DK170585D0 - Afproevningsapparat - Google Patents

Afproevningsapparat

Info

Publication number
DK170585D0
DK170585D0 DK170585A DK170585A DK170585D0 DK 170585 D0 DK170585 D0 DK 170585D0 DK 170585 A DK170585 A DK 170585A DK 170585 A DK170585 A DK 170585A DK 170585 D0 DK170585 D0 DK 170585D0
Authority
DK
Denmark
Prior art keywords
recess
circuit board
board
interface connector
customized
Prior art date
Application number
DK170585A
Other languages
English (en)
Other versions
DK170585A (da
Inventor
John William Bailey
Paul Alan Hayter
Brian Robert Mason
Graham Norman Turner
Original Assignee
Mars Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from GB848409794A external-priority patent/GB8409794D0/en
Application filed by Mars Inc filed Critical Mars Inc
Publication of DK170585D0 publication Critical patent/DK170585D0/da
Publication of DK170585A publication Critical patent/DK170585A/da

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31926—Routing signals to or from the device under test [DUT], e.g. switch matrix, pin multiplexing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • G01R31/2607—Circuits therefor
    • G01R31/2637—Circuits therefor for testing other individual devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31907—Modular tester, e.g. controlling and coordinating instruments in a bus based architecture
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration
    • G01R31/31912—Tester/user interface
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/261—Functional testing by simulating additional hardware, e.g. fault simulation
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/26—Functional testing
    • G06F11/273—Tester hardware, i.e. output processing circuits
    • G06F11/277—Tester hardware, i.e. output processing circuits with comparison between actual response and known fault-free response

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Human Computer Interaction (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
DK170585A 1984-04-16 1985-04-16 Afproevningsapparat DK170585A (da)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
GB848409794A GB8409794D0 (en) 1984-04-16 1984-04-16 Testing apparatus
GB08508319A GB2157837B (en) 1984-04-16 1985-03-29 Circuit testing apparatus

Publications (2)

Publication Number Publication Date
DK170585D0 true DK170585D0 (da) 1985-04-16
DK170585A DK170585A (da) 1985-10-17

Family

ID=26287620

Family Applications (1)

Application Number Title Priority Date Filing Date
DK170585A DK170585A (da) 1984-04-16 1985-04-16 Afproevningsapparat

Country Status (9)

Country Link
US (1) US4714875A (da)
EP (1) EP0159907A3 (da)
AU (1) AU586163B2 (da)
BR (1) BR8501786A (da)
CA (1) CA1235527A (da)
DK (1) DK170585A (da)
ES (1) ES8607571A1 (da)
GB (1) GB2157837B (da)
IE (1) IE56616B1 (da)

