CN205193115U - Probe and test device including the same - Google Patents

Abstract

The utility model relates to a probe reaches testing arrangement including this probe, the probe includes: the conductive rod, the sleeve and the buffer spring; the conducting rod is provided with a detection end and a wiring end; a limiting boss is arranged on the outer wall of the conducting rod close to the wiring end; a limiting bulge is arranged on the sleeve close to the detection end and extends towards the direction of the conducting rod; the buffer spring is sleeved on the conducting rod between the limiting boss and the limiting bulge. The testing device comprises at least two probes, a base, a positioning jig, a guide column, an installation piece and a lifting cylinder; the sleeve is fixedly embedded in the mounting piece, and the detection end of the conducting rod faces towards the positioning jig. Fixed the inlaying of sleeve through with the probe locates the installed part, and the lift cylinder drives the installed part and moves along the guide post towards positioning jig for the conducting rod probe end presses the preset point on sheet metal, thereby detects out the resistivity numerical value of welded junction, so that the defective products that do not conform to the welding requirement are checked out.

Description

Probe and test device including the same

technical field

The utility model relates to the technical field of middle frame manufacturing, in particular to a probe and a testing device comprising the probe.

Background technique

In the manufacturing process of the middle frame of electronic products such as mobile phones and tablet computers, in order to facilitate the subsequent installation of circuit boards and electronic components, it is usually necessary to weld metal sheets along the inner wall of the middle frame to install and fix the circuit board and electronic components on the metal sheet. In order to play the role of grounding protection, the circuit board and/or electronic components are conductively connected to the metal sheet. However, the change in the resistivity of the solder joint will also become an important factor affecting the performance parameters of electronic products; therefore, when the metal After the thin plate and the middle frame are welded, it is necessary to detect the resistivity between several preset points on the metal thin plate, so as to check out defective products that do not meet the welding requirements. Traditionally, one-piece probes are used to contact several preset points on the thin metal plate for testing, which is prone to poor contact, poor stability of test results, and the probe is easy to bend during use.

Utility model content

Based on this, it is necessary to address the above problems and provide a probe with better test result stability and less bending during use and a test device including the probe.

A probe, comprising: a conductive rod, a sleeve sleeved on the conductive rod, and a buffer spring accommodated between the sleeve and the conductive rod; the conductive rod has a detection end and is connected to the The terminal opposite to the detection end; the outer wall of the conductive rod adjacent to the terminal is provided with a limit boss; the sleeve adjacent to the detection end is provided with a limit protrusion, and the limit protrusion faces the The conductive rod extends in the direction; the buffer spring is sleeved on the conductive rod between the limiting boss and the limiting protrusion.

In one of the embodiments, the conductive rod includes a detection section and a wiring section integrally formed with the detection section, the outer circumference diameter of the detection section is smaller than the outer circumference diameter of the wiring section; the buffer spring sleeve Located on the detection section, the inner diameter of the buffer spring is smaller than the outer diameter of the wiring section.

In one of the embodiments, an anti-off protrusion is provided on the outer wall of the conductive rod adjacent to the detection end.

In one of the embodiments, the anti-loosening protrusion is arranged around the outer wall of the conductive rod.

A test device, comprising at least two of the above-mentioned probes, the test device also includes: a base, a positioning jig arranged on the base, several positioning jigs arranged on the base around the positioning jig A guide column, a mounting part slidably arranged along the guide column, and a lifting cylinder that drives the mounting part to move toward or away from the positioning jig; the sleeve is fixedly embedded in the mounting part, and the conductive rod The detection end faces the positioning jig.

In one of the embodiments, an installation frame is provided on the guide column away from the base, and the lifting cylinder is arranged on the installation frame.

In one of the embodiments, the number of the guide posts is two, and the mounting frame is respectively connected to the two guide posts.

In one of the embodiments, the mounting part includes a metal plate and an insulating plate installed on the metal plate, and the insulating plate is arranged toward the positioning jig; the metal plate is provided with a number of accommodating through holes , the sleeve is fixedly embedded in the insulating plate, and part of the conductive rod is accommodated in the accommodation through hole.

