CN111785196A - Display panel, test method thereof and display device - Google Patents
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Abstract
The invention discloses a display panel, a test method thereof and a display device. The display panel includes: a plurality of data lines; the test unit comprises a plurality of output ends, and the plurality of output ends of the test unit are electrically connected with the first ends of the plurality of data lines in a one-to-one correspondence manner; at least two output ends of the multiplexers are electrically connected with the second ends of at least two adjacent data lines in a one-to-one correspondence mode, and the input end of each multiplexer is electrically connected with a data connecting line; the testing unit is configured to control the sub-pixels corresponding to the multiplexers in the odd-numbered columns to be in a first display state and the sub-pixels corresponding to the multiplexers in the even-numbered columns to be in a second display state when the data connecting lines are tested, wherein the first display state is different from the second display state; the multiplexer is configured to control the data connection lines to be conducted with the corresponding data lines when the data connection lines are tested. The embodiment of the invention can test whether the data connecting line is short-circuited or not, and improves the yield of products.
Description
Technical Field
The embodiment of the invention relates to a display technology, in particular to a display panel, a test method thereof and a display device.
Background
With the development of display technologies, the display panel has an increasingly larger function, and accordingly, the requirement on the yield of the display panel is higher and higher.
Before the display panel leaves a factory, a series of tests are required to ensure that the display panel can work normally, however, the yield of the existing display panel is still low after the tests are performed.
Disclosure of Invention
The invention provides a display panel and a test method thereof, which can improve the yield of the display panel and avoid the waste of cost.
In a first aspect, an embodiment of the present invention provides a display panel, where the display panel includes: the data lines are connected with one column of sub-pixels; the test unit comprises a plurality of output ends, and the plurality of output ends of the test unit are electrically connected with the first ends of the plurality of data lines in a one-to-one correspondence manner; at least two output ends of the multiplexers are electrically connected with the second ends of at least two adjacent data lines in a one-to-one correspondence mode, and the input end of each multiplexer is electrically connected with a data connecting line; the testing unit is configured to control the sub-pixels corresponding to the multiplexers in the odd-numbered columns to be in a first display state and control the sub-pixels corresponding to the multiplexers in the even-numbered columns to be in a second display state when the data connecting lines are tested, wherein the first display state is different from the second display state; the multiplexer is configured to control the data connection lines to be conducted with the corresponding data lines when the data connection lines are tested.
Optionally, the test unit comprises: the test circuit comprises a plurality of switch units, a plurality of test signal lines, a first test control signal line and a second test control signal line; a plurality of data lines corresponding to the same color sub-pixel are electrically connected with the same test signal line through a switch unit respectively, and each test signal line corresponds to one color sub-pixel; the first end of each switch unit is used as one output end of the test unit, and the second end of each switch unit is electrically connected with the corresponding test signal line; the control ends of the switch units corresponding to the multiplexers positioned in the odd columns are electrically connected with the first test control signal line, and the control ends of the switch units corresponding to the multiplexers positioned in the even columns are electrically connected with the second test control signal line.
Optionally, the display panel further includes a plurality of open circuit test switches and open circuit test control signal lines; the circuit breaking test switch is connected between two adjacent data connecting lines, the control end of the circuit breaking test switch is electrically connected with the circuit breaking test control signal line, and the circuit breaking test switch is used for conducting the two adjacent data connecting lines according to the control signal of the control end of the circuit breaking test switch.
Optionally, the test unit comprises: a plurality of switch units, a plurality of test signal lines, and a third test control signal line; among a plurality of data lines corresponding to the same color sub-pixel, a plurality of data lines corresponding to multiplexers positioned in odd columns are electrically connected with a test signal line through a switch unit respectively, a plurality of data lines corresponding to multiplexers positioned in even columns are electrically connected with another test signal line through a switch unit respectively, and each test signal line corresponds to one color sub-pixel; the first end of each switch unit is used as an output end of the test unit, the second end of each switch unit is electrically connected with the corresponding test signal line, and the control end of each switch unit is electrically connected with the third test control signal line.
In a second aspect, an embodiment of the present invention further provides a display device, including the display panel according to the first aspect.
In a third aspect, an embodiment of the present invention further provides a method for testing a display panel, where the display panel includes: the data lines are connected with one column of sub-pixels; the test unit comprises a plurality of output ends, and the plurality of output ends of the test unit are electrically connected with the first ends of the plurality of data lines in a one-to-one correspondence manner; at least two output ends of the multiplexers are electrically connected with the second ends of at least two adjacent data lines in a one-to-one correspondence mode, and the input end of each multiplexer is electrically connected with a data connecting line;
the method comprises the following steps:
in a first test stage, the test unit controls the sub-pixels corresponding to the multiplexers in the odd-numbered columns to be in a first display state, and simultaneously controls the sub-pixels corresponding to the multiplexers in the even-numbered columns to be in a second display state, wherein the first display state is different from the second display state; the multiplexer controls the data connecting lines to be conducted with the corresponding data lines;
and judging whether the data connecting line is short-circuited according to the display state of the sub-pixel.
