CN1893005A - Method to prevent package components from spilling glue - Google Patents

Method to prevent package components from spilling glue Download PDF

Info

Publication number
CN1893005A
CN1893005A CN 200510081895 CN200510081895A CN1893005A CN 1893005 A CN1893005 A CN 1893005A CN 200510081895 CN200510081895 CN 200510081895 CN 200510081895 A CN200510081895 A CN 200510081895A CN 1893005 A CN1893005 A CN 1893005A
Authority
CN
China
Prior art keywords
substrate
mold
lower mold
cavity
preventing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
CN 200510081895
Other languages
Chinese (zh)
Other versions
CN100394569C (en
Inventor
刘春条
陈大容
李正人
林俊良
温兆均
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Cyntec Co Ltd
Original Assignee
Cyntec Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Cyntec Co Ltd filed Critical Cyntec Co Ltd
Priority to CNB2005100818957A priority Critical patent/CN100394569C/en
Publication of CN1893005A publication Critical patent/CN1893005A/en
Application granted granted Critical
Publication of CN100394569C publication Critical patent/CN100394569C/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Images

Landscapes

  • Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)

Abstract

The invention relates to a method for preventing glue overflow of a packaging element, which provides a substrate with an ejector pin force application area, wherein the ejector pin force application area can apply downward force to enable the substrate to be completely contacted with a mold, and glue overflow is not generated because no gap exists between the substrate and the mold and a sealing glue body flows between the substrate and a lower mold.

