CN114519902A - Control device for monitoring a machine - Google Patents

Abstract

The invention relates to a control device for monitoring a machine and for monitoring the emission performance of the machine, wherein the monitoring is based on a comparison of: the relative position of the machine-based measured and/or operational value criteria with respect to the nominal value of the machine is compared. The control device (1) for monitoring a machine (2) according to the invention is designed and set up to carry out the following steps: -detecting (S10) measured values and/or operational values of the machine (2), -deriving a criterion (S20) based on the detected measured values and/or operational values, -comparing (S30) the criterion with a nominal value, wherein the nominal value represents a state of normal functioning of the machine (2), and determining (S31) a relative position of the criterion with respect to the nominal value, and-deriving (S40) a state of the machine (2) based on a result of the comparison and the determined relative position.

Description

Control devices for monitoring machines

technical field

The invention relates to a control device for monitoring a machine and for monitoring the emission performance of the machine, wherein the monitoring is based on a comparison of a standard based on measured and/or operating values of the machine with respect to the nominal value of the machine The relative position of the value.

Background technique

A method for evaluating the robustness of at least one diagnostic function is known from DE 10 2014 115 485 B4, wherein at least one characteristic value is determined for at least one characteristic variable of the diagnostic function.

SUMMARY OF THE INVENTION

The control device according to the invention for monitoring a machine is designed and set up to carry out the following steps:

- detect the measured and/or operating values of the machine,

- finding criteria based on detected measured and/or operating values,

- comparing the standard with the nominal value, which represents the functional state of the machine, and finding the relative position of the standard with respect to the nominal value, and

- The state of the machine is determined based on the result of the comparison and the determined relative position.

The control device determines the state of the machine on the basis of the result of the comparison and the determined relative position of the standard with respect to the nominal value, in this way the invention achieves that the robustness of the determination can be improved, thereby enabling Improve the robustness of the monitoring.

The effectiveness of the monitoring is understood as robustness. Monitoring is non-robust if the monitoring indicates that the machine is functioning properly despite the machine being defective, or that the monitoring is indicating that the machine is defective despite the machine being functioning properly. Since the detected measured values and/or operating values are usually subject to certain fluctuations, the determined criterion is also subject to certain fluctuations. Monitoring can be considered robust if, despite the fluctuations, the monitoring indicates that the state of the machine is correct.

The machine is preferably a vehicle, in particular an internal combustion engine. In principle, however, the control device according to the invention can be used in machines for which monitoring of measured and/or operating values is taken into account.

Variables describing the state of the machine are understood to be measured values and/or operating values. This can be, for example, efficiency, noise emission and/or pollutant emission, temperature or pressure. In this case, measurement and calculation by means of a model or reading from a characteristic curve set are to be understood as detections.

The criterion determined on the basis of the detected measured values and/or operating values of the machine characterizes the current state of the machine. In this case, the criterion can correspond to the detected measured value and/or operating value. In particular, however, if more than one measured value and/or operating value of the machine is detected, it is advantageous to convert the detected measured value and/or operating value to a standard suitable for characterizing the machine. If the machine is in nominal condition, i.e. functional, then the standard takes the nominal value.

The nominal value represents the functioning state of the machine. The nominal value can be related to the operating state of the machine. The further the machine deviates from the nominal state, the further the standard deviates from the nominal value.

Preferably, the control device is designed and set up to repeatedly carry out the steps of detection, determination of the criterion, comparison and determination of the state.

In this way the control device repeats the steps of detection, determination of criteria, comparison and determination of status, in this way the invention enables the machine to be monitored over a period of time and/or for a plurality of monitoring processes.

Preferably, the steps of detecting, determining the criterion, comparing and determining the state are performed continuously. Particularly preferably, the control device is used for so-called on-board diagnostics of the machine.

For the robustness of the control monitoring, the control device can, for example, determine from the relative position of the criterion with respect to the nominal value: the frequency or the duration of the repetition of the steps. If the relative position of the criterion is far from the nominal value, perform the steps more frequently or longer in order to obtain unambiguous results. Conversely, if the relative position of the criterion is close to the nominal value, it is sufficient to repeat the steps less frequently or to perform the steps in a shorter period of time to obtain unambiguous results.

Preferably, the control device is designed and set up to additionally take into account the defect values during the comparison and to determine the relative position of the criterion with respect to the nominal value and with respect to the defect value. The defect value represents the defect status of the machine.

The control device takes into account the determination of the state of the machine on the basis of the result of the comparison and the relative position of the criterion with respect to the nominal value and with respect to the defect value. In this way, the present invention enables: the defect state of the machine and the function of the machine can be determined. The relative position of the normal state assessment criteria. As a result, the validity of the relative position can be increased, whereby the robustness of the monitoring can also be increased.

Preferably, the control device is designed and set up to determine a defect measure based on a standard relative position and to take the determined defect measure into account when determining the machine state.

The control device takes into account certain defect measures when determining the state of the machine. In this way, the invention makes it possible to take into account the defect measures of the machine when monitoring.

Preferably, in order to determine the defect measure, the control device maps the value range between the nominal value and the defect value onto the value range between the two defined values A and B, preferably 0 and 1 . The mapping function here is particularly preferably continuous and monotonic. The nominal value maps to value A and the defect value maps to value B. An example of a mapping function is a linear mapping or S-function. The mapping function can be related to the operating state of the machine. In contrast, the values A and B are independent of the operating state.

The values of the standard on the side of the nominal value that deviate from the defect value are mapped to values less than or equal to A. Values of the criterion on the side of the defect value deviating from the nominal value are mapped to values greater than or equal to B. The same mapping function, extrapolation or another function can be used for the mapping. However, the function is also particularly preferably continuous and monotonic. Advantageously, the function is limited upwards and downwards and tends to limit values for values far from nominal and/or defect values.

