DK1436575T3 - Tredimensional dobbelgitter spektograf - Google Patents

Tredimensional dobbelgitter spektograf

Info

Publication number
DK1436575T3
DK1436575T3 DK02778234T DK02778234T DK1436575T3 DK 1436575 T3 DK1436575 T3 DK 1436575T3 DK 02778234 T DK02778234 T DK 02778234T DK 02778234 T DK02778234 T DK 02778234T DK 1436575 T3 DK1436575 T3 DK 1436575T3
Authority
DK
Denmark
Prior art keywords
input light
diffraction grating
spectograph
diffracted light
light source
Prior art date
Application number
DK02778234T
Other languages
Danish (da)
English (en)
Inventor
Jian Ming Xiao
Original Assignee
Horiba Jobin Yvon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Horiba Jobin Yvon Inc filed Critical Horiba Jobin Yvon Inc
Application granted granted Critical
Publication of DK1436575T3 publication Critical patent/DK1436575T3/da

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/04—Slit arrangements slit adjustment
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/12—Generating the spectrum; Monochromators
    • G01J3/18—Generating the spectrum; Monochromators using diffraction elements, e.g. grating
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/02—Details
    • G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
    • G01J3/0229—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using masks, aperture plates, spatial light modulators or spatial filters, e.g. reflective filters

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Spectrometry And Color Measurement (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Holo Graphy (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Diffracting Gratings Or Hologram Optical Elements (AREA)
  • Optical Integrated Circuits (AREA)
DK02778234T 2001-09-07 2002-09-06 Tredimensional dobbelgitter spektograf DK1436575T3 (da)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US09/948,278 US6952260B2 (en) 2001-09-07 2001-09-07 Double grating three dimensional spectrograph
PCT/US2002/028472 WO2003023459A2 (en) 2001-09-07 2002-09-06 Double grating three dimensional spectrograph

Publications (1)

Publication Number Publication Date
DK1436575T3 true DK1436575T3 (da) 2009-03-02

Family

ID=25487586

Family Applications (1)

Application Number Title Priority Date Filing Date
DK02778234T DK1436575T3 (da) 2001-09-07 2002-09-06 Tredimensional dobbelgitter spektograf

Country Status (7)

Country Link
US (1) US6952260B2 (de)
EP (1) EP1436575B1 (de)
AT (1) ATE414265T1 (de)
AU (1) AU2002339895A1 (de)
DE (1) DE60229869D1 (de)
DK (1) DK1436575T3 (de)
WO (1) WO2003023459A2 (de)

Families Citing this family (24)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1344193B1 (de) * 2000-12-21 2007-07-04 De La Rue International Limited Optische sensoreinrichtung und verfahren zur spektralanalyse
US7038775B2 (en) * 2001-07-05 2006-05-02 Hamamatsu Photonics K.K. Spectroscopic device
US7265827B2 (en) * 2001-09-07 2007-09-04 Horiba Jobin Yvon, Inc. Double grating three dimensional spectrograph with multi-directional diffraction
DE10324934A1 (de) * 2003-06-03 2004-12-23 Carl Zeiss Jena Gmbh Anordnung und ein Verfahren zur Erkennung von Schichten, die auf Oberflächen von Bauteilen angeordnet sind, und Bestimmung deren Eigenschaften
JP2005127943A (ja) * 2003-10-27 2005-05-19 Hitachi Ltd 光計測装置及び分光装置
US20060132768A1 (en) * 2004-12-22 2006-06-22 Chroma Ate Inc. Optical spectrometer
US7873246B2 (en) * 2006-11-07 2011-01-18 Olympus Corporation Beam steering element and associated methods for manifold fiberoptic switches and monitoring
US7702194B2 (en) * 2006-11-07 2010-04-20 Olympus Corporation Beam steering element and associated methods for manifold fiberoptic switches
US8131123B2 (en) * 2006-11-07 2012-03-06 Olympus Corporation Beam steering element and associated methods for manifold fiberoptic switches and monitoring
US7720329B2 (en) * 2006-11-07 2010-05-18 Olympus Corporation Segmented prism element and associated methods for manifold fiberoptic switches
US7769255B2 (en) * 2006-11-07 2010-08-03 Olympus Corporation High port count instantiated wavelength selective switch
US8000568B2 (en) * 2006-11-07 2011-08-16 Olympus Corporation Beam steering element and associated methods for mixed manifold fiberoptic switches
US8190025B2 (en) * 2008-02-28 2012-05-29 Olympus Corporation Wavelength selective switch having distinct planes of operation
CA2872150A1 (en) * 2011-05-02 2012-11-08 Green Vision Systems Ltd. Microelectromechanical system (mems) and (mem) optical interferometer for hyper-spectral imaging and analysis
DE102015108818B4 (de) 2015-06-03 2020-01-02 Carl Zeiss Spectroscopy Gmbh Anordnung zur Spektroskopie und Verfahren zur Herstellung der Anordnung
US10126560B2 (en) * 2016-02-18 2018-11-13 National Engineering Research Center for Optical Instrumentation Spectrum-generation system based on multiple-diffraction optical phasometry
US11592407B2 (en) 2018-05-18 2023-02-28 Enersoft Inc. Systems, devices, and methods for x-ray fluorescence analysis of geological samples
US11060912B2 (en) * 2018-12-06 2021-07-13 University Of Maryland, College Park Multi-stage parallel spectroscopy systems and methods
US10641656B1 (en) * 2018-12-20 2020-05-05 Shimadzu Corporation Spectrometer and incident light limiting member to be used for the same
CN110736541A (zh) * 2019-09-19 2020-01-31 杭州远方光电信息股份有限公司 一种光谱仪
WO2022058912A1 (en) 2020-09-16 2022-03-24 Enersoft Inc. Multiple-sensor analysis of geological samples
WO2022266779A1 (en) 2021-06-25 2022-12-29 Enersoft Inc. Laser induced breakdown spectroscopy for geological analysis
US12281979B2 (en) * 2021-12-17 2025-04-22 Honeywell International Inc. High-speed tunable chemical composition detecting components and apparatuses
EP4552549A1 (de) * 2023-11-13 2025-05-14 OPTOPOL Technology Spolka z ograniczona Odpowiedzialnoscia Vorrichtung zur messung der eigenschaften des menschlichen auges mit oct-technologie

