DK3239689T3 - Fluidovervågningssystem - Google Patents

Fluidovervågningssystem Download PDF

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Publication number
DK3239689T3
DK3239689T3 DK16382179.6T DK16382179T DK3239689T3 DK 3239689 T3 DK3239689 T3 DK 3239689T3 DK 16382179 T DK16382179 T DK 16382179T DK 3239689 T3 DK3239689 T3 DK 3239689T3
Authority
DK
Denmark
Prior art keywords
monitoring system
fluid monitoring
fluid
monitoring
Prior art date
Application number
DK16382179.6T
Other languages
English (en)
Inventor
Jon Mabe
Original Assignee
Atten2 Advanced Monitoring Tech S L
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Atten2 Advanced Monitoring Tech S L filed Critical Atten2 Advanced Monitoring Tech S L
Application granted granted Critical
Publication of DK3239689T3 publication Critical patent/DK3239689T3/da

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Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/06—Investigating concentration of particle suspensions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8806—Specially adapted optical and illumination features
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/26—Oils; Viscous liquids; Paints; Inks
    • G01N33/28—Oils, i.e. hydrocarbon liquids
    • G01N33/2888—Lubricating oil characteristics, e.g. deterioration
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/005—Diaphragms
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/02—Diffusing elements; Afocal elements
    • G02B5/0273—Diffusing elements; Afocal elements characterized by the use
    • G02B5/0278—Diffusing elements; Afocal elements characterized by the use used in transmission
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N15/06—Investigating concentration of particle suspensions
    • G01N15/075—Investigating concentration of particle suspensions by optical means
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N2015/0007—Investigating dispersion of gas
    • G01N2015/0011—Investigating dispersion of gas in liquids, e.g. bubbles
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N15/00—Investigating characteristics of particles; Investigating permeability, pore-volume or surface-area of porous materials
    • G01N2015/0042—Investigating dispersion of solids
    • G01N2015/0053—Investigating dispersion of solids in liquids, e.g. trouble
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2201/00—Features of devices classified in G01N21/00
    • G01N2201/06—Illumination; Optics
    • G01N2201/062—LED's
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N33/00—Investigating or analysing materials by specific methods not covered by groups G01N1/00 - G01N31/00
    • G01N33/26—Oils; Viscous liquids; Paints; Inks
    • G01N33/28—Oils, i.e. hydrocarbon liquids
    • G01N33/2835—Specific substances contained in the oils or fuels
    • G01N33/2858—Metal particles
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/0008—Microscopes having a simple construction, e.g. portable microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/0016—Technical microscopes, e.g. for inspection or measuring in industrial production processes
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/10—Image acquisition modality
    • G06T2207/10016—Video; Image sequence
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30164—Workpiece; Machine component
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
    • H04N23/56—Cameras or camera modules comprising electronic image sensors; Control thereof provided with illuminating means

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical & Material Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Optics & Photonics (AREA)
  • General Chemical & Material Sciences (AREA)
  • Quality & Reliability (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Theoretical Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Oil, Petroleum & Natural Gas (AREA)
  • Food Science & Technology (AREA)
  • Medicinal Chemistry (AREA)
  • Dispersion Chemistry (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
DK16382179.6T 2016-04-26 2016-04-26 Fluidovervågningssystem DK3239689T3 (da)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP16382179.6A EP3239689B1 (en) 2016-04-26 2016-04-26 Fluid monitoring system

Publications (1)

Publication Number Publication Date
DK3239689T3 true DK3239689T3 (da) 2022-01-10

Family

ID=55862711

Family Applications (1)

Application Number Title Priority Date Filing Date
DK16382179.6T DK3239689T3 (da) 2016-04-26 2016-04-26 Fluidovervågningssystem

Country Status (4)

Country Link
US (1) US11017519B2 (da)
EP (1) EP3239689B1 (da)
DK (1) DK3239689T3 (da)
ES (1) ES2903348T3 (da)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102977514B1 (ko) * 2021-09-03 2026-06-15 세메스 주식회사 버블 측정 유닛과 이를 포함하는 기판 처리 장치 및 버블 측정 방법
CN114624300A (zh) * 2022-03-10 2022-06-14 西安热工研究院有限公司 一种抗固体颗粒冲刷型在线氯表/pH表传感器
US20240013435A1 (en) * 2022-07-06 2024-01-11 Inuitive Ltd. Calibration arrangement