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US4857833A (en) * 1987-08-27 1989-08-15 Teradyne, Inc. Diagnosis of faults on circuit board
US4908576A (en) * 1987-09-08 1990-03-13 Jackson Daniel K System for printed circuit board testing
FR2623630B1 (fr) * 1987-11-23 1992-01-03 Lmt Radio Professionelle Procede et dispositif de localisation des pannes de circuits logiques
GB8728444D0 (en) * 1987-12-04 1988-01-13 Plessey Co Plc Analogue circuit element & chain for testing analogue circuit
US5047708A (en) * 1988-12-23 1991-09-10 Kondner Jr Robert L Apparatus for testing circuit boards
US5029168A (en) * 1989-02-27 1991-07-02 Acer Incorporated Multiplexing communication card and scanning method for run-in testing
JPH04505962A (ja) * 1989-04-05 1992-10-15 ナイツ　テクノロジー　インコーポレイテッド 集積回路を試験するための接触感知
US5369593A (en) * 1989-05-31 1994-11-29 Synopsys Inc. System for and method of connecting a hardware modeling element to a hardware modeling system
US5353243A (en) * 1989-05-31 1994-10-04 Synopsys Inc. Hardware modeling system and method of use
US5086271A (en) * 1990-01-12 1992-02-04 Reliability Incorporated Driver system and distributed transmission line network for driving devices under test
US5019771A (en) * 1990-05-09 1991-05-28 Knights Technology, Inc. Contact sensing for integrated circuit testing
US5023545A (en) * 1990-06-04 1991-06-11 The United States Of America Circuit probing system
US5113140A (en) * 1990-06-20 1992-05-12 National Research Council Of Canada Microprocessor-controlled high-voltage capacitance bridge
JP2716285B2 (ja) 1991-06-10 1998-02-18 日本電気アイシーマイコンシステム株式会社 デバッグ装置
US5235272A (en) * 1991-06-17 1993-08-10 Photon Dynamics, Inc. Method and apparatus for automatically inspecting and repairing an active matrix LCD panel
GB2260416B (en) * 1991-10-10 1995-07-26 Smiths Industries Plc Resistance monitors
GB9121506D0 (en) * 1991-10-10 1991-11-27 Smiths Industries Plc Resistance monitors
GB2261957B (en) * 1991-11-16 1995-05-17 Voltech Instr Ltd Apparatus for testing wound components
US5646547A (en) * 1994-04-28 1997-07-08 Xilinx, Inc. Logic cell which can be configured as a latch without static one's problem
US5561367A (en) * 1992-07-23 1996-10-01 Xilinx, Inc. Structure and method for testing wiring segments in an integrated circuit device
GB2274716A (en) * 1992-09-22 1994-08-03 Mistrock Microsystems Limited Circuit tester
GB2278689B (en) * 1993-06-02 1997-03-19 Ford Motor Co Method and apparatus for testing integrated circuits
GB2279760B (en) * 1993-07-06 1997-04-23 Gentex Corp Communication headset tester
US5504432A (en) * 1993-08-31 1996-04-02 Hewlett-Packard Company System and method for detecting short, opens and connected pins on a printed circuit board using automatic test equipment
US5543727A (en) * 1994-04-05 1996-08-06 Bellsouth Corporation Run-in test system for PC circuit board
US5541862A (en) * 1994-04-28 1996-07-30 Wandel & Goltermann Ate Systems Ltd. Emulator and digital signal analyzer
AU3560295A (en) * 1994-10-06 1996-05-02 Northern Telecom Limited Bus for sensitive analog signals
US5528137A (en) * 1995-01-24 1996-06-18 International Business Machines Corporation Network sensitive pulse generator
US5673295A (en) * 1995-04-13 1997-09-30 Synopsis, Incorporated Method and apparatus for generating and synchronizing a plurality of digital signals
US5861743A (en) * 1995-12-21 1999-01-19 Genrad, Inc. Hybrid scanner for use in an improved MDA tester
US5933019A (en) * 1997-03-05 1999-08-03 Depue; Clayton S. Circuit board testing switch
US5952833A (en) * 1997-03-07 1999-09-14 Micron Technology, Inc. Programmable voltage divider and method for testing the impedance of a programmable element
US6130530A (en) * 1997-12-22 2000-10-10 Hd Electric Company Tester for power transformers and capacitors
US6795743B1 (en) 2000-09-18 2004-09-21 Dell Products L.P. Apparatus and method for electronically encoding an article with work-in-progress information
DE10241045B4 (de) * 2002-08-30 2006-07-20 Infineon Technologies Ag Verfahren zum Durchführen von Testmessungen an lichtemittierenden Bauelementen
US7512504B2 (en) * 2002-09-19 2009-03-31 Marvell World Trade Ltd. Testing system using configurable integrated circuit
US6970794B2 (en) * 2002-09-19 2005-11-29 Marvell International Ltd. Semiconductor having reduced configuration pins and method thereof
GB0308550D0 (en) * 2003-04-10 2003-05-21 Barker Colin Improvements to an automatic test machine
US7218147B2 (en) * 2003-10-01 2007-05-15 Stmicroelectronics Pvt. Ltd. Input buffer and method of operating the same
US7680961B2 (en) * 2005-10-25 2010-03-16 Hewlett-Packard Development Company, L.P. Device recognition system and method
TWI288241B (en) * 2005-11-30 2007-10-11 Ip Leader Technology Corp Probing apparatus, probing print-circuit board and probing system for high-voltage matrix-based probing
TWI383160B (zh) * 2009-12-31 2013-01-21 Test Research Inc 電性連接瑕疵偵測系統及方法
CN102401875A (zh) * 2010-09-07 2012-04-04 鸿富锦精密工业（深圳）有限公司 软性电路板测试电路
CN103308842A (zh) * 2012-03-07 2013-09-18 鸿富锦精密工业（深圳）有限公司 调试电路
KR102127508B1 (ko) * 2013-08-23 2020-06-30 삼성디스플레이 주식회사 인쇄 회로 기판 어셈블리 및 그것을 포함하는 표시 장치
CN107688144A (zh) * 2017-09-25 2018-02-13 河南中烟工业有限责任公司 一种烟机电路板故障定位装置
US12000887B2 (en) 2018-11-21 2024-06-04 Lam Research Corporation Wireless electronic-control system
TWI696914B (zh) * 2019-05-17 2020-06-21 和碩聯合科技股份有限公司 電子裝置、訊號驗證器及訊號驗證的方法
EP3839530A1 (en) * 2019-12-20 2021-06-23 Siemens Aktiengesellschaft Methods and systems for assessing printed circuit boards
CN111896858A (zh) * 2020-04-30 2020-11-06 珠海博杰电子股份有限公司 微针电子测试系统