Optionally, the test unit comprises: the test circuit comprises a plurality of switch units, a plurality of test signal lines, a first test control signal line and a second test control signal line; a plurality of data lines corresponding to the same color sub-pixel are electrically connected with the same test signal line through a switch unit respectively, and each test signal line corresponds to one color sub-pixel; the first end of each switch unit is used as one output end of the test unit, and the second end of each switch unit is electrically connected with the corresponding test signal line; the control ends of the switch units corresponding to the multiplexers positioned in the odd columns are electrically connected with the first test control signal line, and the control ends of the switch units corresponding to the multiplexers positioned in the even columns are electrically connected with the second test control signal line;
the test unit controls the sub-pixels corresponding to the multiplexers in the odd columns to be in a first display state, and simultaneously controls the sub-pixels corresponding to the multiplexers in the even columns to be in a second display state, and the method comprises the following steps:
the first test control signal line controls the switch unit connected with the first test control signal line to be conducted, and the test signal line controls the corresponding sub-pixel to be in a first display state; the second test control signal line controls the switch unit connected with the second test control signal line to be switched off, and the sub-pixel corresponding to the second test control signal line is in a second display state.
Optionally, the display panel further includes a plurality of open circuit test switches and open circuit test control signal lines; the circuit breaking test switch is connected between two adjacent data connecting lines, the control end of the circuit breaking test switch is electrically connected with the circuit breaking test control signal line, and the circuit breaking test switch is used for conducting the two adjacent data connecting lines according to the control signal of the control end of the circuit breaking test switch;
the method further comprises the following steps:
in a second test stage, the open circuit test control signal line controls the open circuit test switch to be conducted, the first test control signal line controls the switch unit connected with the first test control signal line to be conducted, and the test signal line controls the corresponding sub-pixel to be in a first display state; the second test control signal line controls the switch unit connected with the second test control signal line to be switched off, and the sub-pixel corresponding to the second test control signal line is in a second display state; the multiplexer controls the data connecting lines to be conducted with the corresponding data lines;
and judging whether the data connecting line is broken according to the display state of the sub-pixel.
Optionally, the test unit comprises: a plurality of switch units, a plurality of test signal lines, and a third test control signal line; among a plurality of data lines corresponding to the same color sub-pixel, a plurality of data lines corresponding to multiplexers positioned in odd columns are electrically connected with a test signal line through a switch unit respectively, a plurality of data lines corresponding to multiplexers positioned in even columns are electrically connected with another test signal line through a switch unit respectively, and each test signal line corresponds to one color sub-pixel; the first end of each switch unit is used as an output end of the test unit, the second end of each switch unit is electrically connected with the corresponding test signal line, and the control end of each switch unit is electrically connected with the third test control signal line;
the test unit controls the sub-pixels corresponding to the multiplexers in the odd columns to be in a first display state, and simultaneously controls the sub-pixels corresponding to the multiplexers in the even columns to be in a second display state, and the method comprises the following steps:
and the third test control signal line controls the switch unit to be conducted, the test signal line corresponding to the multiplexer positioned in the odd-numbered row inputs the test signal, and the test signal line corresponding to the multiplexer positioned in the even-numbered row does not input the test signal.
Optionally, the method further comprises:
in a third testing stage, the testing unit controls one color sub-pixel to be in a first display state and controls other color sub-pixels to be in a second display state;
and judging whether the sub-pixels are abnormal or not according to the display states of the sub-pixels.
According to the technical scheme of the embodiment of the invention, the adopted display panel comprises a plurality of data lines, and each data line is connected with one column of sub-pixels; the test unit comprises a plurality of output ends, and the plurality of output ends of the test unit are electrically connected with the first ends of the plurality of data lines in a one-to-one correspondence manner; at least two output ends of the multiplexers are electrically connected with the second ends of at least two adjacent data lines in a one-to-one correspondence mode, and the input end of each multiplexer is electrically connected with a data connecting line; the testing unit is configured to control the sub-pixels corresponding to the multiplexers in the odd-numbered columns to be in a first display state and control the sub-pixels corresponding to the multiplexers in the even-numbered columns to be in a second display state when the data connecting lines are tested, wherein the first display state is different from the second display state; the multiplexer is configured to control the data connection lines to be conducted with the corresponding data lines when the data connection lines are tested. This embodiment can test whether short circuit of data link line in the display panel, judges whether short circuit of data link line according to display panel's display state, and the test process is simple high-efficient, and easily operation is favorable to improving display panel's yield, reduces the waste of cost such as material.
Drawings
Fig. 1 is a schematic structural diagram of a display panel according to an embodiment of the present invention;
fig. 2 is a schematic diagram illustrating a test result of a display panel according to an embodiment of the invention;
FIG. 3 is a schematic diagram illustrating a test result of a display panel according to an embodiment of the present invention;
fig. 4 is a schematic structural diagram of another display panel according to an embodiment of the present invention;
FIG. 5 is a schematic diagram illustrating a test result of a display panel according to an embodiment of the present invention;
FIG. 6 is a schematic diagram illustrating a test result of a display panel according to an embodiment of the present invention;
fig. 7 is a schematic structural diagram of another display panel according to an embodiment of the present invention;
fig. 8 is a schematic structural diagram of a display device according to an embodiment of the present invention;
fig. 9 is a flowchart of a testing method of a display panel according to an embodiment of the present invention.