The values determined by the mapping of the standard can be regarded as a defect measure of the machine. A defect measure below or close to A indicates that the machine is functioning properly, and a defect measure near or above B indicates that the machine is defective. The defect measure between A and B is ambiguous, wherein when determining the state of the machine, it is possible to indicate whether the machine is defective or functional. It is also possible to adjust the duration or the number of repetitions of detection, evaluation criteria, comparison and evaluation status based on defect metrics.

Preferably, the control device is designed and set up to determine the debounce speed based on the standard relative position, and to take the determined debounce speed into account when determining the machine state.

The control device considers the determined debounce speed when determining the machine state. In this way, the present invention realizes that the debounce speed can be used as a speed parameter when determining the state, so that the determined robustness can be improved. , thereby improving the robustness of the monitoring.

Preferably, the control device maps the defect measure onto another value range defined by the values C, D and E. Advantageously, C is less than D and D is less than E. For example, C corresponds to the value -1, D corresponds to the value 0, and E corresponds to the value 1. Here, defect metrics at points close to A are mapped onto C, defect metrics at points defined between A and B are mapped onto D, and defect metrics at points close to B are mapped onto E. The defined points particularly preferably correspond to limit values. If the mapped defect metric is between D and E, then it is a defective machine, and if the mapped defect metric is between C and D, then it is known as a functioning machine.

Preferably, the mapping function is continuous and monotonic. Advantageously, the mapping function is limited for very large and very small values of the defect metric and tends towards lower and/or upper values.

A map of defect metrics, ie the debounce speed, can be used as a speed parameter for finding the state of the machine. This can mean, for example, that at high debounce speeds, a few unambiguous results are sufficient, but at low debounce speeds, many results are required before the control device considers the results robust and determines the machine state. For example, a negative debounce speed can trigger the determination of a functional state, while a positive debounce speed can trigger the determination of a defective state.

In cases where the defect metric between A and B is ambiguous, the debounce speed is 0 or close to 0. The evaluation therefore does not terminate or lasts for a very long time. This is consistent with ambiguous results and solves the problem of random results in this situation.

Preferably, the control device is designed and designed to determine the probability that the machine is functioning properly and/or to be defective on the basis of the relative position of the criterion, and to take the determined probability into account when determining the state of the machine.

The control device takes the determined probabilities into account when determining the machine state, in this way the invention realizes that the duration or the number of repetitions of the steps of detecting, determining the criterion, comparing and determining the state is adjusted according to the determined probability.

Preferably, in order to determine the first probability, the control device maps the defect measure onto a range of values which is equal to or slightly below 1 for defect measures below A, and which is equal to or slightly below 1 for values above B equal to or slightly higher than 0. A monotonic transition occurs between A and B. The result of this mapping can be regarded as the probability that the criterion that occurs is less than the defect metric under consideration. Thus, the result of the mapping indicates the probability that the machine is functioning properly.

Further preferably, the control device determines a second probability, which represents the probability that the machine is defective. For this purpose, the control device maps the defect measure onto a range of values that is equal to or slightly above 0 for defect measures below A and equal to or slightly below 1 for values above B . The result of this mapping indicates the probability that the machine is defective.

To find the state, the control device repeats the steps of detecting, finding the criterion, comparing, and finding the state, and computes the first and second probability product by multiplying the computed first and second probabilities separately. If one of the two probability products falls below the first limit value, but at the same time the other remains above the second limit value, the determination of the state is ended. These two limit values can be related to the number of calculated probabilities.

The result of finding the state of the machine arises from the relationship of the products of these two probabilities to each other. If the first probability product is smaller than the second probability product, the control device determines the defect state of the machine. Otherwise, the control device ascertains the functioning state of the machine.

Particularly preferably, if the two probability products fall below a second limit value and/or if at least one probability product falls below a third limit value, the control device suspends the determination of the state without results.

Additionally or alternatively, a maximum number of determined probabilities can be defined, upon reaching which the control device aborts the determination of the state without results.

The control device according to the invention for monitoring the emission performance of a machine is formed and set up to carry out the following steps:

- determining the first defect measure of the first component of the machine,

- determining a first emissions impact based on the determined first defect measure, and - monitoring the emissions performance of the machine based on the first emissions impact.

The control device monitors the emission performance of the machine on the basis of the first emission influence, in this way the invention enables the evaluation of the emission performance during monitoring of the function of the first component, ie during the determination of the first defect measure. Thus, the present invention has the advantage of evaluating the emissions by determining the first emissions impact when performing on-board diagnostics (OBD) of the machine, and taking this evaluation into account when monitoring the emissions performance.

In this case, the control device for monitoring the emission behavior can in particular be a control device according to the invention for monitoring the machine, which is designed and set up for monitoring the emission behavior. In this case, in addition to or as an alternative to the step for monitoring the machine, a control device for monitoring the machine can execute the step for monitoring the emission behavior.

Defect measure is understood here as a measure representing the degree of machine defect. Preferably, the control device for monitoring the emission behavior is designed and designed, like a control device for monitoring a machine, to determine the relative position of the machine on the basis of a criterion determined on the basis of detected measured and/or operating values of the machine. A first defect metric is determined. Particularly preferably, the control device for monitoring the machine and the control device for monitoring the emission behavior form one control device.

Emission influence is understood here as the influence of the state of the first component on the emission behavior. If the first component is in the nominal state, the emissions impact corresponds to the nominal emissions. Conversely, if the state of the first component deviates from the nominal state, the defect metric also no longer corresponds to the nominal value, and the emissions impact of the first component generally deviates from the nominal emissions.

Emission performance is understood here as the output of emissions from the machine to the environment.

