DE69920246D1 - Lumineszenter reisslack in der dehnungsanalyse - Google Patents

Lumineszenter reisslack in der dehnungsanalyse

Info

Publication number
DE69920246D1
DE69920246D1 DE69920246T DE69920246T DE69920246D1 DE 69920246 D1 DE69920246 D1 DE 69920246D1 DE 69920246 T DE69920246 T DE 69920246T DE 69920246 T DE69920246 T DE 69920246T DE 69920246 D1 DE69920246 D1 DE 69920246D1
Authority
DE
Germany
Prior art keywords
strain
coating
luminescent
substrate material
subject invention
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE69920246T
Other languages
English (en)
Other versions
DE69920246T2 (de
Inventor
Peter Ifju
S Schanze
Yingsheng Wang
James Hubner
David Jenkins
Wissam El-Ratal
B Brennan
Liu He
Yibing Shen
Bruce Carroll
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
University of Florida
Original Assignee
University of Florida
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by University of Florida filed Critical University of Florida
Publication of DE69920246D1 publication Critical patent/DE69920246D1/de
Application granted granted Critical
Publication of DE69920246T2 publication Critical patent/DE69920246T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/16Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge
    • G01B11/20Measuring arrangements characterised by the use of optical techniques for measuring the deformation in a solid, e.g. optical strain gauge using brittle lacquer
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L1/00Measuring force or stress, in general
    • G01L1/24Measuring force or stress, in general by measuring variations of optical properties of material when it is stressed, e.g. by photoelastic stress analysis using infrared, visible light, ultraviolet

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
  • Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
  • Paints Or Removers (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Cereal-Derived Products (AREA)
  • Adjustment And Processing Of Grains (AREA)
DE69920246T 1999-08-06 1999-10-21 Lumineszenter reisslack in der dehnungsanalyse Expired - Fee Related DE69920246T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US370519 1982-04-21
US09/370,519 US6327030B1 (en) 1999-08-06 1999-08-06 System, method, and coating for strain analysis
PCT/US1999/024640 WO2001011311A1 (en) 1999-08-06 1999-10-21 Luminescent brittle coating in strain analysis

Publications (2)

Publication Number Publication Date
DE69920246D1 true DE69920246D1 (de) 2004-10-21
DE69920246T2 DE69920246T2 (de) 2005-02-03

Family

ID=23460019

Family Applications (1)

Application Number Title Priority Date Filing Date
DE69920246T Expired - Fee Related DE69920246T2 (de) 1999-08-06 1999-10-21 Lumineszenter reisslack in der dehnungsanalyse

Country Status (9)

Country Link
US (2) US6327030B1 (de)
EP (1) EP1121567B1 (de)
JP (1) JP3314083B1 (de)
AT (1) ATE276506T1 (de)
AU (1) AU1217500A (de)
CA (1) CA2321841C (de)
DE (1) DE69920246T2 (de)
EA (1) EA009014B1 (de)
WO (1) WO2001011311A1 (de)

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JP6654159B2 (ja) * 2017-01-24 2020-02-26 株式会社トヨタプロダクションエンジニアリング 歪み量算出装置、歪み量算出方法及び歪み量算出プログラム
JP2018163083A (ja) * 2017-03-27 2018-10-18 株式会社トヨタプロダクションエンジニアリング 歪み測定装置、歪み測定方法及び歪み測定プログラム
JP6651480B2 (ja) * 2017-03-27 2020-02-19 株式会社トヨタプロダクションエンジニアリング 測定システム、測定方法及び測定プログラム
US10228237B2 (en) * 2017-07-12 2019-03-12 The Boeing Company Non-destructive optical method for determining minimum bond strength and proving bond efficacy
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CN108007352B (zh) * 2018-01-05 2024-03-15 洛阳理工学院 基于数字散斑相关技术的足部受力测量装置
JP6470863B1 (ja) * 2018-08-30 2019-02-13 株式会社トヨタプロダクションエンジニアリング 応力発光計測装置及び応力発光計測方法
JP6470864B1 (ja) * 2018-08-31 2019-02-13 株式会社トヨタプロダクションエンジニアリング 応力発光計測装置及び応力発光計測方法
JP6499363B1 (ja) * 2018-08-31 2019-04-10 株式会社トヨタプロダクションエンジニアリング 応力発光計測装置及び応力発光計測方法
JP2020085446A (ja) * 2018-11-14 2020-06-04 株式会社トヨタプロダクションエンジニアリング 応力発光量推定検出方法
WO2020226109A1 (ja) * 2019-05-09 2020-11-12 株式会社島津製作所 応力測定方法及びシステム、並びに応力測定用プログラム
JP7054124B2 (ja) * 2019-06-06 2022-04-13 国立研究開発法人産業技術総合研究所 ひずみ計測装置及びひずみ計測方法
WO2020246460A1 (ja) * 2019-06-06 2020-12-10 国立研究開発法人産業技術総合研究所 ひずみ計測装置及びひずみ計測方法
WO2020246462A1 (ja) * 2019-06-06 2020-12-10 国立研究開発法人産業技術総合研究所 応力発光計測装置及び応力発光計測方法
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CN111325718B (zh) * 2020-01-23 2023-07-25 深圳大学 应变模态分析方法及相关装置
WO2021173710A1 (en) 2020-02-24 2021-09-02 Regents Of The University Of Minnesota Orthodontic aligner with strain measurement features, and methods of making and using the same
JP7334664B2 (ja) * 2020-04-02 2023-08-29 株式会社島津製作所 応力発光測定方法および応力発光測定装置
JP7726046B2 (ja) * 2021-12-06 2025-08-20 株式会社島津製作所 応力計測方法、応力計測プログラムおよび応力計測装置
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Also Published As

Publication number Publication date
EP1121567A1 (de) 2001-08-08
CA2321841A1 (en) 2001-02-06
EA009014B1 (ru) 2007-10-26
ATE276506T1 (de) 2004-10-15
EA200100424A1 (ru) 2001-10-22
WO2001011311A1 (en) 2001-02-15
EP1121567B1 (de) 2004-09-15
DE69920246T2 (de) 2005-02-03
JP3314083B1 (ja) 2002-08-12
US20010008445A1 (en) 2001-07-19
US6327030B1 (en) 2001-12-04
AU1217500A (en) 2001-03-05
JP2003506698A (ja) 2003-02-18
CA2321841C (en) 2005-12-20

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