CN115166375A - Insertion loss test port - Google Patents
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- CN115166375A CN115166375A CN202210892409.3A CN202210892409A CN115166375A CN 115166375 A CN115166375 A CN 115166375A CN 202210892409 A CN202210892409 A CN 202210892409A CN 115166375 A CN115166375 A CN 115166375A
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- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2688—Measuring quality factor or dielectric loss, e.g. loss angle, or power factor
- G01R27/2694—Measuring dielectric loss, e.g. loss angle, loss factor or power factor
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Abstract
本申请涉及印制线路板加工技术领域，提出一种插入损耗测试端口，设于电路板上，所述插入损耗测试端口包括：多个定位孔，多个定位孔间隔分布在电路板且围成一测试区；两个接地PAD，平行且间隔地设于测试区内，每个接地PAD均为条形且沿第一方向延伸；测试组件，设于两个接地PAD之间，测试组件包括至少一个测试PAD，测试PAD的至少部分与相邻接地PAD之间具有预设距离；其中，定位孔和测试PAD组成第一测试端口；接地PAD和测试PAD组成第二测试端口。上述插入损耗测试端口实现了进行差分插损测试及特性插损测试时常用系列探针的适配，无需购买多种规格的探针装置，节省成本。
The present application relates to the technical field of printed circuit board processing, and proposes an insertion loss test port, which is arranged on a circuit board. The insertion loss test port includes: a plurality of positioning holes, the plurality of positioning holes are distributed on the circuit board at intervals and surrounded by a a test area; two grounded PADs are arranged in the test area in parallel and spaced apart, each grounded PAD is in the shape of a bar and extends along the first direction; a test assembly is disposed between the two grounded PADs, and the test assembly includes at least A test PAD, at least part of the test PAD has a preset distance from the adjacent grounded PAD; wherein, the positioning hole and the test PAD form a first test port; the ground PAD and the test PAD form a second test port. The above-mentioned insertion loss test port realizes the adaptation of a series of probes commonly used in differential insertion loss test and characteristic insertion loss test, without purchasing probe devices of various specifications and saving costs.
Description
Technical Field
The application relates to the technical field of printed circuit board processing, in particular to an insertion loss test port.
Background
With the development of information technology, insertion loss (also called insertion loss) is regarded as a key parameter for measuring signal loss of a PCB, and is increasingly emphasized in the manufacturing process of the PCB. The insertion loss is divided into two types: differential insertion loss and characteristic insertion loss. The differential insertion loss is insertion loss of a differential line and consists of two parallel transmission lines with equal length and 180-degree transmission phase difference; the characteristic insertion loss is insertion loss of a single-ended line and is composed of a single transmission line.
Because the test ports are designed differently, different probes need to be selected for testing according to actual design in the test process; the price of the probe is very expensive, and the cost of enterprises is increased when probes with various specifications are purchased.
Disclosure of Invention
The application aims to provide an insertion loss test port to solve the technical problem that the probe specifications of the existing insertion loss test port are incompatible.
An embodiment of the present application provides an insertion loss test port, locate on the circuit board, insertion loss test port includes:
the positioning holes are distributed on the circuit board at intervals and enclose a test area;
the two grounding PADs are arranged in the test area in parallel at intervals, and each grounding PAD is in a strip shape and extends along a first direction;
the testing assembly is arranged between the two grounding PADs and comprises at least one testing PAD, and at least part of the testing PAD has a preset distance with the adjacent grounding PAD;
the positioning hole and the test PAD form a first test port; the ground PAD and the test PAD constitute a second test port.
In an embodiment, the width of both the test PAD and the ground PAD is greater than or equal to 0.2mm in a second direction perpendicular to the first direction.
In one embodiment, the test assembly includes one rectangular test PAD extending in the first direction, and the predetermined distance between the test PAD and two ground PADs is equal.
In an embodiment, the test assembly comprises two test PADs for adapting a probe with a preset probe spacing, each test PAD comprises a first test part, a connecting part and a second test part which are connected in sequence, the first test part and the second test part extend along the first direction, a preset included angle is formed between an extension line of the connecting part and the first direction, the distance between the two second test parts is greater than two, the distance between the first test parts is smaller than the preset probe spacing, and the distance between each first test part and the adjacent ground PAD is the preset distance.
In one embodiment, the width of each of the first test portion and the second test portion is 0.2mm, the distance between the two first test portions is less than 0.35mm, and the distance between the two second test portions is less than 0.5mm.