Detailed Description
The present invention will be described in further detail with reference to the accompanying drawings and examples. It is to be understood that the specific embodiments described herein are merely illustrative of the invention and are not limiting of the invention. It should be further noted that, for the convenience of description, only some of the structures related to the present invention are shown in the drawings, not all of the structures.
As mentioned in the background art, the yield of the conventional display panel is still low after the test, the inventor has found through careful research that the conventional display panel can only perform the dot-screen test on the display panel, that is, it is tested whether the sub-pixels emit light abnormally, but it is not possible to test whether the data connection line between the data line and the driving chip is abnormal, and when the data connection line is short-circuited or broken, the corresponding sub-pixels cannot normally receive the data signal from the driving chip, thereby causing the display abnormality, reducing the yield of the display panel, and simultaneously causing the waste of the productivity of the module section and the material.
Based on the technical problem, the invention provides the following solution:
fig. 1 is a schematic structural diagram of a display panel according to an embodiment of the present invention, and referring to fig. 1, the display panel includes: a plurality of Data lines Data, each of which is connected to a column of the subpixels PX; the test unit 101 is provided with a plurality of output ends, and the plurality of output ends of the test unit 101 are electrically connected with the first ends of the plurality of Data lines Data in a one-to-one correspondence manner; at least two output ends of the multiplexer 102 are electrically connected with the second ends of at least two adjacent Data lines Data in a one-to-one correspondence manner, and an input end of the multiplexer 102 is electrically connected with a Data connection line 1041; the testing unit 101 is configured to control the sub-pixels PX corresponding to the multiplexers 102 in the odd-numbered columns to be in a first display state and control the sub-pixels PX corresponding to the multiplexers 102 in the even-numbered columns to be in a second display state when testing the data connection lines 1041, wherein the first display state is different from the second display state; the multiplexer 102 is configured to control the Data connection lines 1041 to be conducted with the corresponding Data lines Data when the Data connection lines 1041 are tested.
Specifically, the display panel may include a plurality of scan lines (not shown) and Data lines Data, which are interlaced horizontally and vertically, the scan lines and the Data lines Data define a region where the sub-pixels PX are located, the sub-pixels PX may be arranged in an array, and may specifically include a pixel driving circuit and a Light Emitting unit, the Light Emitting unit may be, for example, an OLED (Organic Light Emitting Diode), the OLED is a current driving type device, the pixel driving circuit may typically be composed of two transistors and a capacitor, and this structure is also commonly referred to as a "2T 1C" pixel driving circuit in the art; the pixel driving circuit can also be composed of seven transistors and a capacitor, and has a threshold compensation function, and the structure is also commonly referred to as a "7T 1C" pixel driving circuit in the field. The display panel may include sub-pixels PX of a plurality of colors, for example, red, green and blue sub-pixels.
The display panel may include a test region, a pixel region 103, a multiplexer region, a data connection region 104, and a binding region 105, which are adjacent in sequence; the test area is used for setting the test unit 101; the pixel region 103 is used to set a plurality of sub-pixels PX; the multiplexer region is used to set the multiplexer 102; the data link line region 104 may typically be a fan-out region for disposing the data link lines 1041; the bonding region 105 may include a plurality of pads 1051 for disposing a driving Chip or COF (Chip on Film) and the like, so as to provide data signals to the corresponding sub-pixels PX through the data connection lines 1041 during normal display of the display panel.
The multiplexers 102 may be composed of a plurality of selection switches and a plurality of multiplexing control lines, for example, in this embodiment, six multiplexing is taken as an example for description, the multiplexers 102 correspond to the data connection lines 1041 one to one, each multiplexer 102 includes six selection switches and six multiplexing control lines (D _ Mux1, D _ Mux2, D _ Mux3, D _ Mux4, D _ Mux5, and D _ Mux6), the working principle of the multiplexer 102 is well known in the art, and it is not described herein again that the number of the data connection lines 1041 can be reduced by using the multiplexer 102, thereby facilitating reduction of the frame.
