CN1987404B - Electronic universal testing machine - Google Patents

Abstract

The invention discloses an electronic universal testing machine, which comprises a moving beam and a driving device connected with the moving beam, and the driving device drives the moving beam to realize loading; the testing machine includes: a small load sensor connected with the moving beam; a small load sensor A tensioning fixture, connected to the small load cell. The host structure with external small load sensor extends the moving beam, utilizes the drive system of the large load sensor test space, and drives the ball screw through the transmission system, thereby driving the moving beam to achieve loading, and performing mechanical performance tests of different load measurement ranges. It solves the common problem of "the test beyond the lower limit of the effective measurement range of the sensor cannot be completed" in the structure of the existing electronic universal testing machine, and is easy to operate.

Description

Electronic universal testing machine

technical field

The invention relates to an electronic universal testing machine, in particular to an electronic universal testing machine with wide measuring range and easy operation.

Background technique

A traditional electronic universal testing machine with a single-space structure is shown in Figure 1. Its working principle is that the drive system 16 drives the ball screw 13 through the transmission system 15, thereby driving the moving beam 11 to realize loading, and the test piece is clamped in the On the jig 14 , the load of the test piece is measured by the sensor 12 . The disadvantages of this structure are as follows: the test beyond the lower limit of the effective measurement range of the sensor cannot be completed; for example, the 300kN electronic universal testing machine has an effective measurement range of 0.6 to 300kN, and the test items with a load less than 0.6kN cannot be realized; For the tests of different items such as tension, compression, and bending, the test fixtures for each item are different. To complete different test items in one space, it is cumbersome to replace the fixtures of the corresponding items.

Fig. 2 shows the electronic universal testing machine host with a structure of differential load double space (large load working space between clamps 24 and small load working space between clamps 28), the working principle of the large load working space is the same as the structure in Fig. 1, The driving and transmission of the small-load working space until the action of moving the crossbeam 21 is the same as that in FIG. 1 . Although this structure solves the first problem of the structure in Fig. 1, it is inconvenient to operate by stepping on the ladder to perform the small load test on the upper part of the equipment.

Fig. 3 is the electronic universal testing machine mainframe of equal load double space (stretching work space between clamps 34, compression, bending work space between clamps 37) structure, its working principle is the same as Fig. 1 structure, between clamps 34 is used To do tensile test, between the clamps 37 is used to do compression, bending test. The upper and lower spaces share the load sensor 32 for measurement. Although this structure solves the second problem of the structure in Figure 1, the test beyond the lower limit of the effective measurement range of the sensor cannot be completed; for example, the 300kN electronic universal testing machine has an effective measurement range of 0.6 to 300kN, and the test items with a load less than 0.6kN It cannot be realized; at the same time, the operation on the upper part of the equipment described in the structure of Figure 2 requires the inconvenience of stepping on the ladder, but this structure can change the clamps 34 and 37 up and down, and placing the frequently used clamps at the bottom can reduce the cumbersome operation.

Contents of the invention

The purpose of the present invention is to provide an electronic universal testing machine to overcome the technical problems that the existing electronic universal testing machine cannot complete the test beyond the lower limit of the effective measurement range of the sensor and is cumbersome to operate.

In order to achieve the above object, technical scheme of the present invention is as follows:

An electronic universal testing machine, comprising a moving beam, a driving device connected to the moving beam, the driving device drives the moving beam to realize loading; the testing machine includes: a small load sensor, connected with the moving beam; a small load tensile fixture, Connected to the small load sensor.

The host structure with external small load sensor extends the moving beam, utilizes the drive system of the large load sensor test space, and drives the ball screw through the transmission system, thereby driving the moving beam to achieve loading, and performing mechanical performance tests of different load measurement ranges. It solves the common problem of "the test beyond the lower limit of the effective measurement range of the sensor cannot be completed" in the structure of the existing electronic universal testing machine, and is easy to operate.

The testing machine includes a large load cell attached to the moving beam.

The testing machine includes a bending fixture connected to the large load cell.

The driving device includes a driving system, a transmission system and a ball screw connected in sequence.

The large-load tensile fixture is installed in the lower space of the testing machine.

The bending fixture is installed in the lower space of the testing machine.

Description of drawings

Fig. 1 is a kind of structure diagram of the host computer of the electronic universal testing machine of existing single-space structure;

Fig. 2 is another kind of existing electronic universal testing machine host structure diagram of differential load double space;

Fig. 3 is another kind of existing electronic universal testing machine host structure diagram of equal load double space;

Fig. 4 is the electronic universal testing machine host structural diagram of the present invention;

Detailed ways

Below, according to FIG. 4 , a preferred embodiment of the present invention is given and described in detail, so that the functions and characteristics of the present invention can be better understood.

Fig. 4 is the three spaces of the external sensor (the large-load stretching work space is between the large-load stretching clamps 44, the large-load compression and bending work space is between the bending clamps 47, and the small-load stretching work space is between the clamps 44 ) structure, the electronic universal testing machine includes a moving beam 41, a ball screw 43, a transmission system 45 and a driving system 46 that link to each other with the moving beam 41; the testing machine includes: a small load sensor 48, which links to each other with the moving beam 41 ; The small load tensile clamp 49 is connected with the small load sensor 48 . Externally attached small load sensor 48 host structure extends the moving beam 41, utilizes the driving system 46 of the test space of the large load sensor 42, drives the ball screw 43 through the transmission system 45, thereby drives the moving beam 41 to realize loading, and performs different load measurement ranges mechanical performance test.

For example, for a 300kN electronic universal testing machine, its effective measurement range is 600-300000N. For test items less than 600N, a 1000N load sensor is added externally (its effective measurement range is 2-1000N), and the effective measurement range is extended to 2-300000N. . In this way, the common problem of "the test beyond the lower limit of the effective measurement range of the sensor cannot be completed" in the structure of the existing electronic universal testing machine can be easily solved.

The height of the 300kN electronic universal testing machine is basically between 2.3 and 2.5 meters. If the small load test is extended to the upper space (as shown in Figure 2), it is impossible to operate standing at the height of a person. It must be operated through auxiliary means. The operating height of the sensor structure is between 0.65 and 1 meter, and the operator can complete the test operation by sitting down, which is comfortable and convenient.

In addition, according to the frequency of use, the clamp 44 or the clamp 47 is selected to be installed in the lower space, which avoids the problem of inconvenient operation of the structure in FIG. 1 .

The above are only preferred embodiments of the present invention, and are not intended to limit the scope of the present invention, that is, all simple and equivalent changes and modifications made according to the claims and descriptions of the present application shall fall within the scope of the present invention. The protection scope of the patent claims of the present invention.

Claims (4)

1. an electronic universal tester comprises moving beam, and the drive unit that links to each other with moving beam, this drive unit drive moving beam and realize loading; It is characterized in that this testing machine comprises:

Little load sensor links to each other with described moving beam;

Little load stretching clamp links to each other with described little load sensor;

This testing machine also comprises big load sensor, is connected on the described moving beam;

This testing machine also comprises bending fixture, links to each other with described big load sensor.

2. electronic universal tester as claimed in claim 1 is characterized in that, described drive unit comprises drive system, kinematic train and the ball-screw that links to each other successively.

3. electronic universal tester as claimed in claim 1 is characterized in that, described big load stretching clamp is installed in the following space of this testing machine.

4. as claim 1 or 3 described electronic universal testers, it is characterized in that described bending fixture is installed in the following space of this testing machine.

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