In one embodiment, the ground PAD and the test PAD are flush on both ends.
In one embodiment, the predetermined distance is greater than 0.1mm.
In an embodiment, the number of the positioning holes is four, and the four positioning holes are located around the test area and are distributed in a rectangular shape.
In an embodiment, the insertion loss test port further includes a signal conducting PAD disposed in the test region, the signal conducting PAD is spaced apart from one end of the test PAD, and the signal conducting PAD is electrically connected to the test PAD through a transmission line.
In an embodiment, the insertion loss test port further includes a plurality of shielding holes disposed in the test region, a portion of the shielding holes being spaced apart from an end of the test PAD or the ground PAD away from the signal-conducting PAD, and a distance between the shielding holes and an end of the test PAD or the ground PAD away from the signal-conducting PAD along the first direction is greater than or equal to 0.2mm; and part of the shielding hole is arranged on the grounding PAD.
Above-mentioned insertion loss test port includes a plurality of locating holes, be located two ground connection PAD of test area and locate the test component between two ground connection PAD, because locating hole and test component can make up with adaptation packer series probe, ground connection PAD and test component can make up with adaptation FormFactor Cascade series probe, thereby realized carrying out the adaptation of difference insertion loss test and characteristic insertion loss test time general series probe, need not to purchase the probe device of multiple specification, save cost, effectively solved the incompatible technical problem of probe specification of current insertion loss test port.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings required to be used in the embodiments or the prior art description will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and for those skilled in the art, other drawings may be obtained according to these drawings without inventive labor.
FIG. 1 is a test port of a Packetmicro series probe corresponding to a conventional differential insertion loss test;
FIG. 2 is a test port of a FormFactor Cascade series probe corresponding to a prior differential insertion loss test;
FIG. 3 is a test port of a Packetmicro series probe corresponding to a conventional characterization insertion loss test;
FIG. 4 is a test port of a FormFactor Cascade series probe corresponding to a prior art characterization insertion loss test;
fig. 5 is a schematic structural diagram of an insertion loss test port corresponding to a differential insertion loss test according to an embodiment of the present application;
FIG. 6 is a schematic diagram of the structure of the ground PAD, the test PAD, the transmission line and the signal pass PAD in the insertion loss test port shown in FIG. 5;
fig. 7 is a schematic structural diagram of an insertion loss test port corresponding to a characteristic insertion loss test provided in the second embodiment of the present application;
fig. 8 is a schematic diagram of the structure of the ground PAD, the test PAD, the transmission line and the signal-on PAD in the insertion loss test port shown in fig. 7.
The designations in the figures mean:
100. an insertion loss test port;
101. a test zone;
10. positioning holes;
20. grounding the PAD;
30. testing the PAD; 31. a first test section; 32. a connecting portion; 33. a second testing section;
40. the PAD is conducted by a signal;
50. a transmission line;
60. a shielding hole;
201. and a ground ring.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the present application is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of and not restrictive on the broad application.
It will be understood that when an element is referred to as being "secured to" or "disposed on" another element, it can be directly on the other element or be indirectly on the other element. When an element is referred to as being "connected to" another element, it can be directly connected to the other element or be indirectly connected to the other element.
It will be understood that the terms "length," "width," "upper," "lower," "inner," "outer," and the like, as used herein, refer to an orientation or positional relationship illustrated in the drawings for convenience in describing the present application and to simplify description, and do not indicate or imply that the referenced device or element must have a particular orientation, be constructed and operated in a particular orientation, and thus should not be considered limiting of the present application. In the description of the present application, "a plurality" means two or more unless specifically limited otherwise.
In this application, unless expressly stated or limited otherwise, the terms "mounted," "connected," "secured," and the like are to be construed broadly and can include, for example, fixed connections, removable connections, or integral parts; can be mechanically or electrically connected; either directly or indirectly through intervening media, either internally or in any other relationship. The specific meaning of the above terms in the present application can be understood by those of ordinary skill in the art as the case may be.
The existing PCB insertion loss test is performed by selecting a corresponding probe according to a test port, and commonly used probes include a Packetmicro series and a FormFactor Cascade series.
