CN108398590A - A kind of voltage peak detection circuit of numeral output - Google Patents
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Abstract
Description
技术领域technical field
本发明涉及一种电子电路结构,更具体地说涉及一种数字输出的电压峰值检测电路。The invention relates to an electronic circuit structure, in particular to a digital output voltage peak detection circuit.
背景技术Background technique
峰值检测器被广泛应用于核辐射探测、地质学、自动增益控制、振荡器以及RF功率运放的反馈保护系统中。峰值检测器有模拟输出的和数字输出的峰值检测器,在噪声或干扰环境下跟踪微弱信号,这要求峰值检测器具有检测精度高、抗干扰能力强并且易于控制及信号处理等特点,模拟输出的峰值检测器由于原理结构的限制,已经不能满足设计要求,一般采用数字输出的峰值检测器。当前数字输出的峰值检测电路由于采用的是先模拟峰值检测再数字转换的原理,就存在峰值检测精度不高、采样频率过低、抗干扰能力差、电容积分非线性大使信号失真、且系统调试困难等缺陷。Peak detectors are widely used in nuclear radiation detection, geology, automatic gain control, oscillators, and feedback protection systems for RF power amplifiers. Peak detectors have analog output and digital output peak detectors, and track weak signals in noise or interference environments, which requires peak detectors to have high detection accuracy, strong anti-interference ability, and easy control and signal processing. Analog output Due to the limitations of the principle and structure, the peak detectors in the field can no longer meet the design requirements, and the peak detectors with digital output are generally used. Due to the current digital output peak detection circuit adopts the principle of analog peak detection first and then digital conversion, there are problems such as low peak detection accuracy, low sampling frequency, poor anti-interference ability, nonlinear capacitance integration, signal distortion, and system debugging. Difficulties and other defects.
数字输出的电压信号峰值测量电路是基础电量测试仪器中信号数据采集的核心电路,传统上电压信号峰值到数字转换主要是先用模拟的电压峰值检测电路获得电压峰值,再将电压峰值通过A/D转换电路获得数字输出。而模拟的电压峰值检测电路主要有两种,一种是电压型的峰值测量电路,另一种是跨导型的峰值测量电路。电压型的峰值测量电路原理简单,但积分非线性大,通频带小,动态范围也小(对小幅度信号的响应差,一般要求信号大于200mV),对处理快信号的效果不太令人满意。虽然跨导型的峰值测量电路性能优于电压型的,但在电路设计上也存在困难。由于使用跨导放大器,在回路增益中有一项积分因子与电容C有关,为了提高电路的线性性能,需要尽可能大的电容C,而加大电容C会减小电路的通频带和摆率。这样两种电路检测出的电压峰值具有滞后性,当峰值由低电平到高电平变化,后续电路检测到此电平变化即认为峰值到来,同时启动对峰值检测电路输出的峰值进行A/D转换,带来明显的转换误差,电路的可靠性不仅取决于积分电路稳定性,而且取决于被检测信号的波形,对一些变化缓慢的信号极易造成误触发,严重影响测量结果。The digital output voltage signal peak value measurement circuit is the core circuit of signal data acquisition in the basic electricity test instrument. Traditionally, the voltage signal peak value to digital conversion is mainly to obtain the voltage peak value by using the analog voltage peak value detection circuit, and then pass the voltage peak value through the A/ The D conversion circuit obtains a digital output. There are mainly two types of analog voltage peak detection circuits, one is a voltage-type peak measurement circuit, and the other is a transconductance-type peak measurement circuit. The principle of the voltage-type peak measurement circuit is simple, but the integral nonlinearity is large, the passband is small, and the dynamic range is also small (the response to small-amplitude signals is poor, and the signal is generally required to be greater than 200mV), and the effect of processing fast signals is not satisfactory. . Although the performance of the peak measurement circuit of the transconductance type is better than that of the voltage type, there are also difficulties in circuit design. Due to the use of a transconductance amplifier, there is an integral factor in the loop gain that is related to the capacitance C. In order to improve the linear performance of the circuit, the capacitance C needs to be as large as possible, and increasing the capacitance C will reduce the passband and slew rate of the circuit. In this way, the voltage peak value detected by the two circuits has a hysteresis. When the peak value changes from low level to high level, the subsequent circuit detects this level change and considers the peak value to arrive, and at the same time starts to perform A/C on the peak value output by the peak detection circuit D conversion brings obvious conversion errors. The reliability of the circuit not only depends on the stability of the integrating circuit, but also depends on the waveform of the detected signal. For some slowly changing signals, it is easy to cause false triggers and seriously affect the measurement results.
