DK1166328T3 - Gasindlöb til frembringelse af en retningsbestemt og afkölet gasstråle - Google Patents

Gasindlöb til frembringelse af en retningsbestemt og afkölet gasstråle

Info

Publication number
DK1166328T3
DK1166328T3 DK00907607T DK00907607T DK1166328T3 DK 1166328 T3 DK1166328 T3 DK 1166328T3 DK 00907607 T DK00907607 T DK 00907607T DK 00907607 T DK00907607 T DK 00907607T DK 1166328 T3 DK1166328 T3 DK 1166328T3
Authority
DK
Denmark
Prior art keywords
gas
directional
gas inlet
produce
ion source
Prior art date
Application number
DK00907607T
Other languages
English (en)
Inventor
Ralf Zimmermann
Egmont Rohwer
Ralph Dorfner
Ulrich Boesl
Antonius Kettrup
Original Assignee
Helmholtz Zentrum Muenchen
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Helmholtz Zentrum Muenchen filed Critical Helmholtz Zentrum Muenchen
Application granted granted Critical
Publication of DK1166328T3 publication Critical patent/DK1166328T3/da

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0404—Capillaries used for transferring samples or ions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/6402—Atomic fluorescence; Laser induced fluorescence
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0422—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for gaseous samples
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0468—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N2021/6482—Sample cells, cuvettes

Landscapes

  • Analytical Chemistry (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Electron Tubes For Measurement (AREA)
  • Vaporization, Distillation, Condensation, Sublimation, And Cold Traps (AREA)
  • Superconductors And Manufacturing Methods Therefor (AREA)
  • Crystals, And After-Treatments Of Crystals (AREA)
  • Gas Separation By Absorption (AREA)
  • Sampling And Sample Adjustment (AREA)
DK00907607T 1999-03-25 2000-02-23 Gasindlöb til frembringelse af en retningsbestemt og afkölet gasstråle DK1166328T3 (da)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE19913451A DE19913451C2 (de) 1999-03-25 1999-03-25 Gaseinlaß zur Erzeugung eines gerichteten und gekühlten Gasstrahls
PCT/EP2000/001478 WO2000058996A2 (de) 1999-03-25 2000-02-23 Gaseinlass zur erzeugung eines gerichteten und gekühlten gasstrahls

Publications (1)

Publication Number Publication Date
DK1166328T3 true DK1166328T3 (da) 2009-03-30

Family

ID=7902309

Family Applications (1)

Application Number Title Priority Date Filing Date
DK00907607T DK1166328T3 (da) 1999-03-25 2000-02-23 Gasindlöb til frembringelse af en retningsbestemt og afkölet gasstråle

Country Status (7)

Country Link
US (1) US6772649B2 (da)
EP (1) EP1166328B1 (da)
JP (1) JP4838423B2 (da)
AT (1) ATE414988T1 (da)
DE (2) DE19913451C2 (da)
DK (1) DK1166328T3 (da)
WO (1) WO2000058996A2 (da)

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TWI767087B (zh) 2017-11-13 2022-06-11 美商阿普托麥克股份有限公司 用於控制氣溶膠噴注列印系統的列印頭中之氣溶膠的流之方法以及用於沉積氣溶膠之裝備
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GB201808932D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
GB201808949D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
GB201808893D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
GB201808890D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
GB201808912D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
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US12033843B2 (en) 2020-03-26 2024-07-09 Agilent Technologies, Inc. Mass spectrometry ION source
TW202247905A (zh) 2021-04-29 2022-12-16 美商阿普托麥克股份有限公司 用於氣溶膠噴射裝置之高可靠性鞘護輸送路徑
CN116297649B (zh) * 2023-02-16 2025-09-09 中国航空工业集团公司北京长城计量测试技术研究所 高温条件下测量热障涂层导热系数用脉冲均匀加热装置

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Also Published As

Publication number Publication date
WO2000058996A2 (de) 2000-10-05
US20020026821A1 (en) 2002-03-07
JP2002540438A (ja) 2002-11-26
JP4838423B2 (ja) 2011-12-14
DE19913451A1 (de) 2000-10-19
DE50015461D1 (de) 2009-01-02
DE19913451C2 (de) 2001-11-22
US6772649B2 (en) 2004-08-10
EP1166328B1 (de) 2008-11-19
EP1166328A2 (de) 2002-01-02
ATE414988T1 (de) 2008-12-15
WO2000058996A3 (de) 2001-04-19

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