In the differential insertion test, referring to fig. 1, the test port design of the prober of the packetmicro series includes four positioning holes 10, two circular test PADs (PADs) 30 and a ground ring 201, the prober is positioned by the four positioning holes 10, and two probe heads of the prober are contacted with the two circular test PADs 30 for testing. Referring to FIG. 2, the test port design of the FormFactor Cascade series probe includes four test PADs 30, two of which are ground PADs (rings) and two of which are signal PADs, which are tested by contacting the four probes of the probe with the four test PADs 30, arranged in a manner of ground-to-signal-ground and the probe station is manually positioned.
In the performance insertion test, referring to fig. 3, the test port design of the packetmicro series probe includes four positioning holes 10, a circular test PAD30, and a ground ring 201, the four positioning holes 10 are used to position the probe, and a probe of the probe is contacted with the circular test PAD30 for testing. Referring to FIG. 4, the test port design of the FormFactor Cascade series probe includes three test PADs 30, two of which are ground PADs and one of which is a signal PAD, arranged by way of ground, and the three probes of the probe are brought into contact with the three test PADs 30 for testing by way of manual positioning of the probe stage.
In the testing process, different probes need to be selected for testing according to actual design due to different designs of testing ports, so that the operation is complex; in addition, probes are expensive and purchasing probes of multiple specifications increases costs to the business.
In order to explain the technical solutions described in the present application, the following description is made with reference to specific drawings and examples. In order to improve the compatibility of the insertion loss test port, the loss test port is provided in the application, specifically, with reference to the first embodiment and the second embodiment, the loss test port can be adapted to common probe devices of a packet micro series and a FormFactor Cascade series, probe devices of various specifications do not need to be purchased, and the enterprise cost is reduced.
Example one
Referring to fig. 5 and 6, an insertion loss test port 100 is provided in an embodiment of the present application, and is applicable to both a packet-based micro series probe and a FormFactor-based Cascade series probe for a differential insertion loss test line. Taking a Packetmicro Delta-L4.0 Probe and a FormFactor Cascade Probe 350 (D) Probe as examples, the Packetmicro Delta-L4.0 Probe comprises two probes with the distance of 0.5 mm; formFactor Cascade Probe 350 (D) shares the common belief that there are four probes, with a 0.35mm spacing between each Probe.
Referring to fig. 5 and 6, the insertion loss test port 100 is disposed on the circuit board, and the insertion loss test port 100 includes a plurality of positioning holes 10, two ground PADs (PADs) 20, and a test assembly.
The positioning holes 10 are distributed on the circuit board at intervals and enclose a testing area 101 to facilitate positioning of the probe.
Two grounded PADs 20 are disposed in the test region 101 in parallel and at intervals, each grounded PAD20 is in a strip shape and extends along a first direction (shown as an X direction), and it can be understood that the more regular the shape of the grounded PAD20 is, the easier the probe head of the probe can contact with the grounded PAD20 and maintain a connection state to facilitate subsequent testing.
The test assembly is arranged between the two grounding PADs 20 and comprises two test PADs 30, and at least part of each test PAD30 is a preset distance d from the adjacent grounding PAD20.
The positioning hole 10 and the test PAD30 form a first test port to be suitable for a Packetmicro Delta-L4.0 probe; the ground PAD20 and the test PAD30 constitute a second test port to accommodate a FormFactor Cascade Probe 350 (D) Probe.
The insertion loss test port 100 comprises a plurality of positioning holes 10, two grounding PAD20 positioned in a test area 101 and a test component arranged between the two grounding PAD20, because the positioning holes 10 and the test component can be combined to adapt to Packetmicro series probes, the grounding PAD20 and the test component can be combined to adapt to FormFactor Cascade series probes, thereby realizing the adaptation of common series probes during differential insertion loss test, being not required to purchase probe devices with various specifications, saving the cost and effectively solving the technical problem that the specifications of the probes of the existing insertion loss test port 100 are incompatible.
Considering both the convenience of manufacture and the convenience of testing, referring to fig. 5 and 6, in the present embodiment, the widths of the test PAD30 and the ground PAD20 are equal to 0.2mm in the second direction (the illustrated Y direction) perpendicular to the first direction. Thus, the probe of the probe is easy to contact with the test PAD30 or the ground PAD20, and is not easily dislocated, so that the test process is stable. It is understood that in other embodiments of the present application, the widths of the test PAD30 and the ground PAD20 may also be greater than 0.2mm in a second direction perpendicular to the first direction, which is not limited herein.
