearly given, which has strong engineering operability. The test section of the test scheme not only considers various real environmental stresses and electrical stress levels, but also comprehensively considers the weight and proportion of various stresses in the real vehicle environment. After engineering project test verification, it shows that the comprehensive stress The ground truth test method has a high degree of confidence.

Description

Comprehensive stress touch test method for electronic product

Technical Field

The invention relates to the technical field of comprehensive stress tests of electronic products, in particular to a comprehensive stress touch test method of an electronic product.

Background

With the strong trend of intelligent and full-electric development of vehicles, the number of vehicle-mounted electronic components increases rapidly, the number of chips in the components and the integration difficulty also show an exponential curve rising trend, and unpredictable factors such as jump, drift, failure and the like under special and critical conditions exist after complex circuit combination, so that the reliability level of an electronic product with higher integration degree is lower theoretically without special reliability design and experimental verification.

The current electronic product comprehensive stress test has the following problems:

1) a bench test scheme of a conventional comprehensive stress blinding test is not formed in the field of armored vehicle engineering research, and a test method and a basis which can be specifically executed are lacked;

2) at present, five tests (high temperature, low temperature, impact, vibration and damp heat) which are commonly adopted are asynchronous and short-time performance verification tests, and are not enough to comprehensively assess the reliability of products;

3) due to the particularity of armor products, the setting indexes of various parameters (such as electric stress) of the comprehensive stress touch test of electronic products in the field cannot refer to the military industry fields of aviation, aerospace, ships and the like. An excessively high stress index will result in a product overstress test; the purpose of touching the ground and checking the reliability of the product cannot be achieved by too low stress indexes, the definition of the stress indexes is difficult, and the engineering experience is lacked.

Disclosure of Invention

Technical problem to be solved

The technical problem to be solved by the invention is as follows: how to design a comprehensive stress model test scheme of an electronic product, providing a simulated stress environment of the product in an actual working scene, getting rid of the dependence of reliability verification on the whole vehicle, realizing scientific assessment on the real reliability level of the product in advance, and achieving the purpose of verifying or checking the reliability level of the product with high reliability in a laboratory environment.

(II) technical scheme

In order to solve the technical problem, the invention provides a comprehensive stress touch test method for an electronic product, which comprises the following steps of:

step 1, rigidly connecting a tested article to a vibration table board through a test fixture;

step 2, installing a temperature sensor and a vibration sensor on the selected control point;

step 3, connecting test equipment according to the test requirements, and carrying out normal-temperature power-on test on the tested article before the test to determine that the function and the performance of the tested article are normal;

step 4, applying comprehensive stress to the tested object;

step 5, observing the change of the electrical stress in the process of applying the comprehensive stress, wherein the change comprises current, voltage and power;

step 6, when the tested product has over-poor performance or loss of function, suspending the test;

and 7, after troubleshooting and repairing, returning to the step 1 to repeat the test until the test is finished after the cutoff condition of the test plan is reached.

(III) advantageous effects

The comprehensive stress groping test scheme and the test method based on the humidity change, the temperature cycle, the random vibration and the electric stress are suitable for the electronic product of the armored vehicle, the test steps and the key parameter values are definitely given, and the engineering operability is strong. The test section of the test scheme not only considers the stress and the electric stress level of various real environments, but also comprehensively considers the weight and the proportion of various stresses in the real vehicle environment, and the comprehensive stress touch-down test method has higher confidence coefficient after being verified by engineering project tests.

Drawings

FIG. 1 is a cross-sectional view of an electrical stress cycle test of the present invention;

FIG. 2 is a vibration pattern diagram of the present invention tracked vehicle;

FIG. 3 is a cross-sectional view of a comprehensive stress-blinding test cycle of the present invention.

Detailed Description

In order to make the objects, contents, and advantages of the present invention clearer, the following detailed description of the embodiments of the present invention will be made in conjunction with the accompanying drawings and examples.