Monitoring is understood here to mean the comparison of the emission performance with the expected emission performance or the expected emission performance. In this case, the expected or expected emission behavior can arise, in particular, from legal regulations on emissions. Emissions are understood here to mean emissions of harmful substances, carbon dioxide and noise. In particular, if the machine has emissions performance that deviates from expected or expected emissions performance due to a defect of the first component, monitoring can also include notifying the operator of the machine, imposing a functional limitation or even an automatic shutdown of the machine.

Preferably, the control device determines the first emission influence from the mapping of the first defect measure by means of the function. The mapping function here can be, for example, a linear mapping or an S-function. In particular, the mapping function can be related to the operating state of the machine.

Further preferably, the mapping function maps the smallest first defect measure to the emission impact corresponding to the nominal emission. The mapping function maps the largest first defect measure to a value which, for example due to legal regulations, requires the machine to be shut down or at least to be repaired because a defined limit value has been reached or exceeded.

In particular, if the first defect measure and the emission influence are not proportional to each other, that is, for example, the emission increases when the defect measure becomes larger as well as becomes smaller, then a more complex mapping function is required, which for example has a non-monotonic behavior , so that, for example, an increase in emission influence can be followed even if the defect measure becomes smaller. If the defect metric can deviate from the nominal value in both directions, but only one direction causes an increase in the emission effect, then the mapping function is defined such that the defect metric is mapped only in that direction to a value indicating Machines with increased emissions impact are shut down or at least serviced.

Preferably, the control device is designed and designed to use a statistical function in the determination of the first emission influence.

The control device uses a statistical function to determine the first emission influence, in this way the invention achieves that a plurality of first defect measures can be taken into account when determining the first emission influence. As a result, strong fluctuations in the influence of the first emission can be reduced, since individual outliers of the first defect measure are reduced by a statistical function.

The statistical function is preferably understood here to mean the mean or median value of the first defect measure. In this case, the control device can apply a statistical function to the first defect measure and determine the first emission influence on the basis of, for example, the averaged first defect measure, or determine the first emission influence directly on the basis of the first defect measure and apply the statistical function. Applied to the determined first emission impact.

Particularly preferably, the control device determines the first emission influence on the basis of an average value of the first defect measures, wherein the control device averages the first defect measures within the debounce time period. The debounce time period is understood here to mean the time period within which the control device classifies the measurement as plausible or implausible. The debounce time period can here be defined as a time preset or as the number of data points. Here, the debounce period can be dynamically adjusted. The debounce period can be shortened if the measurement data is unambiguous and credible, but the debounce period can be extended if the measurement data is ambiguous.

Preferably, the control device is designed and designed to take into account the nominal emissions of the machine when determining the first emissions influence.

The control device takes into account the nominal emissions of the machine when determining the first emission influence, in this way the invention enables the emission influence to be taken into account not only in absolute value, but also additively or multiplicatively.

Addition means here: The emissions impact is added as a factor to the nominal emissions. Here, the smallest defect measure corresponds, for example, to a coefficient of 0 for the emission influence.

Multiplying here means that the emissions impact is multiplied by the nominal emissions as a factor. Here, the smallest defect measure would, for example, correspond to a factor of 1 for the emission influence.

Preferably, the control device is designed and designed to determine at least one further emission influence and to monitor the emission behavior of the machine on the basis of the first and the at least one further emission influence.

The control device determines the emission performance based on the first and at least one further emission influence, in this way, the invention realizes that if the machine comprises more than one component and/or more than one emission, it is also possible to monitor the performance of the machine Emissions performance.

Preferably, the control device uses different mapping functions for different emissions in order to monitor various emissions compositions and settings, since defects in the first component can have different, possibly even opposite, effects on different emissions. By using different mapping functions, the control device can advantageously determine the respective emission influence for each emission based on the first defect measure.

Preferably, in the case of more than one component to be monitored, the control device is designed and set up to determine at least one further defect measure. The control device can then use at least one further defect measure in order to determine a corresponding emission influence for one or more emissions to be monitored.

Particularly preferably, the control device is designed and set up for monitoring various emissions for a plurality of components, using individual mapping functions for the respective emissions and determining a defect measure for each component. The individual mapping functions of each type of emission can again be different for each component, in order to take into account that the defect measure of the first component may have a different influence on the observed emissions than the defect measure of the second component.

In particular, the invention enables an overall assessment of the emissions even in the event of failure of several component parts. This is advantageous, for example, when a failure of a part of an individual component does not lead to an error message, but in a combination it can lead to a limit value being exceeded.

Further advantageous embodiments of the invention are described below.

Description of drawings

Preferred embodiments are explained in detail on the basis of the following figures. Shown here:

FIG. 1 shows one embodiment of a powertrain with a control device;

Figure 2 shows one embodiment of the steps performed by the control device for determining the state of the machine;

Figure 3 illustrates one embodiment of determining defect metrics and debounce speeds;

Figure 4 illustrates one embodiment of determining first and second probabilities;

Figure 5 illustrates one embodiment of steps performed by a control device for monitoring the emissions performance of a machine;

Figure 6 illustrates one embodiment of determining first, second and third emission effects.

Detailed ways

FIG. 1 shows a powertrain 2 for a vehicle. The powertrain 2 includes an intake line 9 , an internal combustion engine 3 , an exhaust line 10 and a first exhaust gas return line 11 and a second exhaust gas return line 12 . Here, the intake line 9 is arranged upstream of the internal combustion engine 3 . The exhaust gas line 10 is arranged downstream of the internal combustion engine 3 and includes the exhaust gas purification system 4 .

