CN113741237A

CN113741237A - All-liquid-crystal automobile instrument durability test result recording and analyzing method

Info

Publication number: CN113741237A
Application number: CN202110853241.0A
Authority: CN
Inventors: 杨奔; 何银山
Original assignee: Dongfeng Electric Drive Systems Co Ltd
Current assignee: Dongfeng Electric Drive Systems Co Ltd
Priority date: 2021-07-27
Filing date: 2021-07-27
Publication date: 2021-12-03

Abstract

The invention relates to a method for analyzing all-liquid-crystal automobile instrument durability test records, which is characterized in that an MCU chip and an MPU chip are connected for durability test; the MCU chip and the MPU chip record the working states of the other party and the other party in real time, and when an abnormality occurs, the abnormality reason is analyzed through the recorded contents of the MCU chip and the MPU chip. The method can realize real-time recording of the state of the instrument and fault analysis when the problem of restarting or black screen occurs during the endurance test.

Description

All-liquid-crystal automobile instrument durability test result recording and analyzing method

Technical Field

The invention relates to the technical field of hardware testing, in particular to a method for recording and analyzing an endurance test result of an all-liquid-crystal automobile instrument.

Background

At present, an automobile all-liquid crystal instrument generally performs endurance tests, such as a high-temperature endurance test, a low-temperature endurance test, a long-time operation endurance test and the like, the endurance test result of the automobile instrument is generally detected by checking the final state of the instrument by a person after a certain time to confirm the endurance test result of the instrument, and if the automobile instrument is restarted in the endurance test process or is recovered after a black screen, the abnormal intermediate state cannot be known from the final instrument state, so that the reliability of the endurance test cannot be ensured.

According to the hardware architecture of the existing full liquid crystal instrument, the hardware architecture is generally an MCU chip + MPU chip architecture, an MCU end is mainly responsible for functional logic processing, and an MPU is mainly responsible for picture display and part of functional logic processing. Therefore, through theoretical possibility analysis, the reasons for restarting or black screen of the automobile instrument in the endurance test are mainly the following aspects:

1. the hardware problem of the full liquid crystal instrument. The quality of the selected hardware components has problems and can be damaged in the endurance test. The black screen state is generally maintained after the hardware is damaged.

And 2, the MCU application layer functional logic has problems. The full liquid crystal instrument generally controls power supply to the MPU through the MCU chip, low power consumption when IGN OFF is achieved, and the MCU power supply problem possibly exists in the endurance test, so that a black screen or the instrument is restarted.

Problems exist with MPU system layer or application layer functional logic. The MPU is divided into a Linux system layer and an application layer, and when the system layer or the application layer has functional logic problems, a black screen or an instrument can be restarted.

Aiming at the analysis of the possible reasons of the 3 points, when the problem of restarting or black screen occurs in the endurance test, the real-time instrument state record becomes a problem which needs to be solved urgently at present.

Disclosure of Invention

The invention provides a method for recording and analyzing an endurance test result of a full-liquid-crystal automobile instrument, aiming at solving the technical problems in the prior art, so as to record the state of the instrument in real time when the problem of restarting or black screen occurs during endurance test.

The technical scheme for solving the technical problems is as follows: a method for analyzing durability test records of all-liquid crystal automobile instruments comprises the following steps:

connecting the MCU chip and the MPU chip and carrying out durability test;

the MCU chip and the MPU chip record the working states of the other party and the other party in real time, and when an abnormality occurs, the abnormality reason is analyzed through the recorded contents of the MCU chip and the MPU chip.

Further, the connection of the MCU chip and the MPU chip includes physical and electrical connections required for a conventional endurance test and a heartbeat connection between the MCU chip and the MPU chip.

Further, through the heartbeat connection, the MCU chip sends serial port communication information to the MPU chip at intervals, the MPU chip returns self state information to the MCU chip, and if the MCU chip does not receive return information of the MPU chip in a plurality of continuous heartbeat cycles, the MPU chip is judged to be abnormal and the abnormal information is recorded and stored.

Further, through the heartbeat connection, the MCU chip sends serial port communication information to the MPU chip every 2 seconds, and the MPU chip returns self state information to the MCU chip.

Further, if the MCU chip does not receive the return message of the MPU chip in 3 continuous heartbeat cycles, the MPU chip is judged to be abnormal, and the abnormal information is recorded and stored.

Further, the real-time recording of the working states of the MCU chip and the MPU chip on the other side comprises: and the MPU chip records and stores the power supply state of the MCU chip to the MPU chip in real time.

The invention has the beneficial effects that: the invention mainly solves the problem that the abnormal state of the instrument recovered after the instrument is restarted or the screen is blacked in the test process cannot be recorded and known in the endurance test process of the all-liquid crystal instrument, and the invention provides a method for mutually performing abnormal supervision and abnormal state storage on an instrument MCU (microprogrammed control unit) and an MPU (micro processing unit) chip.

The invention provides an important basis for more accurate test passing or not for the durability test of the full liquid crystal instrument by a chip mutual supervision method. The recording is carried out by a software method, and the method is simple and easy to use.