发明内容Contents of the invention
本发明目的是提供一种数字输出的电压峰值检测电路,目的是克服现有数字输出的电压峰值检测电路主要存在的小信号模拟电压峰值到数字转换精度不高、转换速度过低、抗干扰能力差、及电容积分非线性大使信号失真、且系统调试困难等缺陷。The purpose of the present invention is to provide a voltage peak detection circuit for digital output, and the purpose is to overcome the small signal analog voltage peak value to digital conversion accuracy, low conversion speed, and anti-interference ability that mainly exist in the existing digital output voltage peak detection circuit. Poor, and capacitance integral nonlinearity causes signal distortion, and system debugging is difficult and other defects.
本发明解决其技术问题的解决方案是:一种数字输出的电压峰值检测电路,包括:电压跟随器、A/D转换器、寄存器、过零电压比较器、二进制数值比较器、三输入一输出的与门,所述电压跟随器的同相输入端与被测信号连接,所述电压跟随器的输出端与自身的反相输入端、所述A/D转换器的模拟信号输入端、所述过零电压比较器的同相输入端连接,所述A/D转换器的N位二进制数字信号输出端依二进制权位高低顺序与所述寄存器的N位二进制数字输入端及所述二进制数值比较器的一个N位二进制数字比较输入端并行连接,所述寄存器的N位二进制数字输出端依二进制权位高低顺序与所述二进制数值比较器的另一个N位二进制数字比较输入端并行连接,系统工作时钟与所述A/D转换器的时钟端和与门的第一输入端连接,所述过零电压比较器的输出端与所述与门的第二输入端连接,所述过零电压比较器的反相输入端与地连接,所述二进制数值比较器的输出端与所述与门的第三输入端连接,所述与门的输出端与所述寄存器的控制端连接,所述二进制数值比较器用于比较一个工作脉冲到来时所述A/D转换器数字信号输出端输出的N位二进制数字的值和在上一个工作脉冲时所述寄存器寄存的N位二进制数字的值的大小,当所述过零电压比较器输出高电平时,当所述A/D转换器数字信号输出端输出的值大于所述当前所述寄存器寄存的值时,所述二进制数值比较器输出端输出高电平,当一个工作脉冲到来时,与门输出端输出高电平,所述寄存器受所述与门输出的高电平控制存入一个工作脉冲到来时的所述A/D转换器数字信号输出端输出的N位二进制数字,当所述A/D转换器数字信号输出端输出的值小于或等于所述当前所述寄存器寄存的值时,所述二进制数值比较器输出端输出低电平,与门输出端输出低电平,所述寄存器受所述与门输出的低电平控制保持上一个工作脉冲时寄存的数据不变,所述二进制数值比较器在系统工作时钟作用下不断进行比较,所述寄存器寄存并输出的是下一个工作脉冲到来前的被测信号的最大N位二进制数字的值,即寄存器的输出跟踪被测信号的峰值,当所述过零电压比较器输出低电平时,与门输出端输出低电平,所述寄存器受所述与门输出的低电平控制保持寄存的数据不变,即该数字输出的电压峰值检测电路只跟踪大于或等于零的被测信号,所述电压跟随器的增益是1,用于对被测信号的隔离。The solution of the present invention to solve its technical problems is: a digital output voltage peak detection circuit, including: a voltage follower, an A/D converter, a register, a zero-crossing voltage comparator, a binary value comparator, three inputs and one output The AND gate of the voltage follower, the non-inverting input terminal of the voltage follower is connected with the signal under test, the output terminal of the voltage follower is connected with its own inverting input terminal, the analog signal input terminal of the A/D converter, the The non-inverting input terminal of the zero-crossing voltage comparator is connected, and the N-bit binary digital signal output terminal of the A/D converter is connected with the N-bit binary digital input terminal of the register and the binary value comparator according to the high and low order of the binary weight position. An N-bit binary digital comparison input terminal of the register is connected in parallel, and the N-bit binary digital output terminal of the register is connected in parallel with another N-bit binary digital comparison input terminal of the binary value comparator according to the order of the binary weight position, and the system works The clock is connected to the clock terminal of the A/D converter and the first input terminal of the AND gate, the output terminal of the zero-crossing voltage comparator is connected to the second input terminal of the AND gate, and the zero-crossing voltage comparator The inverting input terminal of the device is connected to the ground, the output terminal of the binary value comparator is connected to the third input terminal of the AND gate, the output terminal of the AND gate is connected to the control terminal of the register, and the binary The numerical comparator is used to compare the value of the N-bit binary number output by the digital signal output terminal of the A/D converter when a working pulse arrives and the value of the N-bit binary number stored in the register during the last working pulse, When the