DE60323504D1 - Flexible schnittstelle für ein universelles bus-testinstrument - Google Patents

Flexible schnittstelle für ein universelles bus-testinstrument

Info

Publication number
DE60323504D1
DE60323504D1 DE60323504T DE60323504T DE60323504D1 DE 60323504 D1 DE60323504 D1 DE 60323504D1 DE 60323504 T DE60323504 T DE 60323504T DE 60323504 T DE60323504 T DE 60323504T DE 60323504 D1 DE60323504 D1 DE 60323504D1
Authority
DE
Germany
Prior art keywords
test instrument
flexible interface
bus test
universal bus
universal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60323504T
Other languages
English (en)
Inventor
Tushar K Gohel
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Teradyne Inc
Original Assignee
Teradyne Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teradyne Inc filed Critical Teradyne Inc
Application granted granted Critical
Publication of DE60323504D1 publication Critical patent/DE60323504D1/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F13/00—Interconnection of, or transfer of information or other signals between, memories, input/output devices or central processing units
    • G06F13/38—Information transfer, e.g. on bus
    • G06F13/40—Bus structure
    • G06F13/4063—Device-to-bus coupling
    • G06F13/4068—Electrical coupling
    • G06F13/4072—Drivers or receivers
    • G06F13/4077—Precharging or discharging

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Quality & Reliability (AREA)
  • Dc Digital Transmission (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Information Transfer Systems (AREA)
  • Small-Scale Networks (AREA)
  • Tests Of Electronic Circuits (AREA)
DE60323504T 2002-08-01 2003-07-17 Flexible schnittstelle für ein universelles bus-testinstrument Expired - Lifetime DE60323504D1 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US40044402P 2002-08-01 2002-08-01
US10/317,310 US6894505B2 (en) 2002-08-01 2002-12-12 Flexible interface for universal bus test instrument
PCT/US2003/022288 WO2004013758A2 (en) 2002-08-01 2003-07-17 Flexible interface for universal bus test instrument

Publications (1)

Publication Number Publication Date
DE60323504D1 true DE60323504D1 (de) 2008-10-23

Family

ID=31498178

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60323504T Expired - Lifetime DE60323504D1 (de) 2002-08-01 2003-07-17 Flexible schnittstelle für ein universelles bus-testinstrument

Country Status (13)

Country Link
US (2) US6894505B2 (de)
EP (1) EP1525532B1 (de)
JP (1) JP4121498B2 (de)
KR (1) KR100815993B1 (de)
CN (1) CN100568208C (de)
AU (1) AU2003259142A1 (de)
BR (1) BR0313361A (de)
CA (1) CA2494082A1 (de)
DE (1) DE60323504D1 (de)
IL (2) IL166604A0 (de)
MY (1) MY125841A (de)
TW (1) TWI276824B (de)
WO (1) WO2004013758A2 (de)

