DK3080548T3 - Måleapparat og metode dertil - Google Patents

Måleapparat og metode dertil Download PDF

Info

Publication number
DK3080548T3
DK3080548T3 DK14869160.3T DK14869160T DK3080548T3 DK 3080548 T3 DK3080548 T3 DK 3080548T3 DK 14869160 T DK14869160 T DK 14869160T DK 3080548 T3 DK3080548 T3 DK 3080548T3
Authority
DK
Denmark
Prior art keywords
measuring apparatus
method therefor
therefor
measuring
Prior art date
Application number
DK14869160.3T
Other languages
English (en)
Inventor
Owen Pearcey
Original Assignee
Hatch Pty Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from AU2013904786A external-priority patent/AU2013904786A0/en
Application filed by Hatch Pty Ltd filed Critical Hatch Pty Ltd
Application granted granted Critical
Publication of DK3080548T3 publication Critical patent/DK3080548T3/da

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C3/00—Measuring distances in line of sight; Optical rangefinders
    • G01C3/02—Details
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C2/00—Hot-dipping or immersion processes for applying the coating material in the molten state without affecting the shape; Apparatus therefor
    • C23C2/14—Removing excess of molten coatings; Controlling or regulating the coating thickness
    • C23C2/16—Removing excess of molten coatings; Controlling or regulating the coating thickness using fluids under pressure, e.g. air knives
    • C23C2/18—Removing excess of molten coatings from elongated material
    • C23C2/20—Strips; Plates
    • C—CHEMISTRY; METALLURGY
    • C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C2/00—Hot-dipping or immersion processes for applying the coating material in the molten state without affecting the shape; Apparatus therefor
    • C23C2/50—Controlling or regulating the coating processes
    • C23C2/52—Controlling or regulating the coating processes with means for measuring or sensing
    • C23C2/524—Position of the substrate
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/026—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G01B11/0683—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating measurement during deposition or removal of the layer

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Mechanical Engineering (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electromagnetism (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
DK14869160.3T 2013-12-09 2014-12-09 Måleapparat og metode dertil DK3080548T3 (da)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
AU2013904786A AU2013904786A0 (en) 2013-12-09 Measuring Apparatus and Method for Same
PCT/AU2014/001108 WO2015085347A1 (en) 2013-12-09 2014-12-09 Measuring apparatus and method for same

Publications (1)

Publication Number Publication Date
DK3080548T3 true DK3080548T3 (da) 2020-05-25

Family

ID=53370356

Family Applications (1)

Application Number Title Priority Date Filing Date
DK14869160.3T DK3080548T3 (da) 2013-12-09 2014-12-09 Måleapparat og metode dertil

Country Status (8)

Country Link
US (1) US10288423B2 (da)
EP (1) EP3080548B1 (da)
CN (1) CN106257996B (da)
AU (1) AU2014361727B2 (da)
CA (1) CA2933249C (da)
DK (1) DK3080548T3 (da)
PL (1) PL3080548T3 (da)
WO (1) WO2015085347A1 (da)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2017190019A1 (en) 2016-04-28 2017-11-02 Tritek Technologies, Inc. Mail processing system and method with increased processing speed
US12277793B2 (en) 2016-04-28 2025-04-15 Tritek Technologies, Inc. Mail processing system with a mail hazard screening machine
GB2572321B (en) * 2018-03-14 2020-09-30 Gyrometric Systems Ltd Measurement of axial displacement of a rotating shaft
EP3786574B1 (de) * 2019-08-26 2024-12-18 Sturm Maschinen- & Anlagenbau GmbH Sensorvorrichtung
TWI725861B (zh) * 2020-05-29 2021-04-21 中國鋼鐵股份有限公司 鋼帶中心位置虛擬量測器及其量測方法

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT1241133B (it) 1990-04-20 1993-12-29 Electronic Systems Spa Apparecchiatura e metodo di scansione per la misura con lettori laser dello spessore di rivestimenti opachi o trasparenti applicati a superfici di qualsiasi genere
CA2220826A1 (en) * 1996-11-12 1998-05-12 National Research Council Of Canada System and method for capturing a range image of reflective surface
US6449041B1 (en) * 1997-07-01 2002-09-10 Lj Laboratories, Llc Apparatus and method for measuring optical characteristics of an object
JP3932836B2 (ja) * 2001-07-27 2007-06-20 株式会社日立製作所 薄膜の膜厚計測方法及びその装置並びにそれを用いたデバイスの製造方法
BE1014355A3 (fr) * 2001-08-30 2003-09-02 Ct Rech Metallurgiques Asbl Procede et dispositif pour la mesure de distances sur des bandes de metal brillant.
CH695914A5 (de) * 2002-05-17 2006-10-13 Hera Rotterdam Bv Vorrichtung und Verfahren zur optischen Erfassung von Gegenständen.
EP1429297A1 (en) 2002-12-13 2004-06-16 Mars, Inc. Apparatus for classifying banknotes
EP1975553A1 (en) * 2007-03-28 2008-10-01 Abb Research Ltd. System for measurement
US20100277748A1 (en) * 2009-04-30 2010-11-04 Sergey Potapenko Method and System for Measuring Relative Positions Of A Specular Reflection Surface
CN102175709B (zh) * 2011-02-22 2013-01-30 东北大学 一种板带热镀锌模拟实验机
US8773656B2 (en) * 2011-08-24 2014-07-08 Corning Incorporated Apparatus and method for characterizing glass sheets

Also Published As

Publication number Publication date
US20160313117A1 (en) 2016-10-27
WO2015085347A1 (en) 2015-06-18
EP3080548A1 (en) 2016-10-19
AU2014361727B2 (en) 2019-07-04
EP3080548B1 (en) 2020-03-18
CN106257996A (zh) 2016-12-28
US10288423B2 (en) 2019-05-14
CA2933249C (en) 2020-11-10
PL3080548T3 (pl) 2020-09-07
CA2933249A1 (en) 2015-06-18
AU2014361727A1 (en) 2016-06-23
CN106257996B (zh) 2019-08-16
EP3080548A4 (en) 2017-08-09

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