zero-crossing voltage comparator outputs a high level, when the value output by the digital signal output terminal of the A/D converter is greater than the value currently registered in the register, the output terminal of the binary value comparator outputs a high level Level, when a working pulse arrives, the output terminal of the AND gate outputs a high level, and the register is controlled by the high level output of the AND gate to store the digital signal of the A/D converter when a working pulse arrives The N-bit binary number output by the output terminal, when the value output by the digital signal output terminal of the A/D converter is less than or equal to the value registered in the current register, the output terminal of the binary value comparator outputs a low level , the output terminal of the AND gate outputs a low level, and the register is controlled by the low level output of the AND gate to keep the data registered during the last working pulse unchanged, and the binary value comparator is continuously performed under the action of the system working clock For comparison, the register registers and outputs the value of the maximum N-bit binary digit of the measured signal before the arrival of the next working pulse, that is, the output of the register tracks the peak value of the measured signal, and when the zero-crossing voltage comparator outputs a low level, the output terminal of the AND gate outputs a low level, and the register is controlled by the low level output of the AND gate to keep the registered data unchanged, that is, the voltage peak detection circuit of the digital output only tracks the measured value greater than or equal to zero. signal, the gain of the voltage follower is 1, which is used to isolate the measured signal.
本发明的有益效果是:该电路采用电压跟随器、过零电压比较器、A/D转换器、寄存器、二进制数值比较器及三输入一输出的与门等电路实现数字输出的电压峰值检测,避免了传统方案中先用模拟的电压峰值检测电路获得峰值,再将模拟的电压峰值通过A/D转换电路获得数字输出。与现有技术相比,该电路简单可靠,适合高低频被测信号电压峰值到数字的转换,响应速度快,测量转换精度高,并且峰值检测电压动态范围大,最小可测μV量级的电压,数字兼性强适用于TTL、COMS等主要逻辑电路、动态能量损耗小。The beneficial effect of the present invention is: this circuit adopts voltage follower, zero-crossing voltage comparator, A/D converter, register, binary value comparator and three-input-one-output AND gate and other circuits to realize the voltage peak detection of digital output, It avoids using the analog voltage peak detection circuit to obtain the peak value in the traditional scheme, and then obtains the digital output through the analog voltage peak value through the A/D conversion circuit. Compared with the existing technology, the circuit is simple and reliable, suitable for the conversion of high and low frequency measured signal voltage peak value to digital, with fast response speed, high measurement conversion accuracy, large dynamic range of peak detection voltage, and the minimum measurable voltage of μV level , Strong digital compatibility, suitable for main logic circuits such as TTL, COMS, etc., with low dynamic energy loss.
附图说明Description of drawings
为了更清楚地说明本发明实施例中的技术方案,下面将对实施例描述中所需要使用的附图作简单说明。显然,所描述的附图只是本发明的一部分实施例,而不是全部实施例,本领域的技术人员在不付出创造性劳动的前提下,还可以根据这些附图获得其他设计方案和附图。In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following will briefly describe the drawings that need to be used in the description of the embodiments. Apparently, the described drawings are only some embodiments of the present invention, not all embodiments, and those skilled in the art can obtain other designs and drawings based on these drawings without creative work.
图1是本发明电压峰值检测电路的电路原理图。Fig. 1 is a schematic circuit diagram of the voltage peak detection circuit of the present invention.