The display panel of the present embodiment can test whether the data connection line 1041 is short-circuited, the display panel may include a plurality of multiplexers 102 arranged along the extension direction of the scan line, which may be divided into odd column multiplexers 1021 located in odd columns and even column multiplexers 1022 located in even columns, when the data connection line 1041 is tested, the test unit 101 controls the sub-pixels corresponding to the odd column multiplexers 1021 to be in a first display state, that is, controls the sub-pixels PX provided with data signals by the odd column multiplexers 1021 to be in the first display state; meanwhile, the testing unit 101 controls the sub-pixels corresponding to the even-numbered row multiplexer 1022 to be in the second display state; in this embodiment, the display panel is taken as an example of normally bright display, when the test unit 101 outputs a test signal to the sub-pixels PX in the corresponding row through the output end of the test unit 101, the row of sub-pixels PX is changed from a white state to a black state, and the sub-pixels corresponding to the output end of the test unit 101 without outputting the test signal are still in a white state; fig. 2 is a schematic diagram of a test result of the display panel according to the embodiment of the present invention, referring to fig. 2, fig. 2 may correspond to a result when the data connection line 1041 of the display panel in fig. 1 has no short circuit, at this time, the sub-pixels corresponding to the odd-numbered row multiplexer 1021 are all in a black state, and the sub-pixels corresponding to the even-numbered row multiplexer 1022 are all in a white state, that is, when the data connection line 1041 has no short circuit, the display panel displays stripes with alternate bright and dark colors (when the data lines corresponding to the multiplexers are fewer, the display panel with the excessive bright and dark stripes is in a gray state as a whole); fig. 3 is a schematic diagram illustrating another test result of the display panel according to the embodiment of the invention, where fig. 3 may correspond to a result when the Data connection lines 1041 of the display panel in fig. 1 are short-circuited, at this time, because two adjacent Data connection lines 1041 are short-circuited, the Data signal received by the first end of the corresponding Data line Data of the sub-pixel corresponding to the odd-column multiplexer 1021 is input to the even-column multiplexer 1022 through the second end of the Data line Data, the odd-column multiplexer 1021 and the Data connection line 1041, and then is input to the second end of the corresponding Data line Data of the even-column multiplexer 1022, so that the sub-pixel PX corresponding to the even-column multiplexer 1022 is changed from a white state to a black state, and a "large and thick dark line" is presented on the display panel, and it can be determined that the Data connection lines of the display panel are short. It should be noted that, when the data connection line is tested, the corresponding multiplexers need to be controlled to be turned on, and if the test unit 101 controls the red sub-pixels corresponding to the odd-column multiplexers 1021 to be in the first display state, the selection switches of the multiplexers 102 corresponding to the red sub-pixels are all turned on; when the test unit 101 controls the blue sub-pixels corresponding to the odd-column multiplexer 1021 to be in the first display state, the selection switches of the multiplexer 102 corresponding to the blue sub-pixels are all turned on, so that the data signals can be transmitted to the corresponding data connection lines 1041, and whether the data connection lines 1041 are short-circuited is tested.
According to the technical scheme of the embodiment, the adopted display panel comprises a plurality of data lines, and each data line is connected with one column of sub-pixels; the test unit comprises a plurality of output ends, and the plurality of output ends of the test unit are electrically connected with the first ends of the plurality of data lines in a one-to-one correspondence manner; at least two output ends of the multiplexers are electrically connected with the second ends of at least two adjacent data lines in a one-to-one correspondence mode, and the input end of each multiplexer is electrically connected with a data connecting line; the testing unit is configured to control the sub-pixels corresponding to the multiplexers in the odd-numbered columns to be in a first display state and control the sub-pixels corresponding to the multiplexers in the even-numbered columns to be in a second display state when the data connecting lines are tested, wherein the first display state is different from the second display state; the multiplexer is configured to control the data connection lines to be conducted with the corresponding data lines when the data connection lines are tested. This embodiment can test whether short circuit of data link line in the display panel, judges whether short circuit of data link line according to display panel's display state, and the test process is simple high-efficient, and easily operation is favorable to improving display panel's yield, reduces the waste of cost such as material.
In this embodiment, a dot-screen test, that is, a CT test, may also be performed on the display panel by the test unit, and the test unit 101 may control the display panel to display a monochrome picture, for example, control a certain color sub-pixel in the display panel to be in a first display state, and control other color sub-pixels to be in a second display state, at this time, all the selection switches in the multiplexer 102 may be turned off and also turned on, and by observing the display picture, it may be determined whether the display panel has a display defect in monochrome display, so as to further improve the yield of products. In this embodiment, through setting up the test unit, can enough carry out the point screen test under the monochromatic picture to display panel, can test whether short circuit of data connecting wire again, the last test unit of display panel is less, is favorable to improving when testing the variety, reduces display panel's frame.
Alternatively, with continued reference to fig. 1, the test unit 101 includes, a plurality of switch units T1, a plurality of test signal lines, a first test control signal line D _ SW1, and a second test control signal line D _ SW 2; a plurality of data lines corresponding to the same color sub-pixel are electrically connected with the same test signal line through a switch unit T1 respectively, and each test signal line corresponds to one color sub-pixel; a first terminal of each switch unit T1 is used as an output terminal of the test unit 101, and a second terminal of the switch unit is electrically connected to the corresponding test signal line; the control terminals of the switch units T1 corresponding to the multiplexers 102 in the odd-numbered columns are electrically connected to the first test control signal line D _ SW1, and the control terminals of the switch units T1 corresponding to the multiplexers 102 in the even-numbered columns are electrically connected to the second test control signal line D _ SW 2.