Referring to fig. 5 and 6, in the present embodiment, the test assembly includes two test PADs 30 adapted to be used for probes with a predetermined probe pitch, each test PAD30 includes a first test portion 31, a connection portion 32, and a second test portion 33 connected in sequence, the first test portion 31 and the second test portion 33 both extend along a first direction, a predetermined included angle is formed between an extension line of the connection portion 32 and the first direction, a distance b between the two second test portions 33 is greater than a distance a between the two first test portions 31 and smaller than the predetermined probe pitch, and a predetermined distance d is formed between each first test portion 31 and an adjacent ground PAD20.
It will be appreciated that the first and second testing portions 31, 33 of both test PADs 30 are parallel to each other to facilitate contact with the probe tips of the probes. Wherein the width of each of the first and second test parts 31 and 33 is 0.2mm.
The first testing portions 31 of the two testing PADs 30 and the two grounding PADs 20 are matched to form a second testing port so as to adapt to the form factor Cascade Probe 350 (D) Probe, namely, the four ground signal probes of the form factor Cascade Probe 350 (D) Probe sequentially and respectively contact one of the grounding PADs 20, the first testing portions 31 of the two testing PADs 30 and the other grounding PAD20 along the second direction.
Specifically, the distance between the four probes of the FormFactor Cascade Probe 350 (D) is 0.35mm, first, the distance a between the two first test portions 31 is 0.15mm, and then, in combination with the width of each first test portion 31 being 0.2mm, the distance between the centers of the two first test portions 31 is 0.35mm; next, the predetermined distance d between the first test portion 31 and the adjacent grounded PAD20 is 0.2mm, which is convenient for manufacturing and testing, and in combination with the width of the first test portion 31 and the grounded PAD20 being 0.2mm, the distance between the center of each first test portion 31 and the center of the adjacent grounded PAD20 is 0.4mm, so that stable contact between the four probes of the ground PAD and the test PAD30 or the grounded PAD20 can be ensured.
It will be appreciated that the probes in the probe device of the same system are spaced apart. In order to ensure that the probe heads of the probes can simultaneously contact the first testing portion 31 of the test PAD30 and the ground PAD20, it is required that the distance between the first testing portion 31 of the test PAD30 and the adjacent ground PAD20 is smaller, i.e., the preset distance d is smaller than the probe head distance, and the distance between two first testing portions 31 is also smaller than the probe head distance, e.g., smaller than 0.35mm. The test PAD30 and the grounding PAD20 need to be arranged at intervals, and the preset distance d needs to be larger than 0.1mm in combination with the difficulty degree of the preparation process. As such, in other embodiments of the present application, the preset distance d between the first testing portion 31 and the adjacent ground PAD20 may also be other values in the range of 0.1mm to 0.35mm. Since the probe pitch of the FormFactor Cascade series probes may be other pitches such as 0.4mm, 0.45mm, etc., the pitch of the test PAD30 and the ground PAD20 may be adjusted according to the probe pitch of the probes, or the widths of the first test portion 31 of the test PAD30 and the ground PAD20 may be adjusted according to the probe pitch of the probes.
The second testing portions 33 of the two testing PADs 30 are matched with the four positioning holes 10 to form a first testing port, so that a packer micro Delta-L4.0 probe is adapted, namely two probes of the packer micro Delta-L4.0 probe sequentially and respectively contact the second testing portions 33 of the two testing PADs 30 along the second direction, the distance between the two second testing portions 33 and the adjacent grounding PAD20 can be kept, and only the interval setting is required.
Specifically, the distance between the two probes of the Packetmicro Delta-L4.0 probe is 0.5mm, that is, the preset probe distance is 0.5mm, the distance b between the two second testing parts 33 is 0.3mm, that is, the distance b between the two second testing parts 33 is smaller than the preset probe distance, and in combination with the width of each second testing part 33 being 0.2mm, the distance between the centers of the two second testing parts 33 is 0.5mm, so that it is ensured that the two probes of the Packetmicro Delta-L4.0 probe can be simultaneously and respectively in stable contact with the two second testing parts 33.
It is understood that in other embodiments of the present application, the width of each of the first testing part 31 and the second testing part 33 may also be greater than 0.2mm, and in this case, the distance a between the two first testing parts 31 may satisfy: all the layers are made of 0.35mm; the distance b between the two second test portions 33 may satisfy: any value within the range of 0 mm-b(s) or less but not limited thereto.
Referring to fig. 5, in the present embodiment, the ground PAD20 and the test PAD30 have two flush ends and a regular structure, so that only a portion of the probe heads of the probes is prevented from being connected.