The internal combustion engine 3 is configured as a supercharged direct-injection diesel engine having four cylinders 13 . For this purpose, the internal combustion engine 3 includes an exhaust gas turbocharger 14 . The exhaust gas turbocharger 14 includes a compressor 15 arranged in the intake line 9 and a turbine 16 arranged in the exhaust line 10 . The turbine 16 and the compressor 15 are coupled to each other so that the energy absorbed by the turbine 16 from the exhaust gas can be used by the compressor 15 to compress the fresh gas to an elevated pressure level.

In order to introduce diesel fuel into the cylinders 13 , the internal combustion engine 3 includes an injection device 30 . The injection device 30 includes an injector, an input line, and a fuel supply for each cylinder 13 .

The exhaust gas purification system 4 includes a diesel oxidation catalyst (DOC) 5 , an SCR system and an ammonia slip catalyst (ASK) 7 . DOC5 constitutes a reduction in carbon monoxide and unburned hydrocarbon emissions.

The SCR system is arranged downstream of DOC 5 and includes SCR 13 catalyst 6 , metering unit 19 and mixer 20 . The metering unit 19 is designed and designed to introduce ammonia (NH 3 ) into the exhaust gas line 10 upstream of the SCR catalyst 6 . In a mixer 20 arranged between the metering unit 19 and the SCR catalyst 6, the introduced ammonia gas is mixed with the exhaust gas. The SCR catalytic converter 6 is designed and designed to reduce NOx emissions by means of ammonia gas.

In order to detect NOx emissions, a NOx sensor 22 is arranged downstream of the exhaust gas aftertreatment system 4 .

The first exhaust gas return line 11 is arranged upstream of the exhaust gas purification system 4 and is designed to discharge the exhaust gas upstream of the turbine 16 of the exhaust gas turbocharger 14 from the exhaust gas line 10 and supply it to the exhaust gas turbocharger. Intake line 9 downstream of compressor 15 of compressor 14 . The second exhaust gas return line 12 is formed for discharging the exhaust gas downstream of the DOC 5 from the exhaust gas line 10 and feeding it to the intake line 9 upstream of the compressor 15 of the exhaust gas turbocharger 14 . By means of the first exhaust gas return line 11 and the second exhaust gas return line 12 , a preferred exhaust gas return rate can be provided for the operation of the internal combustion engine 3 and an operation of the internal combustion engine 3 as efficiently as possible can be achieved.

The powertrain 2 includes the control device 1 . The control device 1 is designed and set up to execute a control program. The control program includes commands to perform the steps shown in Figure 2:

- detection of multiple measured and operating values of S10 machine 2,

- finding the S20 criterion based on the detected measured and operating values,

- Compare S30 the standard with a nominal value and a defective value, wherein the nominal value represents the functional state of the machine 2 and the defective value represents the defective state of the machine 2, and determine S31 the standard relative to the nominal value and the defective the relative position of the value,

- determining the S32 defect measure based on the relative position of the determined S31 of said criteria,

- determining S33 the debounce speed based on the determined defect measure S32, and

- Determine S40 the state of the machine 2 based on the result of the comparison S30, the relative position determined S31, the defect measure determined S32 and the debounce speed determined S33.

The control unit program is used here for on-board monitoring of the powertrain. To this end, the control device program continuously performs the steps of detecting S10, finding criteria S20, comparing S30, finding S31 the relative position of the criteria, determining S32 defect measure, determining S33 debounce speed and finding status S40.

The control unit program detects information on the SCR catalytic converter 6 , the NOx emissions downstream of the exhaust gas aftertreatment system 4 and the speed and load of the internal combustion engine 3 as measured and operating values. The number of revolutions and the load are provided to the control device by the motor control, the NOx emissions are measured by the NOx sensor 22 and the control device program finds the SCR catalyst by executing a model for calculating the ageing, loading and temperature of the SCR catalyst 6 state of device 6.

The control device program determines criteria S20 based on the detected measured values and operating values. For this purpose, the control unit program compares the ascertained NOx emissions and the ascertained state of the SCR catalytic converter 6 with ascertained expected values for the number of revolutions and load. The expected values are stored here in a characteristic curve family that can be called up by the control device program. The criterion sought S20 therefore characterizes the degree to which the measured and operating values correspond to the expected state of the powertrain 2 .

The control device program includes a command to compare S30 the criterion determined S20 with the nominal value and the defect value. The nominal value represents a functioning state of the powertrain 2 , and the defective value represents a defective state of the powertrain 2 . If the powertrain 2 is in the nominal state, the criterion determined for S20 essentially corresponds to the nominal value. The farther the powertrain deviates from the nominal state, that is, the more defective it is, the farther the obtained criterion of S20 is from the nominal value and the closer to the defective value.

If the detected NOx emissions and the detected state of the SCR catalyst 6 correspond as far as possible to the expected values of the detected number of revolutions and the detected load, the criterion for S20 determined is related to the distance defect value. closer to the nominal value. If the detected NOx emissions and the detected state of the SCR catalytic converter 6 do not correspond to the expected values, the criterion S20 determined is closer to the defective value than to the nominal value. If only the NOx emissions or only the detected state of the SCR catalyst 6 corresponds to the expected value, the criterion S20 determined may lie relatively centrally between the nominal value and the defective value. Therefore, it may not be clearly clear whether the powertrain 2 is defective or functional.

In order to robustly determine S40 the state of the powertrain, the control device program therefore includes commands that take into account the standard relative position, defect measure and debounce speed when determining state S40. To this end, the control device program first obtains the relative position of the criterion S31 by calculating the distances of the criterion from the nominal value and the defect value.

In order to determine the S32 defect measure, the control device program includes a command to map the value range between the nominal value and the defect value onto the value range between the two defined values A and B. The values A and B here are 0 and 1 as shown in the upper illustration in FIG. 3 . The control program uses a linear function as the mapping function for the exemplary operating point of the powertrain 2 . The control device program uses other functions for some operating points. The nominal value NW is mapped to the value A, and the defect value DW is mapped to the value B.