The invention firstly designs an electrical stress cycle test section, as shown in fig. 1, taking a vehicle direct current 28V electronic product as an example, the nominal value of the electrical stress is 28V, and according to the actual application environment of the product, the lower limit voltage adopted in the test is 20V direct current and the upper limit voltage is 33V. The input voltage of the product in the 1 st cycle of 24 hours is determined to be the nominal voltage direct current 28V, the input voltage in the 2 nd cycle is the lower limit voltage direct current 20V, the input voltage in the 3 rd cycle is the nominal voltage direct current 28V, the input voltage in the 4 th cycle is the upper limit voltage direct current 33V, and the input voltage in the 5 th cycle is the nominal voltage direct current 28V … …. By analogy, a complete electrical stress cycle was constructed, which was repeated throughout the test period.

Table 1: narrow band random vibration data for a crawler fastener

And secondly, designing a vibration stress applying model, taking electronic equipment on the tracked vehicle as an example, and according to the vibration stress generated by the transportation and the use of the vehicle as the working vibration condition of the product. Combining with the vibration stress application requirement of the tracked vehicle equipment in GJB899A-2009, proposing a tracked vehicle random spectrum type (figure 2), selecting narrow-band random vibration data of a tracked vehicle fastening object from the vibration data (see table 1), taking 6 vibration time periods in the section of each working cycle (24 hours), and selecting the sequence of vibration curves according to the vibration time periods in the actual vehicle mounting direction of a product: the 1 st vibration period V01 is scanned 5 times continuously-the 2 nd vibration period V02 is scanned 5 times continuously-the 3 rd vibration period V03 is scanned 5 times continuously-the 4 th vibration period V04 is scanned 5 times continuously-the 5 th vibration period V05 is scanned 5 times continuously-the 6 th vibration period V01 is scanned 5 times continuously; the 1 st shaking period V02 of the second duty cycle scans 5 times in succession-the 2 nd shaking period V03 of the second duty cycle scans 5 times … … in succession, and so on. The stress design for each duty cycle was combined with the vibration stress application time as in table 1 and the random pattern as in figure 2.

The cyclic cross section of the comprehensive stress bottoming test of the invention is shown in fig. 3, and is as follows: the method is carried out according to the rule of power failure 2 h-power on 8 h-power off 4 h-power on 8 h-power off 2h, is a test scheme and a test method based on comprehensive stress of humidity change, temperature cycle, random vibration and electric stress, and selects 24h as 1 working cycle. Wherein,

1) the electrical stress is applied according to the cycle rule of figure 1, and the working voltage applied each time is selected to be applied circularly according to the rule of 2h power-on 8h power-off 4h power-on 8h power-off 2h power-off; 2) the maximum and minimum allowable temperatures for the actual normal operation of the product are selected as the upper limit and the lower limit for the temperature stress, and a certain electronic product is taken as an example: the working temperature range of the product is as follows: -43 ℃ to +70 ℃; the storage range is-43 to +70 ℃. The working temperature of the product is consistent with the storage temperature, and the cold soaking and hot soaking of the product are not considered separately. Selecting the lowest working temperature of the reliability test to be-43 ℃; the maximum working temperature is 70 ℃, and the temperature change rate is 5 ℃/min according to the condition that the temperature change rate is more than 5 ℃/min in the product working environment. Applying low temperature for 12h and then applying high temperature for 12h in each working cycle; 3) considering that the product is possibly applied to the high-temperature and high-humidity environment in the south, after the relative humidity is stabilized to 95 percent when each working cycle is carried out to a high-temperature stage, the humidification is stopped and is not controlled any more, and the humidity is changed freely; 4) vibration conditions were applied according to the cross-sections of table 1 and fig. 2, each time for 1h, consistent with engineering experience of applying vibration environmental stress at 25% duty cycle time.

Based on the analysis, the comprehensive stress test method for the electronic product provided by the invention comprises the following steps:

a. rigidly connecting the tested object to the vibration table board through a test clamp;

b. reliably mounting the temperature sensor and the vibration sensor at the selected control point;

c. connecting test equipment according to test requirements, and carrying out normal-temperature power-on test on the tested article before the test to ensure that the tested article has normal functions and performances;

d. applying comprehensive stress to the tested object according to the condition of the figure 3;

e. noting changes in electrical stress (including current, voltage, power, etc.) during the application of the resultant stress;

f. when the tested product has over-poor performance or loss of function, suspending the test;

g. and repeating the step a after the troubleshooting and repairing.

h. The test was terminated after the test plan cut-off condition was reached.