Specifically, the switch unit T1 may be a transistor, for example, a thin film transistor, the display panel includes a plurality of thin film transistors, for example, the pixel driving circuit of the sub-pixel includes a plurality of thin film transistors, the switch unit T1 is configured as a thin film transistor, and the switch unit T1 may be manufactured simultaneously with the thin film transistors in the pixel driving circuit, so that the manufacturing process is mature, which is beneficial to reducing the cost. In this embodiment, the number of the testing signal lines is the same as the number of the color types of the sub-pixels, for example, if the display panel includes three color sub-pixels of red, green and blue sub-pixels, the testing signal line correspondingly includes a red testing signal line D _ R, a green testing signal line D _ G and a blue testing signal line D _ B, each column of sub-pixels is electrically connected to the corresponding testing signal line through a corresponding switch unit T1, as if one column of red sub-pixels is electrically connected to the red testing signal line D _ R through a switch unit T1, the same column of green sub-pixels is electrically connected to the green testing signal line D _ G through a switch unit T1, the same column of blue sub-pixels is electrically connected to the blue testing signal line D _ B through a switch unit T1, the control terminal of the switch unit T1 corresponding to the odd-column multiplexer 1021 is electrically connected to the first testing control signal line D _ 1, the control terminals of the switch cells corresponding to the even column multiplexer 1022 are electrically connected to the second test control signal line D _ SW2, when the data link line 1041 is tested, the switch cells corresponding to the odd-numbered column multiplexers can be controlled to be turned on by the first test control signal line D _ SW1, and the switch units corresponding to the even-numbered column multiplexers are controlled to be turned off by the second test control signal line D _ SW2, so that only the sub-pixels corresponding to the odd column multiplexers can receive data signals from the corresponding test cell 101 output, the sub-pixels corresponding to the even-numbered row multiplexers cannot receive the data signals from the output ends of the corresponding test units, and if the sub-pixels corresponding to the even-numbered row multiplexers are in a black state, it indicates that the sub-pixels receive the data signals from the corresponding data connection lines 1041, that is, the data connection lines are short-circuited. When the dot-screen test is performed, the first test control signal line D _ SW1 and the second test control signal line D _ SW2 can be used to control all the switch units T1 to be turned on, so that all the sub-pixels of the same color in the display panel can emit light simultaneously.
Optionally, fig. 4 is a schematic structural diagram of another display panel according to an embodiment of the present invention, and referring to fig. 4, the display panel further includes a plurality of open circuit test switches T2 and an open circuit test control signal line SW; the open circuit test switch T2 is connected between two adjacent data connection lines T2, the control terminal of the open circuit test switch T2 is electrically connected to the open circuit test control signal line SW, and the open circuit test switch T2 is used for conducting the two adjacent data connection lines 1041 according to the control signal of the control terminal.
Specifically, the open circuit test switch T2 may be a thin film transistor, and may be fabricated simultaneously with other thin film transistors in the display panel, which is beneficial to reducing the cost. Fig. 5 is a schematic diagram showing another test result of the display panel according to the embodiment of the invention, and referring to fig. 5, fig. 5 can correspond to the result of the display panel in fig. 4 when the data connection lines are not broken, at this time, the breaking test switches T2 are all turned on under the control of the breaking test control signal lines SW, so that the data connection lines 1041 are mutually short-circuited, the test unit 101 can control the sub-pixels corresponding to the odd-numbered columns of multiplexers to be in the first display state and control the sub-pixels corresponding to the even-numbered columns of multiplexers to be in the second display state, that is, the test unit controls the switch units T1 corresponding to the odd-numbered columns of multiplexers to be turned on, controls the switch units T1 corresponding to the even-numbered columns of multiplexers to be turned off, and simultaneously controls the corresponding selection switches in the multiplexers 102 to be in the on state, if the data connection line 1041 is not disconnected, the signal on the data line corresponding to the odd-numbered row multiplexer 1021 reaches the data line corresponding to the even-numbered row multiplexer through the multiplexer, the data connection line and the disconnection test switch T2, so that all the sub-pixels of the display panel are in the same display state, such as black state; fig. 6 is a schematic diagram illustrating another test result of the display panel according to the embodiment of the invention, referring to fig. 6, fig. 6 may correspond to the result when the data connection lines of the display panel in fig. 4 are disconnected, at this time, the data signals on the data lines corresponding to the odd-numbered row multiplexers 1021 cannot reach the data lines corresponding to the even-numbered row multiplexers 1022 through the data connection lines, so that the sub-pixels corresponding to the even-numbered row multiplexers 1022 are in a bright state, and bright lines are shown on the display panel, thereby determining that the corresponding data connection lines 1041 in the display panel are disconnected. Preferably, the connection point of the disconnection test switch T2 and the data connection line 1041 may be close to the binding region, for example, the length of the data connection line 1041 between the connection point and the binding region is less than 10% of the total length of the data connection line 1041, so that more parts of the data connection line can be detected whether there is a disconnection.
Optionally, fig. 7 is a schematic structural diagram of another display panel according to an embodiment of the present invention, and referring to fig. 7, the test unit 101 includes: a plurality of switching units T1, a plurality of test signal lines and a third test control signal line D _ SW 3; among the Data lines corresponding to the same color sub-pixel, the Data lines corresponding to the multiplexers 102 in the odd-numbered columns are electrically connected with a test signal line through a switch unit T1, the Data lines corresponding to the multiplexers 102 in the even-numbered columns are electrically connected with another test signal line through a switch unit, and each test signal line corresponds to one color sub-pixel; the first terminal of each switch unit T1 is used as an output terminal of the test unit 101, the second terminal of the switch unit T1 is electrically connected to the corresponding test signal line, and the control terminal of the switch unit T1 is electrically connected to the third test control signal line D _ SW 3.