The above-mentioned probe passes through the limit boss provided on the outer wall of the conductive rod adjacent to the terminal of the conductive rod, the limit protrusion provided on the sleeve near the detection end of the conductive rod, and the limit protrusion set on the position limit boss and The structural design of the buffer spring on the conductive rod between the limit protrusions, and when it is applied to the test device, the sleeve of the probe is fixed and embedded in the mounting part, and the lifting cylinder drives the mounting part along the guide column toward the positioning tool. The tool moves, so that the detection end of the conductive rod is pressed against the preset point on the metal sheet, so as to detect the resistivity value of the welding place, so as to check out the defective products that do not meet the welding requirements.

Description of drawings

Fig. 1 is the structural representation of the probe of a preferred embodiment of the utility model;

Figure 2 is a cross-sectional view of the probe shown in Figure 1;

Fig. 3 is a schematic structural diagram of a testing device in a preferred embodiment of the present invention.

detailed description

In order to facilitate the understanding of the utility model, the utility model will be described more fully below with reference to the relevant drawings. Preferred embodiments of the utility model are provided in the accompanying drawings. However, the invention can be embodied in many different forms and is not limited to the embodiments described herein. On the contrary, the purpose of providing these embodiments is to make the understanding of the disclosure of the present utility model more thorough and comprehensive.

As shown in Figures 1 and 2, the probe 10 of a preferred embodiment of the present invention includes: a conductive rod 11, a sleeve 12 sleeved on the conductive rod 11, and a sleeve 12 and a conductive rod. Buffer spring 13 between 11. The conductive rod 11 has a detection end 111 and a connection end 112 opposite to the detection end 111 . In order not only to prevent the buffer spring 13 from falling off between the sleeve 12 and the conductive rod 11, but also to hold the two ends of the buffer spring 13 during the movement of the conductive rod 11 relative to the sleeve 12 along the direction from the detection end 111 to the terminal 112. end and compress the buffer spring 13, and then apply a buffer force from the terminal 112 to the detection end 111 direction to the conductive rod 11 to prevent the conductive rod 11 from being bent, and the outer wall of the conductive rod 11 adjacent to the terminal 112 is provided with a limiting boss 113, A limit projection 121 is provided on the sleeve 12 adjacent to the detection end 111, and the limit projection 121 extends toward the direction of the conductive rod 11, and the buffer spring 13 is sleeved between the limit boss 113 and the limit projection 121. On the conductive rod 11. Wherein, the position-limiting boss 113 and the position-limiting protrusion 121 play a role of supporting the two ends of the buffer spring 13 .

Specifically, the conductive rod 11 includes a detection section 14 and a wiring section 15 integrally connected with the detection section 14 , and the outer circumference diameter of the detection section 14 is smaller than that of the wiring section 15 . The buffer spring 13 is sheathed on the detection section 14 , and the inner diameter of the buffer spring 13 is smaller than the outer diameter of the wiring section 15 . In this embodiment, the limiting boss 113 is the wiring section 15 , and the side wall of the wiring section 15 connected to the detection section 14 plays a role of supporting one end of the buffer spring 13 .

In order to prevent the sleeve 12 from falling off from the detection end 111 of the conductive rod 11, the outer wall of the conductive rod 11 adjacent to the detection end 14 is provided with an anti-off protrusion 16, specifically, the anti-off protrusion 16 is arranged around the outer wall of the conductive rod 11.

As shown in Figure 3, the testing device 20 of a preferred embodiment of the utility model comprises at least two above-mentioned probes 10, and the testing device 20 also comprises: a base 21, a positioning jig 22 arranged on the base 21, A plurality of guide columns 23 disposed on the base 21 surrounding the positioning jig 22 , mounting pieces 24 slidably disposed along the guiding columns 23 , and a lift cylinder 25 that drives the mounting pieces 24 to move toward or away from the positioning jig 22 . The sleeve 12 of the probe 10 is fixedly embedded in the mounting part 24 , and the detection end 111 of the conductive rod 11 faces the positioning jig 22 . Preferably, the sleeve 12 is fixedly embedded in the mounting part 24 in an interference fit manner. In this embodiment, the mounting member 24 includes a metal plate 26 and an insulating plate 27 mounted on the metal plate 26 , and the insulating plate 27 is disposed toward the positioning jig 22 . The metal plate 26 is provided with a plurality of accommodating through holes (not shown in the figure), the sleeve 12 is fixedly embedded in the insulating plate 27, and part of the conductive rods 11 are accommodated in the accommodating through holes.