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US20050223288A1 (en) * 2004-02-12 2005-10-06 Lockheed Martin Corporation Diagnostic fault detection and isolation
US20060120181A1 (en) * 2004-10-05 2006-06-08 Lockheed Martin Corp. Fault detection and isolation with analysis of built-in-test results
US20060085692A1 (en) * 2004-10-06 2006-04-20 Lockheed Martin Corp. Bus fault detection and isolation
US7243176B2 (en) * 2004-11-05 2007-07-10 Intel Corporation Method and apparatus for power efficient and scalable memory interface
US20080052281A1 (en) * 2006-08-23 2008-02-28 Lockheed Martin Corporation Database insertion and retrieval system and method
US7395479B2 (en) * 2004-12-30 2008-07-01 Teradyne, Inc. Over-voltage test for automatic test equipment
US7427025B2 (en) * 2005-07-08 2008-09-23 Lockheed Marlin Corp. Automated postal voting system and method
US7279908B2 (en) * 2005-12-06 2007-10-09 Honeywell International Inc. Dynamically switched line and fault detection for differential signaling systems
KR101338848B1 (ko) * 2006-02-01 2013-12-06 지이 애비에이션 시스템즈 엘엘씨 통신 시스템 및 방법
US7765356B2 (en) * 2006-04-11 2010-07-27 Raytheon Company System for modifying data in a bus buffer
JP4886435B2 (ja) * 2006-09-05 2012-02-29 株式会社東芝 差動信号振幅の自動調整回路
US20080133799A1 (en) * 2006-11-28 2008-06-05 Nokia Corporation Control and slow data transmission method for serial interface
KR20080089867A (ko) * 2007-04-02 2008-10-08 삼성에스디아이 주식회사 차동 신호 전송 시스템 및 이를 구비한 평판표시장치
KR100846967B1 (ko) * 2007-04-02 2008-07-17 삼성에스디아이 주식회사 차동 신호 전송 시스템 및 이를 구비한 평판표시장치
US7684904B2 (en) * 2007-06-27 2010-03-23 Arinc Incorporated Systems and methods for communication, navigation, surveillance and sensor system integration in a vehicle
US8745337B2 (en) * 2007-12-31 2014-06-03 Teradyne, Inc. Apparatus and method for controlling memory overrun
JP2011019189A (ja) * 2009-07-10 2011-01-27 Fujitsu Semiconductor Ltd 半導体集積回路
US8736283B2 (en) * 2010-03-04 2014-05-27 Franklin Sensors Inc. Advanced obscured feature detector
US8593163B2 (en) * 2010-03-04 2013-11-26 Franklin Sensors, Inc. Surface-conforming obscured feature detector
CN101833063B (zh) * 2010-04-26 2012-07-04 广州市广晟微电子有限公司 对spi控制芯片进行测试的方法及装置
US8581600B2 (en) * 2010-12-14 2013-11-12 Hewlett-Packard Development Company, L.P. Electrical connectivity test apparatus and methods
JP5659799B2 (ja) * 2011-01-06 2015-01-28 富士ゼロックス株式会社 送受信装置及び信号伝送装置
CN102288896A (zh) * 2011-05-17 2011-12-21 上海华岭集成电路技术股份有限公司 高速通信总线芯片端口特性测试方法
US9946679B2 (en) * 2011-10-05 2018-04-17 Analog Devices, Inc. Distributed audio coordination over a two-wire communication bus
US10649948B2 (en) * 2011-10-05 2020-05-12 Analog Devices, Inc. Two-wire communication systems and applications
US8988081B2 (en) 2011-11-01 2015-03-24 Teradyne, Inc. Determining propagation delay
US8898227B1 (en) * 2013-05-10 2014-11-25 Owl Computing Technologies, Inc. NFS storage via multiple one-way data links
US9214939B2 (en) * 2013-12-02 2015-12-15 Texas Instruments Deutschland Gmbh Adaptive bus termination apparatus and methods
CN105785833A (zh) * 2014-12-17 2016-07-20 中车大连电力牵引研发中心有限公司 用于轨道车辆的总线分析设备及系统
CN105425767B (zh) * 2015-11-04 2018-05-18 中国直升机设计研究所 一种维护设备自动识别不同待测机型的方法
DE202016105593U1 (de) 2016-10-07 2016-11-03 Dspace Digital Signal Processing And Control Engineering Gmbh Modul zur Aufnahme asymmetrischer und symmetrischer Signale
US10404363B2 (en) 2017-05-01 2019-09-03 Teradyne, Inc. Optical pin electronics
US10715250B2 (en) * 2017-05-01 2020-07-14 Teradyne, Inc. Calibrating non-linear data
US10404364B2 (en) 2017-05-01 2019-09-03 Teradyne, Inc. Switch matrix system
US10523316B2 (en) 2017-05-01 2019-12-31 Teradyne, Inc. Parametric information control
US10564219B2 (en) 2017-07-27 2020-02-18 Teradyne, Inc. Time-aligning communication channels
CN108845244B (zh) * 2018-06-28 2024-06-11 北京汉能光伏投资有限公司 一种电路检测方法及装置
US11408927B2 (en) 2019-06-18 2022-08-09 Teradyne, Inc. Functional testing with inline parametric testing
US11159248B2 (en) 2019-12-18 2021-10-26 Teradyne, Inc. Optical receiving device
CN111114826B (zh) * 2019-12-27 2023-03-14 中国航空工业集团公司沈阳飞机设计研究所 一种分布式火控系统机上控制电路检测装置
US11899056B2 (en) 2022-03-04 2024-02-13 Teradyne, Inc. Communicating using contactless coupling
US12504459B2 (en) * 2023-11-30 2025-12-23 Teradyne, Inc. Injecting vibrations to detect a fault in a transmission line

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US6563298B1 (en) * 2000-08-15 2003-05-13 Ltx Corporation Separating device response signals from composite signals
US7017087B2 (en) * 2000-12-29 2006-03-21 Teradyne, Inc. Enhanced loopback testing of serial devices

Also Published As

Publication number Publication date
US20050193275A1 (en) 2005-09-01
US7420375B2 (en) 2008-09-02
AU2003259142A8 (en) 2004-02-23
JP4121498B2 (ja) 2008-07-23
CN1682203A (zh) 2005-10-12
CA2494082A1 (en) 2004-02-12
KR100815993B1 (ko) 2008-03-21
MY125841A (en) 2006-08-30
IL166604A (en) 2012-03-29
BR0313361A (pt) 2005-07-12
TWI276824B (en) 2007-03-21
US6894505B2 (en) 2005-05-17
WO2004013758A2 (en) 2004-02-12
IL166604A0 (en) 2006-01-15
TW200403446A (en) 2004-03-01
CN100568208C (zh) 2009-12-09
JP2005535035A (ja) 2005-11-17
EP1525532B1 (de) 2008-09-10
US20040056666A1 (en) 2004-03-25
KR20050048595A (ko) 2005-05-24
WO2004013758A3 (en) 2004-06-03
AU2003259142A1 (en) 2004-02-23
EP1525532A2 (de) 2005-04-27

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