Specifically, in this embodiment, the control terminals of all the switch units T1 are connected to a third test control signal line D _ SW3, and a color sub-pixel may correspond to two test signal lines, for example, a display panel includes three color sub-pixels of a red sub-pixel, a green sub-pixel and a blue sub-pixel, and may correspondingly include a first red test signal line D _ R1, a second red test signal line D _ R2, a first green test signal line D _ G1, a second green test signal line D _ G2, a first blue test signal line D _ B1 and a second blue test signal line D _ B2, where the first red test signal line D _ R1 provides a data signal to a red sub-pixel corresponding to the even column multiplexer 1022, and the second red test signal line D _ R2 provides a data signal to a red sub-pixel corresponding to the odd column multiplexer 1021; the first green test signal line D _ G1 provides data signals to the green sub-pixels corresponding to the even column multiplexer 1022, and the second green test signal line D _ G2 provides data signals to the green sub-pixels corresponding to the odd column multiplexer 1021; the first blue test signal line D _ B1 provides data signals to the blue subpixels corresponding to the even column multiplexer 1022, and the second blue test signal line D _ B2 provides data signals to the blue subpixels corresponding to the odd column multiplexer 1021; when the data connecting line is subjected to short-circuit test, all the switch units are controlled to be conducted to control the first blue test signal line, the first red test signal line and the first green test signal line to have no signal, and control the second red test signal line, the second green test signal line and the second blue test signal line to have a signal, so that the sub-pixels corresponding to the odd-numbered rows of multiplexers are controlled to be in a first display state, and the sub-pixels corresponding to the even-numbered rows of multiplexers are controlled to be in a second display state, and whether the data connecting line in the display panel is short-circuited is tested.
Fig. 8 is a schematic structural diagram of a display device according to an embodiment of the present invention, referring to fig. 8, the display device includes a display panel according to any embodiment of the present invention, and the display device may be a mobile phone, a tablet, a notebook, an MP3, an MP4, a smart watch, or other wearable devices.
Fig. 9 is a flowchart of a testing method for a display panel according to an embodiment of the present invention, where the display panel may be a display panel according to any embodiment of the present invention, and the testing method includes:
Specifically, the first test stage may be a test stage for testing whether the data connection line is short-circuited, and the specific test method may refer to the description of the display panel part in the embodiment of the present invention, which is not repeated herein, and determine whether the data connection line is short-circuited according to the display state of the sub-pixel, for example, whether the data connection line is short-circuited by manually observing or determining whether a large thick dark line exists in the display panel by using an optical device, where the presence of the large thick dark line indicates that a short-circuit phenomenon exists, and the absence of the large thick dark line indicates that the short-circuit phenomenon does not exist; this embodiment can test whether short circuit of data link line in the display panel, judges whether short circuit of data link line according to display panel's display state, and the test process is simple high-efficient, and easily operation is favorable to improving display panel's yield, reduces the waste of cost such as material.
Optionally, the test unit comprises: the test circuit comprises a plurality of switch units, a plurality of test signal lines, a first test control signal line and a second test control signal line; a plurality of data lines corresponding to the same color sub-pixel are electrically connected with the same test signal line through a switch unit respectively, and each test signal line corresponds to one color sub-pixel; the first end of each switch unit is used as an output end of the test unit, and the second end of each switch unit is electrically connected with the corresponding test signal line; the control ends of the switch units corresponding to the multiplexers in the odd columns are electrically connected with the first test control signal line, and the control ends of the switch units corresponding to the multiplexers in the even columns are electrically connected with the second test control signal line;
the test unit controls the sub-pixels corresponding to the multiplexers in the odd columns to be in a first display state, and simultaneously controls the sub-pixels corresponding to the multiplexers in the even columns to be in a second display state, wherein the control method comprises the following steps:
the first test control signal line controls the switch unit connected with the first test control signal line to be conducted, and the test signal line controls the corresponding sub-pixel to be in a first display state; the second test control signal line controls the switch unit connected with the second test control signal line to be switched off, and the sub-pixel corresponding to the second test control signal line is in a second display state. That is, at this time, the sub-pixels corresponding to the odd-numbered row multiplexers receive the data signals provided by the test unit to display the black state, and the sub-pixels corresponding to the even-numbered row multiplexers cannot receive the data signals provided by the test unit to display the normally-on state (white state). It is understood that, in the first testing stage, the sub-pixels corresponding to the odd-numbered column multiplexers may be controlled to be in the second display state, and the sub-pixels corresponding to the even-numbered column multiplexers may be controlled to be in the first display state.
Optionally, the display panel further includes a plurality of open circuit test switches and open circuit test control signal lines; the circuit breaking test switch is connected between two adjacent data connecting lines, the control end of the circuit breaking test switch is electrically connected with the circuit breaking test control signal line, and the circuit breaking test switch is used for conducting the two adjacent data connecting lines according to the control signal of the control end of the circuit breaking test switch;
the method further comprises the following steps:
in the second test stage, the open circuit test control signal line controls the open circuit test switch to be conducted, the first test control signal line controls the switch unit connected with the first test control signal line to be conducted, and the test signal line controls the corresponding sub-pixel to be in the first display state; the second test control signal line controls the switch unit connected with the second test control signal line to be switched off, and the sub-pixel corresponding to the second test control signal line is in a second display state; the multiplexer controls the data connecting lines to be conducted with the corresponding data lines;
and judging whether the data connecting line is broken according to the display state of the sub-pixel.
