DE3142817A1 - Uebertragungseinrichtung, test-spannvorrichtung mit uebertragungseinrichtung und verfahren zur bildung einer uebertragungseinrichtung - Google Patents
Uebertragungseinrichtung, test-spannvorrichtung mit uebertragungseinrichtung und verfahren zur bildung einer uebertragungseinrichtungInfo
- Publication number
- DE3142817A1 DE3142817A1 DE19813142817 DE3142817A DE3142817A1 DE 3142817 A1 DE3142817 A1 DE 3142817A1 DE 19813142817 DE19813142817 DE 19813142817 DE 3142817 A DE3142817 A DE 3142817A DE 3142817 A1 DE3142817 A1 DE 3142817A1
- Authority
- DE
- Germany
- Prior art keywords
- contact
- guide plate
- transmission device
- test
- transmission
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
- 238000012360 testing method Methods 0.000 title claims description 110
- 230000005540 biological transmission Effects 0.000 title claims description 97
- 238000000034 method Methods 0.000 title claims description 14
- 239000000523 sample Substances 0.000 claims description 72
- 238000012546 transfer Methods 0.000 claims description 16
- 239000004020 conductor Substances 0.000 claims description 3
- 239000012777 electrically insulating material Substances 0.000 claims 1
- 238000004519 manufacturing process Methods 0.000 claims 1
- 238000005266 casting Methods 0.000 description 12
- 238000003780 insertion Methods 0.000 description 5
- 230000037431 insertion Effects 0.000 description 5
- 239000000463 material Substances 0.000 description 5
- 239000004417 polycarbonate Substances 0.000 description 4
- 229920000515 polycarbonate Polymers 0.000 description 4
- 230000001681 protective effect Effects 0.000 description 4
- 229910001369 Brass Inorganic materials 0.000 description 3
- 239000010951 brass Substances 0.000 description 3
- 230000008901 benefit Effects 0.000 description 2
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 2
- 239000004593 Epoxy Substances 0.000 description 1
- 229920004142 LEXAN™ Polymers 0.000 description 1
- 239000004418 Lexan Substances 0.000 description 1
- 235000004443 Ricinus communis Nutrition 0.000 description 1
- 240000000528 Ricinus communis Species 0.000 description 1
- 238000007792 addition Methods 0.000 description 1
- 230000000712 assembly Effects 0.000 description 1
- 238000000429 assembly Methods 0.000 description 1
- 238000005452 bending Methods 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000003306 harvesting Methods 0.000 description 1
- 238000002955 isolation Methods 0.000 description 1
- 239000011159 matrix material Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000012811 non-conductive material Substances 0.000 description 1
- ISWSIDIOOBJBQZ-UHFFFAOYSA-N phenol group Chemical group C1(=CC=CC=C1)O ISWSIDIOOBJBQZ-UHFFFAOYSA-N 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 125000006850 spacer group Chemical group 0.000 description 1
- 239000012780 transparent material Substances 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch
- G01R1/07378—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch using an intermediate adapter, e.g. space transformers
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
- G01R1/07357—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with flexible bodies, e.g. buckling beams
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US20231580A | 1980-10-30 | 1980-10-30 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| DE3142817A1 true DE3142817A1 (de) | 1982-07-08 |
Family
ID=22749363
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE19813142817 Withdrawn DE3142817A1 (de) | 1980-10-30 | 1981-10-28 | Uebertragungseinrichtung, test-spannvorrichtung mit uebertragungseinrichtung und verfahren zur bildung einer uebertragungseinrichtung |
Country Status (4)
| Country | Link |
|---|---|
| JP (1) | JPS57101769A (fr) |
| DE (1) | DE3142817A1 (fr) |
| FR (1) | FR2493671A1 (fr) |
| GB (1) | GB2086670B (fr) |
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3337915A1 (de) * | 1982-10-21 | 1984-05-24 | Feinmetall Gmbh, 7033 Herrenberg | Kontaktiervorrichtung |
| DE3340243A1 (de) * | 1983-11-08 | 1985-05-23 | Hans-Jürgen 6477 Limeshain Wagner | Vorrichtung zum pruefen von leiterplatten |
| DE3343274A1 (de) * | 1983-11-30 | 1985-06-05 | Feinmetall Gmbh, 7033 Herrenberg | Kontaktiervorrichtung |
| DE3639361A1 (de) * | 1986-11-18 | 1988-05-19 | Luther Erich | Geraet zum pruefen von leiterplatten |
| DE8714018U1 (de) * | 1987-10-19 | 1988-12-01 | Siemens AG, 1000 Berlin und 8000 München | Prüfnadel zur elektrischen Prüfung von Leiterplatten |
