DK0760954T3 - Fasestøjdetektor - Google Patents

Fasestøjdetektor

Info

Publication number
DK0760954T3
DK0760954T3 DK95919278T DK95919278T DK0760954T3 DK 0760954 T3 DK0760954 T3 DK 0760954T3 DK 95919278 T DK95919278 T DK 95919278T DK 95919278 T DK95919278 T DK 95919278T DK 0760954 T3 DK0760954 T3 DK 0760954T3
Authority
DK
Denmark
Prior art keywords
carrier
signal
phase noise
noise detector
carrier frequency
Prior art date
Application number
DK95919278T
Other languages
English (en)
Inventor
Richard Alec Woode
Michael Edmund Tobar
Eugene Nikolay Ivanov
Original Assignee
Poseidon Scient Instr Pty Ltd
Univ Western Australia
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Poseidon Scient Instr Pty Ltd, Univ Western Australia filed Critical Poseidon Scient Instr Pty Ltd
Application granted granted Critical
Publication of DK0760954T3 publication Critical patent/DK0760954T3/da

Links

Classifications

    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03B—GENERATION OF OSCILLATIONS, DIRECTLY OR BY FREQUENCY-CHANGING, BY CIRCUITS EMPLOYING ACTIVE ELEMENTS WHICH OPERATE IN A NON-SWITCHING MANNER; GENERATION OF NOISE BY SUCH CIRCUITS
    • H03B5/00—Generation of oscillations using amplifier with regenerative feedback from output to input
    • H03B5/18—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element comprising distributed inductance and capacitance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00—Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/26—Measuring noise figure; Measuring signal-to-noise ratio
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits
    • G01R31/2824—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits testing of oscillators or resonators
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03B—GENERATION OF OSCILLATIONS, DIRECTLY OR BY FREQUENCY-CHANGING, BY CIRCUITS EMPLOYING ACTIVE ELEMENTS WHICH OPERATE IN A NON-SWITCHING MANNER; GENERATION OF NOISE BY SUCH CIRCUITS
    • H03B2202/00—Aspects of oscillators relating to reduction of undesired oscillations
    • H03B2202/02—Reduction of undesired oscillations originated from natural noise of the circuit elements of the oscillator
    • H03B2202/025—Reduction of undesired oscillations originated from natural noise of the circuit elements of the oscillator the noise being coloured noise, i.e. frequency dependent noise
    • H03B2202/027—Reduction of undesired oscillations originated from natural noise of the circuit elements of the oscillator the noise being coloured noise, i.e. frequency dependent noise the noise being essentially proportional to the inverse of the frequency, i.e. the so-called 1/f noise
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03B—GENERATION OF OSCILLATIONS, DIRECTLY OR BY FREQUENCY-CHANGING, BY CIRCUITS EMPLOYING ACTIVE ELEMENTS WHICH OPERATE IN A NON-SWITCHING MANNER; GENERATION OF NOISE BY SUCH CIRCUITS
    • H03B2202/00—Aspects of oscillators relating to reduction of undesired oscillations
    • H03B2202/07—Reduction of undesired oscillations through a cancelling of the undesired oscillation
    • H03B2202/076—Reduction of undesired oscillations through a cancelling of the undesired oscillation by using a feedback loop external to the oscillator, e.g. the so-called noise degeneration

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)
  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
  • Transmission And Conversion Of Sensor Element Output (AREA)
  • Inductance-Capacitance Distribution Constants And Capacitance-Resistance Oscillators (AREA)
  • Soundproofing, Sound Blocking, And Sound Damping (AREA)
  • Noise Elimination (AREA)
  • Control Of High-Frequency Heating Circuits (AREA)
  • Burglar Alarm Systems (AREA)
  • Stereo-Broadcasting Methods (AREA)
DK95919278T 1994-05-25 1995-05-25 Fasestøjdetektor DK0760954T3 (da)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
AUPM5870A AUPM587094A0 (en) 1994-05-25 1994-05-25 Microwave loop oscillators
PCT/AU1995/000306 WO1995032435A1 (en) 1994-05-25 1995-05-25 Phase noise detector

Publications (1)

Publication Number Publication Date
DK0760954T3 true DK0760954T3 (da) 2003-11-10

Family

ID=3780444

Family Applications (1)

Application Number Title Priority Date Filing Date
DK95919278T DK0760954T3 (da) 1994-05-25 1995-05-25 Fasestøjdetektor

Country Status (9)