Specifically, the specific test method for whether the data connection line is disconnected or not may refer to the description of the display panel part in the embodiment of the present invention, which is not described herein again, and it should be noted that the first test stage and the second test stage do not distinguish the order, for example, the first test stage may be performed first, and then the second test stage may be performed first, and then the first test stage may be performed.
Optionally, the test unit includes: a plurality of switch units, a plurality of test signal lines, and a third test control signal line; among a plurality of data lines corresponding to the same color sub-pixel, a plurality of data lines corresponding to multiplexers positioned in odd columns are electrically connected with a test signal line through a switch unit respectively, a plurality of data lines corresponding to multiplexers positioned in even columns are electrically connected with another test signal line through a switch unit respectively, and each test signal line corresponds to one color sub-pixel; the first end of each switch unit is used as an output end of the test unit, the second end of each switch unit is electrically connected with the corresponding test signal line, and the control end of each switch unit is electrically connected with the third test control signal line;
the test unit controls the sub-pixels corresponding to the multiplexers in the odd columns to be in a first display state, and simultaneously controls the sub-pixels corresponding to the multiplexers in the even columns to be in a second display state, wherein the control method comprises the following steps:
and the third test control signal line controls the switch unit to be conducted, the test signal line corresponding to the multiplexer positioned in the odd-numbered columns inputs the test signal, and the test signal line corresponding to the multiplexer positioned in the even-numbered columns does not input the test signal. Therefore, when the display panel is tested, the sub-pixels corresponding to the multiplexers in the odd columns are in the first display state, and the sub-pixels corresponding to the multiplexers in the even columns are in the second display state.
Optionally, the method further comprises:
in a third test stage, the test unit controls one color sub-pixel to be in a first display state and controls other color sub-pixels to be in a second display state;
and judging whether the sub-pixel is abnormal or not according to the display state of the sub-pixel.
Specifically, the third testing stage may be understood as a dot-screen testing stage, in which a monochrome screen is displayed, and whether a sub-pixel in the display panel is abnormal, such as whether the display is abnormal, is determined under the monochrome screen. The third test stage can be performed before the first test stage and the second test stage, and when the third test stage passes, the first test stage or the second test stage is performed, if the third test stage does not pass, for example, the data line has a short circuit or an open circuit, the first test stage and the second test stage may not pass, and the third test stage is set to be performed before the first test stage and the second test stage, so that the test efficiency can be improved, and the time required by the test can be reduced.
It is to be noted that the foregoing is only illustrative of the preferred embodiments of the present invention and the technical principles employed. It will be understood by those skilled in the art that the present invention is not limited to the particular embodiments described herein, but is capable of various obvious changes, rearrangements and substitutions as will now become apparent to those skilled in the art without departing from the scope of the invention. Therefore, although the present invention has been described in greater detail by the above embodiments, the present invention is not limited to the above embodiments, and may include other equivalent embodiments without departing from the spirit of the present invention, and the scope of the present invention is determined by the scope of the appended claims.
Claims (10)
1. A display panel, comprising:
the data lines are connected with one column of sub-pixels;
the test unit comprises a plurality of output ends, and the plurality of output ends of the test unit are electrically connected with the first ends of the plurality of data lines in a one-to-one correspondence manner;
at least two output ends of the multiplexers are electrically connected with the second ends of at least two adjacent data lines in a one-to-one correspondence mode, and the input end of each multiplexer is electrically connected with a data connecting line;
the testing unit is configured to control the sub-pixels corresponding to the multiplexers in the odd-numbered columns to be in a first display state and control the sub-pixels corresponding to the multiplexers in the even-numbered columns to be in a second display state when the data connecting lines are tested, wherein the first display state is different from the second display state; the multiplexer is configured to control the data connection lines to be conducted with the corresponding data lines when the data connection lines are tested.
2. The display panel according to claim 1, wherein the test unit comprises: the test circuit comprises a plurality of switch units, a plurality of test signal lines, a first test control signal line and a second test control signal line;
a plurality of data lines corresponding to the same color sub-pixel are electrically connected with the same test signal line through a switch unit respectively, and each test signal line corresponds to one color sub-pixel;
the first end of each switch unit is used as one output end of the test unit, and the second end of each switch unit is electrically connected with the corresponding test signal line;
the control ends of the switch units corresponding to the multiplexers positioned in the odd columns are electrically connected with the first test control signal line, and the control ends of the switch units corresponding to the multiplexers positioned in the even columns are electrically connected with the second test control signal line.
3. The display panel according to claim 2, wherein the display panel further comprises a plurality of open test switches and open test control signal lines;
the circuit breaking test switch is connected between two adjacent data connecting lines, the control end of the circuit breaking test switch is electrically connected with the circuit breaking test control signal line, and the circuit breaking test switch is used for conducting the two adjacent data connecting lines according to the control signal of the control end of the circuit breaking test switch.