Specifically, a mounting frame 28 is provided on the guide column 23 away from the base 21 , and the lifting cylinder 25 is disposed on the mounting frame 28 . In other embodiments, the installation frame 28 is not limited to be disposed on the guide column 23 , and may also be directly disposed on the base 21 for installation of the lifting cylinder 25 . In this embodiment, there are two guide posts 23 , and the installation frame 28 is connected to the two guide posts 23 respectively.

In the actual application of the test device 20, the middle frame 30 to be tested and welded with the metal sheet is installed on the positioning jig 22, and the lifting cylinder 25 is activated to drive the mounting part 24 to move toward the positioning jig 22 along the guide column 23, The detection end 111 of the conductive rod 11 is pressed against a preset point on the thin metal plate to form a conductive connection. The electrical signal flows in through the conductive rod 11 of one of the probes 10, and then flows out through the conductive rod 11 of the other probe 10 after passing through the welding place, so as to detect the resistivity value of the welding place, so as to check out irregularities that do not meet the welding requirements. Good product.

The above-mentioned probe 10 passes through the limit protrusion 113 provided on the outer wall of the conductive rod 11 adjacent to the terminal 112 of the conductive rod 11, and the limit protrusion 121 provided on the sleeve 12 adjacent to the detection end 111 of the conductive rod 11. , and the structural design of the buffer spring 13 sleeved on the conductive rod 11 between the position-limiting boss 113 and the position-limiting protrusion 121, and when applied to the test device 20, the sleeve 12 of the probe 10 Fixedly embedded in the mounting part 24, the lifting cylinder 25 drives the mounting part 24 to move along the guide column 23 toward the positioning jig 22, so that the detection end 111 of the conductive rod 11 presses the preset point on the metal sheet, thereby detecting the resistance of the welding place Rate value, in order to check out the defective products that do not meet the welding requirements.

The above-mentioned embodiments only express several implementation modes of the utility model, and the description thereof is relatively specific and detailed, but it should not be understood as limiting the scope of the utility model patent. It should be noted that those skilled in the art can make several modifications and improvements without departing from the concept of the present invention, and these all belong to the protection scope of the present invention. Therefore, the scope of protection of the utility model patent should be based on the appended claims.

Claims (8)

1. A probe, characterized in that it comprises: a conductive rod, a sleeve sleeved on the conductive rod, and a buffer spring accommodated between the sleeve and the conductive rod; the conductive rod has The detection end and the terminal opposite to the detection end; the outer wall of the conductive rod adjacent to the terminal is provided with a limit boss; the sleeve adjacent to the detection end is provided with a limit protrusion, and the limit The positioning protrusion extends toward the direction of the conductive rod; the buffer spring is sleeved on the conductive rod between the limiting boss and the limiting protrusion. 2. The probe according to claim 1, wherein the conductive rod includes a detection section and a connection section integrally formed with the detection section, and the diameter of the outer circumference of the detection section is smaller than that of the connection section. Outer circumference diameter; the buffer spring is sheathed on the detection section, and the inner circumference diameter of the buffer spring is smaller than the outer circumference diameter of the wiring section. 3 . The probe according to claim 1 , wherein an anti-off protrusion is provided on the outer wall of the conductive rod adjacent to the detection end. 4 . 4. The probe according to claim 3, wherein the anti-loosening protrusion is arranged around the outer wall of the conductive rod. 5. A test device, characterized in that it comprises at least two probes as claimed in any one of claims 1 to 4, and the test device further comprises: a base, a positioning tool arranged on the base A tool, a number of guide posts arranged on the base around the positioning jig, a mounting part slidably arranged along the guide post, and a lift cylinder that drives the mounting part to move toward or away from the positioning jig; The sleeve is fixedly embedded in the installation part, and the detection end of the conductive rod faces the positioning jig. 6 . The testing device according to claim 5 , wherein a mounting frame is provided on the guide column away from the base, and the lifting cylinder is disposed on the mounting frame. 7 . 7 . The testing device according to claim 6 , wherein the number of the guide posts is two, and the mounting frame is respectively connected to the two guide posts. 7 . 8. The test device according to claim 5, wherein the mounting member comprises a metal plate and an insulating plate mounted on the metal plate, the insulating plate is arranged towards the positioning jig; the metal A number of accommodating through holes are opened on the board, the sleeve is fixedly embedded in the insulating plate, and part of the conductive rod is accommodated in the accommodating through holes.