具体实施方式Detailed ways
以下将结合实施例和附图对本发明的构思、具体结构及产生的技术效果进行清楚、完整地描述,以充分地理解本发明的目的、特征和效果。显然,所描述的实施例只是本发明的一部分实施例,而不是全部实施例,基于本发明的实施例,本领域的技术人员在不付出创造性劳动的前提下所获得的其他实施例,均属于本发明保护的范围。另外,文中所提到的所有连接关系,并非单指元件直接相接,而是指可根据具体实施情况,通过添加或减少连接元件,来组成更优的电路结构。本发明创造中的各个技术特征,在不互相矛盾冲突的前提下可以交互组合。The idea, specific structure and technical effects of the present invention will be clearly and completely described below in conjunction with the embodiments and accompanying drawings, so as to fully understand the purpose, features and effects of the present invention. Apparently, the described embodiments are only some of the embodiments of the present invention, rather than all of them. Based on the embodiments of the present invention, other embodiments obtained by those skilled in the art without creative efforts belong to The protection scope of the present invention. In addition, all connection relationships mentioned in the text do not simply refer to the direct connection of components, but mean that a more optimal circuit structure can be formed by adding or reducing connection components according to specific implementation conditions. The various technical features in the invention can be combined interactively on the premise of not conflicting with each other.
实施例1,参考图1,一种数字输出的电压峰值检测电路,包括:运算放大器A1构成的电压跟随器、A/D转换器、寄存器、由电压比较器A2构成的过零电压比较器a2、二进制数值比较器、三输入一输出的与门,所述电压跟随器a1的同相输入端与被测信号Ui连接,所述电压跟随器a1的输出端与自身的反相输入端、所述A/D转换器的模拟信号输入端IN+、所述过零电压比较器a2的同相输入端,所述A/D转换器的N位二进制数字信号输出端DOUT依二进制权位高低顺序与所述寄存器的N位二进制数字输入端D及所述二进制数值比较器的一个N位二进制数字比较输入端A并行连接,所述寄存器的N位二进制数字输出端Q依二进制权位高低顺序与所述二进制数值比较器的另一个N位二进制数字比较输入端B并行连接,系统工作时钟与所述A/D转换器的时钟端CLK和与门的第一输入端X连接,所述过零电压比较器a2的输出端与所述与门的第二输入端Y连接,所述过零电压比较器a2的反相输入端与地连接,所述二进制数值比较器的输出端A>B与所述与门的第三输入端Z连接,所述与门的输出端W与所述寄存器的控制端CP连接,所述二进制数值比较器用于比较一个工作脉冲到来时所述A/D转换器数字信号输出端DOUT输出的N位二进制数字的值和在上一个工作脉冲时所述寄存器寄存的N位二进制数字的值的大小,当所述过零电压比较器a2输出高电平时,当所述A/D转换器数字信号输出端DOUT输出的值大于所述当前所述寄存器寄存的值时,所述二进制数值比较器输出端A>B输出高电平,当一个工作脉冲到来时,与门输出端W输出高电平,所述寄存器受所述与门输出的高电平控制存入一个工作脉冲到来时的所述A/D转换器数字信号输出端DOUT输出的N位二进制数字,当所述A/D转换器数字信号输出端DOUT输出的值小于或等于所述当前所述寄存器寄存的值时,所述二进制数值比较器输出端A>B输出低电平,与门输出端W输出低电平,所述寄存器受所述与门输出的低电平控制寄存器保持上一个工作脉冲时寄存的数据不变,所述二进制数值比较器在系统工作时钟作用下不断进行比较,所述寄存器所寄存并输出的是下一个工作脉冲到来前的被测信号的最大N位二进制数字的值OOUT,即寄存器的输出跟踪被测信号的峰值。当所述过零电压比较器a2输出低电平时,与门输出端W输出低电平,所述寄存器受所述与门输出的低电平控制保持寄存的数据不变,即该数字输出的电压峰值检测电路只跟踪大于或等于零的被测信号Ui,此外,电压跟随器a1的增益是1,对被测信号Ui起到隔离作用,提高了电路的转换精度。Embodiment 1, with reference to Fig. 1, a kind of voltage peak detection circuit of digital output, comprises: the voltage follower that operational amplifier A1 forms, A/D converter, register, the zero-crossing voltage comparator that is formed by voltage comparator A2 a2, a binary value comparator, an AND gate with three inputs and one output, the non-inverting input terminal of the voltage follower a1 is connected to the measured signal U i , the output terminal of the voltage follower a1 is connected to its own inverting input terminal, The analog signal input terminal IN + of the A/D converter, the non-inverting input terminal of the zero-crossing voltage comparator a2, the N-bit binary digital signal output terminal D OUT of the A/D converter according to the level of the binary weight The sequence is connected in parallel with an N-bit binary digital input terminal D of the register and an N-bit binary digital comparison input terminal A of the binary value comparator, and the N-bit binary digital output terminal Q of the register is in the order of binary weight positions It is connected in parallel with another N-bit binary digital comparison input terminal B of the binary value comparator, and the system working clock is connected with the clock terminal CLK of the A/D converter and the first input terminal X of the AND