Referring to fig. 5, in the present embodiment, the number of the positioning holes 10 is four, and four positioning holes 10 are located around the test area 101 and are distributed in a rectangular shape. The distance between the center of each positioning hole 10 and the center of the adjacent positioning hole 10 is 6.35mm or 2.54mm, that is, the rectangular test area 101 has a length of 6.35mm and a width of 2.54mm, so that the probe positioning structure can be adapted to the existing probe positioning structure without redesign.
Referring to fig. 5 and 6, in the present embodiment, the insertion loss test port 100 further includes a signal-conducting PAD40 disposed in the test region 101, the signal-conducting PAD40 is disposed at an interval from one end of the test PAD30, and the signal-conducting PAD40 is electrically connected to the test PAD30 through the transmission line 50.
In order to reduce the crosstalk effect on the insertion loss test port 100, the insertion loss test port 100 further includes a plurality of shielding holes 60 disposed in the test area 101, and the number of the shielding holes 60 may be set according to the position of the test port, and may be designed in multiple numbers. Since the shielding hole 60 is disposed on one side of the signal-conducting PAD40 and affects the coupling effect between the differential lines, the shielding hole 60 is disposed at an interval from one end of the test PAD30 or the ground PAD20 away from the signal-conducting PAD40, that is, the shielding hole 60 and the ground PAD40 are respectively disposed on two opposite sides of the test PAD30. In the first direction, the distance between the shielding hole 60 and one end of the test PAD30 or the ground PAD20 away from the signal-on PAD40 is equal to or greater than 0.2mm.
In addition, two or more shielding holes 60 may be opened in the ground PAD20, wherein at least one shielding hole 60 is opened in each of the ground PADs at positions corresponding to the first test portion 31 and the second test portion 33. It will be appreciated that the grounded PAD20 is used to achieve shielding in the horizontal direction and the shield aperture 60 is used to achieve shielding in the vertical direction.
It will be appreciated that the positioning holes 10 and the shielding holes 60 are prepared by drilling holes in the PCB; the grounding PAD20 and the testing component can be obtained in the circuit pattern preparation through processes of exposure, development, etching and the like, the above contents are all designed for a single-side testing port, and the other end can be designed for a mirror image.
The insertion loss test port 100 comprises a plurality of positioning holes 10, two grounding PAD20 positioned in a test area 101 and a test component arranged between the two grounding PAD20, because the positioning holes 10 and the test component can be combined to adapt to Packetmicro series probes, the grounding PAD20 and the test component can be combined to adapt to FormFactor Cascade series probes, thereby realizing the adaptation of common series probes during differential insertion loss test, being not required to purchase probe devices with various specifications, saving the cost and effectively solving the technical problem that the specifications of the probes of the existing insertion loss test port 100 are incompatible.
Example two
Referring to fig. 7 and 8, a second embodiment of the present application provides an insertion loss testing port 100, which can be applied to a packet-factor and a FormFactor Cascade probes for a characteristic insertion loss line, and takes a FormFactor Cascade Probe 350 (S) Probe and a packet-factor Delta-L Probe as examples. The Packetmicro Delta-L probe comprises a probe head; the FormFactor Cascade Probe 350 (S) Probe has three probes in common, with a 0.35mm spacing between each Probe.
Referring to fig. 7 and 8, the insertion loss test port 100 is disposed on the circuit board, and the insertion loss test port 100 includes a plurality of positioning holes 10, two ground PADs 20 and a test assembly.
The positioning holes 10 are distributed on the circuit board at intervals and enclose a testing area 101 to facilitate positioning of the probe.
Two ground PADs 20 are disposed in the test region 101 in parallel and at intervals, and each ground PAD20 is bar-shaped and extends along a first direction.
The test assembly is arranged between the two grounding PADs 20, the test assembly comprises a test PAD30, and a preset distance d is reserved between the test PAD30 and the adjacent grounding PAD20.
The positioning hole 10 and the test PAD30 form a first test port to be suitable for a Packetmicro Delta-L probe; the ground PAD20 and the test PAD30 constitute a second test port to accommodate a FormFactor Cascade Probe 350 (S) Probe.
The insertion loss test port 100 comprises a plurality of positioning holes 10, two grounding PADs 20 positioned in the test area 101 and test components arranged between the two grounding PADs 20, because the positioning holes 10 and the test components can be combined to adapt to Packetmicro series probes, the grounding PADs 20 and the test components can be combined to adapt to FormFactor Cascade series probes, thereby realizing the adaptation of common series probes when carrying out characteristic insertion loss test, being not required to purchase probe devices with various specifications, saving the cost and effectively solving the technical problem that the specifications of the probes of the existing insertion loss test port 100 are incompatible.