Description

Prevent the method for overflow of glue of package element
Technical field
The present invention relates to a kind of formation method of potted element, more particularly a kind of method that prevents overflow of glue of package element that is applied to form potted element.
Background technology
At present relevant sphere grid array (BGA) N-type semiconductor N component package processing procedure, it mainly is that chip is attached to substrate, and make chip and substrate constitute with the routing juncture to electrically connect, the substrate that then will stick together chip more places set of molds to carry out the sealing step, chip is coated in the colloid, treat that colloid solidifies the back and takes out, again each weld pad of substrate bottom surface is planted Metal Ball and cuts moulding, and produce semiconductor element.
Yet, above-mentioned semiconductor element is in the sealing process, though the set of molds that its sizing shaped is used has the mould of high precision, but because the restriction of machining accuracy, make mold and bed die matched moulds have error afterwards, and make and have slit between composition surface between mold and the substrate, so when sealing, liquid adhesive material pours in die cavity through pressurization, the adhesive material that promptly has a little liquid state overflows in die cavity, and enter in the slit between mold and substrate, the colloid that causes overflowing can be attached on substrate or the mold.
Therefore, when the colloid that overflows is attached to substrate, because of face shaping does not meet the quality management standard, need the step through removing photoresist and repairing again, thereby the inconvenience and the processing procedure cost that increase processing procedure increase, and when removing photoresist operation, produce defective products, so that influence the product yield of this encapsulation procedure because of cutter injures substrate surface easily.
When the colloid that overflows was attached to mold, the accuracy in the time of can influencing the set of molds matched moulds so operating personnel need often cleaning mould, so that can influence the yield of manufacture procedure of adhesive, and easily made set of molds impaired, and shortens its useful life again.
In addition, mention also that in the prior art another kind prevents the method for excessive glue, it is included in has a substrate in the semiconductor encapsulating structure, an embankment, and a chip and a plurality of soldered ball form a plurality of leads and several weld pads on the surface of substrate.Embankment is taken from a lead frame and is attached to the upper surface of substrate with viscose, corresponding to the window of upper surface of base plate, overflows to prevent packing colloid.Chip is attached on the substrate with viscose, a plurality of outputs/input pad forms the center part of chip surface, and is positioned at the window on the substrate, and plural wires is in order to electrically connect substrate and I/o pad, a plurality of soldered balls then are to be set up on each weld pad, in order to electrically connect with the outside.Though the situation that prevents excessive glue that this kind mode can reach to a certain degree takes place, the embankment that is positioned on the substrate is the surface that additionally is additional to substrate, and is cumbersome on processing procedure.
Summary of the invention
The objective of the invention is to overcome the deficiencies in the prior art and defective, a kind of method that prevents overflow of glue of package element is proposed, by the external connection end around on the substrate as the thimble end, by withstanding the thimble end downwards, make and contact fully between substrate and the mould, and exist between substrate and the mould without any the space, make that after the encapsulating, the phenomenon that does not have the glue that overflows takes place.
For reaching above-mentioned purpose, the invention provides a kind of method that prevents excessive glue, this method comprises:
Substrate with a chip is provided, and this substrate has a plurality of external connection end and this chip and this substrate and electrically connects;
Set of molds with a die cavity is provided, and this set of molds has a mold and a bed die, and this die cavity can ccontaining this substrate;
This substrate is placed in the die cavity of this bed die;
Carry out a matched moulds step, this mold combines with this bed die;
Withstand these a plurality of external connection end of this substrate downwards, make this substrate contact fully with this time die cavity, and without any the space between this substrate and this time die cavity; And
Pour into have insulate heat solidity composite properties an adhesive body between this substrate and this set of molds, wherein this adhesive body covers between the upper surface of mold and this substrate, and this substrate around.
Provide substrate because this method comprises, on substrate, have chip and plural wires in order to electrically connect substrate and chip with a plurality of external connection end.Then, provide the set of molds of a sealing shaping usefulness, and set of molds is made of a mold and a bed die, and the size of the die cavity between mold and bed die can ccontaining substrate.Then, substrate is placed in the bed die, make a plurality of external connection end around this substrate can expose to bed die around.Carry out a matched moulds step then, mold is combined with bed die.Then, withstand the external connection end of substrate downwards, make between substrate and the mould to contact fully by thimble.Then, carry out an encapsulating step and since between substrate and the mould without any the space can allow adhesive body flow between substrate and the bed die, therefore when matched moulds, the situation that does not have the glue that overflows takes place.
Description of drawings