gate. The output terminal of the zero-voltage comparator a2 is connected to the second input terminal Y of the AND gate, the inverting input terminal of the zero-crossing voltage comparator a2 is connected to the ground, and the output terminal A>B of the binary value comparator It is connected with the third input terminal Z of the AND gate, the output terminal W of the AND gate is connected with the control terminal CP of the register, and the binary value comparator is used to compare the A/D conversion when a working pulse arrives. The value of the N-bit binary number output by the digital signal output terminal D OUT of the device and the value of the N-bit binary number stored in the register during the last working pulse, when the zero-crossing voltage comparator a2 outputs a high level, When the value output by the digital signal output terminal D OUT of the A/D converter is greater than the value stored in the current register, the output terminal A>B of the binary value comparator outputs a high level, and when a working pulse arrives When the AND gate output terminal W outputs a high level, the register is controlled by the high level output of the AND gate to store the N output of the A/D converter digital signal output terminal D OUT when a working pulse arrives. When the value output by the digital signal output terminal D OUT of the A/D converter is less than or equal to the value stored in the current register, the binary value comparator output terminal A>B outputs a low level , the AND gate output terminal W outputs a low level, and the register is controlled by the low level control register output by the AND gate to keep the data registered during the last working pulse unchanged, and the binary value comparator is under the action of the system working clock The comparison is performed continuously, and what the register registers and outputs is the value O OUT of the largest N-bit binary digit of the signal under test before the arrival of the next working pulse, that is, the output of the register tracks the peak value of the signal under test. When the zero-crossing voltage comparator a2 outputs a low level, the AND gate output terminal W outputs a low level, and the register is controlled by the low level output of the AND gate to keep the registered data unchanged, that is, the digital output The voltage peak detection circuit only tracks the measured signal Ui greater than or equal to zero. In addition, the gain of the voltage follower a1 is 1, which isolates the measured signal Ui and improves the conversion accuracy of the circuit.
对本发明的原理进一步描述:初始状态下,数字输出的电压峰值检测电路是在系统工作时钟的作用下进行工作的,当没有工作脉冲,即检测电路开始工作前,通过寄存器复位端R对寄存器进行复位控制,此时寄存器寄存的是N位二进制数字0,由于工作脉冲状态是低电平“0”,此信号被加到与门的输入端X,所以与门输出端W输出的是低电平“0”,这个低电平“0”被加到寄存器的控制端CP上,此时寄存器被锁定,寄存器保持寄存的是N位二进制数字0,寄存器输出端Q输出的是N位二进制数字0。The principle of the present invention is further described: in the initial state, the voltage peak detection circuit of the digital output works under the action of the system working clock. When there is no working pulse, that is, before the detection circuit starts to work, the register is reset through the register reset terminal R Reset control. At this time, the register stores the N-bit binary number 0. Since the working pulse state is low level "0", this signal is added to the input terminal X of the AND gate, so the output terminal W of the AND gate outputs a low power level. Level "0", this low level "0" is added to the control terminal CP of the register, at this time the register is locked, the register keeps storing N-bit binary numbers 0, and the output terminal Q of the register outputs N-bit binary numbers 0.