Values of the standard on the side of the nominal value away from the defect value are mapped to values smaller than A. Values of the criterion on the side of the defect value deviating from the nominal value are mapped to values greater than B. The control device program here uses the same linear function for these mappings, and the control device maps the criterion using another function or extrapolation for some operating point programs. The linear function is limited upwards and downwards here, so that values beyond the nominal and limit values, ie values smaller than A or larger than B, tend to the limit values.

The mapped value of the criterion corresponds to the defect measure of the powertrain 2 . Mapped values below or close to A indicate a functional powertrain 2, and results close to or above B indicate a defective powertrain 2. The result between A and B is ambiguous.

In order to determine the S33 debounce speed, the control device program includes a command to map the determined defect measure of S32 onto another value range, as shown in the lower illustration of FIG. 3 . Said further value range is defined by three values C, D and E. Here, C is less than D, and D is less than E, that is, C=-1, D=0, E=1. Here, defect metrics at points close to A are mapped to C, defect metrics close to the preset defect metrics between A and B are mapped to D, and defect metrics at points close to B are mapped to E superior. The preset defect measure corresponds to the limit value which defines the boundary between a functional and defective powertrain 2 .

The mapping function is continuous, but has zero slope in the region of value D. For very large and very small values of the defect metric, the function is limited and tends towards lower and upper values.

The control device program uses the determined debounce speed of S33 as a parameter for finding S40 the state of the powertrain 2 . In the case of a high debounce speed, i.e. close to 1 or -1, some unambiguous result is sufficient, in the case of a low debounce speed, i.e. close to 0, in the evaluation state S40 is regarded as yes Many results are required before robustness. Here, a negative debounce speed corresponds to a functioning powertrain 2 , and a positive debounce speed corresponds to a defective powertrain 2 .

In the case of an ambiguous defect measure between A and B, the debounce speed is 0 or close to 0, and the state of the powertrain 2 is determined S40 never terminates or continues for a very long time. This is consistent with ambiguous results and solves the problem of random results in this situation.

In an alternative embodiment, instead of the debounce speed, the control device program includes means for obtaining the first and second probability products, comparing the first and second probability products with the first and second limit values, and Based on the result of comparing the probability product with the limit value, the command for the state of the powertrain 2 is obtained S40.

For this purpose, the control device program, as shown in the upper illustration in FIG. 4 , performs a first mapping, which maps the determined defect measure S32 onto a value range from zero to one. Here, defect metrics less than or equal to A are mapped to a value of 1, and defect metrics greater than or equal to B are mapped to a value of 0. Defect metrics between A and B are mapped to values between zero and one via an S-function. The result of this mapping yields the probability that Powertrain 2 is functioning properly.

The control device program performs a second mapping as shown in the lower illustration of FIG. 4, which maps the defect metrics onto a range of values from zero to one, such that defect metrics less than or equal to A are mapped To a value of 0, defect metrics greater than or equal to B are mapped to a value of 1, while defect metrics between A and B are mapped to values between 0 and 1 by means of the S-function shown. The result of the second mapping yields the probability that the powertrain 2 is defective.

To obtain S40 the state of powertrain 2, the control device program includes commands to obtain the product of the first and second probabilities by multiplying the calculated first and second probabilities separately from each other. When one of the two probability products is below the first limit value and the other probability product is simultaneously greater than the second limit value, the determination of the state of the powertrain 2 ends. The first and second limit values are defined according to the number of calculated first and second probabilities.

The control device program determines the result of obtaining the state of S40 from the relationship of these two probability products. If the second probability product is greater than the first probability product, the control unit program determines the defective powertrain 2 . If the first probability product is greater than the second probability product, the control unit program determines a functioning powertrain 2 .

If the two probability products fall below the second limit value and/or at least one probability product falls below the third limit value, the evaluation state S40 is aborted and restarted without a result. In addition, a maximum number of calculated probabilities is defined, when this number is reached, the control device program terminates the determination of state S40 without results and restarts after the waiting period has elapsed.

In an alternative embodiment, the control device 1 of the powertrain 2 is formed and set up to monitor the emission behavior. For this purpose, the control device 1 is designed and set up to execute a control program. The control program includes commands to perform the steps shown in Figure 5:

- detection of multiple measured and operating values of the S100 powertrain 2,

- determining the first criterion of the S210 SDPF6 based on the detected measured and operational values,

- determination of a second criterion for S220 DOC5 based on the detected measured and operating values,

- comparing the first criterion with a first nominal value and a first defective value, wherein the first nominal value represents a functionally functioning state of the SDPF 6 and the first defective value represents a defective state of the SDPF 6, and determining S410 the relative position of the first standard to the first nominal value and the first defect value,

- a second criterion is compared with a second nominal value and a second defect value, wherein the second nominal value represents the functionally normal state of the DOC 5 and the second defect value represents the defective state of the DOC 5, and it is determined S420 the relative position of the second standard to the second nominal value and the second defect value,

- determining S510 a first defect measure of the SDPF6 based on the determined relative position of the first criterion S410,

- determining S520 a second defect measure of DOC5 based on the determined relative position of the second criterion S420,

- determining S610 a first emission impact based on the determined first defect measure S510,

- determining S620 a second emission impact based on the determined first defect measure S510,

- determining S630 a third emission impact based on the determined second defect measure S520,

- determining S700 the total emissions impact based on the determined first emissions impact S610, second emissions impact S620 and third emissions impact S630, and

- Monitoring the emissions performance of the S800 Powertrain 2 based on the total emissions impact the S700.