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GB766935A (en) * 1953-10-26 1957-01-30 Ibm Circuit testing apparatus
GB850061A (en) * 1958-10-13 1960-09-28 Beckman Instruments Inc Data handling system
DE1187727B (de) * 1961-04-17 1965-02-25 Siemens Ag Einrichtung zur Herstellung elektrischer Verbindungen in Messschaltungen
GB1263644A (en) * 1969-08-07 1972-02-16 Olivetti & Co Spa Apparatus for automatically testing electronic circuits
DE1946492B1 (da) * 1969-09-13 1971-02-04
US3854125A (en) * 1971-06-15 1974-12-10 Instrumentation Engineering Automated diagnostic testing system
US3851161A (en) * 1973-05-07 1974-11-26 Burroughs Corp Continuity network testing and fault isolating
US4070565A (en) * 1976-08-18 1978-01-24 Zehntel, Inc. Programmable tester method and apparatus
US4114093A (en) * 1976-12-17 1978-09-12 Everett/Charles, Inc. Network testing method and apparatus
US4225819A (en) * 1978-10-12 1980-09-30 Bell Telephone Laboratories, Incorporated Circuit board contact contamination probe
US4342958A (en) * 1980-03-28 1982-08-03 Honeywell Information Systems Inc. Automatic test equipment test probe contact isolation detection method
US4465972A (en) * 1982-04-05 1984-08-14 Allied Corporation Connection arrangement for printed circuit board testing apparatus
JPS6072317A (ja) * 1983-09-28 1985-04-24 Nec Corp Ｌｓｉ論理回路

Also Published As

Publication number Publication date
ES8607571A1 (es) 1986-06-16
DK170585A (da) 1985-10-17
EP0159907A2 (en) 1985-10-30
IE850905L (en) 1985-10-16
US4714875A (en) 1987-12-22
GB2157837B (en) 1988-05-18
EP0159907A3 (en) 1987-10-14
AU586163B2 (en) 1989-07-06
IE56616B1 (en) 1991-10-09
GB8508319D0 (en) 1985-05-09
BR8501786A (pt) 1985-12-10
ES542237A0 (es) 1986-06-16
AU4132585A (en) 1985-10-24
GB2157837A (en) 1985-10-30
CA1235527A (en) 1988-04-19

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Legal Events

Date Code Title Description
AHB Application shelved due to non-payment
B1 Patent granted (law 1993)