4. The display panel according to claim 1, wherein the test unit comprises: a plurality of switch units, a plurality of test signal lines, and a third test control signal line;
among a plurality of data lines corresponding to the same color sub-pixel, a plurality of data lines corresponding to multiplexers positioned in odd columns are electrically connected with a test signal line through a switch unit respectively, a plurality of data lines corresponding to multiplexers positioned in even columns are electrically connected with another test signal line through a switch unit respectively, and each test signal line corresponds to one color sub-pixel;
the first end of each switch unit is used as an output end of the test unit, the second end of each switch unit is electrically connected with the corresponding test signal line, and the control end of each switch unit is electrically connected with the third test control signal line.
5. A display device characterized by comprising the display panel according to any one of claims 1 to 4.
6. A method for testing a display panel, the display panel comprising: the data lines are connected with one column of sub-pixels; the test unit comprises a plurality of output ends, and the plurality of output ends of the test unit are electrically connected with the first ends of the plurality of data lines in a one-to-one correspondence manner; at least two output ends of the multiplexers are electrically connected with the second ends of at least two adjacent data lines in a one-to-one correspondence mode, and the input end of each multiplexer is electrically connected with a data connecting line;
the method comprises the following steps:
in a first test stage, the test unit controls the sub-pixels corresponding to the multiplexers in the odd-numbered columns to be in a first display state, and simultaneously controls the sub-pixels corresponding to the multiplexers in the even-numbered columns to be in a second display state, wherein the first display state is different from the second display state; the multiplexer controls the data connecting lines to be conducted with the corresponding data lines;
and judging whether the data connecting line is short-circuited according to the display state of the sub-pixel.
7. The test method of claim 6, wherein the test unit comprises: the test circuit comprises a plurality of switch units, a plurality of test signal lines, a first test control signal line and a second test control signal line; a plurality of data lines corresponding to the same color sub-pixel are electrically connected with the same test signal line through a switch unit respectively, and each test signal line corresponds to one color sub-pixel; the first end of each switch unit is used as one output end of the test unit, and the second end of each switch unit is electrically connected with the corresponding test signal line; the control ends of the switch units corresponding to the multiplexers positioned in the odd columns are electrically connected with the first test control signal line, and the control ends of the switch units corresponding to the multiplexers positioned in the even columns are electrically connected with the second test control signal line;
the test unit controls the sub-pixels corresponding to the multiplexers in the odd columns to be in a first display state, and simultaneously controls the sub-pixels corresponding to the multiplexers in the even columns to be in a second display state, and the method comprises the following steps:
the first test control signal line controls the switch unit connected with the first test control signal line to be conducted, and the test signal line controls the corresponding sub-pixel to be in a first display state; the second test control signal line controls the switch unit connected with the second test control signal line to be switched off, and the sub-pixel corresponding to the second test control signal line is in a second display state.
8. The method of claim 7, wherein the display panel further comprises a plurality of open test switches and open test control signal lines; the circuit breaking test switch is connected between two adjacent data connecting lines, the control end of the circuit breaking test switch is electrically connected with the circuit breaking test control signal line, and the circuit breaking test switch is used for conducting the two adjacent data connecting lines according to the control signal of the control end of the circuit breaking test switch;
the method further comprises the following steps:
in a second test stage, the open circuit test control signal line controls the open circuit test switch to be conducted, the first test control signal line controls the switch unit connected with the first test control signal line to be conducted, and the test signal line controls the corresponding sub-pixel to be in a first display state; the second test control signal line controls the switch unit connected with the second test control signal line to be switched off, and the sub-pixel corresponding to the second test control signal line is in a second display state; the multiplexer controls the data connecting lines to be conducted with the corresponding data lines;
and judging whether the data connecting line is broken according to the display state of the sub-pixel.
9. The method of claim 6, wherein the test unit comprises: a plurality of switch units, a plurality of test signal lines, and a third test control signal line; among a plurality of data lines corresponding to the same color sub-pixel, a plurality of data lines corresponding to multiplexers positioned in odd columns are electrically connected with a test signal line through a switch unit respectively, a plurality of data lines corresponding to multiplexers positioned in even columns are electrically connected with another test signal line through a switch unit respectively, and each test signal line corresponds to one color sub-pixel; the first end of each switch unit is used as an output end of the test unit, the second end of each switch unit is electrically connected with the corresponding test signal line, and the control end of each switch unit is electrically connected with the third test control signal line;
the test unit controls the sub-pixels corresponding to the multiplexers in the odd columns to be in a first display state, and simultaneously controls the sub-pixels corresponding to the multiplexers in the even columns to be in a second display state, and the method comprises the following steps:
and the third test control signal line controls the switch unit to be conducted, the test signal line corresponding to the multiplexer positioned in the odd-numbered row inputs the test signal, and the test signal line corresponding to the multiplexer positioned in the even-numbered row does not input the test signal.
10. The method of claim 6, further comprising:
in a third testing stage, the testing unit controls one color sub-pixel to be in a first display state and controls other color sub-pixels to be in a second display state;
and judging whether the sub-pixels are abnormal or not according to the display states of the sub-pixels.
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