Referring to fig. 7, in the present embodiment, the widths of the test PAD30 and the ground PAD20 are equal to 0.2mm in the second direction perpendicular to the first direction, in combination with the convenience of manufacturing and the convenience of testing. It is understood that in other embodiments of the present application, the widths of the test PAD30 and the ground PAD20 may also be greater than 0.2mm in a second direction perpendicular to the first direction.
Referring to fig. 7 and 8, in the present embodiment, the test assembly includes a rectangular test PAD30, the test PAD30 is disposed to extend along a first direction, and the test PAD30 is located between two ground PADs 20. That is, the distance between the test PAD30 and the two ground PADs 20 is equal, and both ends of the ground PADs 20 and the test PAD30 are flush.
Wherein, the test PAD30 is matched with the two grounding PADs 20 to form a second test port to adapt to the FormFactor cassette Probe 350 (S) Probe, namely, the ground communication ground three probes of the FormFactor cassette Probe 350 (S) Probe sequentially and respectively contact one of the grounding PADs 20, the test PAD30 and the other grounding PAD20 along the second direction.
Specifically, the distance between the three ground contact PADs of the form factor Cascade Probe 350 (S) Probe is 0.35mm, the preset distance d between the test PAD30 and the adjacent ground PAD20 is 0.2mm, the manufacture is convenient and the test is convenient, and the distance between the center of the test PAD30 and the center of the ground PAD20 is 0.4mm in combination with the width of the test PAD30 and the ground PAD20 being 0.2mm, so that the stable contact between the three ground contact PADs and the test PAD30 or the ground PAD20 can be ensured.
Since the probe head spacing in the probe apparatus of the same system is fixed, in order to ensure that the probe head of the probe can contact the test PAD30 and the grounding PAD20 at the same time, the spacing between the test PAD30 and the adjacent grounding PAD20, i.e. the preset distance d, is required to be smaller than the probe head spacing, e.g. smaller than 0.35mm. The test PAD30 and the grounding PAD20 need to be arranged at intervals, and the preset distance d needs to be larger than 0.1mm in combination with the difficulty degree of the preparation process. As such, in other embodiments of the present application, the predetermined distance d between the test PAD30 and the adjacent ground PAD20 may also be other values within the range of 0.1mm to 0.35mm. Since the probe pitch of the probes may be other, the pitch between the test PAD30 and the ground PAD20 needs to be adjusted according to the probe pitch of the probes, or the widths of the test PAD30 and the ground PAD20 need to be adjusted according to the probe pitch of the probes.
The test PAD30 and the four positioning holes 10 are matched to form a first test port, so that a Packetmicro Delta-L probe is adapted, namely, a single probe of the Packetmicro Delta-L probe contacts the test PAD30.
Referring to the first embodiment, as for the positioning hole 10, the shielding hole 60, and the signal-conducting PAD40 of the insertion loss test port 100, since the positioning hole 10, the shielding hole 60, and the signal-conducting PAD40 provided in this embodiment adopt the technical solution of the first embodiment, all the beneficial effects brought by the technical solutions of the embodiments are also achieved, and are not described herein again.
The insertion loss test port 100 further includes a plurality of shielding holes 60 disposed in the test area 101, and the number of the shielding holes 60 may be set according to the position of the test port, and may be designed in a plurality. The partial shielding hole 60 is spaced apart from one end of the test PAD30 or the ground PAD20 away from the signal-conducting PAD40, that is, the partial shielding hole 60 and the signal-conducting PAD40 are respectively located at opposite sides of the test PAD30. In addition, one or more shielding holes 60 may also be formed in the ground PAD20.
The above-mentioned embodiments are only used for illustrating the technical solutions of the present application, and not for limiting the same; although the present application has been described in detail with reference to the foregoing embodiments, it should be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; such modifications and substitutions do not substantially depart from the spirit and scope of the embodiments of the present application and are intended to be included within the scope of the present application.
Claims (10)
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| CN202210892409.3A CN115166375A (en) | 2022-07-27 | 2022-07-27 | Insertion loss test port |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116520131A (en) * | 2023-04-21 | 2023-08-01 | 竞华电子(深圳)有限公司 | PCB board test module and PCB whole board |
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