Family Cites Families (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5859705A (en) * 1993-05-26 1999-01-12 The Dow Chemical Company Apparatus and method for using light scattering to determine the size of particles virtually independent of refractive index
JP2866604B2 (ja) * 1994-11-10 1999-03-08 株式会社コスモ総合研究所 油中の不溶解分濃度測定方法及びその装置
US5572320A (en) 1994-11-17 1996-11-05 The United States Of America As Represented By The Secretary Of The Navy Fluid sampler utilizing optical near-field imaging
US5790246A (en) * 1996-04-18 1998-08-04 Montores Pty. Ltd. Apparatus and network for determining a parameter of a particle in a fluid employing detector and processor
GB0013139D0 (en) * 2000-05-30 2000-07-19 Univ Nottingham Improvements in and relating to microscopy
AU2002354814A1 (en) * 2001-07-06 2003-01-21 Exfo Electro-Optical Engineering Inc Optical attenuation system
GB0120588D0 (en) * 2001-08-24 2001-10-17 Land Instr Int Ltd Light source for open-path gas monitoring
US7385694B2 (en) 2002-06-04 2008-06-10 Lockheed Martin Corporation Tribological debris analysis system
US7703922B2 (en) * 2005-07-15 2010-04-27 Jozef F Van de Velde Relaxed confocal catadioptric scanning laser ophthalmoscope
US9041938B2 (en) * 2006-05-02 2015-05-26 California Institute Of Technology Surface wave assisted structures and systems
US8325349B2 (en) * 2008-03-04 2012-12-04 California Institute Of Technology Focal plane adjustment by back propagation in optofluidic microscope devices
US8416400B2 (en) * 2009-06-03 2013-04-09 California Institute Of Technology Wavefront imaging sensor
WO2011053631A1 (en) * 2009-10-28 2011-05-05 Alentic Microscience Inc. Microscopy imaging
EP2550522B1 (en) * 2010-03-23 2016-11-02 California Institute of Technology Super resolution optofluidic microscopes for 2d and 3d imaging
WO2012033957A2 (en) * 2010-09-09 2012-03-15 California Institute Of Technology Delayed emission detection devices and methods
WO2012058233A2 (en) * 2010-10-26 2012-05-03 California Institute Of Technology Scanning projective lensless microscope system
US8842901B2 (en) * 2010-12-14 2014-09-23 The Regents Of The University Of California Compact automated semen analysis platform using lens-free on-chip microscopy
JP2014507645A (ja) * 2011-01-06 2014-03-27 ザ・リージェンツ・オブ・ザ・ユニバーシティー・オブ・カリフォルニア 無レンズ断層撮影装置及び方法
CA2836774C (en) * 2011-05-20 2023-07-04 The Brigham And Women's Hospital, Inc. Analysis and sorting of motile cells
FR2991457B1 (fr) * 2012-06-01 2014-07-18 Commissariat Energie Atomique Procede et systeme de caracterisation de la vitesse de deplacement de particules contenues dans un liquide, telles que des particules sanguines
US8654329B2 (en) * 2012-06-19 2014-02-18 The United States Of America, As Represented By The Secretary Of The Navy Parallel multisensor optical particle sensors for flowing fluid systems
WO2014012031A1 (en) 2012-07-13 2014-01-16 The Regents Of The University Of California High throughput lens-free three-dimensional tracking of sperm
US9341612B2 (en) * 2013-03-27 2016-05-17 Atten2 Advanced Monitoring Technologies S.L.U. System and method for monitoring a fluid

Also Published As

Publication number Publication date
EP3239689A1 (en) 2017-11-01
EP3239689B1 (en) 2021-10-06
US11017519B2 (en) 2021-05-25
US20170309012A1 (en) 2017-10-26
ES2903348T3 (es) 2022-04-01

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