CN1320698C - 包括接触力控制机构的用于致动电子部件接触器的系统 - Google Patents

包括接触力控制机构的用于致动电子部件接触器的系统 Download PDF

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Publication number
CN1320698C
CN1320698C CNB031060293A CN03106029A CN1320698C CN 1320698 C CN1320698 C CN 1320698C CN B031060293 A CNB031060293 A CN B031060293A CN 03106029 A CN03106029 A CN 03106029A CN 1320698 C CN1320698 C CN 1320698C
Authority
CN
China
Prior art keywords
connecting rod
contactor
carriage
contact force
component
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
CNB031060293A
Other languages
English (en)
Chinese (zh)
Other versions
CN1440091A (zh
Inventor
L·黑尼格尔
C·弗洛伊德沃克斯
J·佩尔雷特
P·霍斯特特勒
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ismeca Semiconductor Holding SA
Original Assignee
Ismeca Semiconductor Holding SA
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ismeca Semiconductor Holding SA filed Critical Ismeca Semiconductor Holding SA
Publication of CN1440091A publication Critical patent/CN1440091A/zh
Application granted granted Critical
Publication of CN1320698C publication Critical patent/CN1320698C/zh
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06705—Apparatus for holding or moving single probes

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Mechanisms For Operating Contacts (AREA)
CNB031060293A 2002-02-20 2003-02-20 包括接触力控制机构的用于致动电子部件接触器的系统 Expired - Fee Related CN1320698C (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
CH0289/2002 2002-02-20
CH00289/02A CH695122A5 (fr) 2002-02-20 2002-02-20 Système d'actionnement de contacteur de composants électroniques comprenant un mécanisme de contrôle de la force de contact.
CH0289/02 2002-02-20

Publications (2)

Publication Number Publication Date
CN1440091A CN1440091A (zh) 2003-09-03
CN1320698C true CN1320698C (zh) 2007-06-06

Family

ID=27792852

Family Applications (1)

Application Number Title Priority Date Filing Date
CNB031060293A Expired - Fee Related CN1320698C (zh) 2002-02-20 2003-02-20 包括接触力控制机构的用于致动电子部件接触器的系统

Country Status (3)

Country Link
CN (1) CN1320698C (fr)
CH (1) CH695122A5 (fr)
MY (1) MY164870A (fr)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103513069B (zh) * 2012-06-21 2016-05-25 深圳麦逊电子有限公司 测试探针装置
TWI762186B (zh) * 2021-02-08 2022-04-21 鴻勁精密股份有限公司 接合機構及其應用之測試設備
CN114740237B (zh) * 2021-08-09 2025-01-28 苏州联讯仪器股份有限公司 测试用探针结构

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4787137A (en) * 1985-11-08 1988-11-29 Ismeca, Sa Automatic component placer and placer head
US4956923A (en) * 1989-11-06 1990-09-18 The Micromanipulator Co., Inc. Probe assembly including touchdown sensor
US5850146A (en) * 1995-12-30 1998-12-15 Samsung Electronics Co., Ltd. Probe apparatus for electrical inspection of printed circuit board assembly
US6344751B1 (en) * 1998-09-28 2002-02-05 Atg Test Systems Gmbh & Co. Kg Finger tester probe

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4677375A (en) * 1985-06-14 1987-06-30 Hanwa Electronic Co., Ltd. Apparatus for testing integrated circuit
JPH0416781A (ja) * 1990-05-11 1992-01-21 Mitsubishi Electric Corp 半導体装置の試験装置
FR2786275B1 (fr) * 1998-11-20 2001-02-02 Adeunis R F Equipement de test pour des composants electroniques radiofrequences ou numeriques rapides

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4787137A (en) * 1985-11-08 1988-11-29 Ismeca, Sa Automatic component placer and placer head
US4956923A (en) * 1989-11-06 1990-09-18 The Micromanipulator Co., Inc. Probe assembly including touchdown sensor
US5850146A (en) * 1995-12-30 1998-12-15 Samsung Electronics Co., Ltd. Probe apparatus for electrical inspection of printed circuit board assembly
US6344751B1 (en) * 1998-09-28 2002-02-05 Atg Test Systems Gmbh & Co. Kg Finger tester probe

Also Published As

Publication number Publication date
CH695122A5 (fr) 2005-12-15
MY164870A (en) 2018-01-30
CN1440091A (zh) 2003-09-03

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C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
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GR01 Patent grant
C17 Cessation of patent right
CF01 Termination of patent right due to non-payment of annual fee

Granted publication date: 20070606

Termination date: 20140220