Fig. 1 is disclosed technology according to the present invention, and expression prevents the flow chart of the method for excessive glue;
Fig. 2 A to Fig. 2 B is disclosed technology according to the present invention, and expression prevents each step schematic diagram of excessive gluing method.
Symbol description among the figure
1-6 prevents the steps flow chart of the method for excessive glue
10 substrates
12 external connection end
14 thimble application of force zones
20 bed dies
22 times die cavitys
30 adhesive materials
Embodiment
Some embodiments of the present invention can be described in detail as follows.Yet except describing in detail, the present invention can also be widely implements at other embodiment, and scope of the present invention do not limited, and its scope with claims is as the criterion.
See also Fig. 1 is applied to the method that prevents excessive glue of potted element for the present invention is disclosed flow chart of steps.Step 1 expression provides the substrate with a plurality of external connection end.Step 2 expression provides the set of molds with a die cavity, and this set of molds comprises the mold with upper mould cave, and the bed die with following die cavity.Step 3 expression is placed in substrate in the following die cavity of bed die, is positioned at substrate a plurality of external connection end all around and can exposes to bed die all around.Then, carry out a matched moulds step, mold is combined with bed die, withstand the external connection end of substrate simultaneously downwards, make substrate contact fully with mould in step 4.Then, adhesive body is poured in the die cavity of set of molds,, therefore between substrate and bed die, can allow adhesive body flow into, therefore do not have the phenomenon generation of the glue that overflows without any the space owing to contact fully between substrate and the mould in step 5.At last,, carry out a curing schedule, finish encapsulation step to solidify adhesive body in step 6.
Next, Fig. 2 A to Fig. 2 B is the step schematic diagram that prevents excessive glue represented according to the above-mentioned steps flow chart.At first, please refer to Fig. 2 A, expression has the vertical view of the substrate of a plurality of external connection end.More comprise a chip (not expression in the drawings) on this substrate 10, this chip can be routing chip or crystal covered chip.If this chip is the routing chip, then then be to electrically connect between chip and the substrate 10 by plural wires (not expression in the drawings); If chip is a crystal covered chip, then crystal covered chip then is by electrically connecting between plurality of solder projection and the substrate 10.
In addition, substrate 10 also comprises one or a plurality of external connection end 12, and these external connection end 12 can be made of lead frame (lead-frame), and these lead frames can be to be shaped on the substrate 10.The purpose of these external connection end 12 more comprises the thimble application of force zone 14 that contacts with mould as with substrate downwards except electrically connecting with electronic component.When thimble withstands the external connection end 12 of substrate 10 both sides downwards, because substrate 10 contacts fully with the following die cavity 22 of bed die 20, this means, between substrate 10 and following die cavity 22 without any the space existence, and when follow-up encapsulating step, adhesive body can't flow between substrate and the following die cavity.When also can or not making tolerance and cause excessive glue because of the tolerance of application of force inequality, size supplied materials.
In addition, the material in these external connection end 12 and thimble application of force zone 14 can be that metallic plate or metal derby are formed, or nonmetallic materials constitute.What deserves to be mentioned is that the material of substrate 10 can be dielectric material, insulating material, also or by following form selected material: the hybrid system of metal, single face comprise the hybrid system and the two-sided hybrid system that comprises metal of metal.
Then, please refer to Fig. 2 B.In Fig. 2 B, the part of solid line is represented following die cavity 22, and in order to ccontaining substrate 10, the size of therefore following die cavity 22 can correspond to the size of substrate 10.
Then, be feature of the present invention, carry out a matched moulds step, make mold combine with bed die 20, simultaneously, thimble withstands the external connection end 14 of substrate 10 downwards, make substrate 10 can contact completely, do not exist and do not have any space with the following die cavity 22 of bed die 20.Because, between substrate 10 and following die cavity 22 without any the space, this makes follow-up when irritating the mould step, adhesive body 30 can't flow between substrate 10 and the following die cavity 22,30 of adhesive bodies are present between the upper surface of mold and substrate 10, therefore when sealing, the phenomenon that does not have the glue that overflows takes place.Wherein, adhesive body 30 can be an insulate heat solidity compound, for example silica packing material (silica filler) or epoxy resin (epoxy).
At last, carry out one again and solidify (curing) step, to solidify adhesive body 30, make the upper surface of substrate 10 and all around, and the element that is positioned on the substrate 10 is coated simultaneously by adhesive body 30.In addition because between substrate 10 and the following die cavity 22 without any the existence in space, do not have the below that there is substrate 10 in any adhesive body 30, so the lower surface of substrate 10 then is to expose out.
The above is preferred embodiment of the present invention only, is not in order to limit claim scope of the present invention; All other do not break away from the equivalence of being finished under the disclosed spirit and changes or modification, all should be included in the scope of claims.