The control unit program is used here for on-board diagnostics and for evaluating the emissions of the powertrain 2 . To this end, the control device program continuously executes the following steps: detecting S100, finding S210, S220 the first and second criteria, comparing S310, S320, determining the relative positions of the first and second criteria S410, S420, determining S510 , S520 first and second defect metrics, determine S610, S620, S630 first, second and third emissions impact, determine S700 total emissions impact, and monitor S800 powertrain 2 emissions performance as passed in Figure 5 The dotted line from step S800 to step S100 is indicated.

The control device program detects information on the DOC 5 , the SDPF 6 , the NOx emissions downstream of the exhaust gas aftertreatment system 4 and the revolutions and load of the internal combustion engine 3 as measured and operating values. The number of revolutions and load are supplied to the control device by the motor control, NOx emissions are measured by the NOx sensor 22, and the control device program finds DOC5 and SDPF6 by executing a model for calculating aging, loading and temperature of DOC5 and SDPF6 status.

The control device program obtains S210 the first criterion based on the detected measured values and operating values. For this purpose, the control device program compares the ascertained NOx emissions and the ascertained state of the SDPF 6 with the ascertained revolutions and expected values of the load. The expected values are stored here in a characteristic curve family that can be called up by the control device program. Similarly, the control device program obtains S220 the second criterion based on the information on DOC2. Thus, the ascertained first criterion and the ascertained second criterion S210, S220 characterize the degree to which the measured and operating values correspond to the expected state of SDPF 6 or DOC 5.

The control device program includes a command to compare S310 the determined first criterion S210 with a first nominal value and a first defect value. The first nominal value represents the functioning state of the SDPF 6 and the first defective value represents the defective state of the SDPF 6 . If the SDPF 6 is in the nominal state, the ascertained first criterion S210 essentially corresponds to the first nominal value. The farther the SDPF 6 deviates from the nominal state, ie, it becomes more and more defective, the farther the first criterion S210 determined is from the first nominal value and the closer it is to the first defect value.

If the detected NOx emissions and the detected state of the SDPF 6 correspond as far as possible to the expected values of the detected number of revolutions and the detected load, the first criterion S210 determined is closer than the distance to the first defect value first nominal value.

If the detected NOx emissions and the detected state of the SDPF 6 do not correspond to the expected values, the first criterion S210 determined is closer to the first defect value than to the distance from the first nominal value. If only the NOx emission or only the detected state of the SDPF 6 corresponds to the expected value, then the first criterion S200 determined may lie relatively centrally between the first nominal value and the first defect value. It is therefore not clear whether SDPF6 is defective or functional.

The control device program also includes a command to compare S320 the second criterion determined S220 with the second nominal value and the second defect value. The second nominal value represents the functionally normal state of DOC5, and the second defective value represents the defective state of DOC5. If DOC5 is in the nominal state, then the ascertained second criterion S220 corresponds substantially to the second nominal value. The farther the DOC5 deviates from the nominal state, ie, it is more and more defective, the farther the obtained second criterion S220 is from the second nominal value and the closer it is to the second defect value.

Depending on how well the detected state of DOC5 corresponds to the expected values of the detected number of revolutions and the load, the second criterion S220 obtained is closer to the second defect value or closer to the second nominal value.

In order to robustly determine the state of SDPF6 and the state of DOC5, the control device program includes taking into account the relative position of the first or second criterion, the first and second defect metrics, and the first and second debounce speeds when determining the state The command. To this end, the control device program first determines S410, S420 the relative positions of the first and second standards by: the control device program calculates the distance of the first standard from the first nominal value and the first defect value and Calculate the distance of the second standard from the second nominal value and the second defect value.

To determine S510 the first and second defect metrics, the control device program includes mapping a range of values between the first nominal value and the first defect value and between the second nominal value and the second defect value to the values between the two A command on the range of values between A and B between the defined values. The values A and B are here 0 and 1 as shown in the upper graph of FIG. 3 . The control program uses a linear function as the mapping function for the exemplary operating point of the powertrain 2 . The control device program uses other, and sometimes different, functions to determine the first and second defect values for some operating points. The first and second nominal values NW are mapped to value A, while the first and second defect values DW are mapped to value B.

The values of the first and second criteria on the side of the first or second nominal value NW which deviate from the first or second defect value DW are mapped to values smaller than A. The values of the first and second criteria on the side of the first or second defect value DW that deviate from the first or second nominal value NW are mapped to values greater than B. For these mappings, the control device program here uses the same linear function; it maps the first and/or second criterion using different functions or extrapolations for some operating points. The linear function is here limited upwards and downwards, so that values beyond the first or second nominal value and the first and second limit values, ie values smaller than A or larger than B, tend to the limit values.

The mapping value of the first standard corresponds to the defect metric of SDPF6, that is, the first defect metric, and the mapping value of the second standard corresponds to the defect metric of DOC5, that is, the second defect metric. Mapping values below or close to A indicate normal SDPF6 or DOC5 function, and results close to or above B indicate defective SDPF6 or DOC5. The result between A and B is ambiguous.

In order to determine the first and second debounce speeds, the control device program includes mapping the determined first defect measure and the determined second defect measure to another value as shown in the lower illustration of FIG. 3 command on the domain. Said further value range is defined by three values C, D and E. Here, C is less than D, and D is less than E, ie, C=-1, D=0, and E=1. Here, a first or second defect distance at a point close to A is mapped to C, a first or second defect measure close to a preset defect measure between A and B is mapped to D, and at a point close to A The first or second defect metric at the point of B is mapped onto E. The preset defect measure corresponds to a limit value which defines the boundary between a functioning and defective SDPF6 or DOC5.

The mapping function is continuous, but has zero slope in the region of value D. For very large and very small values of the first or second defect metric, the function is limited and tends towards lower and upper values.

