DK0428663T3 - Fremgangsmåde og apparat til hurtig spektralanalyse af et signal - Google Patents

Fremgangsmåde og apparat til hurtig spektralanalyse af et signal

Info

Publication number
DK0428663T3
DK0428663T3 DK90908190.3T DK90908190T DK0428663T3 DK 0428663 T3 DK0428663 T3 DK 0428663T3 DK 90908190 T DK90908190 T DK 90908190T DK 0428663 T3 DK0428663 T3 DK 0428663T3
Authority
DK
Denmark
Prior art keywords
frequency
pct
spectrum analyzer
signal
measuring
Prior art date
Application number
DK90908190.3T
Other languages
English (en)
Inventor
Hans-Detlef Brust
Original Assignee
Brust Hans Detlef
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Brust Hans Detlef filed Critical Brust Hans Detlef
Application granted granted Critical
Publication of DK0428663T3 publication Critical patent/DK0428663T3/da

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
    • G01R23/16—Spectrum analysis; Fourier analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/302—Contactless testing
    • G01R31/305—Contactless testing using electron beams

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Mathematical Physics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Spectrometry And Color Measurement (AREA)
DK90908190.3T 1989-05-29 1990-05-28 Fremgangsmåde og apparat til hurtig spektralanalyse af et signal DK0428663T3 (da)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
DE3917411A DE3917411A1 (de) 1989-05-29 1989-05-29 Verfahren und anordnung zur schnellen spektralanalyse eines signals an einem oder mehreren messpunkten

Publications (1)

Publication Number Publication Date
DK0428663T3 true DK0428663T3 (da) 1993-12-13

Family

ID=6381583

Family Applications (1)

Application Number Title Priority Date Filing Date
DK90908190.3T DK0428663T3 (da) 1989-05-29 1990-05-28 Fremgangsmåde og apparat til hurtig spektralanalyse af et signal

Country Status (8)

Country Link
US (1) US5260648A (da)
EP (1) EP0428663B1 (da)
JP (1) JPH04500126A (da)
AT (1) ATE93064T1 (da)
DE (2) DE3917411A1 (da)
DK (1) DK0428663T3 (da)
ES (1) ES2044593T3 (da)
WO (1) WO1990015340A1 (da)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5162723A (en) * 1991-02-11 1992-11-10 Hewlett-Packard Company Sampling signal analyzer
DE4439971A1 (de) * 1993-11-09 1995-05-24 Advantest Corp Fehleranalysesystem für integrierte Schaltkreise
DE69528481T2 (de) * 1994-01-12 2003-06-18 Advantest Corp., Tokio/Tokyo Kontaktlose Wellensignalbeobachtungsvorrichtung
EP0702236A3 (en) * 1994-09-19 1996-06-05 Hamamatsu Photonics Kk Voltage measuring system
US5581194A (en) * 1995-06-07 1996-12-03 Advanced Micro Devices, Inc. Method and apparatus for passive optical characterization of semiconductor substrates subjected to high energy (MEV) ion implantation using high-injection surface photovoltage
JPH1062502A (ja) * 1996-08-21 1998-03-06 Mitsubishi Electric Corp 被測定デバイスの故障解析方法、故障解析装置及び故障解析システム
US6425132B1 (en) 1998-04-06 2002-07-23 Wavetek Corporation Ingress testing of CATV system utilizing remote selection of CATV node
JP4891508B2 (ja) * 1999-11-23 2012-03-07 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ ウォーターマーク埋込み及び検出
DE10130687A1 (de) * 2001-06-26 2003-01-02 Rohde & Schwarz Meßsystem mit einem Referenzsignal zwischen einem Signalgenerator und einem Signalanalysator
JP4344197B2 (ja) * 2003-08-26 2009-10-14 パナソニック株式会社 絶縁膜測定装置、絶縁膜測定方法及び絶縁膜評価装置
JP2006040991A (ja) * 2004-07-23 2006-02-09 Hitachi Ltd 半導体装置の評価方法、および製造方法
US7116092B2 (en) * 2004-07-28 2006-10-03 International Business Machines Corporation Integrated spectrum analyzer circuits and methods for providing on-chip diagnostics
CN101300498B (zh) * 2005-11-04 2011-04-20 特克特朗尼克公司 利用实时频谱分析仪的瞬时信号的宽带宽频谱分析
JP5219023B2 (ja) * 2007-10-26 2013-06-26 独立行政法人情報通信研究機構 電界、電圧または磁界用測定プローブ
US20090300534A1 (en) * 2008-05-30 2009-12-03 Trilithic, Inc. Apparatus and method for displaying network status
US20100064078A1 (en) * 2008-08-15 2010-03-11 Powell Thomas J Wireless communication between testing instrument and network
KR100987583B1 (ko) * 2008-10-27 2010-10-12 포항공과대학교 산학협력단 전광 효과를 이용한 빔 진단 장치 및 방법
JP6379018B2 (ja) * 2014-11-20 2018-08-22 株式会社日立ハイテクノロジーズ 荷電粒子線装置および検査方法
CN110582833B (zh) * 2017-12-27 2022-07-01 日商光电魂股份有限公司 试样检查装置及试样检查方法
US12431327B2 (en) * 2022-04-01 2025-09-30 Intel Corporation Stroboscopic electron-beam signal image mapping