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2036613A5 (de) 1969-03-26 1970-12-24 Jobin Et G Yvon
FR2239674B1 (de) 1973-08-03 1976-04-30 Jobin & Yvon
SU754220A1 (ru) * 1978-07-11 1980-08-07 Novosib I Inzh Geodezii Двойной дифракционный монохроматор 1
DE2919925C2 (de) * 1979-05-17 1986-07-03 Fa. Carl Zeiss, 7920 Heidenheim Vorrichtung zur photometrischen Analyse von kleinen Probenmengen
US4455087A (en) * 1981-04-06 1984-06-19 Hamamatsu Systems Inc. Monochromatic imaging apparatus
FI75047C (sv) * 1982-05-11 1988-04-11 Scanoptics Oy Anordning för utförande av spektralanalys.
DE3224559A1 (de) * 1982-07-01 1984-01-05 Bodenseewerk Perkin-Elmer & Co GmbH, 7770 Überlingen Monochromator
FR2543768A1 (fr) 1983-03-31 1984-10-05 Instruments Sa Multiplexeur-demultiplexeur de longueurs d'onde, et procede de realisation d'un tel ensemble
DE3414261A1 (de) * 1984-04-14 1985-10-24 Fa. Carl Zeiss, 7920 Heidenheim Interferenz-refraktometer
EP0358830A1 (de) * 1988-09-12 1990-03-21 Instruments S.A. - Division Jobin-Yvon Rauscharmes optisches System
ATE126883T1 (de) * 1989-06-16 1995-09-15 Fisons Plc Optisches system zur spektralanalyse.
FR2687471B1 (fr) * 1992-02-18 1994-07-01 Centre Nat Rech Scient Dispositif de spectrographie.
US5565983A (en) * 1995-05-26 1996-10-15 The Perkin-Elmer Corporation Optical spectrometer for detecting spectra in separate ranges
US6023330A (en) * 1998-12-21 2000-02-08 Leco Corporation Centered sphere spectrometer

Also Published As

Publication number Publication date
WO2003023459A3 (en) 2003-08-21
WO2003023459A2 (en) 2003-03-20
EP1436575A2 (de) 2004-07-14
WO2003023459B1 (en) 2004-05-06
US20030048442A1 (en) 2003-03-13
EP1436575A4 (de) 2004-12-01
AU2002339895A1 (en) 2003-03-24
US6952260B2 (en) 2005-10-04
DE60229869D1 (de) 2008-12-24
EP1436575B1 (de) 2008-11-12
ATE414265T1 (de) 2008-11-15

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