The control device program uses the determined first debounce speed and the determined second debounce speed as parameters for determining the state of SDPF 6 and the state of DOC 5 . Before the fetch state is considered robust, some unambiguous result is sufficient in the case where the first or second debounce speed is high, i.e. close to 1 or -1, in the first or second In the case of low debounce speed, ie close to 0, many results are required. Here, a negative first or second debounce speed corresponds to a functional SDPF6 or DOC5, while a positive first or second debounce speed corresponds to a defective SDPF6 or DOC5.

In the case of an ambiguous first or second defect metric between A and B, the first or second debounce speed is 0 or close to 0, and the state evaluation of SDPF6 or DOC5 never terminates or lasts very long time. This is consistent with ambiguous results and solves the problem of random results in this situation.

In order to determine S610 , S620 , S630 the first, second and third emission effects based on the determined first defect measure and the determined second defect measure S510 , S520 , the control device program comprises applying the determined first defect measure S510 Mapped to two further value ranges defined by the values F and G, as shown in the upper and lower representations of FIG. 6 , and the determined second defect measure S520 was mapped to On another value range defined by the values F and G, as shown in the upper illustration in FIG. 6 .

In this case, the upper illustration of FIG. 6 corresponds to the first and third emission effects, while the lower illustration of FIG. 6 corresponds to the second emission effect. Here, the first emission effect describes the effect of the first defect metric S510 on NOx emissions, the second emission effect describes the effect of the first defect metric S510 on NH3 emissions, and the third emission effect describes the effect of the second defect metric S520 on NH3 emissions Effects of HC emissions.

The control device program here performs the determination of the first, second and third emission influences S610 , S620 , S630 , so that at first an average value of the first and second defect measures is formed within the debounce time period. The debounce time period corresponds to the time period up to which the determination of the state of the SDPF 6 or DOC 5 based on the first or second debounce speed can be considered robust. Based on the averaged first defect metric and the averaged second defect metric, the control device program then determines the first, second and third emission effects S610, S620, S630. The control unit program here selects the selected functions shown in FIGS. 3 and 6 as a function of the operating point of the powertrain 2 , and also uses different functions for the first and third emission effects, at least in part.

The control device routine also includes commands to consider the first, second and third nominal emissions of SDPF6 and DOC5 when determining the first, second and third emissions effects S610, S620, S630. This is additionally carried out by the control device program, so that the first, second and third emission effects are derived as follows:

E ₁ =E _{1, nominal} +K ₁ (D ₁ ), E ₂ =E _{2, nominal} +K ₂ (D ₁ )und E ₃ =E _{3, nominal} +K ₃ (D ₂ )

where E ₁ is the first emission effect, E ₂ is the second emission effect, E ₃ is the third emission effect, E _{1, nominal} is the first nominal emission of SDPF6, E _{2, nominal} is the second nominal emission of SDPF6 Emissions, E3 _{, nominal} is the nominal emission of _DOC5 , and K1(D1) and K2(D1 ₎ are the coefficients _of the _first and _second emission effects related to the _first defect measure D1, and K3 (D ₂ ) is the coefficient of the third emission effect related to the second defect measure D ₂ .

The control device routine includes determining a total emissions impact of the powertrain 2 based on the first, second and third emissions impacts and commands to monitor the emissions performance of the powertrain based on the total emissions impact.

To do this, the control device program first determines the linear and independent addition of the first, second and third emission effects:

E _Ges =E _{Ges, nominal} +∑K _i ,

where i=1, 2, 3.

Based on the total emissions impact, the control device program monitors the emissions performance of the S700 powertrain 2 by comparing the total emissions impact to limit values stored in the control device. If the emissions performance of the powertrain 2 is within the nominal range based on the comparison, no intervention by the control device is required. Conversely, if the emissions of the powertrain appear outside the nominal range, ie violate one or more limit values, the control device controls the powertrain in such a way that the control device alters the operation of the powertrain or The operator of the vehicle is informed to maintain, repair and/or at least inspect the defective component, here SDPF 6 or DOC 5 . If the emission performance deviates significantly from the limit values, the control device shuts down the powertrain 2, for example to prevent lasting damage to the SDPF 6, DOC 5 or other components.

In an alternative embodiment not shown, the control device program includes the following commands:

- by a linear, uncorrelated multiplication according to E=E _nominal · _{∏Fi ,} where Fi is a factor related to the defect measure of the emission impact,

- by a common mapping based on the combination of all defect metrics according to E=E(D ₁ . . . , D _n ), or

- by mapping based on pairwise interactions of two defect measures according to E ₌ E(D1,..., _Dn ) or E=E _nominal · _ΠFij (Di, _{Dj )} ,

to determine the total emissions impact.

In particular, the advantage of determining based on a common map and a map based on pairwise interactions is that the total emissions impact can be determined directly on the basis of the defect measure. Thus, it is not necessary to determine the individual emission effects.