Country Link
US (1) US5841322A (da)
EP (1) EP0760954B1 (da)
JP (1) JPH10501061A (da)
AT (1) ATE245817T1 (da)
AU (1) AUPM587094A0 (da)
CA (1) CA2191232A1 (da)
DE (1) DE69531348T2 (da)
DK (1) DK0760954T3 (da)
WO (1) WO1995032435A1 (da)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5608331A (en) * 1995-06-06 1997-03-04 Hughes Electronics Noise measurement test system
US6753690B2 (en) * 1998-11-30 2004-06-22 Poseidon Scientific Instruments Pty Ltd Interferometric signal processing apparatus
DE19901750B4 (de) * 1999-01-18 2006-04-13 Rohde & Schwarz Gmbh & Co. Kg Anordnung zum Messen des Phasenrauschens des Ausgangssignals eines Meßobjektes
US7415077B2 (en) * 2002-07-29 2008-08-19 Infineon Technologies Ag Transmission arrangement, particularly for mobile radio
US7075378B2 (en) * 2003-07-11 2006-07-11 The United States of America as represented by the Secretary of Commerce, the National Institute of Standards and Technology High spectral purity microwave oscillator using air-dielectric cavity
US7505141B2 (en) 2006-01-20 2009-03-17 Eugene Nikolay Ivanov Interferometric apparatus for producing an output signal characteristic of phase and/or amplitude noise of a device
US7674836B2 (en) * 2006-07-28 2010-03-09 3M Innovative Properties Company Method of making macroporous cation exchange resins
CN101904115B (zh) * 2007-11-13 2014-10-22 光电波股份有限公司 基于光子技术及具有低相位噪声的互相关零差检测
US9350293B1 (en) 2015-01-16 2016-05-24 Raytheon Company Amplitude-noise reduction system and method for ultra-low phase-noise oscillators
US10547096B2 (en) * 2016-12-22 2020-01-28 Knowles Cazenovia, Inc. Microwave cavity resonator stabilized oscillator
US11817871B2 (en) 2021-01-28 2023-11-14 Anritsu Company Frequency synthesizers having low phase noise
US12009826B1 (en) * 2022-11-08 2024-06-11 Anritsu Company Phase noise suppression for reference oscillator
US11817867B1 (en) * 2023-01-11 2023-11-14 Raytheon Company Frequency stabilized microwave source using an IQ mixer to detect amplitude modulation of the reflected signal
US11817872B1 (en) * 2023-01-11 2023-11-14 Raytheon Company Frequency stabilized and phase noise suppressed microwave source using an IQ mixer to detect amplitude modulation and phase perturbation of the reflected signal
US12237810B1 (en) 2023-08-03 2025-02-25 Raytheon Company Vibration compensated interferometric noise suppressed oscillator (INSO)
US12506442B1 (en) 2024-06-20 2025-12-23 Raytheon Company Offset-mixer interferometric noise suppressed oscillator (INSO)

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4555678A (en) * 1983-11-21 1985-11-26 Raytheon Company Microwave oscillator
US4639939A (en) * 1984-02-20 1987-01-27 Nec Corporation Apparatus for cancelling periodic carrier phase jitters
DE3533330A1 (de) * 1984-09-18 1986-03-27 Nec Corp., Tokio/Tokyo Schaltung zum detektieren des rauschpegels in einem fm-signal fuer einen am/fm-empfaenger
GB2179458B (en) * 1985-08-23 1988-11-09 Ferranti Plc Microwave noise measuring apparatus
AU589088B2 (en) * 1986-03-05 1989-09-28 Nec Corporation Noise detection by sampling digital baseband signal at eye openings
US4692714A (en) * 1986-10-20 1987-09-08 Raytheon Company Single resonator push-push oscillator
US5032800A (en) * 1990-06-15 1991-07-16 Raytheon Company Tunable oscillator with noise degeneration
US5036299A (en) * 1990-06-22 1991-07-30 California Institute Of Technology Method and apparatus for reducing microwave oscillator output noise

Also Published As

Publication number Publication date
ATE245817T1 (de) 2003-08-15
JPH10501061A (ja) 1998-01-27
US5841322A (en) 1998-11-24
DE69531348T2 (de) 2004-04-15
WO1995032435A1 (en) 1995-11-30
EP0760954A1 (en) 1997-03-12
CA2191232A1 (en) 1995-11-30
EP0760954B1 (en) 2003-07-23
DE69531348D1 (de) 2003-08-28
AUPM587094A0 (en) 1994-06-16
EP0760954A4 (en) 1999-11-10

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