工作状态下,当被测信号Ui=0V时,经电压跟随器a1的输出端加到A/D转换器的模拟信号输入端IN+,由于系统工作时钟联接到A/D转换器的时钟端CLK上,在系统工作时钟的工作脉冲的作用下,此时A/D转换器的数字信号输出端DOUT并行输出N位二进制数字0,此N位二进制数字0依二进制权位高低顺序并行地输出到寄存器的N位二进制数字输入端D及二进制数值比较器的一个N位二进制数字比较输入端A,此时寄存器的输出端Q并行输出N位二进制数字到二进制数值比较器的另一个N位二进制数字比较输入端B,由于寄存器的初始状态是N位二进制数字0,即加到二进制数值比较器的比较输入端B是N位二进制数字0,显然加到二进制数值比较器的比较端A与比较端B上的数据相同,二进制数值比较器的比较状态位“A>B”输出低电平“0”,与门输出端W输出低电平,这个低电平“0”经与门被加到寄存器的控制端CP上,此时寄存器被锁定,寄存器寄存的内容保持不变,寄存器输出端Q输出的是N位二进制数字0。In the working state, when the measured signal U i =0V, the output terminal of the voltage follower a1 is added to the analog signal input terminal IN + of the A/D converter, because the system working clock is connected to the clock of the A/D converter On the terminal CLK, under the action of the working pulse of the system working clock, the digital signal output terminal D OUT of the A/D converter outputs N-bit binary digital 0 in parallel at this time, and the N-bit binary digital 0 is parallel in the order of binary weight output to the N-bit binary digital input terminal D of the register and an N-bit binary digital comparison input terminal A of the binary value comparator. At this time, the output terminal Q of the register outputs N-bit binary numbers in parallel to the other N of the binary value comparator. 1-bit binary digital comparison input terminal B, since the initial state of the register is N-bit binary digital 0, that is, the comparison input terminal B added to the binary value comparator is N-bit binary digital 0, obviously added to the comparison terminal A of the binary value comparator The same as the data on the comparison terminal B, the comparison status bit "A>B" of the binary value comparator outputs a low level "0", and the output terminal W of the AND gate outputs a low level, and this low level "0" is passed through the AND gate is added to the control terminal CP of the register, at this time the register is locked, the contents stored in the register remain unchanged, and the output terminal Q of the register outputs an N-bit binary number 0.
当Ui>0V时,A/D转换器的数字信号输出端DOUT输出的是大于零的N位二进制数字,此N位二进制数字依二进制权位高低顺序并行地输出到寄存器的N位二进制数字输入端D及二进制数值比较器的一个N位二进制数字比较输入端A,而加到二进制数值比较器的另一个N位二进制数字比较输入端B是N位二进制数字0,显然输入到二进制数值比较器的比较输入端A的数据大于输入到二进制数值比较器的比较输入端B的数据,二进制数值比较器的比较状态位“A>B”输出高电平“1”,而Ui>0V,过零电压比较器a2输出高电平“1”,当系统工作时钟的工作脉冲为高电平“1”时,与门输出端W输出为高电平“1”,此高电平“1”被加到寄存器的控制端CP上,A/D转换器的数字信号输出端DOUT输出的数据被写入寄存器,同理在工作脉冲的作用下,检测电路不停地比较A/D转换器的数字信号输出端DOUT输出的N位二进制数字(加到二进制数值比较器的N位二进制数字比较输入端A)与寄存器的输出端Q输出的N位二进制数字(加到二进制数值比较器的N位二进制数字比较输入端B),如比较输入端A的数据大于比较输入端B的数据,则A/D转换器的数字信号输出端DOUT输出的数据取代寄存器原有数据,如比较输入端A的数据小于比较输入端B的数据,则寄存器原有数据保持不变,即寄存器输出端Q输出的N位二进制数字就是下一工作脉冲到来前被测信号Ui的数字输出的峰值信号OOUT。When U i >0V, the digital signal output terminal D OUT of the A/D converter outputs an N-bit binary number greater than zero, and the N-bit binary number is output to the N-bit binary number of the register in parallel according to the order of the binary weight. The digital input terminal D and an N-bit binary digital comparison input terminal A of the binary value comparator, and the other N-bit binary digital comparison input terminal B added to the binary value comparator is an N-bit binary digital 0, obviously input to the binary value The data of the comparison input terminal A of the comparator is greater than the data input to the comparison input terminal B of the binary value comparator, the comparison status bit "A>B" of the binary value comparator outputs a high level "1", and U i >0V , the zero-crossing voltage comparator a2 outputs a high level "1", when the working pulse of the system working clock is a high level "1", the output terminal W of the AND gate outputs a high level "1", this high level "1" is added to the control terminal CP of the register, and the data output by the digital signal output terminal D OUT of the A/D converter is written into the register. Similarly, under the action of the working pulse, the detection circuit continuously compares the A/D The N-bit binary number output by the digital signal output terminal D OUT of the converter (added to the N-bit binary number comparison input terminal A of the binary value comparator) and the N-bit binary number output by the output terminal Q of the register (added to the binary value comparison input terminal A) The N-bit binary digital comparison input terminal B of the device, if the data of the comparison input terminal A is greater than the data of the comparison input terminal B, the data output by the digital signal output terminal D OUT of the A/D converter replaces the original data of the register, such as The data of comparison input terminal A is smaller than the data of comparison input terminal B, then the original data of the register remains unchanged, that is, the N-bit binary number output by the output terminal Q of the register is the digital output of the measured signal U i before the arrival of the next working pulse Peak signal O OUT .