In the invention, 1) a comprehensive stress-based test section of an armored vehicle electronic product is explicitly provided: the comprehensive stress is composed of humidity change, temperature circulation, random vibration and electric stress; 2) defining the application scheme of the temperature stress in the comprehensive stress bottom touch test section: adopting a temperature cycle test scheme; 3) defining the application scheme of the vibration stress in the comprehensive stress bottom-touch test section: adopting a random vibration test scheme; 4) defining the application scheme of the electrical stress in the comprehensive stress bottom-touch test section: summarizing and providing a special electric stress test scheme by combining various factors such as the national military standard, the real vehicle working condition and the like; 5) and (3) clearly giving the values of all key parameters under the comprehensive stress bottom-of-touch test profile subjected to full engineering verification: the temperature change rate, the high temperature cut-off point and the low temperature cut-off point of the temperature cycle; selecting and stopping points of a curve of random vibration; upper and lower electrical stress values, etc.

The above description is only a preferred embodiment of the present invention, and it should be noted that, for those skilled in the art, several modifications and variations can be made without departing from the technical principle of the present invention, and these modifications and variations should also be regarded as the protection scope of the present invention.

Claims

1. An electronic product comprehensive stress testing method, is characterized in that, comprises the following steps:

Step 1. Rigidly connect the electronic product under test to the vibrating table through the test fixture;

Step 2, installing the temperature sensor and the vibration sensor on the selected control point;

Step 3. Connect the test equipment according to the test requirements, and conduct a normal temperature power-on test on the tested product before the test to confirm that the function and performance of the tested product are normal;

Step 4, applying comprehensive stress to the tested product;

Step 5, observe the change of electrical stress during the process of comprehensive stress application, including current, voltage and power;

Step 6. When the performance of the tested product is out of tolerance or the function is lost, the test is suspended;

Step 7. After troubleshooting and repairing, return to step 1 to repeat the test until the cut-off condition of the test plan is reached and the test ends.

2. method as claimed in claim 1, is characterized in that, in step 4, according to following condition, comprehensive stress is applied to tested product:

The electrical stress is to choose the working voltage applied each time according to the law of power-off 2h, power-on 8h, power-off 4h, power-on 8h, power-off 2h;

For temperature stress, the maximum and minimum allowable temperatures of the actual normal work of the product are selected as the upper and lower limits. The working temperature of the product is consistent with the storage temperature. The minimum working temperature of this preliminary test is selected as -43°C; In the working environment of the product, if the temperature change rate is greater than 5°C/min and less than the preset threshold value, the temperature change rate is 5°C/min, and the preset low temperature is applied for 12 hours in each working cycle, and then the preset high temperature is applied for 12 hours;

When the relative humidity is stabilized to 95% in the high temperature stage of each working cycle, stop the humidification and no longer control it, and let the humidity change freely;

The vibration data is selected from the narrow-band random vibration data in Table 1, and the vibration conditions are applied according to the following profile, and the vibration is applied for 1 hour each time: 6 vibration periods are selected in the profile of each working cycle, and the vibration period is selected according to the actual vehicle installation direction of the product. The sequence of the vibration curve: the first vibration period V01 continuously scans 5 times - the second vibration period V02 continuously scans 5 times - the third vibration period V03 continuously scans 5 times - the fourth vibration period V04 continuously scans 5 times - the 5 continuous scans of V05 in 5 vibration periods - 5 continuous scans of V01 in the 6th vibration period; 5 continuous scans of V02 in the first vibration period of the second working cycle - continuous scanning of V03 in the second vibration period of the second working cycle 5 times, and so on;

Table 1

3. The method according to claim 1 or 2, wherein the product is an armored vehicle electronic product.