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3660763A (en) * 1970-01-08 1972-05-02 Benjamin Parzen Wide band frequency extender for a frequency comparator
US3643126A (en) * 1970-03-04 1972-02-15 Hewlett Packard Co Frequency-measuring system utilizing means for momentarily stopping the variable frequency generator
IT1071425B (it) * 1976-08-31 1985-04-10 Rai Radiotelevisione Italiana Procedimento ed apparecchiatura per la misura dell ampiezza e del ritardo di gruppo sulle singole bande laterali..dai morsetti di ingresso a quelli di uscita di un trasmettitore modulato in ampiezza
DE2814049A1 (de) * 1978-03-31 1979-10-18 Siemens Ag Verfahren zur beruehrungslosen messung des potentialverlaufs in einem elektronischen bauelement und anordnung zur durchfuehrung des verfahrens
DE2813948A1 (de) * 1978-03-31 1979-10-11 Siemens Ag Verfahren zur elektronischen abbildung der potentialverteilung in einem elektronischen bauelement
JPS5764171A (en) * 1980-10-08 1982-04-19 Advantest Corp Spectrum analyzer
DE3482769D1 (de) * 1984-05-30 1990-08-23 Siemens Ag Verfahren und vorrichtung zur detektion und abbildung eines messpunkts, der eine spannung wenigstens einer bestimmten frequenz fuehrt.
EP0226913A3 (de) * 1985-12-17 1988-10-05 Siemens Aktiengesellschaft Verfahren und Anordnung zur Lokalisierung und/oder Abbildung der ein bestimmtes zeitabhängiges Signal führenden Punkte einer Probe
DE3617044A1 (de) * 1986-05-21 1987-11-26 Siemens Ag Messverarbeitungsanordnung fuer korpuskularstrahlung
US4728884A (en) * 1986-10-09 1988-03-01 Tektronix, Inc. Infinite dynamic range phase detector
DE3887403D1 (de) * 1987-08-06 1994-03-10 Siemens Ag Spannungsmessung mit einer Elektronensonde ohne externes Triggersignal.
DE3866079D1 (de) * 1987-09-30 1991-12-12 Siemens Ag Automatische frequenznachfuehrung bei korpuskularstrahlmessverfahren unter anwendung eines modulierten primaerstrahls.

Also Published As

Publication number Publication date
WO1990015340A1 (de) 1990-12-13
US5260648A (en) 1993-11-09
ES2044593T3 (es) 1994-01-01
EP0428663A1 (de) 1991-05-29
DE3917411A1 (de) 1990-12-06
ATE93064T1 (de) 1993-08-15
JPH04500126A (ja) 1992-01-09
DE59002300D1 (de) 1993-09-16
EP0428663B1 (de) 1993-08-11

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