该电路具有一定的抗干扰能力,当Ui<0V时,过零电压比较器a2输出低电平“0”,与门输出端W输出低电平,这个低电平“0”经与门被加到寄存器的控制端CP上,此时寄存器被锁死,寄存器寄存数据不变,从而防止电路受到负电平信号干扰,此外,电压跟随器a1的增益是1,对被测信号Ui起到隔离作用,提高了电路的转换精度。The circuit has a certain anti-interference ability. When U i <0V, the zero-crossing voltage comparator a2 outputs a low level "0", and the output terminal W of the AND gate outputs a low level. This low level "0" is passed through the AND gate is added to the control terminal CP of the register, and the register is locked at this time, and the data stored in the register remains unchanged, thereby preventing the circuit from being interfered by negative level signals. In addition, the gain of the voltage follower a1 is 1, and the measured signal U i To the isolation effect, the conversion accuracy of the circuit is improved.
A/D转换器位数的选择,这取决于测量精度要求,A/D转换器位数越高,电压峰值测量就越高,这里可以取八位、十位、十二位、十六位的A/D转换器;依据选定的A/D转换器位数确定寄存器和二进制数值比较器的位数,即A/D转换器位数与寄存器和二进制数值比较器的位数是相同的,均为N位。The choice of A/D converter digits depends on the measurement accuracy requirements. The higher the A/D converter digits, the higher the voltage peak measurement. Here, eight digits, ten digits, twelve digits, and sixteen digits can be used. The A/D converter; the number of bits of the register and the binary value comparator is determined according to the number of bits of the selected A/D converter, that is, the number of bits of the A/D converter is the same as the number of bits of the register and the binary value comparator , are N bits.
该电路采用运算放大器A1构成的电压跟随器a1、电压比较器A2构成的过零电压比较器a2、A/D转换器、寄存器、二进制数值比较器及三输入一输出的与门等电路实现数字输出的电压峰值检测,避免了传统方案中先用模拟的电压峰值检测电路获得峰值,再将模拟的电压峰值通过A/D转换电路获得数字输出。与现有技术相比,电路简单可靠,适合高低频被测信号电压峰值到数字的转换,响应速度快,测量转换精度高,并且峰值检测电压动态范围大,最小可测μV量级的电压,数字兼性强适用于TTL、COMS等主要逻辑电路、动态能量损耗小。The circuit adopts the voltage follower a1 composed of the operational amplifier A1, the zero-crossing voltage comparator a2 composed of the voltage comparator A2, the A/D converter, the register, the binary value comparator and the AND gate circuit with three inputs and one output. Realize the voltage peak detection of the digital output, avoiding the traditional scheme to first use the analog voltage peak detection circuit to obtain the peak value, and then use the analog voltage peak value to obtain the digital output through the A/D conversion circuit. Compared with the existing technology, the circuit is simple and reliable, suitable for high and low frequency measured signal voltage peak to digital conversion, fast response, high measurement conversion accuracy, and a large dynamic range of peak detection voltage, the smallest measurable voltage of μV level, Strong digital compatibility, suitable for main logic circuits such as TTL, COMS, etc., with low dynamic energy loss.
以上对本发明的较佳实施方式进行了具体说明,但本发明创造并不限于所述实施例,熟悉本领域的技术人员在不违背本发明精神的前提下还可作出种种的等同变型或替换,这些等同的变型或替换均包含在本申请权利要求所限定的范围内。The preferred embodiments of the present invention have been described in detail above, but the invention is not limited to the described embodiments, and those skilled in the art can also make various equivalent modifications or replacements without violating the spirit of the present invention. These equivalent modifications or replacements are all within the scope defined by the claims of the present application.
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