Claims (9)

1.一种防止封装元件溢胶的方法,其特征在于,该方法包含:1. A method for preventing packaging components from overflowing glue, characterized in that the method comprises: 提供具有一芯片的一基板,该基板具有复数个外接端及该芯片与该基板电性连接;providing a substrate with a chip, the substrate has a plurality of external terminals and the chip is electrically connected to the substrate; 提供具有一模穴的一模具组,该模具组具有一上模具与一下模具,且该模穴可以容置该基板;providing a mold set with a mold cavity, the mold set has an upper mold and a lower mold, and the mold cavity can accommodate the substrate; 将该基板容置于该下模具的一下模穴内;accommodating the substrate in a lower mold cavity of the lower mold; 执行一合模步骤,该上模具与该下模具结合;Execute a mold closing step, the upper mold is combined with the lower mold; 向下顶住该基板的该复数个外接端,使得该基板与该下模穴完全接触,且没有任何空隙在该基板与该下模穴之间;以及Pressing down against the plurality of outer ends of the substrate so that the substrate is in full contact with the lower cavity without any gap between the substrate and the lower cavity; and 灌入具有绝缘热固性复合物特性的一封胶体于该基板与该模具组之间,其中该封胶体覆盖住上模具与该基板的上表面之间,以及该基板的四周。Pouring an insulating thermosetting compound between the base plate and the mold set, wherein the sealant covers the space between the upper mold and the upper surface of the base plate, and the periphery of the base plate. 2.如权利要求1所述的防止封装元件溢胶的方法,其中,该基板的材料选自于下列族群之一:介电材料、绝缘材料、金属的复合系统、单面包含金属的复合系统或双面包含金属的复合系统。2. The method for preventing glue overflow of packaging components as claimed in claim 1, wherein the material of the substrate is selected from one of the following groups: dielectric materials, insulating materials, metal composite systems, and composite systems containing metal on one side Or composite systems containing metal on both sides. 3.如权利要求1所述的防止封装元件溢胶的方法,其中,该芯片与该基板电性连接的方式选自于下列族群之一:复数条导线或复数个锡焊凸块。3 . The method for preventing glue overflow of package components as claimed in claim 1 , wherein the way of electrically connecting the chip to the substrate is selected from one of the following groups: a plurality of wires or a plurality of solder bumps. 4.如权利要求1所述的防止封装元件溢胶的方法,其中,该复数个外接端的材料选自于下列族群之一:导线架或一体成型于该基板的导线架。4 . The method for preventing glue overflow of package components as claimed in claim 1 , wherein the materials of the plurality of external terminals are selected from one of the following groups: a lead frame or a lead frame integrally formed on the substrate. 5.如权利要求1所述的防止封装元件溢胶的方法,其中,该绝缘热固性复合物选自于下列族群之一:环氧树脂或硅氧填充材料。5. The method for preventing glue overflow of packaging components as claimed in claim 1, wherein the insulating thermosetting compound is selected from one of the following groups: epoxy resin or silicone filling material. 6.一种防止封装元件溢胶的方法,其特征在于,该方法包含:6. A method for preventing packaged components from overflowing glue, characterized in that the method comprises: 提供一基板,具有至少一对顶针施力区域位于该基板的两侧;A substrate is provided, with at least one pair of thimble force application areas located on both sides of the substrate; 提供具有一模穴的一模具组,该模具组具有一上模具与一下模具,且该模穴可以容置该基板;providing a mold set with a mold cavity, the mold set has an upper mold and a lower mold, and the mold cavity can accommodate the substrate; 容置该基板于该下模具的一下模穴内,且该基板的该顶针施力区域外露于该下模具的外侧;accommodating the substrate in the lower mold cavity of the lower mold, and the ejector pin force application area of the substrate is exposed to the outside of the lower mold; 执行一合模步骤,使得该上模具与该下模具结合;performing a mold closing step so that the upper mold is combined with the lower mold; 向下顶住该顶针施力区域,使得该基板与该下模穴完全接触且没有任何的空隙存在;Press down against the force application area of the thimble, so that the substrate is in full contact with the lower mold cavity without any gaps; 灌入具有绝缘热固性复合物特性的一封胶体于该基板与该模具组内;以及pouring an encapsulant having properties of an insulating thermosetting compound into the substrate and the mold set; and 固化该封胶体,该封胶体只包覆住该基板的一上表面及该基板的四周,而裸露出该基板的一下表面。The sealant is cured, and the sealant only covers an upper surface of the substrate and the periphery of the substrate, while exposing the lower surface of the substrate. 7.如权利要求6所述的防止封装元件溢胶的方法,其中,该基板的材料选自于下列族群之一:介电材料、绝缘材料、金属的复合系统、单面包含金属的复合系统或双面包含金属的复合系统。7. The method for preventing glue overflow of packaging components as claimed in claim 6, wherein the material of the substrate is selected from one of the following groups: dielectric materials, insulating materials, metal composite systems, and composite systems containing metal on one side Or composite systems containing metal on both sides. 8.如权利要求6所述的防止封装元件溢胶的方法,其中,该顶针施力区域的材料为一体成型于该基板的导线架。8 . The method for preventing glue overflow of packaged components as claimed in claim 6 , wherein the material of the force-applying region of the ejector pin is integrally formed on the lead frame of the substrate. 9.如权利要求6所述的防止封装元件溢胶的方法,其中,该绝缘热固性复合物选自于下列族群之一:环氧树脂或硅氧填充材料。9. The method for preventing glue overflow of packaging components as claimed in claim 6, wherein the insulating thermosetting compound is selected from one of the following groups: epoxy resin or silicone filling material.
CNB2005100818957A 2005-07-06 2005-07-06 Method for preventing glue overflow of packaging element Expired - Lifetime CN100394569C (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CNB2005100818957A CN100394569C (en) 2005-07-06 2005-07-06 Method for preventing glue overflow of packaging element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CNB2005100818957A CN100394569C (en) 2005-07-06 2005-07-06 Method for preventing glue overflow of packaging element