Claims (18)

1. A control device (1) for monitoring a machine (2), wherein the control device is formed and set up to carry out the following steps: - detecting (S10) measured and/or operating values of said machine (2), - finding a criterion (S20) based on the detected measured values and/or operating values, - comparing (S30) the standard with a nominal value, wherein the nominal value represents a functional state of the machine (2), and determining (S31) the relative value of the standard relative to the nominal value relative position, and - Determining the state of the machine (2) based on the result of the comparison and the determined relative position (S40). 2 . The control device ( 1 ) according to claim 1 , wherein the control device ( 1 ) is designed and set up to repeatedly perform detection ( S10 ), determination of the criterion ( S20 ), comparison ( S30 ), 2 . The steps of determining (S31) and obtaining the state (S40). 3 . The control device ( 1 ) according to claim 1 , wherein the control device ( 1 ) is designed and set up to additionally take into account defect values in the comparison ( S30 ), wherein the defect values represent the The defective state of the machine (2), and the relative position of the criterion relative to the nominal value and relative to the defective value is determined (S31). 4. The control device (1) according to any one of the preceding claims, wherein the control device (1) is formed and set up for determining (S32) a defect measure based on the relative position of the criterion, and in determining The state (S40) of the machine (2) takes into account the determined defect measure (S32). 5. The control device (1) according to any one of the preceding claims, wherein the control device (1) is constructed and set up to determine (S33) a debounce speed based on the relative position of the criterion, and to determine (S33) a debounce speed. The determined debounce speed (S33) is taken into account when taking the state (S40) of the machine (2). 6. The control device (1) according to any one of the preceding claims, wherein the control device (1) is constructed and set up to determine that the machine (2) is functional and/or based on the criterion relative position or the probability of being defective, and the determined probability is taken into account when determining the state of the machine (2) (S40). 7. The control device (1) according to claim 3, wherein the control device (1) is constructed and set up to determine (S32) a defect measure by: - mapping the value range between the nominal value and the defect value onto the value range defined by A and B, - mapping the nominal value to a defined value A, and mapping the defect value to a defined value B, and - mapping the criterion based on its relative position to a value less than or equal to A, greater than or equal to B, or to a range of values between A and B, wherein the mapping of the criterion corresponds to the machine ( 2) defect measure, And based on the determined defect measure (S32), the state of the said machine (2) is calculated|required (S40). 8 . The control device ( 1 ) according to claim 7 , wherein the control device ( 1 ) is designed and set up to map the determined defect measure ( S32 ) to the three values C, D and E. 9 . On the defined value range, determine (S33) the debounce speed by means of the following steps: - mapping the defect metric corresponding to value A onto value C, the defect metric corresponding to value B onto value E, and the preset defect metric between values A and B onto value D, and - mapping defect metrics that do not correspond to values A and B or preset defect metrics to values less than C, greater than E, or to values located between C and E, wherein the mapping of defect metrics corresponds to de- shaking speed, And based on the determined debounce speed ( S33 ) and/or the determined defect measure ( S32 ), the state of the machine ( 2 ) is determined ( S40 ). 9 . The control device ( 1 ) according to claim 7 , wherein the control device ( 1 ) is formed and set up to be used when comparing ( S30 ). 10 . - performing a first mapping of said defect metrics onto a value range from zero to one, wherein defect metrics less than or equal to A are mapped onto a value of 1, defect metrics greater than or equal to B are mapped onto a value of 0, and mapping defect metrics between A and B to values between zero and one such that the first mapping corresponds to a first probability that the machine (2) is functioning properly, - performing a second mapping of said defect metrics onto a value range from zero to one, wherein defect metrics less than or equal to A are mapped onto a value of 0, and defect metrics greater than or equal to B are mapped onto a value of 1, and mapping defect metrics between A and B to values between zero and one such that the second mapping corresponds to a second probability that the machine (2) is defective, - take the product of the first and second probabilities by repeatedly taking the first and second probabilities and multiplying them separately from each other, and - comparing said first and said second probability product with first and second limit values, And based on the result of the said comparison, the state of the said machine (2) is calculated|required (S40). 10. A control device for monitoring the emission performance of a machine, wherein the control device is constructed and set up to perform the steps of: - determining a first defect measure of a first component of the machine, - determining a first emission impact based on the determined first defect measure, and - monitoring said emissions performance based on said first emissions impact. 11. The control device according to claim 10, wherein the control device is constructed and arranged to use a statistical function in determining the first emission influence. 12. A control device according to claim 10 or 11, wherein the control device is constructed and set up to take into account the nominal emissions of the machine when determining the first emissions impact. 13. The control device according to any one of claims 10 to 12, wherein the control device is constructed and set up to determine at least one further emission influence, and is based on the first emission influence and the at least one further emission influence The emissions impact of monitoring the emissions performance of the machine. 14. The control device according to claim 13, wherein the control device is constructed and arranged to determine a total emissions impact of the machine based on the first emissions impact and the at least one further emissions impact, and based on the The overall emissions impact monitors the emissions performance of the machine. 15. The control device according to claim 14, wherein the control device is constructed and set up to, - performing said total emissions impact based on a linear and uncorrelated addition or multiplication of said first emissions impact and said at least one further emissions impact, - determining said total emissions impact based on said first defect measure and at least one further defect measure, and/or - determining the total emission impact based on the pairwise interaction of the first defect metric and the at least one further defect metric. 16. The control device according to any one of claims 10 to 15, wherein the first emission influence and the at least one further emission influence are determined based on a function, and the function is formulated in relation to an operating point. 17. The control device (1) according to any of the preceding claims in combination with any of claims 10 to 16, wherein the control device is designed and set up to determine the first and/or at least the A first defect measure and/or at least one further defect measure of a further component: - detection of measured and/or operating values of said machine, - finding criteria based on detected measured and/or operating values, - comparing said standard with a nominal value, wherein said nominal value represents a functional state of said machine, - determining the relative position of said standard with respect to said nominal value, - mapping the value range between the nominal value and the defect value of the first and/or at least one further component onto the value range defined by the two values A and B, wherein the defect value represents the the defective state of the described machine, - mapping the nominal value to the defined value A and the defect value to the defined value B, and - mapping the criterion to a value less than or equal to A, greater than or equal to B, or to a value between A and B based on the relative position of the criterion, wherein the mapping of the criterion corresponds to the A defect measure of the first and/or at least one further component. 18. A control device according to any one of claims 10 to 17, wherein the control device is constructed and set up to control the machine based on monitored emission performance.

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