Drawings

FIG. 1 is a schematic diagram of a logic implementation of the method of the present invention.

Detailed Description

The principles and features of this invention are described below in conjunction with the following drawings, which are set forth by way of illustration only and are not intended to limit the scope of the invention.

The invention mainly aims at the endurance test process of the full liquid crystal automobile instrument, and by a method for mutual monitoring of the MCU chip and the MPU chip, when one of the MCU chip or the MPU chip is abnormal, the other can record and store the abnormal state and the occurrence time number of the other in real time, and record and analyze the black screen or the restart recovery state in the endurance test process of the full liquid crystal instrument.

The specific implementation mode is as follows:

and 1, the MPU end records the power supply states of the voltage, the power supply and power failure conditions and the like of the MPU chip of the MPU end in real time through an application layer small program, stores the log in a hard disk of the MPU end and supervises the power supply state of the MCU in real time. Because the full liquid crystal instrument generally controls power supply to the MPU through the MCU chip, low power consumption when IGN OFF is achieved, MCU power supply problems may exist in the endurance test, and screen blacking or instrument restarting is caused. Therefore, the power supply state of the MCU is monitored and recorded in real time through the MPU, and when a black screen occurs or the instrument is restarted, the reason for the problem can be obtained by analyzing log files recorded by the MPU.

And 2, the MCU end and the MPU end monitor the system states of the two parties in real time through heartbeat connection. The heartbeat connection method can be various, for example, the MCU end sends serial port communication information to the MPU chip every 2 seconds, and the MPU chip returns self state information. If the MCU does not receive the MPU return message in 3 continuous heartbeat cycles, the MPU system is considered to be abnormal, and the abnormal information is recorded and stored in the EEPROOM memory chip. Refer to fig. 1. The MPU may return information on its own status, such as 0/1 flag information, for indicating whether the MPU is operating normally, or may return information on the operating voltage and refresh frequency.

The MPU is divided into a Linux system layer and an application layer, and when the system layer or the application layer has functional logic problems, a black screen or an instrument can be restarted. Through heartbeat connection, the MCU can acquire the working state of the MPU in real time, and when a black screen appears or the instrument is restarted, the reason for the problem can be obtained by analyzing the log file recorded by the MCU terminal.

After passing the endurance test, whether the abnormal state of the meter occurs in the endurance test is analyzed by reading the stored log information in the eepromo and MPU chips. And judging whether the abnormal condition is the MCU side problem or the MPU side problem by log analysis.

The method mainly solves the problem that in the process of the endurance test of the all-liquid crystal instrument, because the MCU and the MPU chip do not have an abnormal log recording function or abnormal logs cannot be stored in time due to power failure downtime, and other factors, the abnormal state of the instrument recovered after the instrument is restarted or the instrument is in a black screen state in the test process cannot be recorded and known, and the method for mutually performing abnormal supervision and abnormal state storage on the MCU and the MPU chip of the instrument provides an important basis for more accurate passing or not of the test for the endurance test of the all-liquid crystal instrument. The recording is carried out by a software method, and the method is simple and easy to use.

The above description is only for the purpose of illustrating the preferred embodiments of the present invention and is not to be construed as limiting the invention, and any modifications, equivalents, improvements and the like that fall within the spirit and principle of the present invention are intended to be included therein.

Claims

1. A method for analyzing durability test records of all-liquid crystal automobile instruments is characterized by comprising the following steps:

connecting the MCU chip and the MPU chip and carrying out durability test;

the MCU chip and the MPU chip respectively record the working state of the other side in real time, and when an abnormality occurs, the abnormality reason is analyzed through the recorded contents of the MCU chip and the MPU chip.

2. The all-liquid-crystal automobile instrument endurance test recording and analyzing method according to claim 1, wherein the connection of the MCU chip and the MPU chip includes physical and electrical connections required for a conventional endurance test and a heartbeat connection between the MCU chip and the MPU chip.

3. The all-liquid-crystal automobile instrument endurance test recording analysis method according to claim 2, wherein through the heartbeat connection, the MCU chip sends serial communication information to the MPU chip at intervals, the MPU chip returns its own state information to the MCU chip, and if none of the MCU chips receives a return message from the MPU chip in a plurality of continuous heartbeat cycles, it determines that the MPU chip is abnormal and records and stores the abnormal information.

4. The all-liquid-crystal automobile instrument endurance test recording analysis method according to claim 3, wherein through the heartbeat connection, the MCU chip sends serial port communication information to the MPU chip every 2 seconds, and the MPU chip returns self state information to the MCU chip.

5. The all-liquid-crystal automobile instrument endurance test recording and analyzing method according to claim 3, wherein if none of the MCU chips receives a return message of the MPU chip for 3 consecutive heartbeat cycles, it is determined that the MPU chip is abnormal and the abnormal information is recorded and stored.

6. The all-liquid-crystal automobile instrument endurance test recording analysis method according to claim 1, wherein the MCU chip and the MPU chip respectively record the operating states of the other in real time, including: and the MPU chip records and stores the power supply state of the MCU chip to the MPU chip in real time.