Publications (2)

Publication Number Publication Date
CN1893005A true CN1893005A (en) 2007-01-10
CN100394569C CN100394569C (en) 2008-06-11

Family

ID=37597702

Family Applications (1)

Application Number Title Priority Date Filing Date
CNB2005100818957A Expired - Lifetime CN100394569C (en) 2005-07-06 2005-07-06 Method for preventing glue overflow of packaging element

Country Status (1)

Country Link
CN (1) CN100394569C (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101154601B (en) * 2006-09-29 2010-12-01 冲电气工业株式会社 Semiconductor device and method for manufacturing semiconductor device
CN102756457A (en) * 2011-04-27 2012-10-31 无锡华润安盛科技有限公司 Die for pre-plastic package of sensor chip

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03239349A (en) * 1990-02-16 1991-10-24 Clarion Co Ltd Manufacture of resin-sealed semiconductor device
JP3281859B2 (en) * 1997-12-22 2002-05-13 三洋電機株式会社 Manufacturing method of hybrid integrated circuit device
CN2502404Y (en) * 2001-08-30 2002-07-24 南茂科技股份有限公司 Molding Tool for Preventing Glue Overflow in Semiconductor Packaging Die
CN2566454Y (en) * 2002-08-21 2003-08-13 南茂科技股份有限公司 Circuit board to prevent mold overflow

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101154601B (en) * 2006-09-29 2010-12-01 冲电气工业株式会社 Semiconductor device and method for manufacturing semiconductor device
CN102756457A (en) * 2011-04-27 2012-10-31 无锡华润安盛科技有限公司 Die for pre-plastic package of sensor chip
CN102756457B (en) * 2011-04-27 2015-03-25 无锡华润安盛科技有限公司 Die for pre-plastic package of sensor chip

Also Published As

Publication number Publication date
CN100394569C (en) 2008-06-11

Similar Documents

Publication Publication Date Title
CN102891125B (en) Chip package structure and manufacturing method thereof
CN102347245B (en) Method of manufacturing circuit device
CN105643855A (en) Electronic component, its manufacturing method and manufacturing device
CN105810594B (en) Method for manufacturing semiconductor device
CN111416000B (en) Photosensitive chip package and manufacturing method thereof
CN101866867B (en) Manufacturing method for lead frame of semiconductor packaging structure with no outer lead
KR102407742B1 (en) Manufacturing Method of Resin-Molded Lead Frame, Manufacturing Method of Resin-Molded Product and Lead Frame
JP5579982B2 (en) Intermediate structure of semiconductor device and method of manufacturing intermediate structure
CN100511588C (en) Lead Frame Chip Scale Packaging Method
KR100801608B1 (en) How to Prevent Overmolding of Molding Compounds in Package Device Manufacturing
TWI482251B (en) Lead frame and method of manufacturing
CN214848589U (en) Semiconductor packaging structure
CN100394569C (en) Method for preventing glue overflow of packaging element
KR100564623B1 (en) Semiconductor package preventing cracks and manufacturing method thereof
CN1464540A (en) Packing method capable of increasing percent of pass for multiple chip package
CN207993847U (en) Semiconductor package assembly
JP2555931B2 (en) Method for manufacturing semiconductor device
CN1303678C (en) Semiconductor package with chip pad opening and manufacturing method thereof
CN1653604A (en) Packaging system for semiconductor devices
TWI294680B (en)
CN108831839B (en) A method for removing burrs generated in semiconductor plastic packaging process
JP3212527B2 (en) BGA type hollow semiconductor package with light irradiation window
JP2004158539A (en) Method for manufacturing resin-encapsulated semiconductor device
CN119923012A (en) Chip packaging method and chip packaging structure
JPH1092967A (en) Bottom projected terminal array type integrated circuit device and method of manufacturing the same

Legal Events

Date Code Title Description
C06 Publication
PB01 Publication
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C14 Grant of patent or utility model
GR01 Patent grant
CX01 Expiry of patent term
CX01 Expiry of patent term

Granted publication date: 20080611