| DE3722485A1 (de) * | 1987-07-03 | 1989-01-12 | Deutsche Telephonwerk Kabel | Federnde kontaktnadel und kontaktiereinrichtung |
| DE102018204106A1 (de) * | 2018-03-16 | 2019-09-19 | Feinmetall Gmbh | Prüfkarte zum elektrischen Verbinden eines Prüflings mit einer elektrischen Prüfeinrichtung |
Families Citing this family (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB2146849B (en) * | 1983-09-17 | 1987-08-05 | Marconi Instruments Ltd | Electrical test probe head assembly |
| US4686467A (en) * | 1984-03-21 | 1987-08-11 | Dit-Mco International Corp. | Circuit board testing system |
| US4774462A (en) * | 1984-06-11 | 1988-09-27 | Black Thomas J | Automatic test system |
| DE3504606A1 (de) * | 1985-02-11 | 1986-08-14 | Helmuth 4952 Porta Westfalica Kahl | Einrichtung zum pruefen von kabeln, die mit steckern versehen sind |
| US4764722A (en) * | 1985-10-28 | 1988-08-16 | International Business Machines Corporation | Coaxial probe |
| US4884024A (en) * | 1985-11-19 | 1989-11-28 | Teradyne, Inc. | Test pin assembly for circuit board tester |
| DE3606877A1 (de) * | 1986-03-03 | 1987-09-10 | Siemens Ag | Vorrichtung zum bestuecken eines adapters mit kontaktnadeln fuer eine leiterplatten-pruefeinrichtung |
| US4803424A (en) * | 1987-08-31 | 1989-02-07 | Augat Inc. | Short-wire bed-of-nails test fixture |
| DE4406538A1 (de) | 1994-02-28 | 1995-08-31 | Mania Gmbh | Leiterplatten-Prüfeinrichtung mit Prüfadapter und Verfahren zum Einstellen desselben |
| US7059046B2 (en) | 2002-06-24 | 2006-06-13 | Delaware Capital Formation, Inc. | Method for producing a captive wired test fixture and fixture therefor |
| WO2005050706A2 (fr) * | 2003-11-14 | 2005-06-02 | Wentworth Laboratories, Inc. | Gabarit a aide a l'assemblage integre |
| EP2110673A1 (fr) * | 2008-04-17 | 2009-10-21 | Technoprobe S.p.A | Tête d'essai à aiguilles verticales équipé avec des moyens d'arrêtes pour éviter leur échappement en dehors de respectives trous de guidages |
| WO2016146499A1 (fr) | 2015-03-13 | 2016-09-22 | Technoprobe S.P.A. | Tête de test dotée de sondes verticales ayant un mouvement coulissant amélioré dans des trous de guidage respectifs et un maintien correct des sondes à l'intérieur de la tête de test dans différentes conditions de fonctionnement |
| IT201900014208A1 (it) * | 2019-08-07 | 2021-02-07 | Technoprobe Spa | Testa di misura di dispositivi elettronici e relativa scheda di misura |
| KR102848240B1 (ko) * | 2020-03-30 | 2025-08-20 | (주)포인트엔지니어링 | 프로브 헤드 및 이를 포함하는 프로브 카드 |
| CN113471737A (zh) * | 2021-05-27 | 2021-10-01 | 闻泰通讯股份有限公司 | Pogo-pin连接器及电子设备 |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE1903088A1 (de) * | 1969-01-22 | 1971-01-21 | Siemens Ag | Kontaktvorrichtung |
| US3970934A (en) * | 1974-08-12 | 1976-07-20 | Akin Aksu | Printed circuit board testing means |
| US4027935A (en) * | 1976-06-21 | 1977-06-07 | International Business Machines Corporation | Contact for an electrical contactor assembly |
-
1981
- 1981-10-28 DE DE19813142817 patent/DE3142817A1/de not_active Withdrawn
- 1981-10-28 FR FR8120222A patent/FR2493671A1/fr not_active Withdrawn
- 1981-10-28 JP JP56171525A patent/JPS57101769A/ja active Pending
- 1981-10-30 GB GB8132722A patent/GB2086670B/en not_active Expired
Cited By (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE3337915A1 (de) * | 1982-10-21 | 1984-05-24 | Feinmetall Gmbh, 7033 Herrenberg | Kontaktiervorrichtung |
| DE3340243A1 (de) * | 1983-11-08 | 1985-05-23 | Hans-Jürgen 6477 Limeshain Wagner | Vorrichtung zum pruefen von leiterplatten |
| DE3343274A1 (de) * | 1983-11-30 | 1985-06-05 | Feinmetall Gmbh, 7033 Herrenberg | Kontaktiervorrichtung |
| DE3639361A1 (de) * | 1986-11-18 | 1988-05-19 | Luther Erich | Geraet zum pruefen von leiterplatten |
| DE3722485A1 (de) * | 1987-07-03 | 1989-01-12 | Deutsche Telephonwerk Kabel | Federnde kontaktnadel und kontaktiereinrichtung |
| DE8714018U1 (de) * | 1987-10-19 | 1988-12-01 | Siemens AG, 1000 Berlin und 8000 München | Prüfnadel zur elektrischen Prüfung von Leiterplatten |
| DE102018204106A1 (de) * | 2018-03-16 | 2019-09-19 | Feinmetall Gmbh | Prüfkarte zum elektrischen Verbinden eines Prüflings mit einer elektrischen Prüfeinrichtung |
Also Published As
| Publication number | Publication date |
|---|---|
| JPS57101769A (en) | 1982-06-24 |
| FR2493671A1 (fr) | 1982-05-07 |
| GB2086670B (en) | 1985-03-20 |
| GB2086670A (en) | 1982-05-12 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 8139 | Disposal/non-payment of the annual fee |